{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T00:22:02Z","timestamp":1742948522215,"version":"3.40.3"},"publisher-location":"Cham","reference-count":29,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319259444"},{"type":"electronic","value":"9783319259451"}],"license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015]]},"DOI":"10.1007\/978-3-319-25945-1_9","type":"book-chapter","created":{"date-parts":[[2015,11,6]],"date-time":"2015-11-06T22:20:37Z","timestamp":1446848437000},"page":"141-157","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Novel Insights on Cross Project Fault Prediction Applied to Automotive Software"],"prefix":"10.1007","author":[{"given":"Harald","family":"Altinger","sequence":"first","affiliation":[]},{"given":"Steffen","family":"Herbold","sequence":"additional","affiliation":[]},{"given":"Jens","family":"Grabowski","sequence":"additional","affiliation":[]},{"given":"Franz","family":"Wotawa","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2015,11,8]]},"reference":[{"key":"9_CR1","doi-asserted-by":"crossref","unstructured":"Altinger, H., Siegl, S., Dajsuren, Y., Wotawa, F.: A novel industry grade dataset for fault prediction based on model-driven developed automotive embedded software. In: Proceedings of the 12th Working Conference on Mining Software Repositories (MSR). IEEE, Florence, Italy (2015)","DOI":"10.1109\/MSR.2015.72"},{"key":"9_CR2","doi-asserted-by":"crossref","unstructured":"Altinger, H., Wotawa, F., Schurius, M.: Testing methods used in the automotive industry: results from a survey. In: Proceedings of the 2014 Workshop on Joining AcadeMiA and Industry Contributions to Test Automation and Model-Based Testing (JAMAICA). ACM (2014)","DOI":"10.1145\/2631890.2631891"},{"key":"9_CR3","doi-asserted-by":"crossref","unstructured":"Bell, R.M., Ostrand, T.J., Weyuker, E.J.: Looking for bugs in all the right places. In: Proceedings of the 2006 International Symposium on Software Testing and Analysis (ISSTA). ACM (2006)","DOI":"10.1145\/1146238.1146246"},{"key":"9_CR4","unstructured":"Broy, M.: Challenges in automotive software engineering. In: Proceedings of the 28th International Conference on Software Engineering. ACM (2006). \n                      http:\/\/doi.acm.org\/10.1145\/1134285.1134292"},{"key":"9_CR5","doi-asserted-by":"crossref","unstructured":"Camargo Cruz, A.E., Ochimizu, K.: Towards logistic regression models for predicting fault-prone code across software projects. In: Proceedings of the 3rd International Symposium on Empirical Software Engineering and Measurement (ESEM). IEEE Computer Society (2009)","DOI":"10.1109\/ESEM.2009.5316002"},{"issue":"4","key":"9_CR6","doi-asserted-by":"publisher","first-page":"7346","DOI":"10.1016\/j.eswa.2008.10.027","volume":"36","author":"C Catal","year":"2009","unstructured":"Catal, C., Diri, B.: A systematic review of software fault prediction studies. Expert Syst. Appl. 36(4), 7346\u20137354 (2009)","journal-title":"Expert Syst. Appl."},{"key":"9_CR7","unstructured":"Curtis, B., Sheppard, S.B., Milliman, P.: Third time charm: Stronger prediction of programmer performance by software complexity metrics. In: Proceedings of the 4th International Conference on Software Engineering (1979)"},{"key":"9_CR8","unstructured":"Drummond, C., Holte, R.C.: C4.5, class imbalance, and cost sensitivity: why under-sampling beats over-sampling. In: Workshop on Learning from Imbalanced Datasets II (2003)"},{"issue":"11","key":"9_CR9","doi-asserted-by":"publisher","first-page":"559","DOI":"10.1080\/14786440109462720","volume":"2","author":"FRS Karl