{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:58:08Z","timestamp":1777658288972,"version":"3.51.4"},"publisher-location":"Cham","reference-count":27,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031544088","type":"print"},{"value":"9783031544095","type":"electronic"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-3-031-54409-5_5","type":"book-chapter","created":{"date-parts":[[2024,2,22]],"date-time":"2024-02-22T06:08:12Z","timestamp":1708582092000},"page":"87-106","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Attacking at\u00a0Non-harmonic Frequencies in\u00a0Screaming-Channel Attacks"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-3398-3423","authenticated-orcid":false,"given":"Jeremy","family":"Guillaume","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1158-0915","authenticated-orcid":false,"given":"Maxime","family":"Pelcat","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1164-7163","authenticated-orcid":false,"given":"Amor","family":"Nafkha","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0021-5808","authenticated-orcid":false,"given":"Rub\u00e9n","family":"Salvador","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2024,2,23]]},"reference":[{"key":"5_CR1","doi-asserted-by":"publisher","DOI":"10.1002\/9781119120810","volume-title":"Foundations of Electromagnetic Compatibility: With Practical Applications","author":"B Adamczyk","year":"2017","unstructured":"Adamczyk, B.: Foundations of Electromagnetic Compatibility: With Practical Applications. Wiley, Hoboken (2017)"},{"issue":"12","key":"5_CR2","doi-asserted-by":"publisher","first-page":"2109","DOI":"10.1109\/JPROC.2006.886029","volume":"94","author":"A Afzali-Kusha","year":"2006","unstructured":"Afzali-Kusha, A., Nagata, M., Verghese, N.K., Allstot, D.J.: Substrate noise coupling in SoC design: modeling, avoidance, and validation. Proc. IEEE 94(12), 2109\u20132138 (2006)","journal-title":"Proc. IEEE"},{"key":"5_CR3","doi-asserted-by":"publisher","unstructured":"Agrawal, D., Archambeault, B., Rao, J.R., Rohatgi, P.: The EM Side\u2014Channel(s). In: Kaliski, B.S., Ko\u00e7, \u00e7.K., Paar, C. (eds.) Cryptographic Hardware and Embedded Systems-CHES 2002. CHES 2022, LNCS, vol. 252, pp. 29\u201345. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_4","DOI":"10.1007\/3-540-36400-5_4"},{"key":"5_CR4","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/978-3-540-45238-6_2","volume-title":"Cryptographic Hardware and Embedded Systems-CHES 2003","author":"D Agrawal","year":"2003","unstructured":"Agrawal, D., Rao, J.R., Rohatgi, P.: Multi-channel attacks. In: Walter, C.D., Ko\u00e7, \u00c7.K., Paar, C. (eds.) CHES 2003. LNCS, vol. 2779, pp. 2\u201316. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/978-3-540-45238-6_2"},{"key":"5_CR5","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"16","DOI":"10.1007\/978-3-540-28632-5_2","volume-title":"Cryptographic Hardware and Embedded Systems-CHES 2004","author":"E Brier","year":"2004","unstructured":"Brier, E., Clavier, C., Olivier, F.: Correlation power analysis with a leakage model. In: Joye, M., Quisquater, J.J. (eds.) CHES 2004. LNCS, vol. 3156, pp. 16\u201329. Springer, Heidelberg (2004). https:\/\/doi.org\/10.1007\/978-3-540-28632-5_2"},{"key":"5_CR6","doi-asserted-by":"crossref","unstructured":"Camurati, G., Francillon, A., Standaert, F.X.: Understanding screaming channels: from a detailed analysis to improved attacks. IACR Trans. Cryptograph. Hardware Embed. Syst. 358\u2013401 (2020)","DOI":"10.46586\/tches.v2020.i3.358-401"},{"key":"5_CR7","doi-asserted-by":"crossref","unstructured":"Camurati, G., Poeplau, S., Muench, M., Hayes, T., Francillon, A.: Screaming channels: when electromagnetic side channels meet radio transceivers. In: ACM Conference on Computer and Communications Security, pp. 163\u2013177 (2018)","DOI":"10.1145\/3243734.3243802"},{"key":"5_CR8","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"13","DOI":"10.1007\/3-540-36400-5_3","volume-title":"Cryptographic Hardware and Embedded Systems-CHES 2002","author":"S Chari","year":"2003","unstructured":"Chari, S., Rao, J.R., Rohatgi, P.: Template Attacks. In: Kaliski, B.S., Ko\u00e7, \u00c7.