{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T14:48:19Z","timestamp":1742914099200,"version":"3.40.3"},"publisher-location":"Cham","reference-count":15,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031366246"},{"type":"electronic","value":"9783031366253"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-36625-3_20","type":"book-chapter","created":{"date-parts":[[2023,7,7]],"date-time":"2023-07-07T12:02:36Z","timestamp":1688731356000},"page":"246-259","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Fabric Defect Detection Model Based on Feature Extraction of Weak Sample Scene"],"prefix":"10.1007","author":[{"given":"Maosen","family":"Wang","sequence":"first","affiliation":[]},{"given":"Mengtian","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Jun","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Shaozhang","family":"Niu","sequence":"additional","affiliation":[]},{"given":"Wen","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Jiaqi","family":"Zhao","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,7,8]]},"reference":[{"key":"20_CR1","doi-asserted-by":"publisher","first-page":"442","DOI":"10.1016\/j.imavis.2011.02.002","volume":"29","author":"HYT Ngan","year":"2011","unstructured":"Ngan, H.Y.T., Pang, G.K.H., Yung, N.H.C.: Automated fabric defect detection\u2014a review. Image Vis. Comput. 29, 442\u2013458 (2011)","journal-title":"Image Vis. Comput."},{"key":"20_CR2","doi-asserted-by":"publisher","first-page":"800","DOI":"10.1080\/00405000.2015.1131440","volume":"107","author":"J Zhou","year":"2016","unstructured":"Zhou, J., Wang, J.: Unsupervised fabric defect segmentation using local patch approximation. J. Text. Inst. 107, 800\u2013809 (2016)","journal-title":"J. Text. Inst."},{"key":"20_CR3","doi-asserted-by":"publisher","unstructured":"Kirchler, M., et al.: TransferGWAS: GWAS of images using deep transfer learning (2021). https:\/\/doi.org\/10.1101\/2021.10.22.465430","DOI":"10.1101\/2021.10.22.465430"},{"issue":"1-2","key":"20_CR4","doi-asserted-by":"publisher","first-page":"305","DOI":"10.1007\/s10710-017-9314-z","volume":"19","author":"J Heaton","year":"2017","unstructured":"Heaton, J.: Ian Goodfellow, Yoshua Bengio, and Aaron Courville: Deep learning. Genet. Program Evolvable Mach. 19(1\u20132), 305\u2013307 (2017). https:\/\/doi.org\/10.1007\/s10710-017-9314-z","journal-title":"Genet. Program Evolvable Mach."},{"key":"20_CR5","doi-asserted-by":"publisher","first-page":"1461","DOI":"10.1016\/j.cageo.2008.01.006","volume":"34","author":"CE Honeycutt","year":"2008","unstructured":"Honeycutt, C.E., Plotnick, R.: Image analysis techniques and gray-level co-occurrence matrices (GLCM) for calculating bioturbation indices and characterizing biogenic sedimentary structures. Comput. Geosci. 34, 1461\u20131472 (2008)","journal-title":"Comput. Geosci."},{"key":"20_CR6","doi-asserted-by":"publisher","first-page":"706","DOI":"10.1016\/j.patcog.2009.08.017","volume":"43","author":"Z Guo","year":"2010","unstructured":"Guo, Z., Zhang, L., Zhang, D.: Rotation invariant texture classification using LBP variance (LBPV) with global matching. Pattern Recogn. 43, 706\u2013719 (2010)","journal-title":"Pattern Recogn."},{"key":"20_CR7","doi-asserted-by":"crossref","unstructured":"Unser, M.: Sum and difference histograms for texture classification. IEEE Trans. Pattern Anal. Mach. Intel. (PAMI) 8, 118\u2013125 (1986)","DOI":"10.1109\/TPAMI.1986.4767760"},{"key":"20_CR8","doi-asserted-by":"publisher","unstructured":"Gonzalez, R.C., et al.: Digital image processing, third edition. J. Biomed. Opt. 14(2), 029901 (2009). https:\/\/doi.org\/10.1117\/1.3115362","DOI":"10.1117\/1.3115362"},{"key":"20_CR9","doi-asserted-by":"crossref","unstructured":"Liu, C., Gryllias, K.: A deep support vector data description method for anomaly detection in helicopters. In: PHM Society European Conference, p. 9 (2021)","DOI":"10.36001\/phme.2021.v6i1.2957"},{"key":"20_CR10","unstructured":"Liang, S., Li, Y., Srikant, R.: Enhancing the reliability of out-of-distribution image detection in neural networks. arXiv: Learning (2017)"},{"key":"20_CR11","doi-asserted-by":"publisher","unstructured":"Vincent, P., et al.: Extracting and composing robust features with denoising autoencoders. Presented at the (2008). https:\/\/doi.org\/10.1145\/1390156.1390294","DOI":"10.1145\/1390156.1390294"},{"key":"20_CR12","doi-asserted-by":"publisher","unstructured":"Choi, Y., et al.: StarGAN: unified generative adversarial networks for multi-domain image-to-image translation. Presented at the (2018). https:\/\/doi.org\/10.1109\/cvpr.2018.00916","DOI":"10.1109\/cvpr.2018.00916"},{"key":"20_CR13","doi-asserted-by":"publisher","unstructured":"Fujioka, T., et al.: Efficient anomaly detection with generative adversarial network for breast ultrasound imaging. Diagnostics 10( 7), 456 (2020). https:\/\/doi.org\/10.3390\/diagnostics10070456","DOI":"10.3390\/diagnostics10070456"},{"key":"20_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"475","DOI":"10.1007\/978-3-030-68799-1_35","volume-title":"Pattern Recognition. ICPR International Workshops and Challenges","author":"T Defard","year":"2021","unstructured":"Defard, T., Setkov, A., Loesch, A., Audigier, R.: PaDiM: a patch distribution modeling framework for anomaly detection and localization. In: Del Bimbo, A., et al. (eds.) ICPR 2021. LNCS, vol. 12664, pp. 475\u2013489. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-68799-1_35"},{"key":"20_CR15","doi-asserted-by":"publisher","unstructured":"Roth, K., et al.: Towards Total Recall in Industrial Anomaly Detection. Presented at the (2022). https:\/\/doi.org\/10.1109\/cvpr52688.2022.01392","DOI":"10.1109\/cvpr52688.2022.01392"}],"container-title":["Lecture Notes in Computer Science","Advances in Swarm Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-36625-3_20","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T15:29:46Z","timestamp":1710343786000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-36625-3_20"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031366246","9783031366253"],"references-count":15,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-36625-3_20","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"8 July 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICSI","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Swarm Intelligence","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Shenzhen","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14 July 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18 July 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"swarm2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"170","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"81","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"48% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.6","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}