{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T10:12:35Z","timestamp":1780395155042,"version":"3.54.1"},"publisher-location":"Cham","reference-count":70,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031730290","type":"print"},{"value":"9783031730306","type":"electronic"}],"license":[{"start":{"date-parts":[[2024,11,24]],"date-time":"2024-11-24T00:00:00Z","timestamp":1732406400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,11,24]],"date-time":"2024-11-24T00:00:00Z","timestamp":1732406400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025]]},"DOI":"10.1007\/978-3-031-73030-6_8","type":"book-chapter","created":{"date-parts":[[2024,11,25]],"date-time":"2024-11-25T16:58:45Z","timestamp":1732553925000},"page":"129-147","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["ProSub: Probabilistic Open-Set Semi-supervised Learning with\u00a0Subspace-Based Out-of-Distribution Detection"],"prefix":"10.1007","author":[{"given":"Erik","family":"Wallin","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lennart","family":"Svensson","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fredrik","family":"Kahl","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lars","family":"Hammarstrand","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2024,11,24]]},"reference":[{"key":"8_CR1","unstructured":"ImageNet100. https:\/\/www.kaggle.com\/datasets\/ambityga\/imagenet100\/. Accessed 01 Mar 2024"},{"key":"8_CR2","unstructured":"Ammar, M.B., Belkhir, N., Popescu, S., Manzanera, A., Franchi, G.: Neco: neural collapse based out-of-distribution detection. In: International Conference on Learning Representations (2024)"},{"key":"8_CR3","unstructured":"Beckman, R., Tiet\u00a0jen, G.: Maximum likelihood estimation for the beta distribution. J. Stat. Comput. Simul. 72(2), 107\u2013118 (1978)"},{"key":"8_CR4","doi-asserted-by":"crossref","unstructured":"Bendale, A., Boult, T.E.: Towards open set deep networks. In: IEEE Conference on Computer Vision and Pattern Recognition (2016)","DOI":"10.1109\/CVPR.2016.173"},{"key":"8_CR5","unstructured":"Berthelot, D., et al.: ReMixMatch: semi-supervised learning with distribution matching and augmentation anchoring. In: International Conference on Learning Representations (2020)"},{"key":"8_CR6","unstructured":"Cao, K., Brbic, M., Leskovec, J.: Open-world semi-supervised learning. In: International Conference on Learning Representations (2022)"},{"key":"8_CR7","doi-asserted-by":"crossref","unstructured":"Chen, Y., Zhu, X., Li, W., Gong, S.: Semi-supervised learning under class distribution mismatch. In: AAAI Conference on Artificial Intelligence (2020)","DOI":"10.1609\/aaai.v34i04.5763"},{"key":"8_CR8","doi-asserted-by":"crossref","unstructured":"Cubuk, E.D., Zoph, B., Shlens, J., Le, Q.V.: RandAugment: practical automated data augmentation with a reduced search space. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition Workshops (2020)","DOI":"10.1109\/CVPRW50498.2020.00359"},{"key":"8_CR9","doi-asserted-by":"crossref","unstructured":"Dempster, A.P., Laird, N.M., Rubin, D.B.: Maximum likelihood from incomplete data via the EM algorithm. J. R. Stat. Soc. ser. B (methodological) 39(1), 1\u201338 (1977)","DOI":"10.1111\/j.2517-6161.1977.tb01600.x"},{"key":"8_CR10","unstructured":"DeVries, T., Taylor, G.W.: Improved regularization of convolutional neural networks with cutout. arXiv preprint arXiv:1708.04552 (2017)"},{"key":"8_CR11","doi-asserted-by":"crossref","unstructured":"Fan, Y., Kukleva, A., Dai, D., Schiele, B.: SSB: simple but strong baseline for boosting performance of open-set semi-supervised learning. In: IEEE\/CVF International Conference on Computer Vision (ICCV) (2023)","DOI":"10.1109\/ICCV51070.2023.01472"},{"key":"8_CR12","doi-asserted-by":"crossref","unstructured":"Golub, G.H., Van\u00a0Loan, C.F.: