{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,12]],"date-time":"2025-11-12T03:18:48Z","timestamp":1762917528220,"version":"3.40.3"},"publisher-location":"Cham","reference-count":20,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319101743"},{"type":"electronic","value":"9783319101750"}],"license":[{"start":{"date-parts":[[2014,1,1]],"date-time":"2014-01-01T00:00:00Z","timestamp":1388534400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014]]},"DOI":"10.1007\/978-3-319-10175-0_16","type":"book-chapter","created":{"date-parts":[[2014,8,14]],"date-time":"2014-08-14T07:37:06Z","timestamp":1408001826000},"page":"229-242","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":34,"title":["Adjusting Laser Injections for Fully Controlled Faults"],"prefix":"10.1007","author":[{"given":"Franck","family":"Courbon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Loubet-Moundi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacques J. A.","family":"Fournier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Assia","family":"Tria","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2014,8,15]]},"reference":[{"key":"16_CR1","doi-asserted-by":"crossref","unstructured":"Anderson, R., Kuhn, M.: Low cost attacks on tamper resistant devices (1997)","DOI":"10.1007\/BFb0028165"},{"key":"16_CR2","unstructured":"Bar-El, H., Choukri, H., Naccache, D., Tunstall, M., Whelan, C.: The sorcerer\u2019s apprentice guide to fault attacks. IACR Cryptology ePrint Archive, p. 100 (2004)"},{"key":"16_CR3","unstructured":"Bond, M., Choudary, O., Murdoch, S.J., Skorobogatov, S.P., Anderson, R.J.: Chip and skim: cloning emv cards with the pre-play attack. CoRR (2012)"},{"key":"16_CR4","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"16","DOI":"10.1007\/978-3-540-28632-5_2","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2004","author":"E Brier","year":"2004","unstructured":"Brier, E., Clavier, C., Olivier, F.: Correlation power analysis with a leakage model. In: Joye, M., Quisquater, J.-J. (eds.) CHES 2004. LNCS, vol. 3156, pp. 16\u201329. Springer, Heidelberg (2004)"},{"key":"16_CR5","doi-asserted-by":"crossref","unstructured":"Dehbaoui, A., Dutertre, J.M., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of aes. In: FDTC, pp. 7\u201315 (2012)","DOI":"10.1109\/FDTC.2012.15"},{"key":"16_CR6","doi-asserted-by":"crossref","unstructured":"Dutertre, J.M., Mirbaha, A.P., Naccache, D., Ribotta, A.L., Tria, A., Vaschalde, T.: Fault round modification analysis of the advanced encryption standard. In: 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp. 140\u2013145 (2012)","DOI":"10.1109\/HST.2012.6224334"},{"key":"16_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"27","DOI":"10.1007\/11506447_4","volume-title":"Advanced Encryption Standard \u2013 AES","author":"C Giraud","year":"2005","unstructured":"Giraud, C.: DFA on AES. In: Dobbertin, H., Rijmen, V., Sowa, A. (eds.) AES 2005. LNCS, vol. 3373, pp. 27\u201341. Springer, Heidelberg (2005)"},{"issue":"5","key":"16_CR8","doi-asserted-by":"publisher","first-page":"91","DOI":"10.1109\/TNS.1965.4323904","volume":"12","author":"D Habing","year":"1965","unstructured":"Habing, D.: The use of lasers to simulate radiation-induced transients in semiconductor devices and circuits. IEEE Trans. Nucl. Sci. 12(5), 91\u2013100 (1965)","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"16_CR9","doi-asserted-by":"crossref","unstructured":"H\u00e9riveaux, L., Cl\u00e9di\u00e8re, J., Anceau, S.: Electrical modeling of the effect of photoelectric laser fault injection on bulk cmos design. In: ISTFA 2013 (2013)","DOI":"10.31399\/asm.cp.istfa2013p0361"},{"issue":"6","key":"16_CR10","doi-asserted-by":"publisher","first-page":"1694","DOI":"10.1109\/23.273491","volume":"40","author":"A Johnston","year":"1993","unstructured":"Johnston, A.: Charge generation and collection in p-n junctions excited with pulsed infrared lasers. IEEE Trans. Nucl. Sci. 40(6), 