Pearson","year":"1901","unstructured":"Karl Pearson, F.R.S.: LIII. On lines and planes of closest fit to systems of points in space. Philos. Mag. Ser. 6 2(11), 559\u2013572 (1901)","journal-title":"Philos. Mag. Ser. 6"},{"issue":"1","key":"9_CR10","doi-asserted-by":"publisher","first-page":"5","DOI":"10.1023\/B:MACH.0000008082.80494.e0","volume":"54","author":"T Gestel van","year":"2004","unstructured":"van Gestel, T., Suykens, J., Baesens, B., Viaene, S., Vanthienen, J., Dedene, G., de Moor, B., Vandewalle, J.: Benchmarking least squares support vector machine classifiers. Mach. Learn. 54(1), 5\u201332 (2004)","journal-title":"Mach. Learn."},{"issue":"7","key":"9_CR11","doi-asserted-by":"publisher","first-page":"653","DOI":"10.1109\/32.859533","volume":"26","author":"TL Graves","year":"2000","unstructured":"Graves, T.L., Karr, A.F., Marron, J.S., Siy, H.: Predicting fault incidence using software change history. IEEE Trans. Softw. Eng. 26(7), 653\u2013661 (2000)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"9_CR12","doi-asserted-by":"crossref","unstructured":"He, Z., Peters, F., Menzies, T., Yang, Y.: Learning from open-source projects: an empirical study on defect prediction. In: Proceedings of the 7th International Symposium on Empirical Software Engineering and Measurement (ESEM) (2013)","DOI":"10.1109\/ESEM.2013.20"},{"issue":"2","key":"9_CR13","doi-asserted-by":"publisher","first-page":"167","DOI":"10.1007\/s10515-011-0090-3","volume":"19","author":"Z He","year":"2012","unstructured":"He, Z., Shu, F., Yang, Y., Li, M., Wang, Q.: An investigation on the feasibility of cross-project defect prediction. Autom. Softw. Eng. 19(2), 167\u2013199 (2012). \n                      http:\/\/dx.doi.org\/10.1007\/s10515-011-0090-3","journal-title":"Autom. Softw. Eng."},{"key":"9_CR14","doi-asserted-by":"crossref","unstructured":"Herbold, S.: Training data selection for cross-project defect prediction. In: Proceedings of the 9th International International Conference on Predictive Models in Software Engineering (PROMISE). ACM (2013)","DOI":"10.1145\/2499393.2499395"},{"key":"9_CR15","doi-asserted-by":"crossref","unstructured":"Jin-Hua, L., Qiong, L., Jing, L.: The w-model for testing software product lines. In: International Symposium on Computer Science and Computational Technology (ISCSCT) (2008)","DOI":"10.1109\/ISCSCT.2008.34"},{"key":"9_CR16","unstructured":"Kendall, M.G.: Rank correlation methods (1948)"},{"issue":"2","key":"9_CR17","first-page":"111","volume":"1","author":"S Kotsiantis","year":"2006","unstructured":"Kotsiantis, S., Kanellopoulos, D., Pintelas, P.: Data preprocessing for supervised leaning. Int. J. Comput. Sci. 1(2), 111\u2013117 (2006)","journal-title":"Int. J. Comput. Sci."},{"issue":"3","key":"9_CR18","doi-asserted-by":"publisher","first-page":"248","DOI":"10.1016\/j.infsof.2011.09.007","volume":"54","author":"Y Ma","year":"2012","unstructured":"Ma, Y., Luo, G., Zeng, X., Chen, A.: Transfer learning for cross-company software defect prediction. Inf. Softw. Technol. 54(3), 248\u2013256 (2012)","journal-title":"Inf. Softw. Technol."