{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T19:41:07Z","timestamp":1769110867464,"version":"3.49.0"},"publisher-location":"Cham","reference-count":24,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783031263866","type":"print"},{"value":"9783031263873","type":"electronic"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-26387-3_28","type":"book-chapter","created":{"date-parts":[[2023,3,16]],"date-time":"2023-03-16T15:03:10Z","timestamp":1678978990000},"page":"457-473","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["A Recommendation System for\u00a0CAD Assembly Modeling Based on\u00a0Graph Neural Networks"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1678-6795","authenticated-orcid":false,"given":"Carola","family":"Gajek","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5283-5304","authenticated-orcid":false,"given":"Alexander","family":"Schiendorfer","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4086-0043","authenticated-orcid":false,"given":"Wolfgang","family":"Reif","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,3,17]]},"reference":[{"key":"28_CR1","doi-asserted-by":"publisher","unstructured":"Bakarov, A.: A survey of word embeddings evaluation methods (2018). https:\/\/doi.org\/10.48550\/ARXIV.1801.09536","DOI":"10.48550\/ARXIV.1801.09536"},{"key":"28_CR2","doi-asserted-by":"publisher","unstructured":"Bronstein, M.M., Bruna, J., Cohen, T., Veli\u010dkovi\u0107, P.: Geometric deep learning: grids, groups, graphs, geodesics, and gauges (2021). https:\/\/doi.org\/10.48550\/ARXIV.2104.13478","DOI":"10.48550\/ARXIV.2104.13478"},{"key":"28_CR3","doi-asserted-by":"publisher","unstructured":"Cunningham, J.D., Simpson, T.W., Tucker, C.S.: An investigation of surrogate models for efficient performance-based decoding of 3D point clouds. J. Mech. Des. 141(12) (2019). https:\/\/doi.org\/10.1115\/1.4044597","DOI":"10.1115\/1.4044597"},{"key":"28_CR4","unstructured":"Goodfellow, I., Bengio, Y., Courville, A.: Deep Learning. MIT Press, Cambridge (2016)"},{"key":"28_CR5","doi-asserted-by":"publisher","unstructured":"Grover, A., Leskovec, J.: Node2vec: scalable feature learning for networks. In: Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining. KDD \u201916, pp. 855\u2013864. Association for Computing Machinery, New York (2016). https:\/\/doi.org\/10.1145\/2939672.2939754","DOI":"10.1145\/2939672.2939754"},{"key":"28_CR6","doi-asserted-by":"publisher","unstructured":"Guo, X., Zhao, L.: A systematic survey on deep generative models for graph generation (2020). https:\/\/doi.org\/10.48550\/ARXIV.2007.06686","DOI":"10.48550\/ARXIV.2007.06686"},{"key":"28_CR7","doi-asserted-by":"publisher","unstructured":"Guo, X., Li, W., Iorio, F.: Convolutional neural networks for steady flow approximation. In: Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining. KDD \u201916, pp. 481\u2013490. Association for Computing Machinery, New York (2016). https:\/\/doi.org\/10.1145\/2939672.2939738","DOI":"10.1145\/2939672.2939738"},{"key":"28_CR8","unstructured":"Hamilton, W., Ying, Z., Leskovec, J.: Inductive representation learning on large graphs. In: Advances in Neural Information Processing Systems, vol. 30. Curran Associates, Inc. (2017)"},{"issue":"3","key":"28_CR9","first-page":"1","volume":"14","author":"WL Hamilton","year":"2020","unstructured":"Hamilton, W.L.: Graph representation learning. Synth. Lect. Artif. Intell. Mach. Learn. 14(3), 1\u2013159 (2020)","journal-title":"Synth. Lect. Artif. Intell. Mach. Learn."},{"key":"28_CR10","doi-asserted-by":"publisher","unstructured":"Kipf, T.N., Welling, M.: Semi-supervised classification with graph convolutional networks (2017). https:\/\/doi.org\/10.48550\/ARXIV.1609.02907","DOI":"10.48550\/ARXIV.1609.02907"},{"issue":"2","key":"28_CR11","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/1970378.1970380","volume":"18","author":"W Li","year":"2011","unstructured":"Li, W., Matejka, J., Grossman, T., Konstan, J.A., Fitzmaurice, G.: Design and evaluation of a command recommendation system for software applications. ACM Trans. Comput.-Hum. Interact. (TOCHI) 18(2), 1\u201335 (2011). https:\/\/doi.org\/10.1145\/1970378.1970380","journal-title":"ACM Trans. Comput.-Hum. Interact. (TOCHI)"},{"key":"28_CR12","doi-asserted-by":"publisher","unstructured":"Li, Y., Vinyals, O., Dyer, C., Pascanu, R., Battaglia, P.: Learning deep generative models of Graphs (2018). https:\/\/doi.org\/10.48550\/ARXIV.1803.03324","DOI":"10.48550\/ARXIV.1803.03324"},{"key":"28_CR13","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1016\/j.cad.2019.03.005","volume":"113","author":"K Lupinetti","year":"2019","unstructured":"Lupinetti, K., Pernot, J.P., Monti, M., Giannini, F.: Content-based CAD assembly model retrieval: survey and future challenges. Comput. Aided Des. 113, 62\u201381 (2019). https:\/\/doi.org\/10.1016\/j.cad.2019.03.005","journal-title":"Comput. Aided Des."