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 13\u201328. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_3"},{"key":"5_CR9","doi-asserted-by":"crossref","unstructured":"Choi, J., Yang, H.Y., Cho, D.H.: TEMPEST comeback: a realistic audio eavesdropping threat on mixed-signal SoCs. In: Proceedings of the 2020 ACM SIGSAC Conference on Computer and Communications Security (2020)","DOI":"10.1145\/3372297.3417241"},{"key":"5_CR10","doi-asserted-by":"crossref","unstructured":"Dessouky, G., Sadeghi, A.R., Zeitouni, S.: SoK: secure FPGA multi-tenancy in the cloud: challenges and opportunities. In: IEEE EuroS &P, pp. 487\u2013506 (2021)","DOI":"10.1109\/EuroSP51992.2021.00040"},{"key":"5_CR11","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"240","DOI":"10.1007\/978-3-662-49890-3_10","volume-title":"Advances in Cryptology-EUROCRYPT 2016","author":"F Durvaux","year":"2016","unstructured":"Durvaux, F., Standaert, F.X.: From improved leakage detection to the detection of points of interests in leakage traces. In: Fischlin, M., Coron, J.S. (eds.) EUROCRYPT 2016. LNCS, vol. 9665, pp. 240\u2013262. Springer, Heidelberg (2016). https:\/\/doi.org\/10.1007\/978-3-662-49890-3_10"},{"key":"5_CR12","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"251","DOI":"10.1007\/3-540-44709-1_21","volume-title":"Cryptographic Hardware and Embedded Systems-CHES 2001","author":"K Gandolfi","year":"2001","unstructured":"Gandolfi, K., Mourtel, C., Olivier, F.: Electromagnetic analysis: concrete results. In: Ko\u00e7, \u00c7.K., Naccache, D., Paar, C. (eds.) CHES 2001. LNCS, vol. 2162, pp. 251\u2013261. Springer, Heidelberg (2001). https:\/\/doi.org\/10.1007\/3-540-44709-1_21"},{"key":"5_CR13","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"426","DOI":"10.1007\/978-3-540-85053-3_27","volume-title":"Cryptographic Hardware and Embedded Systems-CHES 2008","author":"B Gierlichs","year":"2008","unstructured":"Gierlichs, B., Batina, L., Tuyls, P., Preneel, B.: Mutual information analysis: a generic side-channel distinguisher. In: Oswald, E., Rohatgi, P. (eds.) CHES 2008. LNCS, vol. 5154, pp. 426\u2013442. Springer, Heidelberg (2008). https:\/\/doi.org\/10.1007\/978-3-540-85053-3_27"},{"key":"5_CR14","unstructured":"Gilbert Goodwill, B.J., Jaffe, J., Rohatgi, P.: A testing methodology for side-channel resistance validation. In: NIST Non-Invasive Attack Testing Workshop, vol. 7, pp. 115\u2013136 (2011)"},{"key":"5_CR15","doi-asserted-by":"crossref","unstructured":"Guillaume, J., Pelcat, M., Nafkha, A., Salvador, R.: Virtual triggering: a technique to segment cryptographic processes in side-channel traces. In: 2022 IEEE Workshop on Signal Processing Systems (SiPS), pp. 1\u20136. IEEE (2022)","DOI":"10.1109\/SiPS55645.2022.9919238"},{"key":"5_CR16","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","volume-title":"Advances in Cryptology-CRYPTO 1999","author":"P Kocher","year":"1999","unstructured":"Kocher, P., Ja, J.: Differential power analysis. In: Wiener, M. (ed.) CRYPTO 1999. LNCS, vol. 1666, pp. 388\u2013397. Springer, Heidelberg (1999). https:\/\/doi.org\/10.1007\/3-540-48405-1_25"},{"key":"5_CR17","doi-asserted-by":"crossref","unstructured":"Le, J., Hanken, C., Held, M., Hagedorn, M.S., Mayaram, K., Fiez, T.S.: Experimental characterization and analysis of an asynchronous approach for reduction of substrate noise in digital circuitry. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 20(2), 344\u2013356 (2011)","DOI":"10.1109\/TVLSI.2010.2100835"},{"key":"5_CR18","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-38162-6","volume-title":"Power Analysis Attacks: Revealing the Secrets of Smart Cards","author":"S Mangard","year":"2008","unstructured":"Mangard, S., Oswald, E., Popp, T.: Power Analysis Attacks: Revealing the Secrets of Smart Cards, vol. 31. Springer, New York (2008). https:\/\/doi.org\/10.1007\/978-0-387-38162-6"},{"key":"5_CR19","doi-asserted-by":"crossref","unstructured":"Masure, L., Dumas, C., Prouff, E.: A comprehensive