{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T20:46:25Z","timestamp":1743108385160,"version":"3.40.3"},"publisher-location":"Cham","reference-count":18,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031716362"},{"type":"electronic","value":"9783031716379"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-3-031-71637-9_23","type":"book-chapter","created":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T21:02:18Z","timestamp":1725742938000},"page":"341-354","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Anomaly Detection in a Production Line: Statistical Learning Approach and Industrial Application"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-8862-2264","authenticated-orcid":false,"given":"Rida","family":"Kheirallah","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anis","family":"Hoayek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frederic","family":"Grimaud","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mireille","family":"Batton-Hubert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Patrick","family":"Burlat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,9,8]]},"reference":[{"key":"23_CR1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijinfomgt.2018.06.008","author":"A Achraya","year":"2018","unstructured":"Achraya, A., Singh, S., Pereira, V., Singh, P.: Big data, knowledge co-creation and decision-making in fashion Industry. Int. J. Inf. Manage. (2018). https:\/\/doi.org\/10.1016\/j.ijinfomgt.2018.06.008","journal-title":"Int. J. Inf. Manage."},{"doi-asserted-by":"publisher","unstructured":"Chen, H.Y., Das, D., Ivanov, A.: Building resilience and managing post-disruption supply chain recovery: lessons from the information and communication technology industry. Int. J. Inf. Manag. Elsevier 49(C), 330\u2013342 (2019). https:\/\/doi.org\/10.1016\/j.ijinfomgt.2019.06.002","key":"23_CR2","DOI":"10.1016\/j.ijinfomgt.2019.06.002"},{"doi-asserted-by":"crossref","unstructured":"Dolgui, A., Ivanov, D., Sokolov, B.: Reconfigurable supply chain: the X-network. Int. J. Prod. Res. 58(13), 4138\u20134163 (2020)","key":"23_CR3","DOI":"10.1080\/00207543.2020.1774679"},{"key":"23_CR4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2023.109045","volume":"177","author":"J Zipfel","year":"2023","unstructured":"Zipfel, J., Verworner, F., Fischer, M., Wieland, U., Kraus, M., Zschech, P.: Anomaly detection for industrial quality assurance: a comparative evaluation of unsupervised deep learning models. Comput. Indust. Eng. 177, 109045 (2023). https:\/\/doi.org\/10.1016\/j.cie.2023.109045","journal-title":"Comput. Indust. Eng."},{"doi-asserted-by":"crossref","unstructured":"Chevtchenko, S.F., et al.: Anomaly detection in industrial machinery using IoT devices and machine learning: a systematic mapping. IEEE Access 11, 128288\u2013128305 (2023)","key":"23_CR5","DOI":"10.1109\/ACCESS.2023.3333242"},{"doi-asserted-by":"publisher","unstructured":"Gra\u00df, A., Beecks, C., Soto, J.A.C.: Unsupervised anomaly detection in production lines. In: Beyerer, J., K\u00fchnert, C., Niggemann, O. (eds.) .Machine learning for cyber physical systems. technologien f\u00fcr die intelligente automation, vol. 9. Springer, Heidelberg (2019). https:\/\/doi.org\/10.1007\/978-3-662-58485-9_3","key":"23_CR6","DOI":"10.1007\/978-3-662-58485-9_3"},{"doi-asserted-by":"publisher","unstructured":"Abdelrahman, O., Keikhosrokiani, P.: Assembly line anomaly detection and root cause analysis using machine learning. IEEE Access 8, 189661\u2013189672 (2020). https:\/\/doi.org\/10.1109\/ACCESS.2020.3029826","key":"23_CR7","DOI":"10.1109\/ACCESS.2020.3029826"},{"issue":"2","key":"23_CR8","first-page":"117","volume":"7","author":"D Massa","year":"2014","unstructured":"Massa, D., Valverde, R.: A fraud detection system based on anomaly intrusion detection systems for E-commerce applications. Comput. Inf. Sci. 7(2), 117\u2013140 (2014)","journal-title":"Comput. Inf. Sci."},{"issue":"1\u20132","key":"23_CR9","doi-asserted-by":"publisher","first-page":"18","DOI":"10.1016\/j.cose.2008.08.003","volume":"28","author":"P Garc\u00eda-Teodoro","year":"2009","unstructured":"Garc\u00eda-Teodoro, P., D\u00edaz-Verdejo, J., Maci\u00e1-Fern\u00e1ndez, G., V\u00e1zquez, E.: Anomaly-based network intrusion detection: techniques, systems, and challenges. Comput. Secur. 