{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T02:04:30Z","timestamp":1742954670060,"version":"3.40.3"},"publisher-location":"Cham","reference-count":12,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031840999"},{"type":"electronic","value":"9783031841002"}],"license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025]]},"DOI":"10.1007\/978-3-031-84100-2_18","type":"book-chapter","created":{"date-parts":[[2025,3,8]],"date-time":"2025-03-08T00:01:18Z","timestamp":1741392078000},"page":"148-155","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Rocket Payload Demonstrator for Real-Time Fault Detection of Pressure Sensors Based on Redundancy and Machine Learning"],"prefix":"10.1007","author":[{"given":"Vincenzo","family":"Tirolese","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Donadi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Federico","family":"Disar\u00f2","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marco","family":"Carminati","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2025,3,8]]},"reference":[{"key":"18_CR1","doi-asserted-by":"publisher","first-page":"1027","DOI":"10.1109\/TVT.2016.2556691","volume":"66","author":"J Zhang","year":"2017","unstructured":"Zhang, J., Yao, H., Rizzoni, G.: Fault Diagnosis for Electric Drive Systems of Electrified Vehicles Based on Structural Analysis. IEEE Trans. Veh. Technol. 66, 1027\u20131039 (2017). https:\/\/doi.org\/10.1109\/TVT.2016.2556691.","journal-title":"IEEE Trans. Veh. Technol."},{"key":"18_CR2","doi-asserted-by":"publisher","first-page":"2984","DOI":"10.1109\/JSEN.2012.2204976","volume":"12","author":"M Carminati","year":"2012","unstructured":"Carminati, M., Ferrari, G., Grassetti, R., Sampietro, M.: Real-Time Data Fusion and MEMS Sensors Fault Detection in an Aircraft Emergency Attitude Unit Based on Kalman Filtering. IEEE Sensors J. 12, 2984\u20132992 (2012). https:\/\/doi.org\/10.1109\/JSEN.2012.2204976.","journal-title":"IEEE Sensors J."},{"key":"18_CR3","doi-asserted-by":"publisher","first-page":"2522","DOI":"10.1109\/JSEN.2022.3227713","volume":"23","author":"H Darvishi","year":"2023","unstructured":"Darvishi, H., Ciuonzo, D., Rossi, P.S.: A Machine-Learning Architecture for Sensor Fault Detection, Isolation, and Accommodation in Digital Twins. IEEE Sensors J. 23, 2522\u20132538 (2023). https:\/\/doi.org\/10.1109\/JSEN.2022.3227713.","journal-title":"IEEE Sensors J."},{"key":"18_CR4","doi-asserted-by":"publisher","first-page":"5749","DOI":"10.1109\/TIA.2023.3286833","volume":"59","author":"T Mian","year":"2023","unstructured":"Mian, T., Choudhary, A., Fatima, S.: Multi-Sensor Fault Diagnosis for Misalignment and Unbalance Detection Using Machine Learning. IEEE Trans. on Ind. Applicat. 59, 5749\u20135759 (2023). https:\/\/doi.org\/10.1109\/TIA.2023.3286833.","journal-title":"IEEE Trans. on Ind. Applicat."},{"key":"18_CR5","doi-asserted-by":"publisher","unstructured":"Mandal, S., Santhi, B., Sridhar, S., Vinolia, K., Swaminathan, P.: Nuclear Power Plant Thermocouple Sensor Fault Detection and Classification using Deep Learning and Generalized Likelihood Ratio Test. IEEE Trans. Nucl. Sci. 1\u20131 (2017). https:\/\/doi.org\/10.1109\/TNS.2017.2697919.","DOI":"10.1109\/TNS.2017.2697919"},{"key":"18_CR6","doi-asserted-by":"publisher","unstructured":"Licciardo, G.D., Vitolo, P., Bosco, S., Pennino, S., Pau, D., Pesaturo, M., Di Benedetto, L., Liguori, R.: Ultra-Tiny Neural Network for Compensation of Post-soldering Thermal Drift in MEMS Pressure Sensors. In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS). pp. 1\u20135. IEEE, Monterey, CA, USA (2023). https:\/\/doi.org\/10.1109\/ISCAS46773.2023.10181480.","DOI":"10.1109\/ISCAS46773.2023.10181480"},{"key":"18_CR7","doi-asserted-by":"publisher","first-page":"4819","DOI":"10.3390\/electronics12234819","volume":"12","author":"D Pau","year":"2023","unstructured":"Pau, D., Ben Yahmed, W., Aymone, F.M., Licciardo, G.D., Vitolo, P.: Tiny Machine Learning Zoo for Long-Term Compensation of Pressure Sensor Drifts. Electronics. 