{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T09:13:44Z","timestamp":1742980424348,"version":"3.40.3"},"publisher-location":"Cham","reference-count":29,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031215131"},{"type":"electronic","value":"9783031215148"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-21514-8_28","type":"book-chapter","created":{"date-parts":[[2022,12,16]],"date-time":"2022-12-16T13:22:24Z","timestamp":1671196944000},"page":"331-344","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Pass Transistor XOR Gate Based Radiation Hardened RO-PUF"],"prefix":"10.1007","author":[{"given":"Syed Farah","family":"Naz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sajid","family":"Khan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0810-814X","authenticated-orcid":false,"given":"Ambika Prasad","family":"Shah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,12,17]]},"reference":[{"key":"28_CR1","doi-asserted-by":"crossref","unstructured":"Suh, G.E., Devadas, S.: Physical unclonable functions for device authentication and secret key generation. In: 2007 44th ACM\/IEEE Design Automation Conference, pp. 9\u201314. IEEE (2007)","DOI":"10.1109\/DAC.2007.375043"},{"issue":"8","key":"28_CR2","doi-asserted-by":"publisher","first-page":"1126","DOI":"10.1109\/JPROC.2014.2320516","volume":"102","author":"C Herder","year":"2014","unstructured":"Herder, C., Meng-Day, Yu., Koushanfar, F., Devadas, S.: Physical unclonable functions and applications: a tutorial. Proc. IEEE 102(8), 1126\u20131141 (2014)","journal-title":"Proc. IEEE"},{"key":"28_CR3","doi-asserted-by":"crossref","unstructured":"Guajardo, J., et al.: Anti-counterfeiting, key distribution, and key storage in an ambient world via physical unclonable functions. Inf. Syst. Front. 11(1), 19\u201341 (2009)","DOI":"10.1007\/s10796-008-9142-z"},{"key":"28_CR4","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"283","DOI":"10.1007\/978-3-642-33027-8_17","volume-title":"Cryptographic Hardware and Embedded Systems \u2013 CHES 2012","author":"S Katzenbeisser","year":"2012","unstructured":"Katzenbeisser, S., Kocaba\u015f, \u00dc., Ro\u017ei\u0107, V., Sadeghi, A.-R., Verbauwhede, I., Wachsmann, C.: PUFs: myth, fact or busted? a security evaluation of physically unclonable functions\u00a0(PUFs) cast in silicon. In: Prouff, E., Schaumont, P. (eds.) CHES 2012. LNCS, vol. 7428, pp. 283\u2013301. Springer, Heidelberg (2012). https:\/\/doi.org\/10.1007\/978-3-642-33027-8_17"},{"key":"28_CR5","doi-asserted-by":"crossref","unstructured":"Shah, A.P., Yadav, N., Beohar, A., Vishvakarma, S.K.: An efficient NBTI sensor and compensation circuit for stable and reliable SCRAM cells. Microelectron. Reliabil. 87, 15\u201323 (2018)","DOI":"10.1016\/j.microrel.2018.05.015"},{"issue":"7","key":"28_CR6","doi-asserted-by":"publisher","first-page":"1527","DOI":"10.1109\/TED.2010.2047907","volume":"57","author":"E Ibe","year":"2010","unstructured":"Ibe, E., Taniguchi, H., Yahagi, Y., Shimbo, K., Toba, T.: Impact of scaling on neutron-induced soft error in SRAMS from a 250 nm to a 22 nm design rule. IEEE Trans. Electron Devices 57(7), 1527\u20131538 (2010)","journal-title":"IEEE Trans. Electron Devices"},{"key":"28_CR7","doi-asserted-by":"crossref","unstructured":"Dodd, P.E., Massengill, L.W.: Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Trans. Nuclear Sci. 50(3), 583\u2013602 (2003)","DOI":"10.1109\/TNS.2003.813129"},{"key":"28_CR8","doi-asserted-by":"crossref","unstructured":"Guo, J., et al.: Design of area-efficient and highly reliable RHBD 10t memory cell for aerospace applications. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 26(5), 991\u2013994 (2018)","DOI":"10.1109\/TVLSI.2017.2788439"},{"key":"28_CR9","doi-asserted-by":"crossref","unstructured":"Maes, R., Ingrid, V.: Physically unclonable functions: a study on the state of the art and future research directions. In: Towards Hardware-Intrinsic Security, pp. 3\u201337. Springer (2010)","DOI":"10.1007\/978-3-642-14452-3_1"},{"key":"28_CR10","doi-asserted-by":"crossref","unstructured":"Gu, C., Hanley, N., O\u2019Neill, M.: FPGA-based strong puf with increased uniqueness and entropy properties. In 2017 IEEE International Symposium on Circuits and Systems (ISCAS), pp. 1\u20134. IEEE (2017)","DOI":"10.1109\/ISCAS.2017.8050838"},{"key":"28_CR11","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"300","DOI":"10.1007\/978-3-642-28368-0_20","volume-title":"Cryptography and Security: From Theory to Applications","author":"V van der Leest","year":"2012","unstructured":"van der Leest, V., van der Sluis, E., Schrijen, G.