{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T14:10:29Z","timestamp":1742911829161,"version":"3.40.3"},"publisher-location":"Cham","reference-count":14,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031409776"},{"type":"electronic","value":"9783031409783"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-40978-3_42","type":"book-chapter","created":{"date-parts":[[2023,8,23]],"date-time":"2023-08-23T05:01:33Z","timestamp":1692766893000},"page":"393-402","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Application of Mobilenetv3 for Detecting Resin Overflow Defects in Abrasive Wheel"],"prefix":"10.1007","author":[{"given":"Chuan-Yu","family":"Chang","sequence":"first","affiliation":[]},{"given":"Min-Yen","family":"Chuang","sequence":"additional","affiliation":[]},{"given":"You-Da","family":"Su","sequence":"additional","affiliation":[]},{"given":"Tzu-Hao","family":"Liu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,8,24]]},"reference":[{"key":"42_CR1","doi-asserted-by":"publisher","unstructured":"Kuo, H., Xu, J., Yu, C., Yan, J.: Screw defect detection system based on AI image recognition technology. In: Proceedings of the International Symposium on Computer, Consumer and Control (IS3C), 13\u201316 November 2020, pp. 493\u2013496 (2020).https:\/\/doi.org\/10.1109\/IS3C50286.2020.00134","DOI":"10.1109\/IS3C50286.2020.00134"},{"key":"42_CR2","doi-asserted-by":"crossref","unstructured":"Song, L., Li, X., Yang, Y., Zhu, X., Guo, Q., Yang, H.: Detection of micro-defects on metal screw surfaces based on deep convolutional neural networks. Sensors 18(11), 3709 (2018)","DOI":"10.3390\/s18113709"},{"key":"42_CR3","doi-asserted-by":"publisher","unstructured":"Tao, H., Jinshan, Z., Na, D., Zhihui, C., Li, D.: The defects identify algorithm and the automated detecting system for the screw thread. In: Proceedings of the International Conference on Electrical and Control Engineering, 25\u201327 June 2010, pp. 2292\u20132294 (2010).https:\/\/doi.org\/10.1109\/iCECE.2010.565","DOI":"10.1109\/iCECE.2010.565"},{"issue":"5","key":"42_CR4","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/34.765658","volume":"21","author":"A Fitzgibbon","year":"1999","unstructured":"Fitzgibbon, A., Pilu, M., Fisher, R.B.: Direct least square fitting of ellipses. IEEE Trans. Pattern Anal. Mach. Intell. 21(5), 476\u2013480 (1999). https:\/\/doi.org\/10.1109\/34.765658","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"42_CR5","doi-asserted-by":"publisher","unstructured":"Howard, A., Sandler, M., Chu, G., Chen, L. C., Chen, B., Tan, M.: Searching for MobileNetV3. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV), 27 October\u20132 November 2019, pp. 1314\u20131324 (2019) https:\/\/doi.org\/10.1109\/ICCV.2019.00140","DOI":"10.1109\/ICCV.2019.00140"},{"issue":"20","key":"42_CR6","doi-asserted-by":"publisher","first-page":"23390","DOI":"10.1109\/JSEN.2021.3106057","volume":"21","author":"M Li","year":"2021","unstructured":"Li, M., Yao, N., Liu, S., Li, S., Zhao, Y., Kong, S.G.: Multisensor image fusion for automated detection of defects in printed circuit boards. IEEE Sens. J. 21(20), 23390\u201323399 (2021)","journal-title":"IEEE Sens. J."},{"key":"42_CR7","doi-asserted-by":"crossref","unstructured":"Liao, X., Lv, S., Li, D., Luo, Y., Zhu, Z., Jiang, C.: YOLOv4-MN3 for PCB surface defect detection. Appl. Sci. 11(24), 11701 (2021)","DOI":"10.3390\/app112411701"},{"key":"42_CR8","doi-asserted-by":"crossref","unstructured":"Xia, B., Cao, J., Wang, C.: SSIM-NET: real-time PCB defect detection based on SSIM and MobileNet-V3. In: Proceedings of the 2nd World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM), pp. 756\u2013759 (2019)","DOI":"10.1109\/WCMEIM48965.2019.00159"},{"key":"42_CR9","doi-asserted-by":"crossref","unstructured":"Sandler, M., Howard, A., Zhu, M., Zhmoginov, A., Chen, L.-C.:MobileNetV2: inverted residuals and linear bottlenecks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4510\u20134520 (2018)","DOI":"10.1109\/CVPR.2018.00474"},{"key":"42_CR10","doi-asserted-by":"publisher","unstructured":"Hu, J., Shen, L., Sun, G.: Squeeze-and-excitation networks. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 7132\u20137141 (2018). https:\/\/doi.org\/10.1109\/CVPR.2018.00745","DOI":"10.1109\/CVPR.2018.00745"},{"key":"42_CR11","doi-asserted-by":"crossref","unstructured":"Han, K., Wang, Y., Tian, Q., Guo, J., Xu, C., Xu, C.: GhostNet: more features from cheap operations. arXiv preprint arXiv:1911.11907 (2019)","DOI":"10.1109\/CVPR42600.2020.00165"},{"issue":"1","key":"42_CR12","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1109\/TSMC.1979.4310076","volume":"9","author":"N Otsu","year":"1979","unstructured":"Otsu, N.: A threshold selection method from gray-level histograms. IEEE Trans. Syst. Man Cybern. 9(1), 62\u201366 (1979). https:\/\/doi.org\/10.1109\/TSMC.1979.4310076","journal-title":"IEEE Trans. Syst. Man Cybern."},{"key":"42_CR13","doi-asserted-by":"publisher","first-page":"32","DOI":"10.1016\/0734-189X(85)90016-7","volume":"30","author":"S Suzuki","year":"1985","unstructured":"Suzuki, S., Abe, K.: Topological structural analysis of digitized binary images by border following. Comput. Vis. Graph. Image Process. 30, 32\u201346 (1985)","journal-title":"Comput. Vis. Graph. Image Process."},{"key":"42_CR14","doi-asserted-by":"publisher","unstructured":"Wang, Q., Wu, B., Zhu, P., Li, P., Zuo, W., Hu, Q.: ECA-Net: efficient channel attention for deep convolutional neural networks. In:Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 13\u201319 June 2020, pp. 11531\u201311539 (2020)https:\/\/doi.org\/10.1109\/CVPR42600.2020.01155","DOI":"10.1109\/CVPR42600.2020.01155"}],"container-title":["Lecture Notes on Data Engineering and Communications Technologies","Advances in Networked-based Information Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-40978-3_42","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,23]],"date-time":"2023-08-23T05:06:05Z","timestamp":1692767165000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-40978-3_42"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031409776","9783031409783"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-40978-3_42","relation":{},"ISSN":["2367-4512","2367-4520"],"issn-type":[{"type":"print","value":"2367-4512"},{"type":"electronic","value":"2367-4520"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"24 August 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"NBiS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Network-Based Information Systems","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Chiang Mai University","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Thailand","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 September 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 September 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"nbis2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/voyager.ce.fit.ac.jp\/conf\/nbis\/2023\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}