{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T09:02:29Z","timestamp":1765357349012,"version":"3.40.3"},"publisher-location":"Cham","reference-count":26,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031294969"},{"type":"electronic","value":"9783031294976"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-29497-6_1","type":"book-chapter","created":{"date-parts":[[2023,3,22]],"date-time":"2023-03-22T14:09:00Z","timestamp":1679494140000},"page":"3-22","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["SAMVA: Static Analysis for Multi-fault Attack Paths Determination"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4734-6466","authenticated-orcid":false,"given":"Antoine","family":"Gicquel","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Damien","family":"Hardy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2092-924X","authenticated-orcid":false,"given":"Karine","family":"Heydemann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8060-8360","authenticated-orcid":false,"given":"Erven","family":"Rohou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2023,3,23]]},"reference":[{"key":"1_CR1","doi-asserted-by":"crossref","unstructured":"Balasch, J., Gierlichs, B., Verbauwhede, I.: An in-depth and black-box characterization of the effects of clock glitches on 8-bit MCUs. In: FDTC. IEEE Computer Society (2011)","DOI":"10.1109\/FDTC.2011.9"},{"key":"1_CR2","doi-asserted-by":"crossref","unstructured":"Binkert, N.L., et al.: The gem5 simulator. SIGARCH Comput. Archit. News 39(2), 1\u20137 (2011)","DOI":"10.1145\/2024716.2024718"},{"key":"1_CR3","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"37","DOI":"10.1007\/3-540-69053-0_4","volume-title":"Advances in Cryptology \u2014 EUROCRYPT \u201997","author":"D Boneh","year":"1997","unstructured":"Boneh, D., DeMillo, R.A., Lipton, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37\u201351. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/3-540-69053-0_4"},{"key":"1_CR4","doi-asserted-by":"crossref","unstructured":"Br\u00e9jon, J.B., Heydemann, K., Encrenaz, E., Meunier, Q., Vu, S.T.: Fault attack vulnerability assessment of binary code. In: CS2. ACM (2019)","DOI":"10.1145\/3304080.3304083"},{"key":"1_CR5","doi-asserted-by":"crossref","unstructured":"Bukasa, S.K., Lashermes, R., Lanet, J.L., Legay, A.: Let\u2019s shock our IoT\u2019s heart: ARMv7-M under (fault) attacks. In: ARES 2018. ACM (2018)","DOI":"10.1145\/3230833.3230842"},{"key":"1_CR6","doi-asserted-by":"crossref","unstructured":"Claudepierre, L., P\u00e9neau, P.Y., Hardy, D., Rohou, E.: TRAITOR: a low-cost evaluation platform for multifault injection. In: ASSS. ACM (2021)","DOI":"10.1145\/3457340.3458303"},{"key":"1_CR7","doi-asserted-by":"publisher","unstructured":"Colombier, B., et al.: Multi-spot laser fault injection setup: new possibilities for fault injection attacks. In: Grosso, V. (eds.) Smart Card Research and Advanced Applications. CARDIS 2021. LNCS, vol. 13173. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-97348-3_9","DOI":"10.1007\/978-3-030-97348-3_9"},{"key":"1_CR8","doi-asserted-by":"crossref","unstructured":"Colombier, B., Menu, A., Dutertre, J.M., Mo\u00ebllic, P.A., Rigaud, J.B., Danger, J.L.: Laser-induced single-bit faults in flash memory: instructions corruption on a 32-bit microcontroller. In: IEEE HOST. IEEE (2019)","DOI":"10.1109\/HST.2019.8741030"},{"key":"1_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1007\/978-3-319-45477-1_1","volume-title":"Computer Safety, Reliability, and Security","author":"L Dureuil","year":"2016","unstructured":"Dureuil, L., Petiot, G., Potet, M.-L., Le, T.-H., Crohen, A., de Choudens, P.: FISSC: a fault injection and simulation secure\u00a0collection. In: Skavhaug, A., Guiochet, J., Bitsch, F. (eds.) SAFECOMP 2016. LNCS, vol. 9922, pp. 3\u201311. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-45477-1_1"},{"key":"1_CR10","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"107","DOI":"10.1007\/978-3-319-31271-2_7","volume-title":"Smart Card Research and Advanced Applications","author":"L Dureuil","year":"2016","unstructured":"Dureuil, L., Potet, M.-L., de Choudens, P., Dumas, C., Cl\u00e9di\u00e8re, J.: From code review to fault injection attacks: filling the gap using fault model inference. In: Homma, N., Medwed, M. (eds.) CARDIS 2015. LNCS, vol. 9514, pp. 107\u2013124. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-31271-2_7"},{"key":"1_CR11","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"221","DOI":"10.1007\/978-3-030-35055-0_14","volume-title":"Secure IT Systems","author":"J-M Dutertre","year":"2019","unstructured":"Dutertre, J.-M., Riom, T., Potin, O., Rigaud, J.-B.: Experimental analysis of the laser-induced instruction skip fault model. In: Askarov, A., Hansen, R.R., Rafnsson, W. (eds.) NordSec 2019. LNCS, vol. 11875, pp. 221\u2013237. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-35055-0_14"},{"key":"1_CR12","doi-asserted-by":"crossref","unstructured":"Given-Wilson, T., Heuser, A., Jafri, N., Legay, A.: An automated and scalable formal process for detecting fault injection vulnerabilities in binaries. Concurr. Comput. Pract. Exp. 31(23), e4794 (2019)","DOI":"10.1002\/cpe.4794"},{"key":"1_CR13","doi-asserted-by":"crossref","unstructured":"Heydemann, K., Lalande, J.F., Berthom\u00e9, P.: Formally verified software countermeasures for control-flow integrity of smart card C code. Comput. Secur. 