{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T17:27:15Z","timestamp":1742923635280,"version":"3.40.3"},"publisher-location":"Cham","reference-count":38,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031251146"},{"type":"electronic","value":"9783031251153"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-25115-3_8","type":"book-chapter","created":{"date-parts":[[2023,1,28]],"date-time":"2023-01-28T13:57:23Z","timestamp":1674914243000},"page":"114-128","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Deep Learning Image Age Approximation - What is More Relevant: Image Content or\u00a0Age Information?"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8711-4091","authenticated-orcid":false,"given":"Robert","family":"J\u00f6chl","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5921-8755","authenticated-orcid":false,"given":"Andreas","family":"Uhl","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,1,29]]},"reference":[{"key":"8_CR1","doi-asserted-by":"publisher","unstructured":"Ahmed, F., Khelifi, F., Lawgaly, A., Bouridane, A.: Temporal image forensic analysis for picture dating with deep learning. In: 2020 International Conference on Computing, Electronics Communications Engineering (iCCECE), pp. 109\u2013114 (2020). https:\/\/doi.org\/10.1109\/iCCECE49321.2020.9231160","DOI":"10.1109\/iCCECE49321.2020.9231160"},{"key":"8_CR2","doi-asserted-by":"publisher","unstructured":"Ahmed, F., Khelifi, F., Lawgaly, A., Bouridane, A.: The \u2018northumbria temporal image forensics\u2019 database: description and analysis. In: 2020 7th International Conference on Control, Decision and Information Technologies (CoDIT), vol. 1, pp. 982\u2013987 (2020). https:\/\/doi.org\/10.1109\/CoDIT49905.2020.9263888","DOI":"10.1109\/CoDIT49905.2020.9263888"},{"key":"8_CR3","doi-asserted-by":"publisher","first-page":"301311","DOI":"10.1016\/j.fsidi.2021.301311","volume":"39","author":"FN Ahmed","year":"2021","unstructured":"Ahmed, F.N., Khelifi, F., Lawgaly, A., Bouridane, A.: A machine learning-based approach for picture acquisition timeslot prediction using defective pixels. Forensic Sci. Int. Digit. Invest. 39, 301311 (2021)","journal-title":"Forensic Sci. Int. Digit. Invest."},{"issue":"5","key":"8_CR4","doi-asserted-by":"publisher","first-page":"1067","DOI":"10.1109\/TIFS.2016.2640938","volume":"12","author":"M Al-Ani","year":"2017","unstructured":"Al-Ani, M., Khelifi, F.: On the SPN estimation in image forensics: a systematic empirical evaluation. IEEE Trans. Inf. Forensics Secur. 12(5), 1067\u20131081 (2017). https:\/\/doi.org\/10.1109\/TIFS.2016.2640938","journal-title":"IEEE Trans. Inf. Forensics Secur."},{"issue":"11","key":"8_CR5","doi-asserted-by":"publisher","first-page":"2691","DOI":"10.1109\/TIFS.2018.2825953","volume":"13","author":"B Bayar","year":"2018","unstructured":"Bayar, B., Stamm, M.C.: Constrained convolutional neural networks: a new approach towards general purpose image manipulation detection. IEEE Trans. Inf. Forensics Secur. 13(11), 2691\u20132706 (2018). https:\/\/doi.org\/10.1109\/TIFS.2018.2825953","journal-title":"IEEE Trans. Inf. Forensics Secur."},{"issue":"5","key":"8_CR6","doi-asserted-by":"publisher","first-page":"1181","DOI":"10.1109\/TIFS.2018.2871749","volume":"14","author":"M Boroumand","year":"2018","unstructured":"Boroumand, M., Chen, M., Fridrich, J.: Deep residual network for steganalysis of digital images. IEEE Trans. Inf. Forensics Secur. 14(5), 1181\u20131193 (2018)","journal-title":"IEEE Trans. Inf. Forensics Secur."