{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T18:10:00Z","timestamp":1771956600828,"version":"3.50.1"},"publisher-location":"Cham","reference-count":36,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031667046","type":"print"},{"value":"9783031667053","type":"electronic"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-3-031-66705-3_11","type":"book-chapter","created":{"date-parts":[[2024,8,22]],"date-time":"2024-08-22T11:23:00Z","timestamp":1724325780000},"page":"164-177","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Self-supervised Learning for\u00a0Robust Surface Defect Detection"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-5095-605X","authenticated-orcid":false,"given":"Muhammad","family":"Aqeel","sequence":"first","affiliation":[]},{"given":"Shakiba","family":"Sharifi","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0523-6042","authenticated-orcid":false,"given":"Marco","family":"Cristani","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0015-5534","authenticated-orcid":false,"given":"Francesco","family":"Setti","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2024,8,21]]},"reference":[{"issue":"20","key":"11_CR1","doi-asserted-by":"publisher","first-page":"3289","DOI":"10.3390\/electronics11203289","volume":"11","author":"E Vrochidou","year":"2022","unstructured":"Vrochidou, E., et al.: Towards robotic marble resin application: crack detection on marble using deep learning. Electronics 11(20), 3289 (2022)","journal-title":"Electronics"},{"key":"11_CR2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103459","volume":"129","author":"J Bo\u017ei\u010d","year":"2021","unstructured":"Bo\u017ei\u010d, J., Tabernik, D., Sko\u010daj, D.: Mixed supervision for surface-defect detection: from weakly to fully supervised learning. Comput. Ind. 129, 103459 (2021)","journal-title":"Comput. Ind."},{"issue":"1","key":"11_CR3","doi-asserted-by":"publisher","first-page":"989","DOI":"10.1007\/s11042-022-13308-x","volume":"82","author":"M Jawahar","year":"2023","unstructured":"Jawahar, M., Anbarasi, L.J., Geetha, S.: Vision based leather defect detection: a survey. Multimedia Tools Appl. 82(1), 989\u20131015 (2023)","journal-title":"Multimedia Tools Appl."},{"key":"11_CR4","doi-asserted-by":"publisher","first-page":"539","DOI":"10.1007\/978-3-031-19821-2_31","volume-title":"European Conference on Computer Vision (ECCV)","author":"V Zavrtanik","year":"2022","unstructured":"Zavrtanik, V., Kristan, M., Sko\u010daj, D.: DSR-a dual subspace re-projection network for surface anomaly detection. In: Avidan, S., Brostow, G., Ciss\u00e9, M., Farinella, G.M., Hassner, T. (eds.) ECCV 2022. LNCS, vol. 13691, pp. 539\u2013554. Springer, Cham (2022). https:\/\/doi.org\/10.1007\/978-3-031-19821-2_31"},{"issue":"6","key":"11_CR5","doi-asserted-by":"publisher","first-page":"6022","DOI":"10.1007\/s10489-021-02736-1","volume":"52","author":"Z Luo","year":"2022","unstructured":"Luo, Z., He, K., Yu, Z.: A robust unsupervised anomaly detection framework. Appl. Intell. 52(6), 6022\u20136036 (2022)","journal-title":"Appl. Intell."},{"key":"11_CR6","unstructured":"Hu, M., Wang, Y., Feng, X., Zhou, S., Wu, Z., Qin, Y.: Robust anomaly detection for time-series data (2022)"},{"key":"11_CR7","doi-asserted-by":"publisher","first-page":"1129","DOI":"10.5194\/isprs-archives-XLIII-B2-2020-1129-2020","volume":"43","author":"Y Ono","year":"2020","unstructured":"Ono, Y., Tsuji, A., Abe, J., Noguchi, H., Abe, J.: Robust detection of surface anomaly using LiDAR point cloud with intensity. Int. Arch. Photogramm. Remote Sens. Spat. Inf. Sci. 43, 1129\u20131136 (2020)","journal-title":"Int. Arch. Photogramm. Remote Sens. Spat. Inf. Sci."},{"key":"11_CR8","doi-asserted-by":"publisher","first-page":"206","DOI":"10.1007\/978-3-030-46150-8_13","volume-title":"Machine Learning and Knowledge Discovery in Databases (ECML-PKDD)","author":"L Beggel","year":"2020","unstructured":"Beggel, L., Pfeiffer, M., Bischl, B.: Robust anomaly detection in images using adversarial autoencoders. In: Brefeld, U., Fromont, E., Hotho, A., Knobbe, A., Maathuis, M., Robardet, C. (eds.) ECML PKDD 2019. LNCS, vol. 11906, pp. 206\u2013222. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-46150-8_13"},{"key":"11_CR9","doi-asserted-by":"publisher","first-page":"108","DOI":"10.1016\/j.ecosta.2018.05.001","volume":"9","author":"P Rousseeuw","year":"2019","unstructured":"Rousseeuw, P., Perrotta, D., Riani, M., Hubert, M.: Robust monitoring of time series with application to fraud detection. Econometrics Stat. 9, 108\u2013121 (2019)","journal-title":"Econometrics Stat."