85, 202\u2013224 (2019)","DOI":"10.1016\/j.cose.2019.05.004"},{"key":"1_CR14","doi-asserted-by":"crossref","unstructured":"Hoffmann, M., Schellenberg, F., Paar, C.: ARMORY: fully automated and exhaustive fault simulation on ARM-M binaries. IEEE Trans. Inf. Forensics Secur. 16, 1058\u20131073 (2021)","DOI":"10.1109\/TIFS.2020.3027143"},{"key":"1_CR15","doi-asserted-by":"crossref","unstructured":"Menu, A., Dutertre, J.M., Potin, O., Rigaud, J.B., Danger, J.L.: Experimental analysis of the electromagnetic instruction skip fault model. In: DTIS. IEEE (2020)","DOI":"10.1109\/DTIS48698.2020.9081261"},{"key":"1_CR16","doi-asserted-by":"crossref","unstructured":"Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller. In: FDTC. IEEE Computer Society (2013)","DOI":"10.1109\/FDTC.2013.9"},{"key":"1_CR17","doi-asserted-by":"crossref","unstructured":"P\u00e9neau, P.Y., Claudepierre, L., Hardy, D., Rohou, E.: NOP-oriented programming: should we care? In: SILM EuroS &P Workshops. IEEE (2020)","DOI":"10.1109\/EuroSPW51379.2020.00100"},{"key":"1_CR18","doi-asserted-by":"crossref","unstructured":"Potet, M.L., Mounier, L., Puys, M., Dureuil, L.: Lazart: A symbolic approach for evaluation the robustness of secured codes against control flow injections. In: ICST. IEEE Computer Society (2014)","DOI":"10.1109\/ICST.2014.34"},{"key":"1_CR19","doi-asserted-by":"crossref","unstructured":"Proy, J., Heydemann, K., Berzati, A., Maj\u00e9ric, F., Cohen, A.: A first ISA-level characterization of EM pulse effects on superscalar microarchitectures: a secure software perspective. In: Proceedings of the 14th International Conference on Availability, Reliability and Security, ARES. ACM (2019)","DOI":"10.1145\/3339252.3339253"},{"key":"1_CR20","doi-asserted-by":"crossref","unstructured":"Rivi\u00e8re, L., Najm, Z., Rauzy, P., Danger, J.L., Bringer, J., Sauvage, L.: High precision fault injections on the instruction cache of ARMv7-M architectures. In: HOST. IEEE Computer Society (2015)","DOI":"10.1109\/HST.2015.7140238"},{"key":"1_CR21","doi-asserted-by":"crossref","unstructured":"Shoshitaishvili, Y., et al.: SOK: (state of) the art of war: offensive techniques in binary analysis. In: IEEE Symposium on Security and Privacy, SP. IEEE Computer Society (2016)","DOI":"10.1109\/SP.2016.17"},{"key":"1_CR22","doi-asserted-by":"crossref","unstructured":"Werner, V., Maingault, L., Potet, M.L.: An end-to-end approach for multi-fault attack vulnerability assessment. In: FDTC 2020. IEEE (2020)","DOI":"10.1109\/FDTC51366.2020.00009"},{"key":"1_CR23","unstructured":"Witteman, M., Oostdijk, M.: Secure application programming in the presence of side channel attacks (2008). https:\/\/www.riscure.com\/publication\/secure-application-programming-presence-side-channel-attacks\/"},{"key":"1_CR24","doi-asserted-by":"crossref","unstructured":"Yen, J.Y.: Finding the k shortest loopless paths in a network. Manage. Sci. 17(11), 712\u2013716 (1971)","DOI":"10.1287\/mnsc.17.11.712"},{"key":"1_CR25","doi-asserted-by":"crossref","unstructured":"Yuce, B., Ghalaty, N.F., Santapuri, H., Deshpande, C., Patrick, C., Schaumont, P.: Software fault resistance is futile: Effective single-glitch attacks. In: FDTC. IEEE Computer Society (2016)","DOI":"10.1109\/FDTC.2016.21"},{"key":"1_CR26","doi-asserted-by":"crossref","unstructured":"Yuce, B., Schaumont, P., Witteman, M.: Fault attacks on secure embedded software: threats, design, and evaluation. J. Hardw. Syst. Secur. 2(2), 111\u2013130 (2018)","DOI":"10.1007\/s41635-018-0038-1"}],"container-title":["Lecture Notes in Computer Science","Constructive Side-Channel Analysis and Secure Design"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-29497-6_1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,3,22]],"date-time":"2023-03-22T14:09:27Z","timestamp":1679494167000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-29497-6_1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031294969","9783031294976"],"references-count":26,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-29497-6_1","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"23 March 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"COSADE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Workshop on Constructive Side-Channel Analysis and Secure Design","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Munich","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Germany","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"3 April 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4 April 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cosade2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/www.cosade.org\/cosade23\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easy Chair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"28","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"12","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"43% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.5","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}