{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,26]],"date-time":"2025-06-26T10:27:50Z","timestamp":1750933670584},"publisher-location":"Cham","reference-count":16,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319117362"},{"type":"electronic","value":"9783319117379"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014]]},"DOI":"10.1007\/978-3-319-11737-9_25","type":"book-chapter","created":{"date-parts":[[2014,10,14]],"date-time":"2014-10-14T20:52:14Z","timestamp":1413319934000},"page":"380-395","source":"Crossref","is-referenced-by-count":20,"title":["Complete Model-Based Equivalence Class Testing for the ETCS Ceiling Speed Monitor"],"prefix":"10.1007","author":[{"given":"C\u00e9cile","family":"Braunstein","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anne E.","family":"Haxthausen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wen-ling","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Felix","family":"H\u00fcbner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jan","family":"Peleska","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Uwe","family":"Schulze","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Linh","family":"Vu Hong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"25_CR1","unstructured":"Braunstein, C., Huang, W.-L., Peleska, J., Schulze, U., H\u00fcbner, F., Haxthausen, A.E., vu Hong, L.: A SysML test model and test suite for the ETCS ceiling speed monitor. Technical report, Embedded Systems Testing Benchmarks Site (April 30, 2014), \n                  \n                    http:\/\/www.mbt-benchmarks.org"},{"issue":"3","key":"25_CR2","doi-asserted-by":"publisher","first-page":"178","DOI":"10.1109\/TSE.1978.231496","volume":"SE-4","author":"T.S. Chow","year":"1978","unstructured":"Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Transactions on Software Engineering\u00a0SE-4(3), 178\u2013186 (1978)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"25_CR3","volume-title":"Model Checking","author":"E.M. Clarke","year":"1999","unstructured":"Clarke, E.M., Grumberg, O., Peled, D.A.: Model Checking. The MIT Press, Cambridge (1999)"},{"key":"25_CR4","unstructured":"European Railway Agency. ERTMS \u2013 System Requirements Specification \u2013 UNISIG SUBSET-026 (February 2012), \n                  \n                    http:\/\/www.era.europa.eu\/Document-Register\/Pages\/Set-2-System-Requirements-Specification.aspx"},{"key":"25_CR5","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"82","DOI":"10.1007\/3-540-59293-8_188","volume-title":"TAPSOFT \u201995: Theory and Practice of Software Development","author":"M.-C. Gaudel","year":"1995","unstructured":"Gaudel, M.-C.: Testing can be formal, too. In: Mosses, P.D., Nielsen, M. (eds.) CAAP 1995, FASE 1995, and TAPSOFT 1995. LNCS, vol.\u00a0915, pp. 82\u201396. Springer, Heidelberg (1995)"},{"issue":"4","key":"25_CR6","doi-asserted-by":"publisher","first-page":"112","DOI":"10.1145\/566171.566190","volume":"27","author":"W. Grieskamp","year":"2002","unstructured":"Grieskamp, W., Gurevich, Y., Schulte, W., Veanes, M.: Generating finite state machines from abstract state machines. ACM SIGSOFT Software Engineering Notes\u00a027(4), 112\u2013122 (2002)","journal-title":"ACM SIGSOFT Software Engineering Notes"},{"key":"25_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"49","DOI":"10.1007\/978-3-642-41707-8_4","volume-title":"Testing Software and Systems","author":"W.-l. Huang","year":"2013","unstructured":"Huang, W.-l., Peleska, J.: Exhaustive model-based equivalence class testing. In: Yenig\u00fcn, H., Yilmaz, C., Ulrich, A. (eds.) ICTSS 2013. LNCS, vol.\u00a08254, pp. 49\u201364. Springer, Heidelberg (2013)"},{"key":"25_CR8","unstructured":"W.-l. Huang, J., Peleska, U.: Schulze. Test automation support. Technical Report D34.1, COMPASS Comprehensive Modelling for Advanced Systems of Systems (2013), \n                  \n                    http:\/\/www.compass-research.eu\/deliverables.html"},{"key":"25_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"305","DOI":"10.1007\/11408901_23","volume-title":"Dependable Computing - EDCC 2005","author":"G. Nicola De","year":"2005","unstructured":"De Nicola, G., di Tommaso, P., Rosaria, E., Francesco, F., Pietro, M., Antonio, O.: A Grey-Box Approach to the Functional Testing of Complex Automatic Train Protection Systems. In: Dal Cin, M., Ka\u00e2niche, M., Pataricza, A. (eds.) EDCC 2005. LNCS, vol.\u00a03463, pp. 305\u2013317. Springer, Heidelberg (2005)"},{"key":"25_CR10","unstructured":"Object Management Group. OMG Systems Modeling Language (OMG SysMLTM). Technical report, Object Management Group, OMG Document Number: formal\/2010-06-02 (2010)"},{"key":"25_CR11","doi-asserted-by":"crossref","unstructured":"Peleska, J.: Industrial-strength model-based testing - state of the art and current challenges. In: Petrenko, A.K., Schlingloff, H. (eds.) Proceedings Eighth Workshop on Model-Based Testing, Rome, Italy, March 17. Electronic Proceedings in Theoretical Computer Science, vol.\u00a0111, pp. 3\u201328. Open Publishing Association (2013)","DOI":"10.4204\/EPTCS.111.1"},{"key":"25_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"146","DOI":"10.1007\/978-3-642-24580-0_11","volume-title":"Testing Software and Systems","author":"J. Peleska","year":"2011","unstructured":"Peleska, J., Honisch, A., Lapschies, F., L\u00f6ding, H., Schmid, H., Smuda, P., Vorobev, E., Zahlten, C.: A real-world benchmark model for testing concurrent real-time systems in the automotive domain. In: Wolff, B., Za\u00efdi, F. (eds.) ICTSS 2011. LNCS, vol.\u00a07019, pp. 146\u2013161. Springer, Heidelberg (2011)"},{"key":"25_CR13","doi-asserted-by":"crossref","unstructured":"Petrenko, A., Yevtushenko, N., van Bochmann, G.: Fault Models for Testing in Context, pp. 163\u2013177. Chapman & Hall (1996)","DOI":"10.1007\/978-0-387-35079-0_10"},{"key":"25_CR14","volume-title":"Software Testing Foundations","author":"A. Spillner","year":"2006","unstructured":"Spillner, A., Linz, T., Schaefer, H.: Software Testing Foundations. dpunkt.verlag, Heidelberg (2006)"},{"key":"25_CR15","unstructured":"U.N.I.S.I.G.: ERTMS\/ETCS SystemRequirements Specification, Chapter\u00a03, Principles, volume Subset-026-3, Issue 3.3.0 (2012)"},{"key":"25_CR16","first-page":"98","volume":"4","author":"M.P. Vasilevskii","year":"1973","unstructured":"Vasilevskii, M.P.: Failure diagnosis of automata. Kibernetika (Transl.)\u00a04, 98\u2013108 (1973)","journal-title":"Kibernetika (Transl.)"}],"container-title":["Lecture Notes in Computer Science","Formal Methods and Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-11737-9_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,28]],"date-time":"2019-05-28T00:34:44Z","timestamp":1559003684000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-11737-9_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014]]},"ISBN":["9783319117362","9783319117379"],"references-count":16,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-11737-9_25","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2014]]}}}