{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T21:02:20Z","timestamp":1747688540761,"version":"3.40.3"},"publisher-location":"Cham","reference-count":10,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031268885"},{"type":"electronic","value":"9783031268892"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-26889-2_27","type":"book-chapter","created":{"date-parts":[[2023,2,28]],"date-time":"2023-02-28T16:03:03Z","timestamp":1677600183000},"page":"304-309","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation"],"prefix":"10.1007","author":[{"given":"Lim Shi","family":"Xuen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ismail","family":"Mohd Khairuddin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohd Azraai","family":"Mohd Razman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jessnor Arif","family":"Mat Jizat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Edmund","family":"Yuen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haochuan","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eng Hwa","family":"Yap","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anwar","family":"P. P. Abdul Majeed","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2023,3,1]]},"reference":[{"key":"27_CR1","doi-asserted-by":"publisher","unstructured":"Jizat, J.A.M., Abdul Majeed, A.P.P., Ahmad, A.F., Taha, Z., Yuen, E.: Evaluation of the machine learning classifier in wafer defects classification. ICT Exp. 7, 535\u2013539 (2021). https:\/\/doi.org\/10.1016\/j.icte.2021.04.007","DOI":"10.1016\/j.icte.2021.04.007"},{"key":"27_CR2","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1016\/J.COMPIND.2014.10.006","volume":"66","author":"SH Huang","year":"2015","unstructured":"Huang, S.H., Pan, Y.C.: Automated visual inspection in the semiconductor industry: a survey. Comput. Ind. 66, 1 (2015). https:\/\/doi.org\/10.1016\/J.COMPIND.2014.10.006","journal-title":"Comput. Ind."},{"key":"27_CR3","doi-asserted-by":"publisher","unstructured":"Kumar, J.L.M., et al.: The classification of EEG-based wink signals: a CWT-transfer learning pipeline. ICT Exp. 7, 421\u2013425 (2021). https:\/\/doi.org\/10.1016\/j.icte.2021.01.004","DOI":"10.1016\/j.icte.2021.01.004"},{"key":"27_CR4","doi-asserted-by":"publisher","unstructured":"Mahendra Kumar, J.L., et al.: The classification of EEG-based winking signals: a transfer learning and random forest pipeline. PeerJ. 9, e11182 (2021). https:\/\/doi.org\/10.7717\/peerj.11182","DOI":"10.7717\/peerj.11182"},{"key":"27_CR5","series-title":"Lecture Notes in Mechanical Engineering","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1007\/978-981-13-9539-0_7","volume-title":"Intelligent Manufacturing and Mechatronics","author":"MA Abdullah","year":"2020","unstructured":"Abdullah, M.A., Ibrahim, M.A.R., Shapiee, M.N.A.B., Mohd Razman, M.A., Musa, R.M., Abdul Majeed, A.P.P.: The classification of skateboarding trick manoeuvres through the integration of IMU and machine learning. In: Jamaludin, Z., Ali Mokhtar, M.N. (eds.) SympoSIMM 2019. LNME, pp. 67\u201374. Springer, Singapore (2020). https:\/\/doi.org\/10.1007\/978-981-13-9539-0_7"},{"key":"27_CR6","doi-asserted-by":"crossref","unstructured":"Rangasamy, K., As\u2019ari, M.A., Rahmad, N.A., Ghazali, N.F.: Hockey activity recognition using pre-trained deep learning model. ICT Exp. 6, 170\u2013174 (2020)","DOI":"10.1016\/j.icte.2020.04.013"},{"key":"27_CR7","doi-asserted-by":"publisher","first-page":"455","DOI":"10.1109\/TSM.2019.2941752","volume":"32","author":"K Imoto","year":"2019","unstructured":"Imoto, K., Nakai, T., Ike, T., Haruki, K., Sato, Y.: A CNN-Based transfer learning method for defect classification in semiconductor manufacturing. IEEE Trans. Semicond. Manuf. 32, 455\u2013459 (2019). https:\/\/doi.org\/10.1109\/TSM.2019.2941752","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"27_CR8","doi-asserted-by":"publisher","unstructured":"Ghosh, B., Bhuyan, M.K., Sasmal, P., Iwahori, Y., Gadde, P.: Defect classification of printed circuit boards based on transfer learning. In: Proceedings of 2018 IEEE Applied Signal Processing Conference, ASPCON 2018, pp. 245\u2013248 (2018). https:\/\/doi.org\/10.1109\/ASPCON.2018.8748670","DOI":"10.1109\/ASPCON.2018.8748670"},{"key":"27_CR9","doi-asserted-by":"crossref","unstructured":"Phua, C., Theng, L.B., Member, S.: Semiconductor wafer surface\u202f: automatic defect classification with deep CNN, pp. 16\u201321 (2020)","DOI":"10.1109\/TENCON50793.2020.9293715"},{"key":"27_CR10","series-title":"Lecture Notes in Electrical Engineering","doi-asserted-by":"publisher","first-page":"219","DOI":"10.1007\/978-981-15-6025-5_20","volume-title":"Embracing Industry 4.0","author":"MNA Shapiee","year":"2020","unstructured":"Shapiee, M.N.A., Ibrahim, M.A.R., Razman, M.A.M., Abdullah, M.A., Musa, R.M., Abdul Majeed, A.P.P.: The classification of skateboarding tricks by means of the integration of transfer learning and machine learning models. In: Mohd Razman, M.A., Mat Jizat, J.A., Mat Yahya, N., Myung, H., Zainal Abidin, A.F., Abdul Karim, M.S. (eds.) Embracing Industry 4.0. LNEE, vol. 678, pp. 219\u2013226. Springer, Singapore (2020). https:\/\/doi.org\/10.1007\/978-981-15-6025-5_20"}],"container-title":["Lecture Notes in Networks and Systems","Robot Intelligence Technology and Applications 7"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-26889-2_27","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,28]],"date-time":"2023-02-28T16:05:44Z","timestamp":1677600344000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-26889-2_27"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031268885","9783031268892"],"references-count":10,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-26889-2_27","relation":{},"ISSN":["2367-3370","2367-3389"],"issn-type":[{"type":"print","value":"2367-3370"},{"type":"electronic","value":"2367-3389"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"1 March 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"RiTA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Robot Intelligence Technology and Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Daejeon","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Korea (Republic of)","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"7 December 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 December 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"rita2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/2022.icrita.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}