{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T14:18:05Z","timestamp":1742912285342,"version":"3.40.3"},"publisher-location":"Cham","reference-count":61,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031471148"},{"type":"electronic","value":"9783031471155"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-3-031-47115-5_18","type":"book-chapter","created":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T15:04:38Z","timestamp":1698678278000},"page":"320-339","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["QNNRepair: Quantized Neural Network Repair"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2612-6296","authenticated-orcid":false,"given":"Xidan","family":"Song","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1893-6259","authenticated-orcid":false,"given":"Youcheng","family":"Sun","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8772-8023","authenticated-orcid":false,"given":"Mustafa A.","family":"Mustafa","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6235-4272","authenticated-orcid":false,"given":"Lucas C.","family":"Cordeiro","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,10,31]]},"reference":[{"key":"18_CR1","unstructured":"TensorFlow Lite. https:\/\/www.tensorflow.org\/lite"},{"key":"18_CR2","doi-asserted-by":"crossref","unstructured":"Abreu, R., Zoeteweij, P., Van Gemund, A.J.: On the accuracy of spectrum-based fault localization. In: Testing: Academic and industrial conference practice and research techniques-MUTATION (TAICPART-MUTATION 2007). IEEE (2007)","DOI":"10.1109\/TAIC.PART.2007.13"},{"issue":"5","key":"18_CR3","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/2659118.2659125","volume":"39","author":"P Agarwal","year":"2014","unstructured":"Agarwal, P., Agrawal, A.P.: Fault-localization techniques for software systems: a literature review. ACM SIGSOFT Softw. Eng. Notes 39(5), 1\u20138 (2014)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"18_CR4","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"203","DOI":"10.1007\/978-3-030-72013-1_11","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"G Amir","year":"2021","unstructured":"Amir, G., Wu, H., Barrett, C., Katz, G.: An SMT-based approach for verifying binarized neural networks. In: TACAS 2021. LNCS, vol. 12652, pp. 203\u2013222. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-72013-1_11"},{"key":"18_CR5","unstructured":"Bak, S., Liu, C., Johnson, T.: The second international verification of neural networks competition (vnn-comp 2021): Summary and results. arXiv preprint arXiv:2109.00498 (2021)"},{"issue":"12","key":"18_CR6","doi-asserted-by":"publisher","first-page":"6022","DOI":"10.1109\/TIP.2019.2924172","volume":"28","author":"TS Borkar","year":"2019","unstructured":"Borkar, T.S., Karam, L.J.: Deepcorrect: correcting dnn models against image distortions. IEEE Trans. Image Process. 28(12), 6022\u20136034 (2019)","journal-title":"IEEE Trans. Image Process."},{"key":"18_CR7","unstructured":"Bressert, E.: Scipy and numpy: an overview for developers (2012)"},{"key":"18_CR8","unstructured":"Choi, J., Wang, Z., Venkataramani, S., Chuang, P.I.J., Srinivasan, V., Gopalakrishnan, K.: Pact: parameterized clipping activation for quantized neural networks. arXiv preprint arXiv:1805.06085 (2018)"},{"key":"18_CR9","doi-asserted-by":"crossref","unstructured":"Dallmeier, V., Lindig, C., Zeller, A.: Lightweight bug localization with ample. In: Proceedings of the Sixth International Symposium on Automated Analysis-Driven Debugging, pp. 99\u2013104 (2005)","DOI":"10.1145\/1085130.1085143"},{"key":"18_CR10","unstructured":"David, R., Duke, et al.: Tensorflow lite micro: Embedded machine learning for tinyml systems. Proc. Mach. Learn. Syst. (2021)"},{"key":"18_CR11","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1007\/978-3-540-78800-3_24","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"L de Moura","year":"2008","unstructured":"de Moura, L., Bj\u00f8rner, N.: Z3: an efficient SMT solver. In: Ramakrishnan, C.R., Rehof, J. (eds.) TACAS 2008. LNCS, vol. 4963, pp. 