12, 4819 (2023). https:\/\/doi.org\/10.3390\/electronics12234819.","journal-title":"Electronics."},{"key":"18_CR8","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2021.3089236","volume":"70","author":"Y Ruan","year":"2021","unstructured":"Ruan, Y., Yuan, L., Yuan, W., He, Y., Lu, L.: Temperature Compensation and Pressure Bias Estimation for Piezoresistive Pressure Sensor Based on Machine Learning Approach. IEEE Trans. Instrum. Meas. 70, 1\u201310 (2021). https:\/\/doi.org\/10.1109\/TIM.2021.3089236.","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"18_CR9","doi-asserted-by":"publisher","unstructured":"Riboldi, C., Crafa, D.M., Fiorini, C., Carminati, M.: A Compact Continuous Analyzer of Particulate Matter Radioactivity. In: Bellotti, F., Grammatikakis, M.D., Mansour, A., Ruo Roch, M., Seepold, R., Solanas, A., and Berta, R. (eds.) Applications in Electronics Pervading Industry, Environment and Society. pp. 162\u2013167. Springer Nature Switzerland, Cham (2024). https:\/\/doi.org\/10.1007\/978-3-031-48121-5_23.","DOI":"10.1007\/978-3-031-48121-5_23"},{"key":"18_CR10","doi-asserted-by":"publisher","unstructured":"Cattaneo, D., Di Bello, A., Cherubin, S., Terraneo, F., Agosta, G.: Embedded Operating System Optimization through Floating to Fixed Point Compiler Transformation. In: 2018 21st Euromicro Conference on Digital System Design (DSD). pp. 172\u2013176. IEEE, Prague (2018). https:\/\/doi.org\/10.1109\/DSD.2018.00042.","DOI":"10.1109\/DSD.2018.00042"},{"key":"18_CR11","doi-asserted-by":"publisher","first-page":"395","DOI":"10.1016\/j.cie.2005.01.009","volume":"48","author":"HJ Shin","year":"2005","unstructured":"Shin, H.J., Eom, D.-H., Kim, S.-S.: One-class support vector machines\u2014an application in machine fault detection and classification. Computers & Industrial Engineering. 48, 395\u2013408 (2005). https:\/\/doi.org\/10.1016\/j.cie.2005.01.009.","journal-title":"Computers & Industrial Engineering."},{"key":"18_CR12","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1016\/j.neucom.2014.05.035","volume":"145","author":"S Yin","year":"2014","unstructured":"Yin, S., Zhu, X., Jing, C.: Fault detection based on a robust one class support vector machine. Neurocomputing. 145, 263\u2013268 (2014). https:\/\/doi.org\/10.1016\/j.neucom.2014.05.035.","journal-title":"Neurocomputing."}],"container-title":["Lecture Notes in Electrical Engineering","Applications in Electronics Pervading Industry, Environment and Society"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-84100-2_18","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,8]],"date-time":"2025-03-08T00:01:20Z","timestamp":1741392080000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-84100-2_18"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"ISBN":["9783031840999","9783031841002"],"references-count":12,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-84100-2_18","relation":{},"ISSN":["1876-1100","1876-1119"],"issn-type":[{"type":"print","value":"1876-1100"},{"type":"electronic","value":"1876-1119"}],"subject":[],"published":{"date-parts":[[2025]]},"assertion":[{"value":"8 March 2025","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ApplePies","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Applications in Electronics Pervading Industry, Environment and Society","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Turin","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 September 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 September 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"applepies2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}