},{"key":"11_CR10","doi-asserted-by":"crossref","unstructured":"Zhao, Z., et al.: Robust anomaly detection on unreliable data. In: IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN) (2019)","DOI":"10.1109\/DSN.2019.00068"},{"issue":"2","key":"11_CR11","doi-asserted-by":"publisher","DOI":"10.1002\/widm.1236","volume":"8","author":"PJ Rousseeuw","year":"2018","unstructured":"Rousseeuw, P.J., Hubert, M.: Anomaly detection by robust statistics. Wiley Interdisc. Rev. Data Min. Knowl. Discov. 8(2), e1236 (2018)","journal-title":"Wiley Interdisc. Rev. Data Min. Knowl. Discov."},{"key":"11_CR12","doi-asserted-by":"crossref","unstructured":"Zhou, C., Paffenroth, R.C.: Anomaly detection with robust deep autoencoders. In: ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (2017)","DOI":"10.1145\/3097983.3098052"},{"key":"11_CR13","doi-asserted-by":"crossref","unstructured":"Su, Y., Zhao, Y., Niu, C., Liu, R., Sun, W., Pei, D.: Robust anomaly detection for multivariate time series through stochastic recurrent neural network. In: ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (2019)","DOI":"10.1145\/3292500.3330672"},{"key":"11_CR14","unstructured":"Zhao, Z., et al.: RAD: on-line anomaly detection for highly unreliable data. arXiv preprint arXiv:1911.04383 (2019)"},{"issue":"12","key":"11_CR15","doi-asserted-by":"publisher","first-page":"2911","DOI":"10.1049\/iet-ipr.2019.1506","volume":"14","author":"GA De Vitis","year":"2020","unstructured":"De Vitis, G.A., Foglia, P., Prete, C.A.: Row-level algorithm to improve real-time performance of glass tube defect detection in the production phase. IET Image Proc. 14(12), 2911\u20132921 (2020)","journal-title":"IET Image Proc."},{"issue":"16","key":"11_CR16","doi-asserted-by":"publisher","first-page":"7657","DOI":"10.3390\/app11167657","volume":"11","author":"Y Chen","year":"2021","unstructured":"Chen, Y., Ding, Y., Zhao, F., Zhang, E., Wu, Z., Shao, L.: Surface defect detection methods for industrial products: a review. Appl. Sci. 11(16), 7657 (2021)","journal-title":"Appl. Sci."},{"issue":"4","key":"11_CR17","doi-asserted-by":"publisher","DOI":"10.1115\/1.4049535","volume":"21","author":"PM Bhatt","year":"2021","unstructured":"Bhatt, P.M., et al.: Image-based surface defect detection using deep learning: a review. J. Comput. Inf. Sci. Eng. 21(4), 040801 (2021)","journal-title":"J. Comput. Inf. Sci. Eng."},{"key":"11_CR18","doi-asserted-by":"publisher","first-page":"622","DOI":"10.1007\/978-3-030-20893-6_39","volume-title":"Asian Conference on Computer Vision (ACCV)","author":"S Akcay","year":"2019","unstructured":"Akcay, S., Atapour-Abarghouei, A., Breckon, T.P.: GANomaly: semi-supervised anomaly detection via adversarial training. In: Jawahar, C., Li, H., Mori, G., Schindler, K. (eds.) ACCV 2018. LNCS, vol. 11363, pp. 622\u2013637. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-20893-6_39"},{"key":"11_CR19","doi-asserted-by":"crossref","unstructured":"Defard, T., Setkov, A., Loesch, A., Audigier, R.: PaDiM: a patch distribution modeling framework for anomaly detection and localization. In: International Conference on Pattern Recognition (ICPR) (2021)","DOI":"10.1007\/978-3-030-68799-1_35"},{"key":"11_CR20","doi-asserted-by":"crossref","unstructured":"Roth, K., Pemula, L., Zepeda, J., Sch\u00f6lkopf, B., Brox, T., Gehler, P.: Towards total recall in industrial anomaly detection. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2022)","DOI":"10.1109\/CVPR52688.2022.01392"},{"key":"11_CR21","doi-asserted-by":"crossref","unstructured":"Rudolph, M., Wandt, B., Rosenhahn, B.: Same same but differnet: semi-supervised defect detection with normalizing flows. In: IEEE\/CVF Winter Conference on Applications of Computer Vision (2021)","DOI":"10.1109\/WACV48630.2021.00195"},{"key":"11_CR22","doi-asserted-by":"crossref","unstructured":"Zavrtanik, V., Kristan, M., Sko\u010daj, D.: Draem-a discriminatively trained reconstruction embedding for surface anomaly detection. In: IEEE\/CVF International Conference on Computer Vision (ICCV) (2021)","DOI":"10.1109\/ICCV48922.2021.00822"},{"key":"11_CR23","doi-asserted-by":"crossref","unstructured":"Capogrosso, L., et al.: Diffusion-based image generation for in-distribution data augmentation in surface defect detection. In: International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, vol. 2, pp. 409\u2013416. SciTePress (2024)","DOI":"10.5220\/0012350400003660"},{"key":"11_CR24","doi-asserted-by":"crossref","unstructured":"Bo\u017ei\u010d, J., Tabernik, D., Sko\u010daj, D.: End-to-end training of a two-stage neural network for defect detection. In: International Conference on Pattern Recognition (ICPR). IEEE (2021)","DOI":"10.1109\/ICPR48806.2021.9412092"},{"key":"11_CR25","first-page":"9595286","volume":"2022","author":"C