-J., Tuyls, P., Handschuh, H.: Efficient implementation of true random number generator based on SRAM PUFs. In: Naccache, D. (ed.) Cryptography and Security: From Theory to Applications. LNCS, vol. 6805, pp. 300\u2013318. Springer, Heidelberg (2012). https:\/\/doi.org\/10.1007\/978-3-642-28368-0_20"},{"key":"28_CR12","doi-asserted-by":"crossref","unstructured":"Maiti, A., Schaumont, P.: The impact of aging on a physical unclonable function. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 22(9), 1854\u20131864 (2013)","DOI":"10.1109\/TVLSI.2013.2279875"},{"issue":"1","key":"28_CR13","doi-asserted-by":"publisher","first-page":"48","DOI":"10.1109\/MDT.2010.25","volume":"27","author":"Yu Meng-Day","year":"2010","unstructured":"Meng-Day, Yu., Devadas, S.: Secure and robust error correction for physical unclonable functions. IEEE Des. Test Comput. 27(1), 48\u201365 (2010)","journal-title":"IEEE Des. Test Comput."},{"key":"28_CR14","doi-asserted-by":"crossref","unstructured":"Vivekraja, V., Nazhandali, L.: Circuit-level techniques for reliable physically uncloneable functions. In: 2009 IEEE International Workshop on Hardware-Oriented Security and Trust, pp.30\u201335. IEEE (2009)","DOI":"10.1109\/HST.2009.5225054"},{"key":"28_CR15","doi-asserted-by":"crossref","unstructured":"Amsaad, F., Chaudhuri, C.R., Niamat, M.: Reliable and reproducible PUF based cryptographic keys under varying environmental conditions. In: 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS), pp. 468\u2013473. IEEE (2016)","DOI":"10.1109\/NAECON.2016.7856851"},{"key":"28_CR16","doi-asserted-by":"crossref","unstructured":"Khan, S., Shah, A.P., Gupta, N., Chouhan, S.S., Pandey, J.G., Vishvakarma, S.K.: An ultra-low power, reconfigurable, aging resilient RO PUF for IoT applications. Microelectron. J. 92,104605 (2019)","DOI":"10.1016\/j.mejo.2019.104605"},{"key":"28_CR17","doi-asserted-by":"crossref","unstructured":"Taneja, S., Alvarez, A.B., Alioto, M.: Fully synthesizable PUF featuring hysteresis and temperature compensation for 3.2% native ber and 1.02 fj\/b in 40 nm. IEEE J. Solid-State Circ. 53(10), 2828\u20132839 (2018)","DOI":"10.1109\/JSSC.2018.2865584"},{"issue":"6","key":"28_CR18","doi-asserted-by":"publisher","first-page":"889","DOI":"10.1109\/TCAD.2014.2370531","volume":"34","author":"J Delvaux","year":"2014","unstructured":"Delvaux, J., Dawu, G., Schellekens, D., Verbauwhede, I.: Helper data algorithms for PUF-based key generation: overview and analysis. IEEE Trans. Comput.-Aid. Des. Integr. Circ. Syst. 34(6), 889\u2013902 (2014)","journal-title":"IEEE Trans. Comput.-Aid. Des. Integr. Circ. Syst."},{"key":"28_CR19","doi-asserted-by":"crossref","unstructured":"Khan, S., et al.: Utilizing manufacturing variations to design a tri-state flip-flop PUF for IoT security applications. Analog Integr. Circ. Sign. Process. 103(3), 477\u2013492 (2020)","DOI":"10.1007\/s10470-020-01642-9"},{"issue":"1","key":"28_CR20","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TSM.2003.822735","volume":"17","author":"M Orshansky","year":"2004","unstructured":"Orshansky, M., Milor, L., Chenming, H.: Characterization of spatial intrafield gate cd variability, its impact on circuit performance, and spatial mask-level correction. IEEE Trans. Semiconduc. Manufact. 17(1), 2\u201311 (2004)","journal-title":"IEEE Trans. Semiconduc. Manufact."