337\u2013340. Springer, Heidelberg (2008). https:\/\/doi.org\/10.1007\/978-3-540-78800-3_24"},{"key":"18_CR12","doi-asserted-by":"crossref","unstructured":"Deng, J., Dong, W., Socher, R., Li, L.J., Li, K., Fei-Fei, L.: Imagenet: a large-scale hierarchical image database. In: 2009 IEEE Conference on computer vision and Pattern Recognition, pp. 248\u2013255. IEEE (2009)","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"18_CR13","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"502","DOI":"10.1007\/978-3-540-24605-3_37","volume-title":"Theory and Applications of Satisfiability Testing","author":"N E\u00e9n","year":"2004","unstructured":"E\u00e9n, N., S\u00f6rensson, N.: An extensible SAT-solver. In: Giunchiglia, E., Tacchella, A. (eds.) SAT 2003. LNCS, vol. 2919, pp. 502\u2013518. Springer, Heidelberg (2004). https:\/\/doi.org\/10.1007\/978-3-540-24605-3_37"},{"key":"18_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"269","DOI":"10.1007\/978-3-319-68167-2_19","volume-title":"Automated Technology for Verification and Analysis","author":"R Ehlers","year":"2017","unstructured":"Ehlers, R.: Formal verification of piece-wise linear feed-forward neural networks. In: D\u2019Souza, D., Narayan Kumar, K. (eds.) ATVA 2017. LNCS, vol. 10482, pp. 269\u2013286. Springer, Cham (2017). https:\/\/doi.org\/10.1007\/978-3-319-68167-2_19"},{"key":"18_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1007\/978-3-030-53288-8_3","volume-title":"Computer Aided Verification","author":"YY Elboher","year":"2020","unstructured":"Elboher, Y.Y., Gottschlich, J., Katz, G.: An abstraction-based framework for neural network verification. In: Lahiri, S.K., Wang, C. (eds.) CAV 2020. LNCS, vol. 12224, pp. 43\u201365. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-53288-8_3"},{"key":"18_CR16","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"171","DOI":"10.1007\/978-3-030-16722-6_10","volume-title":"Fundamental Approaches to Software Engineering","author":"HF Eniser","year":"2019","unstructured":"Eniser, H.F., Gerasimou, S., Sen, A.: DeepFault: fault localization for deep neural networks. In: H\u00e4hnle, R., van der Aalst, W. (eds.) FASE 2019. LNCS, vol. 11424, pp. 171\u2013191. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-16722-6_10"},{"issue":"2","key":"18_CR17","doi-asserted-by":"publisher","first-page":"441","DOI":"10.1109\/61.997915","volume":"17","author":"Z Galijasevic","year":"2002","unstructured":"Galijasevic, Z., Abur, A.: Fault location using voltage measurements. IEEE Trans. Power Delivery 17(2), 441\u2013445 (2002)","journal-title":"IEEE Trans. Power Delivery"},{"key":"18_CR18","doi-asserted-by":"crossref","unstructured":"Gehr, T., Mirman, M., Drachsler-Cohen, D., Others: Ai2: safety and robustness certification of neural networks with abstract interpretation. In: 2018 IEEE Symposium on Security and Privacy (SP), pp. 3\u201318. IEEE (2018)","DOI":"10.1109\/SP.2018.00058"},{"key":"18_CR19","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"79","DOI":"10.1007\/978-3-030-45237-7_5","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"M Giacobbe","year":"2020","unstructured":"Giacobbe, M., Henzinger, T.A., Lechner, M.: How many bits does it take to quantize your neural network? In: TACAS 2020. LNCS, vol. 12079, pp. 79\u201397. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-45237-7_5"},{"key":"18_CR20","unstructured":"Goldberger, B., et al.: Minimal modifications of deep neural networks using verification. In: LPAR, p. 23rd (2020)"},{"key":"18_CR21","doi-asserted-by":"crossref","unstructured":"Gong, R., et al.: Differentiable soft quantization: bridging full-precision and low-bit neural networks. