{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,16]],"date-time":"2026-04-16T23:21:50Z","timestamp":1776381710252,"version":"3.51.2"},"publisher-location":"Cham","reference-count":14,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031477201","type":"print"},{"value":"9783031477218","type":"electronic"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-3-031-47721-8_55","type":"book-chapter","created":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T10:02:32Z","timestamp":1704794552000},"page":"837-848","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["E-ELPV: Extended ELPV Dataset for\u00a0Accurate Solar Cells Defect Classification"],"prefix":"10.1007","author":[{"given":"Marco","family":"Grisanti","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maria Ausilia Napoli","family":"Spatafora","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Ortis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastiano","family":"Battiato","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,1,10]]},"reference":[{"key":"55_CR1","doi-asserted-by":"crossref","unstructured":"Akram, M.W., Li, G., Jin, Y., Chen, X., Zhu, C., Zhao, X., Khaliq, A., Faheem, M., Ahmad, A.: CNN based automatic detection of photovoltaic cell defects in electroluminescence images. Energy 189, 116319 (2019)","DOI":"10.1016\/j.energy.2019.116319"},{"key":"55_CR2","doi-asserted-by":"crossref","unstructured":"Boulhidja, S., Mellit, A., Voswinckel, S., Lughi, V., Ciocia, A., Spertino, F., Massi Pavan, A.: Experimental evidence of PID effect on CIGS photovoltaic modules. Energies 13, 537 (2020)","DOI":"10.3390\/en13030537"},{"key":"55_CR3","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s00138-021-01191-9","volume":"32","author":"S Deitsch","year":"2021","unstructured":"Deitsch, S., Buerhop-Lutz, C., Sovetkin, E., Steland, A., Maier, A., Gallwitz, F., Riess, C.: Segmentation of photovoltaic module cells in uncalibrated electroluminescence images. Mach. Vis. Appl. 32, 1\u201323 (2021)","journal-title":"Mach. Vis. Appl."},{"key":"55_CR4","doi-asserted-by":"publisher","first-page":"455","DOI":"10.1016\/j.solener.2019.02.067","volume":"185","author":"S Deitsch","year":"2019","unstructured":"Deitsch, S., Christlein, V., Berger, S., Buerhop-Lutz, C., Maier, A., Gallwitz, F., Riess, C.: Automatic classification of defective photovoltaic module cells in electroluminescence images. Sol. Energy 185, 455\u2013468 (2019)","journal-title":"Sol. Energy"},{"key":"55_CR5","doi-asserted-by":"crossref","unstructured":"Demirci, M.Y., Be\u015fli, N., G\u00fcm\u00fc\u015f\u00e7\u00fc, A.: Efficient deep feature extraction and classification for identifying defective photovoltaic module cells in electroluminescence images. Expert Syst. Appl. 175, 114810 (2021)","DOI":"10.1016\/j.eswa.2021.114810"},{"key":"55_CR6","doi-asserted-by":"crossref","unstructured":"Huang, G., Liu, Z., Van Der\u00a0Maaten, L., Weinberger, K.Q.: Densely connected convolutional networks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4700\u20134708 (2017)","DOI":"10.1109\/CVPR.2017.243"},{"key":"55_CR7","doi-asserted-by":"crossref","unstructured":"Obodovskiy, I.: Radiation\u2014Fundamentals. Risks, and Safety, chapter Luminescence. Elsevier, Applications (2019)","DOI":"10.1016\/B978-0-444-63979-0.00012-4"},{"key":"55_CR8","unstructured":"Peng, H., Sun, X., Weng, W., Fang, X.: Polymer Materials for Energy and Electronic Applications. Academic Press (2016)"},{"issue":"3","key":"55_CR9","doi-asserted-by":"publisher","first-page":"211","DOI":"10.1007\/s11263-015-0816-y","volume":"115","author":"O Russakovsky","year":"2015","unstructured":"Russakovsky, O., Deng, J., Su, H., Krause, J., Satheesh, S., Ma, S., Huang, Z., Karpathy, A., Khosla, A., Bernstein, M., Berg, A.C., Fei-Fei, L.: ImageNet large scale visual recognition challenge. Int. J. Comput. Vis. 115(3), 211\u2013252 (2015). https:\/\/doi.org\/10.1007\/s11263-015-0816-y","journal-title":"Int. J. Comput. Vis."},{"key":"55_CR10","doi-asserted-by":"crossref","unstructured":"Sarpietro, R.E., Pino, C., Coffa, S., Messina, A., Palazzo, S., Battiato, S., Spampinato, C., Rundo, F.: Explainable deep learning system for advanced silicon and silicon carbide electrical wafer defect map assessment. IEEE Access 10, 99102\u201399128 (2022)","DOI":"10.1109\/ACCESS.2022.3204278"},{"key":"55_CR11","unstructured":"Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition (2014). arXiv:1409.1556"},{"key":"55_CR12","doi-asserted-by":"crossref","unstructured":"Szegedy, C., Vanhoucke, V., Ioffe, S., Shlens, J., Wojna, Z.: Rethinking the inception architecture for computer vision. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2818\u20132826 (2016)","DOI":"10.1109\/CVPR.2016.308"},{"key":"55_CR13","doi-asserted-by":"publisher","first-page":"453","DOI":"10.1016\/j.solener.2020.03.049","volume":"201","author":"W Tang","year":"2020","unstructured":"Tang, W., Yang, Q., Xionga, K., Yana, W.: Deep learning based automatic defect identification of photovoltaic module using electroluminescence images. Sol. Energy 201, 453\u2013460 (2020)","journal-title":"Sol. Energy"},{"key":"55_CR14","doi-asserted-by":"crossref","unstructured":"Xie, S., Girshick, R., Doll\u00e1r, P., Tu, Z., He, K.: Aggregated residual transformations for deep neural networks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1492\u20131500 (2017)","DOI":"10.1109\/CVPR.2017.634"}],"container-title":["Lecture Notes in Networks and Systems","Intelligent Systems and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-47721-8_55","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T22:18:20Z","timestamp":1706825900000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-47721-8_55"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9783031477201","9783031477218"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-47721-8_55","relation":{},"ISSN":["2367-3370","2367-3389"],"issn-type":[{"value":"2367-3370","type":"print"},{"value":"2367-3389","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"10 January 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}}]}}