28(1\u20132), 18\u201328 (2009)","journal-title":"Comput. Secur."},{"key":"23_CR10","doi-asserted-by":"publisher","DOI":"10.1016\/j.dss.2020.113303","volume":"133","author":"T Pourhabibi","year":"2020","unstructured":"Pourhabibi, T., Ong, K.-L., Kam, B.H., Boo, Y.L.: Fraud detection: a systematic literature review of graph-based anomaly detection approaches. Decis. Support Syst. 133, 113303 (2020)","journal-title":"Decis. Support Syst."},{"issue":"12","key":"23_CR11","doi-asserted-by":"publisher","first-page":"2481","DOI":"10.1016\/j.sigpro.2003.07.018","volume":"83","author":"M Markou","year":"2003","unstructured":"Markou, M., Singh, S.: Novelty detection: a review - part 1: statistical approaches. Signal Process. 83(12), 2481\u20132497 (2003)","journal-title":"Signal Process."},{"issue":"3","key":"23_CR12","doi-asserted-by":"publisher","first-page":"15","DOI":"10.1145\/1541880.1541882","volume":"41","author":"V Chandola","year":"2009","unstructured":"Chandola, V., Banerjee, A., Kumar, V.: Anomaly detection: a survey. ACM Comput. Surv. 41(3), 15 (2009)","journal-title":"ACM Comput. Surv."},{"doi-asserted-by":"publisher","unstructured":"Mehrotra, K., Mohan, C., Huang, H.: Anomaly Detection Principles and Algorithms. Springer, Cham (2017). https:\/\/doi.org\/10.1007\/978-3-319-67526-8. Corpus ID: 11903501","key":"23_CR13","DOI":"10.1007\/978-3-319-67526-8"},{"doi-asserted-by":"publisher","unstructured":"Scrivano, S., Tolio, T.: A Markov chain model for the performance evaluation of manufacturing lines with general processing times. Procedia CIRP 103(7), 20\u201325 (2021). https:\/\/doi.org\/10.1016\/j.procir.2021.10.002","key":"23_CR14","DOI":"10.1016\/j.procir.2021.10.002"},{"issue":"1","key":"23_CR15","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1145\/2133360.2133363","volume":"6","author":"FT Liu","year":"2012","unstructured":"Liu, F.T., Ting, K.M., Zhou, Z.H.: Isolation-based anomaly detection. ACM Trans. Knowl. Discov. Data 6(1), 3 (2012)","journal-title":"ACM Trans. Knowl. Discov. Data"},{"doi-asserted-by":"crossref","unstructured":"Cortes, C., Vapnik, V.: Support-vector networks. Mach. Learn. 20(3), 273\u2013297 (1995)","key":"23_CR16","DOI":"10.1007\/BF00994018"},{"unstructured":"Tschannen, M., Bachem, O., Lucic, M.: Recent advances in autoencoder-based representation learning. Computer Science Machine Learning. arXiv preprint arXiv:1812.05069 (2018)","key":"23_CR17"},{"unstructured":"Grant, E.L., Leavenworth, R.S.: Statistical Quality Control. McGraw-Hill Education (2018)","key":"23_CR18"}],"container-title":["IFIP Advances in Information and Communication Technology","Advances in Production Management Systems. Production Management Systems for Volatile, Uncertain, Complex, and Ambiguous Environments"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-71637-9_23","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T21:05:57Z","timestamp":1725743157000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-71637-9_23"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9783031716362","9783031716379"],"references-count":18,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-71637-9_23","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"8 September 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"The authors affirm that this article is original, unpublished, and not under consideration elsewhere. They have reviewed and approved the manuscript and declare no conflicts of interest.","order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Disclosure of Interests"}},{"value":"APMS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"IFIP International Conference on Advances in Production Management Systems","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Chemnitz","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Germany","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 September 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 September 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"43","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"apms2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/www.apms-conference.org","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}