},{"key":"28_CR14","doi-asserted-by":"publisher","unstructured":"Mikolov, T., Chen, K., Corrado, G., Dean, J.: Efficient estimation of word representations in vector space (2013). https:\/\/doi.org\/10.48550\/ARXIV.1301.3781","DOI":"10.48550\/ARXIV.1301.3781"},{"key":"28_CR15","volume-title":"Computer Aided Design and Manufacturing","author":"M Sarcar","year":"2008","unstructured":"Sarcar, M., Rao, K.M., Narayan, K.L.: Computer Aided Design and Manufacturing. PHI Learning Pvt Ltd., New Delhi (2008)"},{"key":"28_CR16","doi-asserted-by":"publisher","unstructured":"Veli\u010dkovi\u0107, P., Cucurull, G., Casanova, A., Romero, A., Li\u00f2, P., Bengio, Y.: Graph attention networks (2018). https:\/\/doi.org\/10.48550\/ARXIV.1710.10903","DOI":"10.48550\/ARXIV.1710.10903"},{"key":"28_CR17","doi-asserted-by":"crossref","unstructured":"Wu, R., Xiao, C., Zheng, C.: DeepCAD: a deep generative network for computer-aided design models. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV), pp. 6772\u20136782 (2021)","DOI":"10.1109\/ICCV48922.2021.00670"},{"key":"28_CR18","doi-asserted-by":"publisher","unstructured":"Wu, S., Sun, F., Zhang, W., Xie, X., Cui, B.: Graph neural networks in recommender systems: a survey (2020). https:\/\/doi.org\/10.48550\/ARXIV.2011.02260","DOI":"10.48550\/ARXIV.2011.02260"},{"issue":"1","key":"28_CR19","doi-asserted-by":"publisher","first-page":"4","DOI":"10.1109\/tnnls.2020.2978386","volume":"32","author":"Z Wu","year":"2021","unstructured":"Wu, Z., Pan, S., Chen, F., Long, G., Zhang, C., Yu, P.S.: A comprehensive survey on graph neural networks. IEEE Trans. Neural Netw. Learn. Syst. 32(1), 4\u201324 (2021). https:\/\/doi.org\/10.1109\/tnnls.2020.2978386","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"issue":"4","key":"28_CR20","doi-asserted-by":"publisher","first-page":"2725","DOI":"10.1007\/s00158-021-02953-9","volume":"64","author":"S Yoo","year":"2021","unstructured":"Yoo, S., Lee, S., Kim, S., Hwang, K.H., Park, J.H., Kang, N.: Integrating deep learning into CAD\/CAE system: generative design and evaluation of 3D conceptual wheel. Struct. Multidiscip. Optim. 64(4), 2725\u20132747 (2021)","journal-title":"Struct. Multidiscip. Optim."},{"key":"28_CR21","unstructured":"Yun, S., Jeong, M., Kim, R., Kang, J., Kim, H.J.: Graph transformer networks. In: Advances in Neural Information Processing Systems, vol. 32. Curran Associates, Inc. (2019)"},{"key":"28_CR22","unstructured":"Zaheer, M., Kottur, S., Ravanbakhsh, S., Poczos, B., Salakhutdinov, R.R., Smola, A.J.: Deep sets. In: Advances in Neural Information Processing Systems, vol. 30. Curran Associates, Inc. (2017)"},{"key":"28_CR23","unstructured":"Zhang, H., Li, M., Wang, M., Zhang, Z.: Understand graph attention network, February 2022. https:\/\/www.dgl.ai\/blog\/2019\/02\/17\/gat.html. Accessed 06 Apr 2022"},{"key":"28_CR24","doi-asserted-by":"publisher","first-page":"12","DOI":"10.1016\/j.cad.2018.03.006","volume":"101","author":"Z Zhang","year":"2018","unstructured":"Zhang, Z., Jaiswal, P., Rai, R.: Featurenet: machining feature recognition based on 3d convolution neural network. Comput. Aided Des. 101, 12\u201322 (2018). https:\/\/doi.org\/10.1016\/j.cad.2018.03.006","journal-title":"Comput. Aided Des."}],"container-title":["Lecture Notes in Computer Science","Machine Learning and Knowledge Discovery in Databases"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-26387-3_28","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,3,16]],"date-time":"2023-03-16T15:08:36Z","timestamp":1678979316000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-26387-3_28"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031263866","9783031263873"],"references-count":24,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-26387-3_28","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"17 March 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ECML PKDD","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Joint European Conference on Machine Learning and Knowledge Discovery in Databases","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Grenoble","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"France","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 September 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 September 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ecml2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/2022.ecmlpkdd.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1060","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"236","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"22% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3-4","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3-4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"17 demo track papers have been accepted from 28 submissions","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}