Matrix Computations. JHU Press (2013)","DOI":"10.56021\/9781421407944"},{"key":"8_CR13","unstructured":"Guo, L.Z., Zhang, Z.Y., Jiang, Y., Li, Y.F., Zhou, Z.H.: Safe deep semi-supervised learning for unseen-class unlabeled data. In: International Conference on Machine Learning (2020)"},{"key":"8_CR14","unstructured":"Han, L., Ye, H.J., Zhan, D.C.: On pseudo-labeling for class-mismatch semi-supervised learning. Transactions on Machine Learning Research (2022)"},{"key":"8_CR15","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: IEEE Conference on Computer Vision and Pattern Recognition (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"8_CR16","doi-asserted-by":"crossref","unstructured":"He, R., Han, Z., Lu, X., Yin, Y.: Safe-student for safe deep semi-supervised learning with unseen-class unlabeled data. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2022)","DOI":"10.1109\/CVPR52688.2022.01418"},{"key":"8_CR17","doi-asserted-by":"crossref","unstructured":"He, R., Han, Z., Yang, Y., Yin, Y.: Not all parameters should be treated equally: deep safe semi-supervised learning under class distribution mismatch. In: AAAI Conference on Artificial Intelligence (2022)","DOI":"10.1609\/aaai.v36i6.20644"},{"key":"8_CR18","unstructured":"Hendrycks, D., Gimpel, K.: A baseline for detecting misclassified and out-of-distribution examples in neural networks. In: International Conference on Learning Representations (2017)"},{"key":"8_CR19","unstructured":"Hendrycks, D., Mazeika, M., Dietterich, T.: Deep anomaly detection with outlier exposure. In: International Conference on Learning Representations (2019)"},{"key":"8_CR20","doi-asserted-by":"crossref","unstructured":"Huang, J., et al.: Trash to treasure: Harvesting OOD data with cross-modal matching for open-set semi-supervised learning. In: IEEE\/CVF International Conference on Computer Vision (2021)","DOI":"10.1109\/ICCV48922.2021.00820"},{"key":"8_CR21","unstructured":"Huang, Z., Sidhom, M.J., Wessler, B., Hughes, M.C.: Fix-a-step: semi-supervised learning from uncurated unlabeled data. In: International Conference on Artificial Intelligence and Statistics (2023)"},{"key":"8_CR22","doi-asserted-by":"crossref","unstructured":"Huang, Z., Yang, J., Gong, C.: They are not completely useless: towards recycling transferable unlabeled data for class-mismatched semi-supervised learning. IEEE Trans. Multimedia 25, 1844\u20131857 (2022)","DOI":"10.1109\/TMM.2022.3179895"},{"key":"8_CR23","unstructured":"Johnson, N.L., Kotz, S., Balakrishnan, N.: Continuous univariate distributions, volume 2 (1995)"},{"key":"8_CR24","unstructured":"Kim, J., Hur, Y., Park, S., Yang, E., Hwang, S.J., Shin, J.: Distribution aligning refinery of pseudo-label for imbalanced semi-supervised learning. In: Advances in Neural Information Processing Systems (2020)"},{"key":"8_CR25","volume-title":"Learning multiple layers of features from tiny images","author":"A Krizhevsky","year":"2009","unstructured":"Krizhevsky, A., Hinton, G.: Learning multiple layers of features from tiny images. University of Toronto, Tech. rep. (2009)"},{"key":"8_CR26","doi-asserted-by":"crossref","unstructured":"Kurita, T., Otsu, N., Abdelmalek, N.: Maximum likelihood thresholding based on population mixture models. Pattern Recogn. 