{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T16:52:10Z","timestamp":1777567930276,"version":"3.51.4"},"publisher-location":"Cham","reference-count":28,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031928048","type":"print"},{"value":"9783031928055","type":"electronic"}],"license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025]]},"DOI":"10.1007\/978-3-031-92805-5_14","type":"book-chapter","created":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T12:59:44Z","timestamp":1747918784000},"page":"211-227","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Find the\u00a0Assembly Mistakes: Error Segmentation for\u00a0Industrial Applications"],"prefix":"10.1007","author":[{"given":"Dan","family":"Lehman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tim J.","family":"Schoonbeek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shao-Hsuan","family":"Hung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacek","family":"Kustra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter H. N.","family":"de With","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fons van der","family":"Sommen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2025,5,12]]},"reference":[{"key":"14_CR1","doi-asserted-by":"publisher","unstructured":"Codegoni, A., Lombardi, G.A.F.: Tinycd: a (not so) deep learning model for change detection. Neural Comput. App. 35, 8471\u20138486 (2023). https:\/\/doi.org\/10.1007\/s00521-022-08122-3","DOI":"10.1007\/s00521-022-08122-3"},{"key":"14_CR2","doi-asserted-by":"crossref","unstructured":"Albers, A., Bohn\u00e9, T., Tadeja, S.K.: Augmented reality for quality inspection: a user-centred systematic review of use cases, trends and technology. In: 2023 IEEE International Symposium on Mixed and Augmented Reality Adjunct (ISMAR-Adjunct), pp. 146\u2013153. IEEE (2023)","DOI":"10.1109\/ISMAR-Adjunct60411.2023.00038"},{"key":"14_CR3","unstructured":"Bai, H., et al.: Vision datasets: a benchmark for vision-based industrial inspection. arXiv preprint arXiv:2306.07890 (2023)"},{"key":"14_CR4","doi-asserted-by":"publisher","unstructured":"Bandara, W.G.C., Patel, V.M.: A transformer-based Siamese network for change detection. In: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium, pp. 207\u2013210 (2022). https:\/\/doi.org\/10.1109\/IGARSS46834.2022.9883686","DOI":"10.1109\/IGARSS46834.2022.9883686"},{"key":"14_CR5","doi-asserted-by":"crossref","unstructured":"Caron, M., et al.: Emerging properties in self-supervised vision transformers. In: 2021 IEEE\/CVF International Conference on Computer Vision (ICCV), pp. 9630\u20139640 (2021). https:\/\/api.semanticscholar.org\/CorpusID:233444273","DOI":"10.1109\/ICCV48922.2021.00951"},{"key":"14_CR6","doi-asserted-by":"publisher","first-page":"13995","DOI":"10.1007\/s11042-023-16165-4","volume":"83","author":"C Chen","year":"2023","unstructured":"Chen, C., Yue, Y., Wang, J.: Multi-view change detection method for mechanical assembly images based on feature fusion and feature refinement with depthwise separable convolution. Multimed. Tools App. 83, 13995\u201314010 (2023). https:\/\/doi.org\/10.1007\/s11042-023-16165-4","journal-title":"Multimed. Tools App."},{"key":"14_CR7","doi-asserted-by":"crossref","unstructured":"Flaborea, A., et al.: PREGO: online mistake detection in PRocedural EGOcentric videos. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 18483\u201318492 (2024)","DOI":"10.1109\/CVPR52733.2024.01749"},{"key":"14_CR8","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TGRS.2021.3095166","volume":"60","author":"ZQ Hao Chen","year":"2021","unstructured":"Hao Chen, Z.Q., Shi, Z.: Remote sensing image change detection with transformers. IEEE Trans. Geosci. Remote Sens. 60, 1\u201314 (2021). https:\/\/doi.org\/10.1109\/TGRS.2021.3095166","journal-title":"IEEE Trans. Geosci. Remote Sens."