},{"key":"28_CR21","doi-asserted-by":"crossref","unstructured":"Gassend, B., Dijk, M.V., Clarke, D., Devadas, S.: Controlled physical random functions. In: Proceedings on 18th Annual Computer Security Applications Conference 2002, pp. 149\u2013160. IEEE (2002)","DOI":"10.1145\/586110.586132"},{"key":"28_CR22","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"407","DOI":"10.1007\/11496137_28","volume-title":"Applied Cryptography and Network Security","author":"B \u0160kori\u0107","year":"2005","unstructured":"\u0160kori\u0107, B., Tuyls, P., Ophey, W.: Robust key extraction from physical uncloneable functions. In: Ioannidis, J., Keromytis, A., Yung, M. (eds.) ACNS 2005. LNCS, vol. 3531, pp. 407\u2013422. Springer, Heidelberg (2005). https:\/\/doi.org\/10.1007\/11496137_28"},{"key":"28_CR23","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1007\/978-3-540-74735-2_5","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2007","author":"J Guajardo","year":"2007","unstructured":"Guajardo, J., Kumar, S.S., Schrijen, G.-J., Tuyls, P.: FPGA intrinsic PUFs and their use for IP protection. In: Paillier, P., Verbauwhede, I. (eds.) CHES 2007. LNCS, vol. 4727, pp. 63\u201380. Springer, Heidelberg (2007). https:\/\/doi.org\/10.1007\/978-3-540-74735-2_5"},{"key":"28_CR24","doi-asserted-by":"crossref","unstructured":"Bol, D., Ambroise, R., Flandre, D., Legat, J.D.: Interests and limitations of technology scaling for subthreshold logic. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 17(10), 1508\u20131519 (2009)","DOI":"10.1109\/TVLSI.2008.2005413"},{"issue":"1","key":"28_CR25","doi-asserted-by":"publisher","first-page":"68","DOI":"10.1109\/TDMR.2011.2167233","volume":"12","author":"S Lin","year":"2011","unstructured":"Lin, S., Kim, Y.-B., Lombardi, F.: Analysis and design of nanoscale CMOS storage elements for single-event hardening with multiple-node upset. IEEE Trans. Dev. Mater. Reliabil. 12(1), 68\u201377 (2011)","journal-title":"IEEE Trans. Dev. Mater. Reliabil."},{"key":"28_CR26","doi-asserted-by":"crossref","unstructured":"Mavis, D.G., Eaton, P.H.: Soft error rate mitigation techniques for modern microcircuits. In: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No. 02CH37320), pp. 216\u2013225. IEEE, (2002)","DOI":"10.1109\/RELPHY.2002.996639"},{"key":"28_CR27","unstructured":"Chowdhury, S.R., Banerjee, A., Roy, A., Saha, H.: A high speed 8 transistor full adder design using novel 3 transistor xor gates. Int. J. Electron. Circ. Syst. 2(4), 217\u2013223 (2008)"},{"key":"28_CR28","doi-asserted-by":"crossref","unstructured":"Shah, A.P., Rossi, D., Sharma, V., Vishvakarma, S.K., Waltl, M.: Soft error hardening enhancement analysis of NBTI tolerant schmitt trigger circuit. Microelectron. Reliabil. 107, 113617 (2020)","DOI":"10.1016\/j.microrel.2020.113617"},{"key":"28_CR29","doi-asserted-by":"crossref","unstructured":"Rahman, M.T., Rahman, F., Forte, D., Tehranipoor, M.: An aging-resistant RO-PUF for reliable key generation. IEEE Trans. Emerg. Top. Comput. 4(3), 335\u2013348 (2015)","DOI":"10.1109\/TETC.2015.2474741"}],"container-title":["Communications in Computer and Information Science","VLSI Design and Test"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-21514-8_28","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T15:48:47Z","timestamp":1728575327000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-21514-8_28"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031215131","9783031215148"],"references-count":29,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-21514-8_28","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"17 December 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"VDAT","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Symposium on VLSI Design and Test","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Jammu","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17 July 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 July 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"vdat2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/iitjammu.ac.in\/vdat2022\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"220","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"32","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"16","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"15% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}