25(10), 1231\u20131240 (1992)","DOI":"10.1016\/0031-3203(92)90024-D"},{"key":"8_CR27","unstructured":"Laine, S., Aila, T.: Temporal ensembling for semi-supervised learning. In: International Conference on Learning Representations (2017)"},{"key":"8_CR28","unstructured":"Lakshminarayanan, B., Pritzel, A., Blundell, C.: Simple and scalable predictive uncertainty estimation using deep ensembles. In: Advances in Neural Information Processing Systems (2017)"},{"key":"8_CR29","unstructured":"Le, Y., Yang, X.S.: Tiny ImageNet visual recognition challenge (2015)"},{"key":"8_CR30","unstructured":"Lee, D.H., et\u00a0al.: Pseudo-label: the simple and efficient semi-supervised learning method for deep neural networks. In: Workshop on Challenges in Representation Learning, ICML (2013)"},{"key":"8_CR31","unstructured":"Lee, K., Lee, K., Lee, H., Shin, J.: A simple unified framework for detecting out-of-distribution samples and adversarial attacks. In: Advances in Neural Information Processing Systems (2018)"},{"key":"8_CR32","doi-asserted-by":"crossref","unstructured":"Li, Z., Qi, L., Shi, Y., Gao, Y.: IOMatch: simplifying open-set semi-supervised learning with joint inliers and outliers utilization. In: IEEE\/CVF International Conference on Computer Vision (ICCV) (2023)","DOI":"10.1109\/ICCV51070.2023.01454"},{"key":"8_CR33","unstructured":"Liang, S., Li, Y., Srikant, R.: Enhancing the reliability of out-of-distribution image detection in neural networks. In: The International Conference on Learning Representations (2018)"},{"key":"8_CR34","doi-asserted-by":"crossref","unstructured":"Liu, J., Wang, Y., Zhang, T., Fan, Y., Yang, Q., Shao, J.: Open-world semi-supervised novel class discovery. In: International Joint Conference on Artificial Intelligence (2023)","DOI":"10.24963\/ijcai.2023\/445"},{"key":"8_CR35","unstructured":"Liu, W., Wang, X., Owens, J., Li, Y.: Energy-based out-of-distribution detection. In: Advances in Neural Information Processing Systems (2020)"},{"key":"8_CR36","doi-asserted-by":"crossref","unstructured":"Liu, X., Lochman, Y., Zach, C.: GEN: pushing the limits of softmax-based out-of-distribution detection. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2023)","DOI":"10.1109\/CVPR52729.2023.02293"},{"key":"8_CR37","doi-asserted-by":"crossref","unstructured":"Ma, Q., Gao, J., Zhan, B., Guo, Y., Zhou, J., Wang, Y.: Rethinking safe semi-supervised learning: Transferring the open-set problem to a close-set one. In: IEEE\/CVF International Conference on Computer Vision (ICCV) (2023)","DOI":"10.1109\/ICCV51070.2023.01500"},{"key":"8_CR38","unstructured":"Ming, Y., Sun, Y., Dia, O., Li, Y.: How to exploit hyperspherical embeddings for out-of-distribution detection? In: The International Conference on Learning Representations (2023)"},{"key":"8_CR39","unstructured":"Mo, S., et al.: RoPAWS: robust semi-supervised representation learning from uncurated data. In: International Conference on Learning Representations (2023)"},{"key":"8_CR40","doi-asserted-by":"crossref","unstructured":"Nassar, I., Hayat, M., Abbasnejad, E., Rezatofighi, H., Haffari, G.: ProtoCon: pseudo-label refinement via online clustering and prototypical consistency for efficient semi-supervised learning. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2023)","DOI":"10.1109\/CVPR52729.2023.01120"},{"key":"8_CR41","doi-asserted-by":"crossref","unstructured":"Otsu, N.: A threshold selection method from gray-level histograms. IEEE Trans. Syst. Man Cybern. 9(1), 62\u201366 (1979)","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"8_CR42","doi-asserted-by":"crossref","unstructured":"Papyan, V., Han, X., Donoho, D.L.: Prevalence of neural collapse during the terminal phase of deep learning training. Proc. Nat. Acad. Sci. 117(40), 24652\u201324663 (2020)","DOI":"10.1073\/pnas.2015509117"},{"key":"8_CR43","doi-asserted-by":"crossref","unstructured":"Park, J., Yun, S., Jeong, J., Shin, J.: OpenCoS: contrastive semi-supervised learning for handling open-set unlabeled data. In: European Conference on Computer Vision (2022)","DOI":"10.1007\/978-3-031-25063-7_9"},{"key":"8_CR44","unstructured":"Rasmus, A., Berglund, M., Honkala, M., Valpola, H., Raiko, T.: Semi-supervised learning with ladder networks. In: Advances in Neural Information Processing Systems (2015)"},{"key":"8_CR45","doi-asserted-by":"crossref","unstructured":"Rizve, M.N., Kardan, N., Khan, S., Shahbaz\u00a0Khan, F., Shah, M.: OpenLDN: learning to discover novel classes for open-world semi-supervised learning. In: European Conference on Computer Vision (2022)","DOI":"10.1007\/978-3-031-19821-2_22"},{"key":"8_CR46","doi-asserted-by":"crossref","unstructured":"Rizve, M.N., Kardan, N., Shah, M.: Towards realistic semi-supervised learning. In: European Conference on Computer Vision (2022)","DOI":"10.1007\/978-3-031-19821-2_25"},{"key":"8_CR47","unstructured":"Saito, K., Kim, D., Saenko, K.: OpenMatch: open-set semi-supervised learning with open-set consistency regularization. In: Advances in Neural Information Processing Systems (2021)"},{"key":"8_CR48","doi-asserted-by":"crossref","unstructured":"Scheirer, W.J., de\u00a0Rezende\u00a0Rocha, A., Sapkota, A., Boult, T.E.: Toward open set recognition. IEEE Trans. Pattern Anal. Mach. Intell. 35(7), 1757\u20131772 (2012)","DOI":"10.1109\/TPAMI.2012.256"},{"key":"8_CR49","doi-asserted-by":"crossref","unstructured":"Schr\u00f6der, C., Rahmann, S.: A hybrid parameter estimation algorithm for beta mixtures and applications to methylation state classification. Algorithms Mol. Biol. 12, 21 (2017)","DOI":"10.1186\/s13015-017-0112-1"},{"key":"8_CR50","unstructured":"Sehwag, V., Chiang, M., Mittal, P.: SSD: a unified framework for self-supervised outlier detection. In: The International Conference on Learning Representations (2021)"},{"key":"8_CR51","unstructured":"Sohn, K., et al.: FixMatch: simplifying semi-supervised learning with consistency and confidence. In: Advances in Neural Information Processing Systems (2020)"},{"key":"8_CR52","unstructured":"Sun, Y., Ming, Y., Zhu, X., Li, Y.: Out-of-distribution detection with deep nearest neighbors. In: International Conference on Machine Learning (2022)"},{"key":"8_CR53","unstructured":"Tarvainen, A., Valpola, H.: Mean teachers are better role models: weight-averaged consistency targets improve semi-supervised deep learning results. In: Advances in Neural Information Processing Systems (2017)"},{"key":"8_CR54","unstructured":"Vaze, S., Han, K., Vedaldi, A., Zisserman, A.: Open-set recognition: a good closed-set classifier is all you need. In: International Conference on Learning Representations (2022)"},{"key":"8_CR55","doi-asserted-by":"crossref","unstructured":"Wallin, E., Svensson, L., Kahl, F., Hammarstrand, L.: DoubleMatch: improving semi-supervised learning with self-supervision. In: International Conference on Pattern Recognition (2022)","DOI":"10.1109\/ICPR56361.2022.9956182"},{"key":"8_CR56","doi-asserted-by":"crossref","unstructured":"Wallin, E., Svensson, L., Kahl, F., Hammarstrand, L.: Improving open-set semi-supervised learning with self-supervision. In: IEEE\/CVF Winter Conference on Applications of Computer Vision (2024)","DOI":"10.1109\/WACV57701.2024.00235"},{"key":"8_CR57","doi-asserted-by":"crossref","unstructured":"Wang, H., Li, Z., Feng, L., Zhang, W.: ViM: out-of-distribution with virtual-logit matching. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2022)","DOI":"10.1109\/CVPR52688.2022.00487"},{"key":"8_CR58","unstructured":"Wang, J., Lukasiewicz, T., Massiceti, D., Hu, X., Pavlovic, V., Neophytou, A.: NP-match: When neural processes meet semi-supervised learning. In: International Conference on Machine Learning (2022)"},{"key":"8_CR59","unstructured":"Wang, Y., et al.: FreeMatch: self-adaptive thresholding for semi-supervised learning. In: International Conference on Learning Representations (2023)"},{"key":"8_CR60","doi-asserted-by":"crossref","unstructured":"Wang, Y., Qiao, P., Liu, C., Song, G., Zheng, X., Chen, J.: Out-of-distributed semantic pruning for robust semi-supervised learning. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2023)","DOI":"10.1109\/CVPR52729.2023.02284"},{"key":"8_CR61","doi-asserted-by":"crossref","unstructured":"Wei, C., Sohn, K., Mellina, C., Yuille, A., Yang, F.: CReST: a class-rebalancing self-training framework for imbalanced semi-supervised learning. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2021)","DOI":"10.1109\/CVPR46437.2021.01071"},{"key":"8_CR62","doi-asserted-by":"crossref","unstructured":"Wei, T., Gan, K.: Towards realistic long-tailed semi-supervised learning: consistency is all you need. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2023)","DOI":"10.1109\/CVPR52729.2023.00338"},{"key":"8_CR63","unstructured":"Xie, Q., Dai, Z., Hovy, E., Luong, T., Le, Q.: Unsupervised data augmentation for consistency training. In: Advances in Neural Information Processing Systems (2020)"},{"key":"8_CR64","unstructured":"Xu, Y., et al.: Dash: semi-supervised learning with dynamic thresholding. In: International Conference on Machine Learning (2021)"},{"key":"8_CR65","doi-asserted-by":"crossref","unstructured":"Yang, F., et al.: Class-aware contrastive semi-supervised learning. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2022)","DOI":"10.1109\/CVPR52688.2022.01402"},{"key":"8_CR66","doi-asserted-by":"crossref","unstructured":"Yu, Q., Ikami, D., Irie, G., Aizawa, K.: Multi-task curriculum framework for open-set semi-supervised learning. In: European Conference on Computer Vision (2020)","DOI":"10.1007\/978-3-030-58610-2_26"},{"key":"8_CR67","doi-asserted-by":"crossref","unstructured":"Zagoruyko, S., Komodakis, N.: Wide residual networks. In: British Machine Vision Conference (BMVC) (2016)","DOI":"10.5244\/C.30.87"},{"key":"8_CR68","unstructured":"Zhang, B., et al.: FlexMatch: boosting semi-supervised learning with curriculum pseudo labeling. In: Advances in Neural Information Processing Systems (2021)"},{"key":"8_CR69","doi-asserted-by":"crossref","unstructured":"Zhao, X., Krishnateja, K., Iyer, R., Chen, F.: How out-of-distribution data hurts semi-supervised learning. In: 2022 IEEE International Conference on Data Mining (ICDM) (2022)","DOI":"10.1109\/ICDM54844.2022.00087"},{"key":"8_CR70","doi-asserted-by":"crossref","unstructured":"Zheng, M., You, S., Huang, L., Wang, F., Qian, C., Xu, C.: SimMatch: semi-supervised learning with similarity matching. In: IEEE\/CVF Conference on Computer Vision and Pattern Recognition (2022)","DOI":"10.1109\/CVPR52688.2022.01407"}],"container-title":["Lecture Notes in Computer Science","Computer Vision \u2013 ECCV 2024"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-73030-6_8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,25]],"date-time":"2024-11-25T17:13:00Z","timestamp":1732554780000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-73030-6_8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,24]]},"ISBN":["9783031730290","9783031730306"],"references-count":70,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-73030-6_8","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11,24]]},"assertion":[{"value":"24 November 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ECCV","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"European Conference on Computer Vision","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Milan","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"29 September 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4 October 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"eccv2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/eccv2024.ecva.net\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}