{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T23:18:25Z","timestamp":1743117505069,"version":"3.40.3"},"publisher-location":"Cham","reference-count":28,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031783883"},{"type":"electronic","value":"9783031783890"}],"license":[{"start":{"date-parts":[[2024,12,5]],"date-time":"2024-12-05T00:00:00Z","timestamp":1733356800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,12,5]],"date-time":"2024-12-05T00:00:00Z","timestamp":1733356800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025]]},"DOI":"10.1007\/978-3-031-78389-0_9","type":"book-chapter","created":{"date-parts":[[2024,12,4]],"date-time":"2024-12-04T14:14:59Z","timestamp":1733321699000},"page":"126-139","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["MSDNet: A Multi-scale Dense Network for Chip Surface Defect Segmentation"],"prefix":"10.1007","author":[{"given":"Xiaoyang","family":"Yu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziyi","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guanwen","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,12,5]]},"reference":[{"issue":"12","key":"9_CR1","doi-asserted-by":"publisher","first-page":"2481","DOI":"10.1109\/TPAMI.2016.2644615","volume":"39","author":"V Badrinarayanan","year":"2017","unstructured":"Badrinarayanan, V., Kendall, A., Cipolla, R.: Segnet: A deep convolutional encoder-decoder architecture for image segmentation. IEEE Trans. Pattern Anal. Mach. Intell. 39(12), 2481\u20132495 (2017)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"2","key":"9_CR2","doi-asserted-by":"publisher","first-page":"163","DOI":"10.1109\/TSM.2019.2902657","volume":"32","author":"S Cheon","year":"2019","unstructured":"Cheon, S., Lee, H., Kim, C.O., Lee, S.H.: Convolutional neural network for wafer surface defect classification and the detection of unknown defect class. IEEE Trans. Semicond. Manuf. 32(2), 163\u2013170 (2019)","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"9_CR3","doi-asserted-by":"crossref","unstructured":"Fang, J., Tan, X., Wang, Y.: Acrm: Attention cascade r-cnn with mix-nms for metallic surface defect detection. In: 2020 25th International Conference on Pattern Recognition (ICPR). pp. 423\u2013430. IEEE (2021)","DOI":"10.1109\/ICPR48806.2021.9412424"},{"key":"9_CR4","doi-asserted-by":"crossref","unstructured":"Fang, Z., Wang, X., Li, H., Liu, J., Hu, Q., Xiao, J.: Fastrecon: Few-shot industrial anomaly detection via fast feature reconstruction. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision. pp. 17481\u201317490 (2023)","DOI":"10.1109\/ICCV51070.2023.01603"},{"key":"9_CR5","first-page":"1","volume":"71","author":"K Hao","year":"2022","unstructured":"Hao, K., Chen, G., Zhao, L., Li, Z., Liu, Y., Wang, C.: An insulator defect detection model in aerial images based on multiscale feature pyramid network. IEEE Trans. Instrum. Meas. 71, 1\u201312 (2022)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9_CR6","doi-asserted-by":"crossref","unstructured":"Hittawe, M.M., Muddamsetty, S.M., Sidib\u00e9, D., M\u00e9riaudeau, F.: Multiple features extraction for timber defects detection and classification using svm. In: 2015 IEEE International Conference on Image Processing (ICIP). pp. 427\u2013431. IEEE (2015)","DOI":"10.1109\/ICIP.2015.7350834"},{"key":"9_CR7","doi-asserted-by":"crossref","unstructured":"Kirillov, A., Mintun, E., Ravi, N., Mao, H., Rolland, C., Gustafson, L., Xiao, T., Whitehead, S., Berg, A.C., Lo, W.Y., et\u00a0al.: Segment anything. arXiv preprint arXiv:2304.02643 (2023)","DOI":"10.1109\/ICCV51070.2023.00371"},{"key":"9_CR8","doi-asserted-by":"crossref","unstructured":"Lei, J., Hu, X., Wang, Y., Liu, D.: Pyramidflow: High-resolution defect contrastive localization using pyramid normalizing flow. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition. pp. 14143\u201314152 (2023)","DOI":"10.1109\/CVPR52729.2023.01359"},{"key":"9_CR9","doi-asserted-by":"crossref","unstructured":"Li, C.L., Sohn, K., Yoon, J., Pfister, T.: Cutpaste: Self-supervised learning for anomaly detection and localization. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. pp. 9664\u20139674 (2021)","DOI":"10.1109\/CVPR46437.2021.00954"},{"issue":"3","key":"9_CR10","doi-asserted-by":"publisher","first-page":"346","DOI":"10.1109\/TSM.2021.3076808","volume":"34","author":"BS Lin","year":"2021","unstructured":"Lin, B.S., Cheng, J.S., Liao, H.C., Yang, L.W., Yang, T., Chen, K.C.: Improvement of multi-lines bridge defect classification by hierarchical architecture in artificial intelligence automatic defect classification. IEEE Trans. Semicond. Manuf. 34(3), 346\u2013351 (2021)","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"9_CR11","doi-asserted-by":"crossref","unstructured":"Lin, D., Li, Y., Prasad, S., Nwe, T.L., Dong, S., Oo, Z.M.: Cam-unet: Class activation map guided unet with feedback refinement for defect segmentation. In: 2020 IEEE International Conference on Image Processing (ICIP). pp. 2131\u20132135. IEEE (2020)","DOI":"10.1109\/ICIP40778.2020.9190900"},{"key":"9_CR12","doi-asserted-by":"crossref","unstructured":"Lin, T.Y., Goyal, P., Girshick, R., He, K., Doll\u00e1r, P.: Focal loss for dense object detection. In: Proceedings of the IEEE international conference on computer vision. pp. 2980\u20132988 (2017)","DOI":"10.1109\/ICCV.2017.324"},{"key":"9_CR13","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2022.3219307","volume":"71","author":"T Liu","year":"2022","unstructured":"Liu, T., He, Z.: Tas 2-net: Triple-attention semantic segmentation network for small surface defect detection. IEEE Trans. Instrum. Meas. 71, 1\u201312 (2022)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9_CR14","doi-asserted-by":"crossref","unstructured":"Liu, W., Anguelov, D., Erhan, D., Szegedy, C., Reed, S., Fu, C.Y., Berg, A.C.: Ssd: Single shot multibox detector. In: Computer Vision\u2013ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11\u201314, 2016, Proceedings, Part I 14. pp. 21\u201337. Springer (2016)","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"9_CR15","doi-asserted-by":"crossref","unstructured":"Long, J., Shelhamer, E., Darrell, T.: Fully convolutional networks for semantic segmentation. In: Proceedings of the IEEE conference on computer vision and pattern recognition. pp. 3431\u20133440 (2015)","DOI":"10.1109\/CVPR.2015.7298965"},{"key":"9_CR16","doi-asserted-by":"crossref","unstructured":"Milletari, F., Navab, N., Ahmadi, S.A.: V-net: Fully convolutional neural networks for volumetric medical image segmentation. In: 2016 fourth international conference on 3D vision (3DV). pp. 565\u2013571. Ieee (2016)","DOI":"10.1109\/3DV.2016.79"},{"key":"9_CR17","doi-asserted-by":"crossref","unstructured":"Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: Unified, real-time object detection. In: Proceedings of the IEEE conference on computer vision and pattern recognition. pp. 779\u2013788 (2016)","DOI":"10.1109\/CVPR.2016.91"},{"key":"9_CR18","unstructured":"Redmon, J., Farhadi, A.: Yolov3: An incremental improvement. arXiv preprint arXiv:1804.02767 (2018)"},{"key":"9_CR19","unstructured":"Ren, S., He, K., Girshick, R., Sun, J.: Faster r-cnn: Towards real-time object detection with region proposal networks. Advances in neural information processing systems 28 (2015)"},{"key":"9_CR20","doi-asserted-by":"crossref","unstructured":"Ronneberger, O., Fischer, P., Brox, T.: U-net: Convolutional networks for biomedical image segmentation. In: Medical Image Computing and Computer-Assisted Intervention\u2013MICCAI 2015: 18th International