{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T04:44:50Z","timestamp":1725770690548},"publisher-location":"Cham","reference-count":26,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319044828"},{"type":"electronic","value":"9783319044835"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014]]},"DOI":"10.1007\/978-3-319-04483-5_22","type":"book-chapter","created":{"date-parts":[[2014,1,28]],"date-time":"2014-01-28T01:32:59Z","timestamp":1390872779000},"page":"212-223","source":"Crossref","is-referenced-by-count":0,"title":["A Cost Effective Approach for Analyzing Software Product Lines"],"prefix":"10.1007","author":[{"given":"Ganesh Khandu","family":"Narwane","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shankara Narayanan","family":"Krishna","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anup Kumar","family":"Bhattacharjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"22_CR1","first-page":"23","volume-title":"SPLC 2007: Proceedings of the 11th International Software Product Line Conference","author":"K. Czarnecki","year":"2007","unstructured":"Czarnecki, K., Wasowski, A.: Feature diagrams and logics: There and back again. In: SPLC 2007: Proceedings of the 11th International Software Product Line Conference, pp. 23\u201334. IEEE Computer Society, Washington, DC (2007)"},{"unstructured":"Berg, K., Bishop, J., Muthig, D.: Tracing software product line variability: from problem to solution space. In: SAICSIT 2005: Proceedings of the 2005 Annual Research Conference of the South African Institute of Computer Scientists and Information Technologists on IT Research in Developing Countries, Republic of South Africa, South African Institute for Computer Scientists and Information Technologists, pp. 182\u2013191 (2005)","key":"22_CR2"},{"unstructured":"Czarnecki, K., Eisenecker, U.: Generative Programming: Methods, Tools, and Applications. Addison-Wesley Professional (June 2000)","key":"22_CR3"},{"key":"22_CR4","doi-asserted-by":"crossref","DOI":"10.1007\/3-540-28901-1","volume-title":"Software Product Line Engineering: Foundations, Principles and Techniques","author":"K. Pohl","year":"2005","unstructured":"Pohl, K., B\u00f6ckle, G., van der Linden, F.: Software Product Line Engineering: Foundations, Principles and Techniques. Springer-Verlag New York, Inc., Secaucus (2005)"},{"key":"22_CR5","volume-title":"Software product lines: practices and patterns","author":"P.C. Clements","year":"2001","unstructured":"Clements, P.C., Northrop, L.M.: Software product lines: practices and patterns. Addison-Wesley Longman Publishing Co., Inc., Boston (2001)"},{"doi-asserted-by":"crossref","unstructured":"Benavides, D., Segura, S., Ruiz-Corts, A.: Automated analysis of feature models 20 years later: a literature review. Information Systems 35(6) (2010)","key":"22_CR6","DOI":"10.1016\/j.is.2010.01.001"},{"key":"22_CR7","first-page":"1049","volume-title":"Proceedings of the 28th International Conference on Software Engineering, ICSE 2006","author":"K. Pohl","year":"2006","unstructured":"Pohl, K., Metzger, A.: Variability management in software product line engineering. In: Proceedings of the 28th International Conference on Software Engineering, ICSE 2006, pp. 1049\u20131050. ACM, New York (2006)"},{"key":"22_CR8","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1145\/302405.302409","volume-title":"ICSE 1999: Proceedings of the 21st International Conference on Software Engineering","author":"J.M. DeBaud","year":"1999","unstructured":"DeBaud, J.M., Schmid, K.: A systematic approach to derive the scope of software product lines. In: ICSE 1999: Proceedings of the 21st International Conference on Software Engineering, pp. 34\u201343. ACM, New York (1999)"},{"doi-asserted-by":"crossref","unstructured":"Satyananda, T.K., Lee, D., Kang, S., Hashmi, S.I.: Identifying traceability between feature model and software architecture in software product line using formal concept analysis. In: International Conference on Computational Science and its Applications, pp. 380\u2013388 (2007)","key":"22_CR9","DOI":"10.1109\/ICCSA.2007.59"},{"unstructured":"Anquetil, N., Grammel, B., da Silva, I.G.L., Noppen, J.A.R., Khan, S.S., Arboleda, H., Rashid, A., Garcia, A.: Traceability for model driven, software product line engineering. In: ECMDA Traceability Workshop Proceedings, Berlin, Germany, Norway, SINTEF, pp. 77\u201386 (June 2008)","key":"22_CR10"},{"issue":"3","key":"22_CR11","doi-asserted-by":"crossref","first-page":"333","DOI":"10.1016\/j.scico.2003.04.005","volume":"53","author":"D. Beuche","year":"2004","unstructured":"Beuche, D., Papajewski, H., Schrder-Preikschat, W.: Variability management with feature models. Science of Computer Programming\u00a053(3), 333\u2013352 (2004); Software Variability Management.","journal-title":"Science of Computer Programming"},{"unstructured":"Eisenbarth, T., Koschke, R., Simon, D.: A formal method for the analysis of product maps. In: Requirements Engineering for Product Lines Workshop, Essen, Germany (2002)","key":"22_CR12"},{"unstructured":"Zhu, C., Lee, Y., Zhao, W., Zhang, J.: A feature oriented approach to mapping from domain requirements to product line architecture. In: Arabnia, H.R., Reza, H. (eds.) Software Engineering Research and Practice, pp. 219\u2013225. CSREA Press (2006)","key":"22_CR13"},{"key":"22_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"422","DOI":"10.1007\/11561347_28","volume-title":"Generative Programming and Component Engineering","author":"K. Czarnecki","year":"2005","unstructured":"Czarnecki, K., Antkiewicz, M.: Mapping features to models: A template approach based on superimposed variants. In: Gl\u00fcck, R., Lowry, M. (eds.) GPCE 2005. LNCS, vol.