{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T23:58:45Z","timestamp":1742947125194,"version":"3.40.3"},"publisher-location":"Cham","reference-count":29,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031228285"},{"type":"electronic","value":"9783031228292"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-22829-2_10","type":"book-chapter","created":{"date-parts":[[2022,12,6]],"date-time":"2022-12-06T09:13:44Z","timestamp":1670318024000},"page":"165-184","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["What Do You See? Transforming Fault Injection Target Characterizations"],"prefix":"10.1007","author":[{"given":"Marina","family":"Kr\u010dek","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,12,7]]},"reference":[{"key":"10_CR1","unstructured":"PlotDigitizer: Version 2.2 (2022). https:\/\/plotdigitizer.com"},{"key":"10_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"182","DOI":"10.1007\/978-3-642-12510-2_13","volume-title":"Smart Card Research and Advanced Application","author":"M Agoyan","year":"2010","unstructured":"Agoyan, M., Dutertre, J.-M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Gollmann, D., Lanet, J.-L., Iguchi-Cartigny, J. (eds.) CARDIS 2010. LNCS, vol. 6035, pp. 182\u2013193. Springer, Heidelberg (2010). https:\/\/doi.org\/10.1007\/978-3-642-12510-2_13"},{"key":"10_CR3","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"260","DOI":"10.1007\/3-540-36400-5_20","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"C Aum\u00fcller","year":"2003","unstructured":"Aum\u00fcller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.-P.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260\u2013275. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_20"},{"key":"10_CR4","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"513","DOI":"10.1007\/BFb0052259","volume-title":"Advances in Cryptology \u2014 CRYPTO 1997","author":"E Biham","year":"1997","unstructured":"Biham, E., Shamir, A.: Differential fault analysis of secret key cryptosystems. In: Kaliski, B.S. (ed.) CRYPTO 1997. LNCS, vol. 1294, pp. 513\u2013525. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/BFb0052259"},{"key":"10_CR5","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"37","DOI":"10.1007\/3-540-69053-0_4","volume-title":"Advances in Cryptology \u2014 EUROCRYPT \u201997","author":"D Boneh","year":"1997","unstructured":"Boneh, D., DeMillo, R.A., Lipton, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37\u201351. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/3-540-69053-0_4"},{"key":"10_CR6","unstructured":"Breier, J., Hou, X.: How practical are fault injection attacks, really? Cryptology ePrint Archive, Paper 2022\/301 (2022). https:\/\/eprint.iacr.org\/2022\/301"},{"key":"10_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"236","DOI":"10.1007\/978-3-319-08302-5_16","volume-title":"Smart Card Research and Advanced Applications","author":"RB Carpi","year":"2014","unstructured":"Carpi, R.B., Picek, S., Batina, L., Menarini, F., Jakobovic, D., Golub, M.: Glitch it if you can: parameter search strategies for successful fault injection. In: Francillon, A., Rohatgi, P. (eds.) CARDIS 2013. LNCS, vol. 8419, pp. 236\u2013252. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-08302-5_16"},{"key":"10_CR8","doi-asserted-by":"crossref","unstructured":"Fuhr, T., Jaulmes, E., Lomn\u00e9, V., Thillard, A.: Fault attacks on AES with faulty ciphertexts only. In: 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 108\u2013118. IEEE (2013)","DOI":"10.1109\/FDTC.2013.18"},{"key":"10_CR9","doi-asserted-by":"crossref","unstructured":"Fukunaga, T., Takahashi, J.: Practical fault attack on a cryptographic LSI with iso\/iec 18033\u20133 block ciphers. In: 2009 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 84\u201392. IEEE (2009)","DOI":"10.1109\/FDTC.2009.34"},{"key":"10_CR10","doi-asserted-by":"crossref","unstructured":"Ghalaty, N.F., Yuce, B., Taha, M., Schaumont, P.: Differential fault intensity analysis. In: 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 49\u201358. IEEE (2014)","DOI":"10.1109\/FDTC.2014.15"},{"issue":"12","key":"10_CR11","doi-asserted-by":"publisher","first-page":"2639","DOI":"10.1162\/0899766042321814","volume":"16","author":"DR Hardoon","year":"2004","unstructured":"Hardoon, D.R., Szedmak, S., Shawe-Taylor, J.: Canonical correlation analysis: an overview with application to learning methods. Neural Comput. 