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision. pp. 4852\u20134861 (2019)","DOI":"10.1109\/ICCV.2019.00495"},{"key":"18_CR22","unstructured":"Guo, C., et al.: Squant: on-the-fly data-free quantization via diagonal hessian approximation. arXiv preprint arXiv:2202.07471 (2022)"},{"key":"18_CR23","unstructured":"Guo, Y.: A survey on methods and theories of quantized neural networks. arXiv preprint arXiv:1808.04752 (2018)"},{"key":"18_CR24","doi-asserted-by":"crossref","unstructured":"He, K., et al.: Deep residual learning for image recognition. Proceedings of the IEEE conference on computer vision and pattern recognition pp. 770\u2013778 (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"18_CR25","doi-asserted-by":"crossref","unstructured":"Henzinger, T.A., Lechner, M., et al.: Scalable verification of quantized neural networks. In: Proceedings of the AAAI Conference on Artificial Intelligence (2021)","DOI":"10.1609\/aaai.v35i5.16496"},{"key":"18_CR26","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1007\/978-3-319-63387-9_1","volume-title":"Computer Aided Verification","author":"X Huang","year":"2017","unstructured":"Huang, X., Kwiatkowska, M., Wang, S., Wu, M.: Safety Verification of Deep Neural Networks. In: Majumdar, R., Kun\u010dak, V. (eds.) CAV 2017. LNCS, vol. 10426, pp. 3\u201329. Springer, Cham (2017). https:\/\/doi.org\/10.1007\/978-3-319-63387-9_1"},{"key":"18_CR27","unstructured":"ifigotin: Imagenetmini-1000. https:\/\/www.kaggle.com\/datasets\/ifigotin\/imagenetmini-1000 (2021), (Accessed 4 April 2023)"},{"key":"18_CR28","doi-asserted-by":"crossref","unstructured":"Jacob, B., et al.: Quantization and training of neural networks for efficient integer-arithmetic-only inference. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2704\u20132713 (2018)","DOI":"10.1109\/CVPR.2018.00286"},{"key":"18_CR29","doi-asserted-by":"crossref","unstructured":"Jones, J.A., Harrold, M.J.: Empirical evaluation of the tarantula automatic fault-localization technique. In: Proceedings of the 20th IEEE\/ACM International Conference on Automated Software Engineering, pp. 273\u2013282 (2005)","DOI":"10.1145\/1101908.1101949"},{"key":"18_CR30","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"97","DOI":"10.1007\/978-3-319-63387-9_5","volume-title":"Computer Aided Verification","author":"G Katz","year":"2017","unstructured":"Katz, G., Barrett, C., Dill, D.L., Julian, K., Kochenderfer, M.J.: Reluplex: an efficient SMT Solver for verifying deep neural networks. In: Majumdar, R., Kun\u010dak, V. (eds.) CAV 2017. LNCS, vol. 10426, pp. 97\u2013117. Springer, Cham (2017). https:\/\/doi.org\/10.1007\/978-3-319-63387-9_5"},{"key":"18_CR31","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"443","DOI":"10.1007\/978-3-030-25540-4_26","volume-title":"Computer Aided Verification","author":"G Katz","year":"2019","unstructured":"Katz, G., et al.: The marabou framework for verification and analysis of deep neural networks. In: Dillig, I., Tasiran, S. (eds.) CAV 2019. LNCS, vol. 11561, pp. 443\u2013452. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-25540-4_26"},{"key":"18_CR32","unstructured":"Krizhevsky, A., Hinton, G.: CIFAR-10 (canadian institute for advanced research). Tech. rep., University of Toronto (2009). https:\/\/www.cs.toronto.edu\/kriz\/cifar.html"},{"key":"18_CR33","doi-asserted-by":"publisher","first-page":"105","DOI":"10.1007\/978-3-540-68279-0_5","volume-title":"50 Years of Integer Programming 1958-2008","author":"AH Land","year":"2010","unstructured":"Land, A.H., Doig, A.G.: An automatic method for solving discrete programming problems. In: J\u00fcnger, M., et al. (eds.) 50 Years of Integer Programming 1958-2008, pp. 105\u2013132. Springer, Heidelberg (2010). https:\/\/doi.org\/10.1007\/978-3-540-68279-0_5"},{"key":"18_CR34","unstructured":"Li, Y., et al.: Brecq: pushing the limit of post-training quantization by block reconstruction. arXiv preprint arXiv:2102.05426 (2021)"},{"key":"18_CR35","unstructured":"Makhorin, A.: Glpk (gnu linear programming kit). http:\/\/www.gnu.org\/s\/glpk\/glpk.html (2008)"},{"key":"18_CR36","unstructured":"Meindl, B., Templ, M.: Analysis of commercial and free and open source solvers for linear optimization problems. Eurostat and Statistics Netherlands within the project ESSnet on common tools and harmonised methodology for SDC in the ESS 20 (2012)"},{"issue":"3","key":"18_CR37","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/2000791.2000795","volume":"20","author":"L