\u00a03676, pp. 422\u2013437. Springer, Heidelberg (2005)"},{"key":"22_CR15","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1145\/1173706.1173738","volume-title":"Proceedings of the 5th International Conference on Generative Programming and Component Engineering, GPCE 2006","author":"K. Czarnecki","year":"2006","unstructured":"Czarnecki, K., Pietroszek, K.: Verifying feature-based model templates against well-formedness ocl constraints. In: Proceedings of the 5th International Conference on Generative Programming and Component Engineering, GPCE 2006, pp. 211\u2013220. ACM, New York (2006)"},{"key":"22_CR16","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1145\/1944892.1944898","volume-title":"Proceedings of the 5th Workshop on Variability Modeling of Software-Intensive Systems, VaMoS 2011","author":"Y.A.C. Cavalcanti","year":"2011","unstructured":"Cavalcanti, Y.A.C., do Carmo Machado, I., da Mota, P.A., Neto, S., Lobato, L.L., de Almeida, E.S., de Lemos Meira, S.R.: Towards metamodel support for variability and traceability in software product lines. In: Proceedings of the 5th Workshop on Variability Modeling of Software-Intensive Systems, VaMoS 2011, pp. 49\u201357. ACM, New York (2011)"},{"unstructured":"Anquetil, N., Kulesza, U., Mitschke, R., Moreira, A., Royer, J.C., Rummler, A., Sousa, A.: A model-driven traceability framework for software product lines. In: Software and Systems Modeling [10]","key":"22_CR17"},{"doi-asserted-by":"crossref","unstructured":"Ghanam, Y., Maurer, F.: Extreme product line engineering: Managing variability and traceability via executable specifications. In: Agile Conference, AGILE 2009, pp. 41\u201348 (2009)","key":"22_CR18","DOI":"10.1109\/AGILE.2009.12"},{"key":"22_CR19","first-page":"235","volume-title":"ECBS 2008: Proceedings of the 15th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems","author":"M. Riebisch","year":"2008","unstructured":"Riebisch, M., Brcina, R.: Optimizing design for variability using traceability links. In: ECBS 2008: Proceedings of the 15th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems, pp. 235\u2013244. IEEE Computer Society, Washington, DC (2008)"},{"doi-asserted-by":"crossref","unstructured":"Metzger, A., Pohl, K., Heymans, P., Schobbens, P.Y., Saval, G.: Disambiguating the documentation of variability in software product lines: A separation of concerns, formalization and automated analysis. In: 15th IEEE Internationa Requirements Engineering Conference, RE 2007, pp. 243\u2013253 (2007)","key":"22_CR20","DOI":"10.1109\/RE.2007.61"},{"unstructured":"Goultiaeva, A., Bacchus, F.: (2013), http:\/\/www.cs.utoronto.ca\/alexia\/cirqit\/","key":"22_CR21"},{"key":"22_CR22","first-page":"186","volume-title":"Proceedings of the 16th International Software Product Line Conference, SPLC 2012","author":"S. Mohalik","year":"2012","unstructured":"Mohalik, S., Ramesh, S., Millo, J.V., Krishna, S.N., Narwane, G.K.: Tracing spls precisely and efficiently. In: Proceedings of the 16th International Software Product Line Conference, SPLC 2012, pp. 186\u2013195. ACM, New York (2012)"},{"doi-asserted-by":"crossref","unstructured":"Benavides, D., Ruiz-Corts, A., Trinidad, P., Segura, S.: A survey on the automated analyses of feature models. In: Jornadas de Ingeniera del Software y Bases de Datos (JISBD 2006), Sitges, Spain (2006)","key":"22_CR23","DOI":"10.1007\/11877028_16"},{"unstructured":"Goultiaeva, A., Bacchus, F.: (2013), http:\/\/www.cs.utoronto.ca\/alexia\/cirqit\/","key":"22_CR24"},{"key":"22_CR25","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"237","DOI":"10.1007\/978-3-642-14186-7_20","volume-title":"Theory and Applications of Satisfiability Testing \u2013 SAT 2010","author":"C. Peschiera","year":"2010","unstructured":"Peschiera, C., Pulina, L., Tacchella, A., Bubeck, U., Kullmann, O., Lynce, I.: The seventh QBF solvers evaluation (QBFEVAL\u201910). In: Strichman, O., Szeider, S. (eds.) SAT 2010. LNCS, vol.\u00a06175, pp. 237\u2013250. Springer, Heidelberg (2010)"},{"unstructured":"Narwane, G.K., Krishna, S.N., Bhattacharjee, A.K.: Software product line analysis engine with cost factors, http:\/\/www.cse.iitb.ac.in\/~krishnas\/splane-cf.pdf","key":"22_CR26"}],"container-title":["Lecture Notes in Computer Science","Distributed Computing and Internet Technology"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-04483-5_22","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T02:48:27Z","timestamp":1688957307000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-04483-5_22"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014]]},"ISBN":["9783319044828","9783319044835"],"references-count":26,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-04483-5_22","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2014]]}}}