16(12), 2639\u20132664 (2004). https:\/\/doi.org\/10.1162\/0899766042321814","journal-title":"Neural Comput."},{"key":"10_CR12","doi-asserted-by":"publisher","unstructured":"Kocher, P., Jaffe, J., Jun, B.: Differential power analysis. In: Wiener, M. (eds.) Advances in Cryptology \u2013 CRYPTO 1999. CRYPTO 1999. LNCS, vol. 1666, pp. 388\u2013397. Springer, Heidelberg (1999). https:\/\/doi.org\/10.1007\/3-540-48405-1_25","DOI":"10.1007\/3-540-48405-1_25"},{"key":"10_CR13","doi-asserted-by":"publisher","unstructured":"Kr\u010dek, M., Fronte, D., Picek, S.: On the importance of initial solutions selection in fault injection. In: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), pp. 1\u201312 (2021). https:\/\/doi.org\/10.1109\/FDTC53659.2021.00011","DOI":"10.1109\/FDTC53659.2021.00011"},{"issue":"1","key":"10_CR14","doi-asserted-by":"publisher","first-page":"79","DOI":"10.1214\/aoms\/1177729694","volume":"22","author":"S Kullback","year":"1951","unstructured":"Kullback, S., Leibler, R.A.: On information and sufficiency. Ann. Math. Stat. 22(1), 79\u201386 (1951)","journal-title":"Ann. Math. Stat."},{"key":"10_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"320","DOI":"10.1007\/978-3-642-15031-9_22","volume-title":"Cryptographic Hardware and Embedded Systems, CHES 2010","author":"Y Li","year":"2010","unstructured":"Li, Y., Sakiyama, K., Gomisawa, S., Fukunaga, T., Takahashi, J., Ohta, K.: Fault sensitivity analysis. In: Mangard, S., Standaert, F.-X. (eds.) CHES 2010. LNCS, vol. 6225, pp. 320\u2013334. Springer, Heidelberg (2010). https:\/\/doi.org\/10.1007\/978-3-642-15031-9_22"},{"key":"10_CR16","doi-asserted-by":"crossref","unstructured":"Maldini, A., Samwel, N., Picek, S., Batina, L.: Genetic algorithm-based electromagnetic fault injection. In: 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 35\u201342. IEEE (2018)","DOI":"10.1109\/FDTC.2018.00014"},{"key":"10_CR17","doi-asserted-by":"crossref","unstructured":"Moradi, M., Oakes, B.J., Saraoglu, M., Morozov, A., Janschek, K., Denil, J.: Exploring fault parameter space using reinforcement learning-based fault injection. In: 2020 50th Annual IEEE\/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), pp. 102\u2013109. IEEE (2020)","DOI":"10.1109\/DSN-W50199.2020.00028"},{"key":"10_CR18","unstructured":"Morcos, A., Raghu, M., Bengio, S.: Insights on representational similarity in neural networks with canonical correlation. In: Bengio, S., Wallach, H., Larochelle, H., Grauman, K., Cesa-Bianchi, N., Garnett, R. (eds.) Advances in Neural Information Processing Systems, vol. 31, pp. 5732\u20135741. Curran Associates, Inc. (2018). http:\/\/papers.nips.cc\/paper\/7815-insights-on-representational-similarity-in-neural-networks-with-canonical-correlation.pdf"},{"key":"10_CR19","doi-asserted-by":"crossref","unstructured":"Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller. In: 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 77\u201388. IEEE (2013)","DOI":"10.1109\/FDTC.2013.9"},{"key":"10_CR20","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"159","DOI":"10.1007\/978-3-319-21476-4_11","volume-title":"Constructive Side-Channel Analysis and Secure Design","author":"S Picek","year":"2015","unstructured":"Picek, S., Batina, L., Buzing, P., Jakobovic, D.: Fault injection with a new flavor: memetic algorithms make a difference. In: Mangard, S., Poschmann, A.Y. (eds.) COSADE 2014. LNCS, vol. 9064, pp. 159\u2013173. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-21476-4_11"},{"key":"10_CR21","doi-asserted-by":"crossref","unstructured":"Picek, S., Batina, L., Jakobovi\u0107, D., Carpi, R.B.: Evolving genetic algorithms for fault injection attacks. In: 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), pp. 1106\u20131111. IEEE (2014)","DOI":"10.1109\/MIPRO.2014.6859734"},{"key":"10_CR22","first-page":"185","volume":"2002","author":"JJ Quisquater","year":"2002","unstructured":"Quisquater, J.J.: Eddy current for magnetic analysis with active sensor. Proc. Esmart 2002, 185\u2013194 (2002)","journal-title":"Proc. Esmart"},{"key":"10_CR23","unstructured":"Raghu, M., Gilmer, J., Yosinski, J., Sohl-Dickstein, J.: SVCCA: singular vector canonical correlation analysis for deep learning dynamics and interpretability. In: Guyon, I., Luxburg, U.V., Bengio, S., Wallach, H., Fergus, R., Vishwanathan, S., Garnett, R. (eds.) Advances in Neural Information Processing Systems, vol. 30, pp. 6076\u20136085. Curran Associates, Inc. (2017). http:\/\/papers.nips.cc\/paper\/7188-svcca-singular-vector-canonical-correlation-analysis-for-deep-learning-dynamics-and-interpretability.pdf"},{"key":"10_CR24","unstructured":"Rohatgi, A.: Webplotdigitizer: Version 4.5 (2021). https:\/\/automeris.io\/WebPlotDigitizer"},{"key":"10_CR25","unstructured":"Schmidt, J.M., Hutter, M.: Optical and EM fault-attacks on CRT-based RSA: Concrete results.na (2007)"},{"key":"10_CR26","doi-asserted-by":"publisher","unstructured":"Skorobogatov, S.: Low temperature data remanence in static RAM. Technical report. UCAM-CL-TR-536, University of Cambridge, Computer Laboratory, June 2002. https:\/\/doi.org\/10.48456\/tr-536","DOI":"10.48456\/tr-536"},{"key":"10_CR27","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"159","DOI":"10.1007\/978-3-319-21476-4_11","volume-title":"Constructive Side-Channel Analysis and Secure Design","author":"S Picek","year":"2015","unstructured":"Picek, S., Batina, L., Buzing, P., Jakobovic, D.: Fault injection with a new flavor: memetic algorithms make a difference. In: Mangard, S., Poschmann, A.Y. (eds.) COSADE 2014. LNCS, vol. 9064, pp. 159\u2013173. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-21476-4_11"},{"key":"10_CR28","doi-asserted-by":"publisher","unstructured":"Werner, V., Maingault, L., Potet, M.L.: Fast calibration of fault injection equipment with hyperparameter optimization techniques. In: Grosso, V., P\u00f6ppelmann, T. (eds.) Smart Card Research and Advanced Applications. CARDIS 2021. LNCS, vol. 13173, pp. 121\u2013138. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-97348-3_7","DOI":"10.1007\/978-3-030-97348-3_7"},{"key":"10_CR29","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"146","DOI":"10.1007\/978-3-030-40186-3_8","volume-title":"Topics in Cryptology \u2013 CT-RSA 2020","author":"L Wu","year":"2020","unstructured":"Wu, L., Ribera, G., Beringuier-Boher, N., Picek, S.: A fast characterization method for semi-invasive fault injection attacks. In: Jarecki, S. (ed.) CT-RSA 2020. LNCS, vol. 12006, pp. 146\u2013170. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-40186-3_8"}],"container-title":["Lecture Notes in Computer Science","Security, Privacy, and Applied Cryptography Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-22829-2_10","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,6]],"date-time":"2022-12-06T20:15:01Z","timestamp":1670357701000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-22829-2_10"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031228285","9783031228292"],"references-count":29,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-22829-2_10","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"7 December 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"SPACE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Security, Privacy, and Applied Cryptography Engineering","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Madras","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 December 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"12 December 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"12","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"space2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"61","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"18","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"30% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.69","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}