},{"key":"8_CR7","unstructured":"Chan, C.H.: Dead pixel real-time detection method for image. US Patent 7,589,770, 15 September 2009"},{"issue":"12","key":"8_CR8","doi-asserted-by":"publisher","first-page":"1","DOI":"10.2352\/ISSN.2470-1173.2016.12.IMSE-283","volume":"2016","author":"GH Chapman","year":"2016","unstructured":"Chapman, G.H., et al.: Increases in hot pixel development rates for small digital pixel sizes. Electron. Imaging 2016(12), 1\u20136 (2016)","journal-title":"Electron. Imaging"},{"key":"8_CR9","doi-asserted-by":"publisher","unstructured":"Chapman, G.H., Thomas, R., Koren, Z., Koren, I.: Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. In: Widenhorn, R., Dupret, A. (eds.) Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, vol. 8659, pp. 119\u2013129. International Society for Optics and Photonics, SPIE (2013). https:\/\/doi.org\/10.1117\/12.2005850","DOI":"10.1117\/12.2005850"},{"key":"8_CR10","doi-asserted-by":"crossref","unstructured":"Chattopadhay, A., Sarkar, A., Howlader, P., Balasubramanian, V.N.: Grad-CAM++: generalized gradient-based visual explanations for deep convolutional networks. In: 2018 IEEE Winter Conference on Applications of Computer Vision (WACV), pp. 839\u2013847. IEEE (2018)","DOI":"10.1109\/WACV.2018.00097"},{"key":"8_CR11","doi-asserted-by":"crossref","unstructured":"Chen, C.W., Cho, C.Y., Sun, Y.F., Chen, T.M., Su, C.L.: Low complexity photo sensor dead pixel detection algorithm. In: 2012 IEEE Asia Pacific Conference on Circuits and Systems, pp. 360\u2013363. IEEE (2012)","DOI":"10.1109\/APCCAS.2012.6419046"},{"key":"8_CR12","doi-asserted-by":"crossref","unstructured":"Cho, C.Y., Chen, T.M., Wang, W.S., Liu, C.N.: Real-time photo sensor dead pixel detection for embedded devices. In: 2011 International Conference on Digital Image Computing: Techniques and Applications, pp. 164\u2013169. IEEE (2011)","DOI":"10.1109\/DICTA.2011.34"},{"issue":"15","key":"8_CR13","doi-asserted-by":"publisher","first-page":"46","DOI":"10.2352\/issn.2470-1173.2017.15.dpmi-088","volume":"2017","author":"N El-Yamany","year":"2017","unstructured":"El-Yamany, N.: Robust defect pixel detection and correction for bayer imaging systems. Electron. Imaging 2017(15), 46\u201351 (2017). https:\/\/doi.org\/10.2352\/issn.2470-1173.2017.15.dpmi-088","journal-title":"Electron. Imaging"},{"key":"8_CR14","doi-asserted-by":"crossref","unstructured":"Fridrich, J., Goljan, M.: Determining approximate age of digital images using sensor defects. In: Memon, N.D., Dittmann, J., Alattar, A.M., III, E.J.D. (eds.) Media Watermarking, Security, and Forensics III, vol. 7880, pp. 49\u201359. International Society for Optics and Photonics, SPIE (2011)","DOI":"10.1117\/12.872198"},{"issue":"36","key":"8_CR15","doi-asserted-by":"publisher","first-page":"6904","DOI":"10.1364\/AO.47.006904","volume":"47","author":"S Ghosh","year":"2008","unstructured":"Ghosh, S., Froebrich, D., Freitas, A.: Robust autonomous detection of the defective pixels in detectors using a probabilistic technique. Appl. Opt. 47(36), 6904\u20136924 (2008)","journal-title":"Appl. Opt."},{"key":"8_CR16","unstructured":"Gildenblat, J.: Pytorch library for cam methods (2021). https:\/\/github.com\/jacobgil\/pytorch-grad-cam. Accessed 07 June 2022"},{"key":"8_CR17","first-page":"172","volume-title":"Informatik 2009 - Im Focus das Leben","author":"T Gloe","year":"2009","unstructured":"Gloe, T.: Die \u2018dresden image database\u2019 f\u00fcr die entwicklung und validierung von methoden der digitalen bildforensik. In: Fischer, S., Maehle, E., Reischuk, R. (eds.) Informatik 2009 - Im Focus das Leben, pp. 172\u2013172. Gesellschaft f\u00fcr Informatik e. V., Bonn (2009)"},{"key":"8_CR18","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770\u2013778 (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"8_CR19","doi-asserted-by":"publisher","unstructured":"Joechl, R., Uhl, A.: Apart from in-field sensor defects, are there additional age traces hidden in a digital image? In: 2021 IEEE International Workshop on Information Forensics and Security (WIFS), Montpellier, France, pp. 1\u20136 (2021). https:\/\/doi.org\/10.1109\/WIFS53200.2021.9648396","DOI":"10.1109\/WIFS53200.2021.9648396"},{"key":"8_CR20","doi-asserted-by":"publisher","unstructured":"Joechl, R., Uhl, A.: Identification of in-field sensor defects in the context of image age approximation. In: 2021 IEEE International Conference on Image Processing (ICIP), Anchorage, AK, USA, pp. 3043\u20133047 (2021). https:\/\/doi.org\/10.1109\/ICIP42928.2021.9506023","DOI":"10.1109\/ICIP42928.2021.9506023"},{"key":"8_CR21","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"181","DOI":"10.1007\/978-3-030-69449-4_14","volume-title":"Digital Forensics and Watermarking","author":"R J\u00f6chl","year":"2021","unstructured":"J\u00f6chl, R., Uhl, A.: A machine learning approach to approximate the age of a digital image. In: Zhao, X., Shi, Y.-Q., Piva, A., Kim, H.J. (eds.) IWDW 2020. LNCS, vol. 12617, pp. 181\u2013195. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-69449-4_14"},{"key":"8_CR22","unstructured":"Joechl, R., Uhl, A.: Device (in)dependence of deep learning-based image age approximation. In: 2022 ICPR-Workshop on Artificial Intelligence for Multimedia Forensics and Disinformation Detection, Montreal, Quebec, Canada, pp. 1\u201314 (2022)"},{"key":"8_CR23","unstructured":"Kingma, D.P., Ba, J.: Adam: a method for stochastic optimization (2017)"},{"key":"8_CR24","first-page":"1097","volume":"25","author":"A Krizhevsky","year":"2012","unstructured":"Krizhevsky, A., Sutskever, I., Hinton, G.E.: ImageNet classification with deep convolutional neural networks. Adv. Neural. Inf. Process. Syst. 25, 1097\u20131105 (2012)","journal-title":"Adv. Neural. Inf. Process. Syst."},{"issue":"2","key":"8_CR25","doi-asserted-by":"publisher","first-page":"392","DOI":"10.1109\/TIFS.2016.2620280","volume":"12","author":"A Lawgaly","year":"2017","unstructured":"Lawgaly, A., Khelifi, F.: Sensor pattern noise estimation based on improved locally adaptive DCT filtering and weighted averaging for source camera identification and verification. IEEE Trans. Inf. Forensics Secur. 12(2), 392\u2013404 (2017). https:\/\/doi.org\/10.1109\/TIFS.2016.2620280","journal-title":"IEEE Trans. Inf. Forensics Secur."},{"key":"8_CR26","doi-asserted-by":"crossref","unstructured":"Leung, J., Chapman, G.H., Koren, I., Koren, Z.: Characterization of gain enhanced in-field defects in digital imagers. In: 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 155\u2013163 (2009)","DOI":"10.1109\/DFT.2009.49"},{"key":"8_CR27","doi-asserted-by":"publisher","unstructured":"Leung, J., Chapman, G.H., Koren, Z., Koren, I.: Statistical identification and analysis of defect development in digital imagers. In: Rodricks, B.G., S\u00fcsstrunk, S.E. (eds.) Digital Photography V, vol. 7250, pp. 272\u2013283. International Society for Optics and Photonics, SPIE (2009). https:\/\/doi.org\/10.1117\/12.806109","DOI":"10.1117\/12.806109"},{"key":"8_CR28","doi-asserted-by":"publisher","unstructured":"Leung, J., Dudas, J., Chapman, G.H., Koren, I., Koren, Z.: Quantitative analysis of in-field defects in image sensor arrays. In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007). IEEE (2007). https:\/\/doi.org\/10.1109\/dft.2007.59","DOI":"10.1109\/dft.2007.59"},{"issue":"1","key":"8_CR29","doi-asserted-by":"publisher","first-page":"18","DOI":"10.3390\/e23010018","volume":"23","author":"P Linardatos","year":"2021","unstructured":"Linardatos, P., Papastefanopoulos, V., Kotsiantis, S.: Explainable AI: a review of machine learning interpretability methods. Entropy 23(1), 18 (2021)","journal-title":"Entropy"},{"key":"8_CR30","doi-asserted-by":"crossref","unstructured":"Selvaraju, R.R., Cogswell, M., Das, A., Vedantam, R., Parikh, D., Batra, D.: Grad-CAM: visual explanations from deep networks via gradient-based localization. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 618\u2013626 (2017)","DOI":"10.1109\/ICCV.2017.74"},{"key":"8_CR31","unstructured":"Springenberg, J.T., Dosovitskiy, A., Brox, T., Riedmiller, M.: Striving for simplicity: the all convolutional net. arXiv preprint arXiv:1412.6806 (2014)"},{"key":"8_CR32","doi-asserted-by":"crossref","unstructured":"Szegedy, C., et al.: Going deeper with convolutions. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1\u20139 (2015)","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"8_CR33","doi-asserted-by":"publisher","unstructured":"Tchendjou, G.T., Simeu, E.: Detection, location and concealment of defective pixels in image sensors. IEEE Trans. Emerg. Top. Comput. 1 (2020). https:\/\/doi.org\/10.1109\/tetc.2020.2976807","DOI":"10.1109\/tetc.2020.2976807"},{"issue":"12","key":"8_CR34","doi-asserted-by":"publisher","first-page":"3260","DOI":"10.1109\/TED.2007.908906","volume":"54","author":"AJ Theuwissen","year":"2007","unstructured":"Theuwissen, A.J.: Influence of terrestrial cosmic rays on the reliability of CCD image sensors part 1: experiments at room temperature. IEEE Trans. Electron Devices 54(12), 3260\u20133266 (2007)","journal-title":"IEEE Trans. Electron Devices"},{"issue":"9","key":"8_CR35","doi-asserted-by":"publisher","first-page":"2324","DOI":"10.1109\/TED.2008.927662","volume":"55","author":"AJ Theuwissen","year":"2008","unstructured":"Theuwissen, A.J.: Influence of terrestrial cosmic rays on the reliability of CCD image sensors part 2: experiments at elevated temperature. IEEE Trans. Electron Devices 55(9), 2324\u20132328 (2008)","journal-title":"IEEE Trans. Electron Devices"},{"key":"8_CR36","doi-asserted-by":"crossref","unstructured":"Timmerman, D., Bennabhaktula, S., Alegre, E., Azzopardi, G.: Video camera identification from sensor pattern noise with a constrained convnet. arXiv preprint arXiv:2012.06277 (2020)","DOI":"10.5220\/0010246804170425"},{"key":"8_CR37","doi-asserted-by":"crossref","unstructured":"Wang, H., et al.: Score-CAM: score-weighted visual explanations for convolutional neural networks. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition Workshops, pp. 24\u201325 (2020)","DOI":"10.1109\/CVPRW50498.2020.00020"},{"key":"8_CR38","doi-asserted-by":"crossref","unstructured":"Zhou, B., Khosla, A., Lapedriza, A., Oliva, A., Torralba, A.: Learning deep features for discriminative localization. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2921\u20132929 (2016)","DOI":"10.1109\/CVPR.2016.319"}],"container-title":["Lecture Notes in Computer Science","Digital Forensics and Watermarking"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-25115-3_8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,28]],"date-time":"2023-01-28T13:58:55Z","timestamp":1674914335000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-25115-3_8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031251146","9783031251153"],"references-count":38,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-25115-3_8","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"29 January 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IWDW","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Workshop on Digital Watermarking","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Guilin","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18 November 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 November 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iwdw2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/iwdw.site\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"30","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"14","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"47% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.23","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1.43","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}