Zhang","year":"2022","unstructured":"Zhang, C., Wang, Z., Liu, B., Xiaolei, W., et al.: Steel plate defect recognition of deep neural network recognition based on space-time constraints. Adv. Multimedia 2022, 9595286 (2022)","journal-title":"Adv. Multimedia"},{"key":"11_CR26","doi-asserted-by":"crossref","unstructured":"Masci, J., Meier, U., Ciresan, D., Schmidhuber, J., Fricout, G.: Steel defect classification with max-pooling convolutional neural networks. In: International Joint Conference on Neural Networks (IJCNN) (2012)","DOI":"10.1109\/IJCNN.2012.6252468"},{"key":"11_CR27","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110211","volume":"187","author":"R Tian","year":"2022","unstructured":"Tian, R., Jia, M.: DCC-CenterNet: a rapid detection method for steel surface defects. Measurement 187, 110211 (2022)","journal-title":"Measurement"},{"key":"11_CR28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107541","volume":"153","author":"S Zhang","year":"2021","unstructured":"Zhang, S., Zhang, Q., Gu, J., Su, L., Li, K., Pecht, M.: Visual inspection of steel surface defects based on domain adaptation and adaptive convolutional neural network. Mech. Syst. Sig. Process. 153, 107541 (2021)","journal-title":"Mech. Syst. Sig. Process."},{"key":"11_CR29","unstructured":"Elkan, C.: The foundations of cost-sensitive learning. In: International Joint Conference on Artificial Intelligence (IJCAI), vol. 17, pp. 973\u2013978. Lawrence Erlbaum Associates Ltd. (2001)"},{"key":"11_CR30","doi-asserted-by":"publisher","first-page":"564","DOI":"10.1007\/11564096_55","volume-title":"Machine Learning (ECML)","author":"G Forman","year":"2005","unstructured":"Forman, G.: Counting positives accurately despite inaccurate classification. In: Gama, J., Camacho, R., Brazdil, P.B., Jorge, A.M., Torgo, L. (eds.) ECML 2005. LNCS, vol. 3720, pp. 564\u2013575. Springer, Heidelberg (2005). https:\/\/doi.org\/10.1007\/11564096_55"},{"key":"11_CR31","doi-asserted-by":"crossref","unstructured":"Elkan, C., Noto, K.: Learning classifiers from only positive and unlabeled data. In: ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (2008)","DOI":"10.1145\/1401890.1401920"},{"key":"11_CR32","unstructured":"Natarajan, N., Dhillon, I.S., Ravikumar, P.K., Tewari, A.: Learning with noisy labels. In: Advances in Neural Information Processing Systems (NeurIPS), vol. 26 (2013)"},{"key":"11_CR33","unstructured":"Van\u00a0Rooyen, B., Menon, A., Williamson, R.C.: Learning with symmetric label noise: the importance of being unhinged. In: Advances in Neural Information Processing Systems (NeurIPS), vol. 28 (2015)"},{"key":"11_CR34","doi-asserted-by":"crossref","unstructured":"Han, J., Luo, P., Wang, X.: Deep self-learning from noisy labels. In: IEEE\/CVF International Conference on Computer Vision (ICCV) (2019)","DOI":"10.1109\/ICCV.2019.00524"},{"key":"11_CR35","unstructured":"Lipton, Z., Wang, Y.X., Smola, A.: Detecting and correcting for label shift with black box predictors. In: International Conference on Machine Learning (ICML) (2018)"},{"key":"11_CR36","doi-asserted-by":"crossref","unstructured":"Huang, J., Qu, L., Jia, R., Zhao, B.: O2U-Net: a simple noisy label detection approach for deep neural networks. In: IEEE\/CVF International Conference on Computer Vision (ICCV) (2019)","DOI":"10.1109\/ICCV.2019.00342"}],"container-title":["Communications in Computer and Information Science","Deep Learning Theory and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-66705-3_11","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,22]],"date-time":"2024-08-22T11:47:31Z","timestamp":1724327251000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-66705-3_11"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9783031667046","9783031667053"],"references-count":36,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-66705-3_11","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"value":"1865-0929","type":"print"},{"value":"1865-0937","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"21 August 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"The authors declare that they have no conflict of interest.","order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Disclosure of Interests"}},{"value":"DeLTA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Deep Learning Theory and Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Dijon","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"France","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10 July 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 July 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"delta2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/delta.scitevents.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}