1694\u20131702 (1993)","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"16_CR11","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511805172","volume-title":"Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication","author":"H Kaeslin","year":"2008","unstructured":"Kaeslin, H.: Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication, 1st edn. Cambridge University Press, New York (2008)","edition":"1"},{"key":"16_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","volume-title":"Advances in Cryptology - CRYPTO \u201999","author":"PC Kocher","year":"1999","unstructured":"Kocher, P.C., Jaffe, J., Jun, B.: Differential power analysis. In: Wiener, M. (ed.) CRYPTO 1999. LNCS, vol. 1666, pp. 388\u2013397. Springer, Heidelberg (1999)"},{"key":"16_CR13","doi-asserted-by":"crossref","unstructured":"Leveugle, R., Ammari, A., Maingot, V., Teyssou, E., Moitrel, P., Mourtel, C., Feyt, N., Rigaud, J.B., Tria, A.: Experimental evaluation of protections against laser-induced faults and consequences on fault modeling. In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2007, pp. 1587\u20131592. EDA Consortium, San Jose (2007)","DOI":"10.1109\/DATE.2007.364528"},{"key":"16_CR14","unstructured":"Loubet-Moundi, P., Vigilant, D., Olivier, F.: Static fault attacks on hardware des registers. IACR Cryptology ePrint Archive 2011, 531 (2011)"},{"key":"16_CR15","unstructured":"Marc Joye, P.P., Yen, S.M.: Secure evaluation of modular functions (2001)"},{"key":"16_CR16","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"78","DOI":"10.1007\/3-540-44499-8_6","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2000","author":"R Mayer-Sommer","year":"2000","unstructured":"Mayer-Sommer, R.: Smartly analyzing the simplicity and the power of simple power analysis on smartcards. In: Paar, C., Ko\u00e7, \u00c7.K. (eds.) CHES 2000. LNCS, vol. 1965, pp. 78\u201392. Springer, Heidelberg (2000)"},{"key":"16_CR17","doi-asserted-by":"crossref","unstructured":"Roscian, C., Sarafianos, A., Dutertre, J.M., Tria, A.: Fault model analysis of laser-induced faults in sram memory cells. In: 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 89\u201398 (2013)","DOI":"10.1109\/FDTC.2013.17"},{"issue":"9\u201311","key":"16_CR18","doi-asserted-by":"publisher","first-page":"1300","DOI":"10.1016\/j.microrel.2013.07.125","volume":"53","author":"A Sarafianos","year":"2013","unstructured":"Sarafianos, A., Roscian, C., Dutertre, J.M., Lisart, M., Tria, A.: Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. Microelectronics Reliability 53(9\u201311), 1300\u20131305 (2013). (european Symposium on Reliability of Electron Devices, Failure Physics and Analysis)","journal-title":"Microelectronics Reliability"},{"key":"16_CR19","unstructured":"Sarafianos, A.: Injection de fautes par impulsion laser dans des circuits s\u00e9curis\u00e9s. These, Ecole Nationale Sup\u00e9rieure des Mines de Saint-Etienne (2013)"},{"key":"16_CR20","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/3-540-36400-5_2","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"SP Skorobogatov","year":"2003","unstructured":"Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski Jr., B.S., Ko\u00e7, \u00c7.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2\u201312. Springer, Heidelberg (2003)"}],"container-title":["Lecture Notes in Computer Science","Constructive Side-Channel Analysis and Secure Design"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-10175-0_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,21]],"date-time":"2023-01-21T01:11:57Z","timestamp":1674263517000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-10175-0_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014]]},"ISBN":["9783319101743","9783319101750"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-10175-0_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2014]]},"assertion":[{"value":"15 August 2014","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}}]}}