study of deep learning for side-channel analysis. IACR Trans. Cryptograph. Hardware Embed. Syst. 3488\u2013375 (2019)","DOI":"10.46586\/tches.v2020.i1.348-375"},{"key":"5_CR20","unstructured":"Mohamed, C., Barelaud, B., Ngoya, E.: Physical analysis of substrate noise coupling in mixed circuits in SoC technology. In: The 5th European Microwave Integrated Circuits Conference, pp. 274\u2013277. IEEE (2010)"},{"key":"5_CR21","doi-asserted-by":"publisher","first-page":"477","DOI":"10.1007\/s10470-016-0883-1","volume":"90","author":"T Noulis","year":"2017","unstructured":"Noulis, T., Baumgartner, P.: CMOS substrate coupling modeling and analysis flow for submicron SoC design. Analog Integr. Circ. Sig. Process 90, 477\u2013485 (2017)","journal-title":"Analog Integr. Circ. Sig. Process"},{"key":"5_CR22","series-title":"LNCS","doi-asserted-by":"publisher","first-page":"61","DOI":"10.1007\/978-3-662-53140-2_4","volume-title":"Cryptographic Hardware and Embedded Systems-CHES 2016","author":"R Poussier","year":"2016","unstructured":"Poussier, R., Standaert, F.X., Grosso, V.: Simple key enumeration (and rank estimation) using histograms: an integrated approach. In: Gierlichs, B., Poschmann, A. (eds.) CHES 2016. LNCS, vol. 9813, pp. 61\u201381. Springer, Heidelberg (2016). https:\/\/doi.org\/10.1007\/978-3-662-53140-2_4"},{"issue":"7","key":"5_CR23","first-page":"638","volume":"55","author":"W Rhee","year":"2008","unstructured":"Rhee, W., Jenkins, K.A., Liobe, J., Ainspan, H.: Experimental analysis of substrate noise effect on PLL performance. IEEE Trans. Circ. Syst. II Express Briefs 55(7), 638\u2013642 (2008)","journal-title":"IEEE Trans. Circ. Syst. II Express Briefs"},{"key":"5_CR24","doi-asserted-by":"crossref","unstructured":"Schellenberg, F., Gnad, D.R.E., Moradi, A., Tahoori, M.B.: An inside job: remote power analysis attacks on FPGAs. In: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), p. 6 (2018)","DOI":"10.23919\/DATE.2018.8342177"},{"key":"5_CR25","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1007\/s13389-016-0120-y","volume":"6","author":"T Schneider","year":"2016","unstructured":"Schneider, T., Moradi, A.: Leakage assessment methodology: extended version. J. Cryptogr. Eng. 6, 85\u201399 (2016)","journal-title":"J. Cryptogr. Eng."},{"key":"5_CR26","doi-asserted-by":"crossref","unstructured":"Standaert, F.X.: Introduction to side-channel attacks. Secure Integr. Circ. Syst. 27\u201342 (2010)","DOI":"10.1007\/978-0-387-71829-3_2"},{"key":"5_CR27","doi-asserted-by":"crossref","unstructured":"Wang, R., Wang, H., Dubrova, E.: Far field EM side-channel attack on AES using deep learning. In: 4th ACM Workshop on Attacks and Solutions in Hardware Security, pp. 35\u201344 (2020)","DOI":"10.1145\/3411504.3421214"}],"container-title":["Lecture Notes in Computer Science","Smart Card Research and Advanced Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-54409-5_5","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,31]],"date-time":"2024-03-31T12:01:56Z","timestamp":1711886516000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-54409-5_5"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9783031544088","9783031544095"],"references-count":27,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-54409-5_5","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"23 February 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CARDIS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Smart Card Research and Advanced Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Amsterdam","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"The Netherlands","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14 November 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"16 November 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cardis2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easy Chair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"28","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"13","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"46% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}