{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T20:15:19Z","timestamp":1784837719322,"version":"3.55.0"},"publisher-location":"Cham","reference-count":39,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031471148","type":"print"},{"value":"9783031471155","type":"electronic"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-47115-5_16","type":"book-chapter","created":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T15:04:38Z","timestamp":1698678278000},"page":"282-300","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["A Formalization of\u00a0Heisenbugs and\u00a0Their Causes"],"prefix":"10.1007","author":[{"given":"Sarah","family":"Sallinger","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Georg","family":"Weissenbacher","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Florian","family":"Zuleger","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2023,10,31]]},"reference":[{"key":"16_CR1","unstructured":"Abadi, M., Lamport, L.: The existence of refinement mappings. In: LICS (1988)"},{"key":"16_CR2","doi-asserted-by":"crossref","unstructured":"Baier, C., et al.: From verification to causality-based explications. In: ICALP (2021)","DOI":"10.1007\/978-3-030-81685-8_42"},{"key":"16_CR3","doi-asserted-by":"crossref","unstructured":"Barthe, G., Crespo, J.M., Kunz, C.: Relational verification using product programs. In: FM (2011)","DOI":"10.1007\/978-3-642-21437-0_17"},{"key":"16_CR4","doi-asserted-by":"crossref","unstructured":"Beer, I., Ben-David, S., Chockler, H., Orni, A., Trefler, R.: Explaining counterexamples using causality. In: CAV (2009)","DOI":"10.1007\/978-3-642-02658-4_11"},{"key":"16_CR5","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"359","DOI":"10.1007\/3-540-45657-0_29","volume-title":"Computer Aided Verification","author":"A Climatti","year":"2002","unstructured":"Climatti, A., et al.: NuSMV 2: an opensource tool for symbolic model checking. In: Brinksma, E., Larsen, K.G. (eds.) CAV 2002. LNCS, vol. 2404, pp. 359\u2013364. Springer, Heidelberg (2002). https:\/\/doi.org\/10.1007\/3-540-45657-0_29"},{"key":"16_CR6","unstructured":"Cimatti, A., Pecheur, C., Cavada, R.: Formal verification of diagnosability via symbolic model checking. In: IJCAI (2003)"},{"key":"16_CR7","doi-asserted-by":"crossref","unstructured":"Clarkson, M.R., Schneider, F.B.: Hyperproperties. J. Comput. Secur. 18(6), 1157\u20131210 (2010)","DOI":"10.3233\/JCS-2009-0393"},{"key":"16_CR8","doi-asserted-by":"crossref","unstructured":"Coenen, N., et al.: Explaining hyperproperty violations. In: CAV (2022)","DOI":"10.1007\/978-3-031-13185-1_20"},{"key":"16_CR9","doi-asserted-by":"crossref","unstructured":"Cotroneo, D., Grottke, M., Natella, R., Pietrantuono, R., Trivedi, K.S.: Fault triggers in open-source software: an experience report. In: ISSRE (2013)","DOI":"10.1109\/ISSRE.2013.6698917"},{"key":"16_CR10","doi-asserted-by":"crossref","unstructured":"Dubslaff, C., Weis, K., Baier, C., Apel, S.: Causality in configurable software systems. In: ICSE (2022)","DOI":"10.1145\/3510003.3510200"},{"key":"16_CR11","doi-asserted-by":"crossref","unstructured":"Eck, M., Palomba, F., Castelluccio, M., Bacchelli, A.: Understanding flaky tests: the developer\u2019s perspective. In: ESEC\/FSE (2019)","DOI":"10.1145\/3338906.3338945"},{"key":"16_CR12","doi-asserted-by":"crossref","unstructured":"Eiter, T., Lukasiewicz, T.: Complexity results for structure-based causality. Artif. Intell. 142(1), 53\u201389 (2002)","DOI":"10.1016\/S0004-3702(02)00271-0"},{"key":"16_CR13","doi-asserted-by":"crossref","unstructured":"Finkbeiner, B., Rabe, M.N., S\u00e1nchez, C.: Algorithms for model checking HyperLTL and HyperCTL$$^*$$. In: CAV (2015)","DOI":"10.1007\/978-3-319-21690-4_3"},{"key":"16_CR14","doi-asserted-by":"crossref","unstructured":"Galles, D., Pearl, J.: Axioms of causal relevance. Artif. Intell. 97(1\u20132), 9\u201343 (1997)","DOI":"10.1016\/S0004-3702(97)00047-7"},{"key":"16_CR15","unstructured":"Goodfellow, I.J., Bengio, Y., Courville, A.C.: Deep Learning. Adaptive Computation and Machine Learning. MIT Press (2016)"},{"key":"16_CR16","doi-asserted-by":"crossref","unstructured":"G\u00f6ssler, G., Stefani, J.B.: Causality analysis and fault ascription in component-based systems. Theor. Comput. Sci. 837, 158\u2013180 (2020)","DOI":"10.1016\/j.tcs.2020.06.010"},{"key":"16_CR17","unstructured":"Gray, J.: Why do computers stop and what can be done about it? Tech. Rep. 85.7, PN87614, Tandem Computers (1986)"},{"key":"16_CR18","unstructured":"Grottke, M., Trivedi, K.S.: A classification of software faults. In: ISSRE (2005)"},{"key":"16_CR19","doi-asserted-by":"crossref","unstructured":"Halpern, J.Y.: A modification of the halpern-pearl definition of causality. In: IJCAI (2015)","DOI":"10.7551\/mitpress\/9780262035026.003.0002"},{"key":"16_CR20","doi-asserted-by":"crossref","unstructured":"Halpern, J.Y., Pearl, J.: Causes and explanations: a structural-model approach: part 1: causes. British J. Philos. Sci. 56 (2005)","DOI":"10.1093\/bjps\/axi147"},{"key":"16_CR21","doi-asserted-by":"crossref","unstructured":"Lahiri, S.K., McMillan, K.L., Sharma, R., Hawblitzel, C.: Differential assertion checking. In: ESEC\/FSE (2013)","DOI":"10.1145\/2491411.2491452"},{"key":"16_CR22","doi-asserted-by":"crossref","unstructured":"Lam, W., Godefroid, P., Nath, S., Santhiar, A., Thummalapenta, S.: Root causing flaky tests in a large-scale industrial setting. In: ISSTA (2019)","DOI":"10.1145\/3293882.3330570"},{"key":"16_CR23","doi-asserted-by":"crossref","unstructured":"Leitner-Fischer, F., Leue, S.: Causality checking for complex system models. In: VMCAI (2013)","DOI":"10.1007\/978-3-642-35873-9_16"},{"key":"16_CR24","doi-asserted-by":"crossref","unstructured":"Leveson, N., Turner, C.: An investigation of the Therac-25 accidents. IEEE Comput. 