{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,7]],"date-time":"2025-08-07T20:44:38Z","timestamp":1754599478937,"version":"3.40.3"},"publisher-location":"Cham","reference-count":28,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031614859"},{"type":"electronic","value":"9783031614866"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-3-031-61486-6_8","type":"book-chapter","created":{"date-parts":[[2024,6,23]],"date-time":"2024-06-23T08:01:47Z","timestamp":1719129707000},"page":"121-138","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Diversity Algorithms for\u00a0Laser Fault Injection"],"prefix":"10.1007","author":[{"given":"Marina","family":"Kr\u010dek","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Ordas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,6,24]]},"reference":[{"issue":"11","key":"8_CR1","doi-asserted-by":"publisher","first-page":"3056","DOI":"10.1109\/JPROC.2012.2188769","volume":"100","author":"A Barenghi","year":"2012","unstructured":"Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056\u20133076 (2012)","journal-title":"Proc. IEEE"},{"key":"8_CR2","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1023\/A:1015059928466","volume":"1","author":"HG Beyer","year":"2002","unstructured":"Beyer, H.G., Schwefel, H.P.: Evolution strategies-a comprehensive introduction. Nat. Comput. 1, 3\u201352 (2002)","journal-title":"Nat. Comput."},{"key":"8_CR3","doi-asserted-by":"crossref","unstructured":"Biham, E., Shamir, A.: Differential fault analysis of secret key cryptosystems (1997)","DOI":"10.1007\/BFb0052259"},{"key":"8_CR4","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"236","DOI":"10.1007\/978-3-319-08302-5_16","volume-title":"Smart Card Research and Advanced Applications","author":"RB Carpi","year":"2014","unstructured":"Carpi, R.B., Picek, S., Batina, L., Menarini, F., Jakobovic, D., Golub, M.: Glitch it if you can: parameter search strategies for successful fault injection. In: Francillon, A., Rohatgi, P. (eds.) CARDIS 2013. LNCS, vol. 8419, pp. 236\u2013252. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-08302-5_16"},{"issue":"5","key":"8_CR5","doi-asserted-by":"publisher","first-page":"603","DOI":"10.1109\/34.1000236","volume":"24","author":"D Comaniciu","year":"2002","unstructured":"Comaniciu, D., Meer, P.: Mean shift: a robust approach toward feature space analysis. IEEE Trans. Pattern Anal. Mach. Intell. 24(5), 603\u2013619 (2002)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"8_CR6","doi-asserted-by":"publisher","unstructured":"Dobraunig, C., Eichlseder, M., Korak, T., Mangard, S., Mendel, F., Primas, R.: SIFA: exploiting ineffective fault inductions on symmetric cryptography. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2018(3), 547\u2013572 (2018). https:\/\/doi.org\/10.13154\/tches.v2018.i3.547-572. https:\/\/tches.iacr.org\/index.php\/TCHES\/article\/view\/7286","DOI":"10.13154\/tches.v2018.i3.547-572"},{"key":"8_CR7","doi-asserted-by":"publisher","unstructured":"Fuhr, T., Jaulmes, E., Lomn\u00e9, V., Thillard, A.: Fault attacks on AES with faulty ciphertexts only. In: Proceedings of the 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2013, USA, pp. 108\u2013118. IEEE Computer Society (2013). https:\/\/doi.org\/10.1109\/FDTC.2013.18","DOI":"10.1109\/FDTC.2013.18"},{"key":"8_CR8","doi-asserted-by":"publisher","first-page":"212","DOI":"10.1145\/321062.321069","volume":"8","author":"R Hooke","year":"1961","unstructured":"Hooke, R., Jeeves, T.A.: \u201cDirect search\u2019\u2019 solution of numerical and statistical problems. J. ACM 8, 212\u2013229 (1961)","journal-title":"J. ACM"},{"key":"8_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"219","DOI":"10.1007\/978-3-319-08302-5_15","volume-title":"Smart Card Research and Advanced Applications","author":"M Hutter","year":"2014","unstructured":"Hutter, M., Schmidt, J.-M.: The temperature side channel and heating fault attacks. In: Francillon, A., Rohatgi, P. (eds.) CARDIS 2013. LNCS, vol. 8419, pp. 219\u2013235. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-08302-5_15"},{"key":"8_CR10","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"215","DOI":"10.1007\/978-3-540-72354-7_18","volume-title":"Information Security Theory and Practices. Smart Cards, Mobile and Ubiquitous Computing Systems","author":"CH Kim","year":"2007","unstructured":"Kim, C.H., Quisquater, J.-J.: Fault attacks for CRT based RSA: new attacks, new results, and new countermeasures. In: Sauveron, D., Markantonakis, K., Bilas, A., Quisquater, J.-J. (eds.) WISTP 2007. LNCS, vol. 4462, pp. 215\u2013228. Springer, Heidelberg (2007). https:\/\/doi.org\/10.1007\/978-3-540-72354-7_18"},{"key":"8_CR11","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","volume-title":"Advances in Cryptology \u2014 CRYPTO\u2019 99","author":"P Kocher","year":"1999","unstructured":"Kocher, P., Jaffe, J., Jun, B.: Differential power analysis. In: Wiener, M. (ed.) CRYPTO 1999. LNCS, vol. 1666, pp. 388\u2013397. Springer, Heidelberg (1999). https:\/\/doi.org\/10.1007\/3-540-48405-1_25"},{"key":"8_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"104","DOI":"10.1007\/3-540-68697-5_9","volume-title":"Advances in Cryptology \u2014 CRYPTO \u201996","author":"PC Kocher","year":"1996","unstructured":"Kocher, P.C.: Timing attacks on implementations of Diffie-Hellman, RSA, DSS, and other systems. In: Koblitz, N. (ed.) CRYPTO 1996. LNCS, vol. 1109, pp. 104\u2013113. Springer, Heidelberg (1996). https:\/\/doi.org\/10.1007\/3-540-68697-5_9"},{"key":"8_CR13","doi-asserted-by":"crossref","unstructured":"Kr\u010dek, M., Ordas, T., Fronte, D., Picek, S.: The more you know: improving laser fault injection with prior knowledge. In: 2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), pp. 18\u201329. IEEE (2022)","DOI":"10.1109\/FDTC57191.2022.00012"},{"key":"8_CR14","doi-asserted-by":"publisher","unstructured":"Kr\u010dek, M., Fronte, D., Picek, S.: On the importance of initial solutions selection in fault injection. In: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), pp. 1\u201312 (2021). https:\/\/doi.org\/10.1109\/FDTC53659.2021.00011","DOI":"10.1109\/FDTC53659.2021.00011"},{"key":"8_CR15","unstructured":"MacQueen, J., et\u00a0al.: Some methods for classification and analysis of multivariate observations. In: Proceedings of the Fifth Berkeley Symposium on Mathematical Statistics and Probability, Oakland, CA, USA, vol.\u00a01, pp. 281\u2013297 (1967)"},{"key":"8_CR16","doi-asserted-by":"crossref","unstructured":"Maldini, A., Samwel, N., Picek, S., Batina, L.: Genetic algorithm-based electromagnetic fault injection. In: 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 35\u201342. IEEE (2018)","DOI":"10.1109\/FDTC.2018.00014"},{"key":"8_CR17","doi-asserted-by":"crossref","unstructured":"Moradi, M., Oakes, B.J., Saraoglu, M., Morozov, A., Janschek, K., Denil, J.: Exploring fault parameter space using reinforcement learning-based fault injection. In: 2020 50th Annual IEEE\/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), pp. 102\u2013109. IEEE (2020)","DOI":"10.1109\/DSN-W50199.2020.00028"},{"key":"8_CR18","doi-asserted-by":"crossref","unstructured":"Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller. In: 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 77\u201388. IEEE (2013)","DOI":"10.1109\/FDTC.2013.9"},{"key":"8_CR19","unstructured":"Moscato, P.: On evolution, search, optimization, genetic algorithms and martial arts - towards memetic algorithms. Caltech Concurrent Computation Program (2000)"},{"key":"8_CR20","first-page":"2825","volume":"12","author":"F Pedregosa","year":"2011","unstructured":"Pedregosa, F., et al.: Scikit-learn: machine learning in Python. J. Mach. Learn. Res. 12, 2825\u20132830 (2011)","journal-title":"J. Mach. Learn. Res."},{"key":"8_CR21","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"159","DOI":"10.1007\/978-3-319-21476-4_11","volume-title":"Constructive Side-Channel Analysis and Secure Design","author":"S Picek","year":"2015","unstructured":"Picek, S., Batina, L., Buzing, P., Jakobovic, D.: Fault injection with a new flavor: memetic algorithms make a difference. In: Mangard, S., Poschmann, A.Y. (eds.) COSADE 2014. LNCS, vol. 9064, pp. 159\u2013173. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-21476-4_11"},{"key":"8_CR22","doi-asserted-by":"crossref","unstructured":"Picek, S., Batina, L., Jakobovi\u0107, D., Carpi, R.B.: Evolving genetic algorithms for fault injection attacks. In: 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), pp. 1106\u20131111. IEEE (2014)","DOI":"10.1109\/MIPRO.2014.6859734"},{"issue":"11","key":"8_CR23","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3569577","volume":"55","author":"S Picek","year":"2023","unstructured":"Picek, S., Perin, G., Mariot, L., Wu, L., Batina, L.: SoK: deep learning-based physical side-channel analysis. ACM Comput. Surv. 55(11), 1\u201335 (2023)","journal-title":"ACM Comput. Surv."},{"key":"8_CR24","doi-asserted-by":"crossref","unstructured":"Rais-Ali, I., Bouvet, A., Guilley, S.: Quantifying the speed-up offered by genetic algorithms during fault injection cartographies. In: 2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), pp. 61\u201372. IEEE (2022)","DOI":"10.1109\/FDTC57191.2022.00016"},{"key":"8_CR25","doi-asserted-by":"crossref","unstructured":"Sedaghatbaf, A., Moradi, M., Almasizadeh, J., Sangchoolie, B., Van\u00a0Acker, B., Denil, J.: DELFASE: a deep learning method for fault space exploration. In: 2022 18th European Dependable Computing Conference (EDCC), pp. 57\u201364. IEEE (2022)","DOI":"10.1109\/EDCC57035.2022.00020"},{"key":"8_CR26","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/3-540-36400-5_2","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"SP Skorobogatov","year":"2003","unstructured":"Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2\u201312. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_2"},{"key":"8_CR27","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"121","DOI":"10.1007\/978-3-030-97348-3_7","volume-title":"Smart Card Research and Advanced Applications","author":"V Werner","year":"2022","unstructured":"Werner, V., Maingault, L., Potet, M.L.: Fast calibration of fault injection equipment with hyperparameter optimization techniques. In: Grosso, V., P\u00f6ppelmann, T. (eds.) CARDIS 2021. LNCS, vol. 13173, pp. 121\u2013138. Springer, Cham (2022). https:\/\/doi.org\/10.1007\/978-3-030-97348-3_7"},{"key":"8_CR28","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"146","DOI":"10.1007\/978-3-030-40186-3_8","volume-title":"Topics in Cryptology \u2013 CT-RSA 2020","author":"L Wu","year":"2020","unstructured":"Wu, L., Ribera, G., Beringuier-Boher, N., Picek, S.: A fast characterization method for semi-invasive fault injection attacks. In: Jarecki, S. (ed.) CT-RSA 2020. LNCS, vol. 12006, pp. 146\u2013170. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-40186-3_8"}],"container-title":["Lecture Notes in Computer Science","Applied Cryptography and Network Security Workshops"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-61486-6_8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,23]],"date-time":"2024-06-23T08:03:01Z","timestamp":1719129781000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-61486-6_8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9783031614859","9783031614866"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-61486-6_8","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"24 June 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ACNS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Applied Cryptography and Network Security","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Abu Dhabi","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"United Arab Emirates","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5 March 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 March 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"acns2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/wp.nyu.edu\/acns2024\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"HotCRP","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"230","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"54","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"23% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4-6","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}