Conference, Munich, Germany, October 5-9, 2015, Proceedings, Part III 18. pp. 234\u2013241. Springer (2015)","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"9_CR21","doi-asserted-by":"crossref","unstructured":"Rudack, A.C., Kong, L.W., Baker, G.G.: Infrared microscopy for overlay and defect metrology on 3d-interconnect bonded wafers. In: 2010 IEEE\/SEMI Advanced Semiconductor Manufacturing Conference (ASMC). pp. 347\u2013352. IEEE (2010)","DOI":"10.1109\/ASMC.2010.5551481"},{"key":"9_CR22","doi-asserted-by":"crossref","unstructured":"Sari, L., Ert\u00fcz\u00fcn, A.: Texture defect detection using independent vector analysis in wavelet domain. In: 2014 22nd International Conference on Pattern Recognition. pp. 1639\u20131644. IEEE (2014)","DOI":"10.1109\/ICPR.2014.290"},{"key":"9_CR23","doi-asserted-by":"crossref","unstructured":"Wang, T., Zhang, C., Ding, R., Yang, G.: Mobile phone surface defect detection based on improved faster r-cnn. In: 2020 25th International Conference on Pattern Recognition (ICPR). pp. 9371\u20139377. IEEE (2021)","DOI":"10.1109\/ICPR48806.2021.9412119"},{"key":"9_CR24","doi-asserted-by":"crossref","unstructured":"Woo, S., Park, J., Lee, J.Y., Kweon, I.S.: Cbam: Convolutional block attention module. In: Proceedings of the European conference on computer vision (ECCV). pp. 3\u201319 (2018)","DOI":"10.1007\/978-3-030-01234-2_1"},{"issue":"4","key":"9_CR25","doi-asserted-by":"publisher","first-page":"1836","DOI":"10.1109\/TASE.2019.2900170","volume":"16","author":"Q Xie","year":"2019","unstructured":"Xie, Q., Li, D., Xu, J., Yu, Z., Wang, J.: Automatic detection and classification of sewer defects via hierarchical deep learning. IEEE Trans. Autom. Sci. Eng. 16(4), 1836\u20131847 (2019)","journal-title":"IEEE Trans. Autom. Sci. Eng."},{"key":"9_CR26","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2022.3220285","volume":"71","author":"L Yang","year":"2022","unstructured":"Yang, L., Zhou, F., Wang, L.: A scratch detection method based on deep learning and image segmentation. IEEE Trans. Instrum. Meas. 71, 1\u201312 (2022)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9_CR27","doi-asserted-by":"crossref","unstructured":"Yi-de, M., Qing, L., Zhi-Bai, Q.: Automated image segmentation using improved pcnn model based on cross-entropy. In: Proceedings of 2004 International Symposium on Intelligent Multimedia, Video and Speech Processing, 2004. pp. 743\u2013746. IEEE (2004)","DOI":"10.1109\/ISIMP.2004.1434171"},{"key":"9_CR28","doi-asserted-by":"crossref","unstructured":"Zhao, H., Shi, J., Qi, X., Wang, X., Jia, J.: Pyramid scene parsing network. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (July 2017)","DOI":"10.1109\/CVPR.2017.660"}],"container-title":["Lecture Notes in Computer Science","Pattern Recognition"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-78389-0_9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,4]],"date-time":"2024-12-04T15:05:57Z","timestamp":1733324757000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-78389-0_9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,5]]},"ISBN":["9783031783883","9783031783890"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-78389-0_9","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2024,12,5]]},"assertion":[{"value":"5 December 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICPR","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Pattern Recognition","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Kolkata","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"1 December 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5 December 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icpr2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/icpr2024.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}