},{"key":"14_CR9","doi-asserted-by":"publisher","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 770\u2013778 (2016). https:\/\/doi.org\/10.1109\/CVPR.2016.90","DOI":"10.1109\/CVPR.2016.90"},{"key":"14_CR10","doi-asserted-by":"publisher","unstructured":"Huynh, D.Q.: Metrics for 3d rotations: comparison and analysis. J. Math. Imaging Vision 35(2), 155\u2013164 (2009). https:\/\/doi.org\/10.1007\/s10851-009-0161-2","DOI":"10.1007\/s10851-009-0161-2"},{"key":"14_CR11","doi-asserted-by":"crossref","unstructured":"Hyun, J., Kim, S., Jeon, G., Kim, S.H., Bae, K., Kang, B.J.: ReconPatch: contrastive patch representation learning for industrial anomaly detection. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision, pp. 2052\u20132061 (2024)","DOI":"10.1109\/WACV57701.2024.00205"},{"key":"14_CR12","doi-asserted-by":"publisher","unstructured":"Jhamtani, H., Berg-Kirkpatrick, T.: Learning to describe differences between pairs of similar images. In: Riloff, E., Chiang, D., Hockenmaier, J., Tsujii, J. (eds.) Proceedings of the 2018 Conference on Empirical Methods in Natural Language Processing, pp. 4024\u20134034. Association for Computational Linguistics, Brussels, Belgium, October\u2013November 2018. https:\/\/doi.org\/10.18653\/v1\/D18-1436, https:\/\/aclanthology.org\/D18-1436","DOI":"10.18653\/v1\/D18-1436"},{"key":"14_CR13","doi-asserted-by":"publisher","unstructured":"Jiang, H., et al.: A survey on deep learning-based change detection from high-resolution remote sensing images. Remote Sens. 14(7), 1552 (2022). https:\/\/doi.org\/10.3390\/rs14071552, https:\/\/www.mdpi.com\/2072-4292\/14\/7\/1552","DOI":"10.3390\/rs14071552"},{"key":"14_CR14","unstructured":"Kingma, D., Ba, J.: Adam: a method for stochastic optimization. In: International Conference on Learning Representations (ICLR). San Diega, CA, USA (2015)"},{"key":"14_CR15","doi-asserted-by":"publisher","unstructured":"Klomp, S., van\u00a0de Wouw, D., With, P.: Real-time small-object change detection from ground vehicles using a Siamese convolutional neural network. J. Imaging Sci. Technol. 63, 060402 (2019). https:\/\/doi.org\/10.2352\/J.ImagingSci.Technol.2019.63.6.060402","DOI":"10.2352\/J.ImagingSci.Technol.2019.63.6.060402"},{"key":"14_CR16","doi-asserted-by":"publisher","unstructured":"Li, W., Aibo, X., Wei, M., Zuo, W., Li, R.: Deep learning-based augmented reality work instruction assistance system for complex manual assembly. J. Manuf. Syst. 73, 307\u2013319 (2024). https:\/\/doi.org\/10.1016\/j.jmsy.2024.02.009, https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0278612524000323?casa_token=PPUvSttkHqQAAAAA:AMMlr6mQNofosIi_713RYVDhGPMyBJztpsF2CCqFxzLwLtBQ7voV92WpTSCcx2tu-kSwjgzWXw","DOI":"10.1016\/j.jmsy.2024.02.009"},{"key":"14_CR17","doi-asserted-by":"publisher","unstructured":"Ronneberger, O., Fischer, P., Brox, T.: U-net: convolutional networks for biomedical image segmentation. In: Navab, N., Hornegger, J., Wells, W.M., Frangi, A.F. (eds.) MICCAI 2015. LNCS, vol. 9351, pp. 234\u2013241. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-24574-4_28","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"14_CR18","doi-asserted-by":"crossref","unstructured":"Sachdeva, R., Zisserman, A.: The change you want to see. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV) (2023)","DOI":"10.1109\/WACV56688.2023.00398"},{"key":"14_CR19","doi-asserted-by":"crossref","unstructured":"Sachdeva, R., Zisserman, A.: The change you want to see (now in 3d). In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV) (2023)","DOI":"10.1109\/ICCVW60793.2023.00220"},{"key":"14_CR20","doi-asserted-by":"crossref","unstructured":"Sakurada, K., Okatani, T.: Change detection from a street image pair using CNN features and superpixel segmentation (2015)","DOI":"10.5244\/C.29.61"},{"key":"14_CR21","doi-asserted-by":"crossref","unstructured":"Schieber, H., Li, S., Corell, N., Beckerle, P., Kreimeier, J., Roth, D.: ASDF: assembly state detection utilizing late fusion by integrating 6d pose estimation (2024)","DOI":"10.1109\/ISMAR62088.2024.00033"},{"key":"14_CR22","doi-asserted-by":"publisher","unstructured":"Schoonbeek, T.J.: Supervised representation learning towards generalizable assembly state recognition. IEEE Robot. Autom. Lett. 9(11), 9915\u20139922 (2024). https:\/\/doi.org\/10.1109\/LRA.2024.3468157","DOI":"10.1109\/LRA.2024.3468157"},{"key":"14_CR23","doi-asserted-by":"crossref","unstructured":"Schoonbeek, T.J., Houben, T., Onvlee, H., van\u00a0der Sommen, F., et\u00a0al.: Industreal: a dataset for procedure step recognition handling execution errors in egocentric videos in an industrial-like setting. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision, pp. 4365\u20134374 (2024)","DOI":"10.1109\/WACV57701.2024.00431"},{"key":"14_CR24","doi-asserted-by":"publisher","unstructured":"Stanescu, A., Mohr, P., Kozinski, M., Mori, S., Schmalstieg, D., Kalkofen, D.: State-aware configuration detection for augmented reality step-by-step tutorials. In: 2023 IEEE International Symposium on Mixed and Augmented Reality (ISMAR), pp. 157\u2013166 (2023). https:\/\/doi.org\/10.1109\/ISMAR59233.2023.00030","DOI":"10.1109\/ISMAR59233.2023.00030"},{"key":"14_CR25","doi-asserted-by":"publisher","unstructured":"Su, Y., Rambach, J., Minaskan, N., Lesur, P., Pagani, A., Stricker, D.: Deep multi-state object pose estimation for augmented reality assembly (2019). https:\/\/doi.org\/10.1109\/ISMAR-Adjunct.2019.00-42","DOI":"10.1109\/ISMAR-Adjunct.2019.00-42"},{"key":"14_CR26","doi-asserted-by":"crossref","unstructured":"Sun, J., Shen, Z., Wang, Y., Bao, H., Zhou, X.: LoFTR: detector-free local feature matching with transformers. In: CVPR (2021)","DOI":"10.1109\/CVPR46437.2021.00881"},{"key":"14_CR27","unstructured":"Unity Technologies: Unity Perception package (2020). https:\/\/github.com\/Unity-Technologies\/com.unity.perception"},{"key":"14_CR28","doi-asserted-by":"publisher","unstructured":"Wu, S., Chen, C., Wang, J.: Mechanical assembly monitoring method based on semi-supervised semantic segmentation. Appl. Sci. 13(2), 1182 (2023). https:\/\/doi.org\/10.3390\/app13021182, https:\/\/www.mdpi.com\/2076-3417\/13\/2\/1182","DOI":"10.3390\/app13021182"}],"container-title":["Lecture Notes in Computer Science","Computer Vision \u2013 ECCV 2024 Workshops"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-92805-5_14","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T12:59:54Z","timestamp":1747918794000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-92805-5_14"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"ISBN":["9783031928048","9783031928055"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-92805-5_14","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]},"assertion":[{"value":"12 May 2025","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ECCV","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"European Conference on Computer Vision","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Milan","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"29 September 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4 October 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"eccv2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/eccv2024.ecva.net\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}