Naish","year":"2011","unstructured":"Naish, L., Lee, H.J., Ramamohanarao, K.: A model for spectra-based software diagnosis. ACM Trans. Softw. Eng. Methodol. (TOSEM) 20(3), 1\u201332 (2011)","journal-title":"ACM Trans. Softw. Eng. Methodol. (TOSEM)"},{"key":"18_CR38","doi-asserted-by":"crossref","unstructured":"Nemhauser, G.L., Wolsey, L.A.: Integer and combinatorial optimization john, vol. 118. Wiley & Sons, New York (1988)","DOI":"10.1002\/9781118627372"},{"key":"18_CR39","doi-asserted-by":"publisher","unstructured":"Nickel, S., Steinhardt, C., Schlenker, H., Burkart, W.: Ibm ilog cplex optimization studio-a primer. In: Decision Optimization with IBM ILOG CPLEX Optimization Studio: A Hands-On Introduction to Modeling with the Optimization Programming Language (OPL), pp. 9\u201321. Springer (2022). https:\/\/doi.org\/10.1007\/978-3-662-65481-1_2","DOI":"10.1007\/978-3-662-65481-1_2"},{"key":"18_CR40","unstructured":"Odena, A., Olsson, C., Andersen, D., Goodfellow, I.: Tensorfuzz: Debugging neural networks with coverage-guided fuzzing. In: ICML, pp. 4901\u20134911. PMLR (2019)"},{"key":"18_CR41","unstructured":"Optimization, G.: Inc. gurobi optimizer reference manual, version 5.0 (2012)"},{"key":"18_CR42","doi-asserted-by":"crossref","unstructured":"Pei, K., Cao, Y., Yang, J., Jana, S.: Deepxplore: automated whitebox testing of deep learning systems. In: Proceedings of the 26th Symposium on Operating Systems Principles, pp. 1\u201318 (2017)","DOI":"10.1145\/3132747.3132785"},{"key":"18_CR43","doi-asserted-by":"crossref","unstructured":"Sandler, M., et al.: Mobilenetv 2: inverted residuals and linear bottlenecks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (2018)","DOI":"10.1109\/CVPR.2018.00474"},{"key":"18_CR44","unstructured":"Sena, L.H., Song, X., da S. Alves, E.H., Bessa, I., Manino, E., Cordeiro, L.C.: Verifying quantized neural networks using smt-based model checking. CoRR abs\/ arXiv: 2106.05997 (2021)"},{"issue":"1","key":"18_CR45","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1186\/s40537-019-0197-0","volume":"6","author":"C Shorten","year":"2019","unstructured":"Shorten, C., Khoshgoftaar, T.M.: A survey on image data augmentation for deep learning. J. Big Data 6(1), 1\u201348 (2019)","journal-title":"J. Big Data"},{"key":"18_CR46","unstructured":"Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. arXiv preprint arXiv:1409.1556 (2014)"},{"key":"18_CR47","unstructured":"Song, C., Fallon, E., Li, H.: Improving adversarial robustness in weight-quantized neural networks. arXiv preprint arXiv:2012.14965 (2020)"},{"key":"18_CR48","unstructured":"Song, X., et al.: Qnnverifier: a tool for verifying neural networks using smt-based model checking. CoRR abs\/ arXiv: 2111.13110 (2021)"},{"key":"18_CR49","doi-asserted-by":"crossref","unstructured":"Song, X., Sun, Y., Mustafa, M.A., Cordeiro, L.: Airepair: a repair platform for neural networks. In: ICSE-Companion. IEEE\/ACM (2022)","DOI":"10.1109\/ICSE-Companion58688.2023.00033"},{"key":"18_CR50","doi-asserted-by":"crossref","unstructured":"Sotoudeh, M., Thakur, A.V.: Provable repair of deep neural networks. In: PLDI (2021)","DOI":"10.1145\/3453483.3454064"},{"key":"18_CR51","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"391","DOI":"10.1007\/978-3-030-58604-1_24","volume-title":"Computer Vision \u2013 ECCV 2020","author":"Y Sun","year":"2020","unstructured":"Sun, Y., Chockler, H., Huang, X., Kroening, D.: Explaining image classifiers using statistical fault localization. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12373, pp. 391\u2013406. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58604-1_24"},{"issue":"5s","key":"18_CR52","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3358233","volume":"18","author":"Y Sun","year":"2019","unstructured":"Sun, Y., Huang, X., Kroening, D., Sharp, J., Hill, M., Ashmore, R.: Structural test coverage criteria for deep neural networks. ACM Trans. Embedded Comput. Syst. (TECS) 18(5s), 1\u201323 (2019)","journal-title":"ACM Trans. Embedded Comput. Syst. (TECS)"},{"key":"18_CR53","doi-asserted-by":"crossref","unstructured":"Sun, Y., Wu, M., Ruan, W., Huang, X., Kwiatkowska, M., Kroening, D.: Concolic testing for deep neural networks. In: Proceedings of the 33rd ACM\/IEEE International Conference on Automated Software Engineering, pp. 109\u2013119 (2018)","DOI":"10.1145\/3238147.3238172"},{"key":"18_CR54","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1007\/978-3-030-81685-8_1","volume-title":"Computer Aided Verification","author":"M Usman","year":"2021","unstructured":"Usman, M., Gopinath, D., Sun, Y., Noller, Y., P\u0103s\u0103reanu, C.S.: NNrepair: constraint-based repair of\u00a0neural network classifiers. In: Silva, A., Leino, K.R.M. (eds.) CAV 2021. LNCS, vol. 12759, pp. 3\u201325. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-81685-8_1"},{"key":"18_CR55","unstructured":"Vanholder, H.: Efficient inference with tensorrt. In: GPU Technology Conference, vol. 1, p. 2 (2016)"},{"key":"18_CR56","unstructured":"Wang, S., Zhang, H., Xu, K., Others: Beta-crown: efficient bound propagation with per-neuron split constraints for neural network robustness verification. In: Advances in Neural Information Processing Systems 34 (2021)"},{"issue":"1","key":"18_CR57","doi-asserted-by":"publisher","first-page":"290","DOI":"10.1109\/TR.2013.2285319","volume":"63","author":"WE Wong","year":"2013","unstructured":"Wong, W.E., Debroy, V., Gao, R., Li, Y.: The dstar method for effective software fault localization. IEEE Trans. Reliab. 63(1), 290\u2013308 (2013)","journal-title":"IEEE Trans. Reliab."},{"key":"18_CR58","doi-asserted-by":"crossref","unstructured":"Wong, W.E., Qi, Y., Zhao, L., Cai, K.Y.: Effective fault localization using code coverage. In: COMPSAC, vol. 1, pp. 449\u2013456. IEEE (2007)","DOI":"10.1109\/COMPSAC.2007.109"},{"key":"18_CR59","doi-asserted-by":"crossref","unstructured":"Yu, B., et al.: Deeprepair: style-guided repairing for deep neural networks in the real-world operational environment. IEEE Trans. Reliability (2021)","DOI":"10.1109\/TR.2021.3096332"},{"key":"18_CR60","doi-asserted-by":"crossref","unstructured":"Zhang, Y., et al.: Qvip: an ilp-based formal verification approach for quantized neural networks. In: ASE. IEEE\/ACM (2022)","DOI":"10.1145\/3551349.3556916"},{"key":"18_CR61","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2020.106296","volume":"123","author":"J Zhang","year":"2020","unstructured":"Zhang, J., Li, J.: Testing and verification of neural-network-based safety-critical control software: a systematic literature review. Inf. Softw. Technol. 123, 106296 (2020)","journal-title":"Inf. Softw. Technol."}],"container-title":["Lecture Notes in Computer Science","Software Engineering and Formal Methods"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-47115-5_18","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,4]],"date-time":"2023-11-04T00:04:16Z","timestamp":1699056256000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-47115-5_18"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9783031471148","9783031471155"],"references-count":61,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-47115-5_18","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"31 October 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"SEFM","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Software Engineering and Formal Methods","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Eindhoven","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"The Netherlands","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 November 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10 November 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"sefm2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/sefm-conference.github.io\/2023\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"41","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"19","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"46% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4,5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}