26(7), 18\u201341 (1993)","DOI":"10.1109\/MC.1993.274940"},{"key":"16_CR25","doi-asserted-by":"crossref","unstructured":"Lewis, D.: Causation. J. Philos. 70(17), 556\u2013567 (1974)","DOI":"10.2307\/2025310"},{"key":"16_CR26","unstructured":"Lewis, D.: Counterfactuals. Wiley-Blackwell (2001)"},{"key":"16_CR27","doi-asserted-by":"crossref","unstructured":"Lu, S., Tucek, J., Qin, F., Zhou, Y.: AVIO: detecting atomicity violations via access-interleaving invariants. IEEE Micro 27(1), 26\u201335 (2007)","DOI":"10.1109\/MM.2007.5"},{"key":"16_CR28","doi-asserted-by":"crossref","unstructured":"Monniaux, D.: The pitfalls of verifying floating-point computations. TOPLAS 30(3), 1\u201341 (2008)","DOI":"10.1145\/1353445.1353446"},{"key":"16_CR29","doi-asserted-by":"crossref","unstructured":"Moran, J., Augusto Alonso, C., Bertolino, A., de la Riva, C., Tuya, J.: FlakyLoc: flakiness localization for reliable test suites in web applications. J. Web. Eng. 19(2), 267\u2013296 (2020)","DOI":"10.13052\/jwe1540-9589.1927"},{"key":"16_CR30","unstructured":"Musuvathi, M., Qadeer, S., Ball, T., Basler, G., Nainar, P.A., Neamtiu, I.: Finding and reproducing heisenbugs in concurrent programs. In: OSDI (2008)"},{"key":"16_CR31","doi-asserted-by":"crossref","unstructured":"Parry, O., Kapfhammer, G.M., Hilton, M., McMinn, P.: A survey of flaky tests. TOSEM 31(1), 1\u201374 (2021)","DOI":"10.1145\/3476105"},{"key":"16_CR32","doi-asserted-by":"crossref","unstructured":"Qadeer, S., Wu, D.: KISS: keep it simple and sequential. In: PLDI (2004)","DOI":"10.1145\/996841.996845"},{"key":"16_CR33","doi-asserted-by":"crossref","unstructured":"Ratliff, Z.B., Kuhn, D.R., Kacker, R.N., Lei, Y., Trivedi, K.S.: The relationship between software bug type and number of factors involved in failures. In: ISSRE Wksp (2016)","DOI":"10.1109\/ISSREW.2016.26"},{"key":"16_CR34","unstructured":"Senftleben, M.: Operational Characterization of Weak Memory Consistency Models. Master\u2019s thesis, University of Kaiserslautern (2013)"},{"key":"16_CR35","unstructured":"Sommerville, I.: Software Engineering, 9 edn. Addison-Wesley (2010)"},{"key":"16_CR36","doi-asserted-by":"crossref","unstructured":"Terragni, V., Salza, P., Ferrucci, F.: A container-based infrastructure for fuzzy-driven root causing of flaky tests. In: ICSE (2020)","DOI":"10.1145\/3377816.3381742"},{"key":"16_CR37","unstructured":"Thomas, M.: The story of the therac-25 in lotos. High Integr. Syst. J. 1(1), 3\u201315 (1994)"},{"key":"16_CR38","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"127","DOI":"10.1007\/3-540-61042-1_42","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"J Tretmans","year":"1996","unstructured":"Tretmans, J.: Test generation with inputs, outputs, and quiescence. In: Margaria, T., Steffen, B. (eds.) TACAS 1996. LNCS, vol. 1055, pp. 127\u2013146. Springer, Heidelberg (1996). https:\/\/doi.org\/10.1007\/3-540-61042-1_42"},{"key":"16_CR39","doi-asserted-by":"crossref","unstructured":"Ziftci, C., Cavalcanti, D.: De-Flake your tests : automatically locating root causes of flaky tests in code at google. In: ICSME (2020)","DOI":"10.1109\/ICSME46990.2020.00083"}],"container-title":["Lecture Notes in Computer Science","Software Engineering and Formal Methods"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-47115-5_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,4]],"date-time":"2023-11-04T00:03:44Z","timestamp":1699056224000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-47115-5_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031471148","9783031471155"],"references-count":39,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-47115-5_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"31 October 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"SEFM","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Software Engineering and Formal Methods","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Eindhoven","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"The Netherlands","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 November 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10 November 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"sefm2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/sefm-conference.github.io\/2023\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"41","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"19","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"46% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4,5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}