},{"key":"9_CR19","doi-asserted-by":"crossref","unstructured":"Meneely, A., Williams, L., Snipes, W., Osborne, J.: Predicting failures with developer networks and social network analysis. In: Proceedings of the 16th ACM SIGSOFT International Symposium on Foundations of Software Engineering (FSE) (2008)","DOI":"10.1145\/1453101.1453106"},{"key":"9_CR20","doi-asserted-by":"crossref","unstructured":"Nam, J., Pan, S.J., Kim, S.: Transfer defect learning. In: Proceedings of the 35th International International Conference on Software Engineering (ICSE) (2013)","DOI":"10.1109\/ICSE.2013.6606584"},{"key":"9_CR21","doi-asserted-by":"publisher","first-page":"55","DOI":"10.1145\/566171.566181","volume":"27","author":"TJ Ostrand","year":"2002","unstructured":"Ostrand, T.J., Weyuker, E.J.: The distribution of faults in a large industrial software system. ACM SIGSOFT Softw. Eng. Notes 27, 55\u201364 (2002)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"issue":"4","key":"9_CR22","doi-asserted-by":"publisher","first-page":"340","DOI":"10.1109\/TSE.2005.49","volume":"31","author":"TJ Ostrand","year":"2005","unstructured":"Ostrand, T.J., Weyuker, E.J., Bell, R.M.: Predicting the location and number of faults in large software systems. IEEE Trans. Softw. Eng. 31(4), 340\u2013355 (2005)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"9_CR23","doi-asserted-by":"crossref","unstructured":"Rana, R., Staron, M., Hansson, J., Nilsson, M.: Defect prediction over software life cycle in automotive domain. In: Proceedings of the Joint International Conference on Software Technologies (ICSOFT) (2014)","DOI":"10.5220\/0005099203770382"},{"key":"9_CR24","volume-title":"Learning with Kernels","author":"B Sch\u00f6lkopf","year":"2002","unstructured":"Sch\u00f6lkopf, B., Smola, A.J.: Learning with Kernels. MIT Press, Cambridge (2002)"},{"key":"9_CR25","unstructured":"The Motor Industry Software Reliability Association: MISRA-C:2004 - Guidelines for the use of the C language in critical systems, 2nd edn. MISRA, Warwickshire (2004)"},{"key":"9_CR26","doi-asserted-by":"publisher","first-page":"540","DOI":"10.1007\/s10664-008-9103-7","volume":"14","author":"B Turhan","year":"2009","unstructured":"Turhan, B., Menzies, T., Bener, A., Di Stefano, J.: On the relative value of cross-company and within-company data for defect prediction. Empirical Softw. Eng. 14, 540\u2013578 (2009)","journal-title":"Empirical Softw. Eng."},{"key":"9_CR27","doi-asserted-by":"crossref","unstructured":"Watanabe, S., Kaiya, H., Kaijiri, K.: Adapting a fault prediction model to allow inter language reuse. In: Proceedings of the 4th International International Workshop on Predictor Models in Software Engineering (PROMISE). ACM (2008)","DOI":"10.1145\/1370788.1370794"},{"key":"9_CR28","doi-asserted-by":"crossref","unstructured":"Zhang, F., Mockus, A., Keivanloo, I., Zou, Y.: Towards building a universal defect prediction model. In: Proceedings of the 11th Working Conference on Mining Software Repositories (MSR) (2014)","DOI":"10.1145\/2597073.2597078"},{"key":"9_CR29","doi-asserted-by":"crossref","unstructured":"Zimmermann, T., Nagappan, N., Gall, H., Giger, E., Murphy, B.: Cross-project defect prediction: a large scale experiment on data vs. domain vs. process. In: Proceedings of the the 7th Joint Meeting European Software Engineering Conference (ESEC) and the ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE) (2009)","DOI":"10.1145\/1595696.1595713"}],"container-title":["Lecture Notes in Computer Science","Testing Software and Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-25945-1_9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,12,18]],"date-time":"2019-12-18T03:25:01Z","timestamp":1576639501000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-25945-1_9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015]]},"ISBN":["9783319259444","9783319259451"],"references-count":29,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-25945-1_9","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2015]]},"assertion":[{"value":"8 November 2015","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}}]}}