{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,9]],"date-time":"2024-09-09T04:05:06Z","timestamp":1725854706947},"publisher-location":"Cham","reference-count":18,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319336176"},{"type":"electronic","value":"9783319336183"}],"license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016]]},"DOI":"10.1007\/978-3-319-33618-3_8","type":"book-chapter","created":{"date-parts":[[2016,5,6]],"date-time":"2016-05-06T04:48:44Z","timestamp":1462510124000},"page":"71-78","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Defect Detection on Patterned Fabrics Using Entropy Cues"],"prefix":"10.1007","author":[{"given":"Maricela","family":"Martinez-Leon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rocio A.","family":"Lizarraga-Morales","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Carlos","family":"Rodriguez-Donate","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo","family":"Cabal-Yepez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruth I.","family":"Mata-Chavez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2016,5,7]]},"reference":[{"issue":"8","key":"8_CR1","doi-asserted-by":"publisher","first-page":"1069","DOI":"10.1016\/j.patrec.2004.10.002","volume":"26","author":"O Alata","year":"2005","unstructured":"Alata, O., Ramananjarasoa, C.: Unsupervised texture image segmentation using 2-D quarter plan autorregresive model with four prediction supports. Pattern Recogn. Lett. 26(8), 1069\u20131081 (2005)","journal-title":"Pattern Recogn. Lett."},{"key":"8_CR2","doi-asserted-by":"publisher","first-page":"2973","DOI":"10.1016\/S0031-3203(02)00017-1","volume":"35","author":"A Badnarova","year":"2002","unstructured":"Badnarova, A., Bennamoun, M., Latham, S.: Optimal gabor filter for textile flaw detection. Pattern Recogn. 35, 2973\u20132991 (2002)","journal-title":"Pattern Recogn."},{"key":"8_CR3","doi-asserted-by":"crossref","unstructured":"Chan, H.-Y., Raju, C., Sari-Sarraf, H., Hequet, E.F.: A general approach to defect detection in textured materials using wavelet domain model and level sets. In: Proceedings of SPIE 60010D, pp. 1\u20136 (2005)","DOI":"10.1117\/12.633204"},{"key":"8_CR4","volume-title":"The Symmetries of Things","author":"JH Conway","year":"2008","unstructured":"Conway, J.H., Burgiel, H., Goodman-Strauss, C.: The Symmetries of Things. AK Peters\/CRC Press, Taylor and Francis, Boca Raton (2008)"},{"key":"8_CR5","volume-title":"Digital Image Processing","author":"RC Gonzalez","year":"2002","unstructured":"Gonzalez, R.C., Woods, R.E.: Digital Image Processing. Prentice-Hall, Upper Saddle River (2002)"},{"issue":"6","key":"8_CR6","doi-asserted-by":"publisher","first-page":"610","DOI":"10.1109\/TSMC.1973.4309314","volume":"3","author":"RM Haralick","year":"1973","unstructured":"Haralick, R.M., Shanmugan, K., Dinstein, I.: Textural features for image classification. IEEE Trans. Syst. Man Cybern. 3(6), 610\u2013621 (1973)","journal-title":"IEEE Trans. Syst. Man Cybern."},{"issue":"1","key":"8_CR7","doi-asserted-by":"publisher","first-page":"348","DOI":"10.1109\/TIE.1930.896476","volume":"55","author":"A Kumar","year":"2011","unstructured":"Kumar, A.: Computer-vision-based fabric defect detection: a survey. IEEE Trans. Ind. Electron. 55(1), 348\u2013363 (2011)","journal-title":"IEEE Trans. Ind. Electron."},{"issue":"5","key":"8_CR8","doi-asserted-by":"publisher","first-page":"461","DOI":"10.1177\/004051750307300515","volume":"73","author":"CJ Kuo","year":"2003","unstructured":"Kuo, C.J., Su, T.: Gray relational analysis for recognizing fabric defects. Text. Res. J. 73(5), 461\u2013465 (2003)","journal-title":"Text. Res. J."},{"issue":"6\u20137","key":"8_CR9","doi-asserted-by":"publisher","first-page":"543","DOI":"10.1016\/S0262-8856(99)00062-1","volume":"18","author":"A Latif-Amet","year":"2000","unstructured":"Latif-Amet, A., Ertuzun, A., Ercil, A.: An efficient method for texture defect detection: sub-band domain co-occurrence matrices. Image Vis. Comput. 18(6\u20137), 543\u2013553 (2000)","journal-title":"Image Vis. Comput."},{"issue":"4","key":"8_CR10","doi-asserted-by":"publisher","first-page":"414","DOI":"10.1016\/j.patrec.2012.09.022","volume":"34","author":"RA Lizarraga-Morales","year":"2013","unstructured":"Lizarraga-Morales, R.A., Sanchez-Yanez, R.E., Ayala-Ramirez, V.: Fast texel size estimation in visual texture using homogeneity cues. Pattern Recogn. Lett. 34(4), 414\u2013422 (2013)","journal-title":"Pattern Recogn. Lett."},{"key":"8_CR11","doi-asserted-by":"crossref","unstructured":"Neubauer, C.: Segmentation of defects in textile fabric. In: Proceedings of IEEE 11th International Conference on Pattern Recognition, vol. 1, pp. 688\u2013691, September 1992","DOI":"10.1109\/ICPR.1992.201654"},{"issue":"1","key":"8_CR12","doi-asserted-by":"publisher","first-page":"131","DOI":"10.1109\/TASE.2008.917140","volume":"6","author":"HYT Ngan","year":"2009","unstructured":"Ngan, H.Y.T., Pang, G.K.H.: Regularity analysis for patterned texture inspection. IEEE Trans. Autom. Sci. Eng. 6(1), 131\u2013144 (2009)","journal-title":"IEEE Trans. Autom. Sci. Eng."},{"issue":"7","key":"8_CR13","doi-asserted-by":"publisher","first-page":"442","DOI":"10.1016\/j.imavis.2011.02.002","volume":"29","author":"HYT Ngan","year":"2011","unstructured":"Ngan, H.Y.T., Pang, G.K.H., Yung, N.H.C.: Automated fabric defect detection - a review. Image Vis. Comput. 29(7), 442\u2013458 (2011)","journal-title":"Image Vis. Comput."},{"issue":"4","key":"8_CR14","doi-asserted-by":"publisher","first-page":"559","DOI":"10.1016\/j.patcog.2004.07.009","volume":"38","author":"HYT Ngan","year":"2005","unstructured":"Ngan, H.Y.T., Pang, G.K.H., Yung, S.P., Ng, M.K.: Wavelet based methods on patterned fabric defect detection. Pattern Recogn. 38(4), 559\u2013576 (2005)","journal-title":"Pattern Recogn."},{"issue":"285\u2013296","key":"8_CR15","first-page":"23","volume":"11","author":"N Otsu","year":"1975","unstructured":"Otsu, N.: A threshold selection method from gray-level histograms. Automatica 11(285\u2013296), 23\u201327 (1975)","journal-title":"Automatica"},{"issue":"1","key":"8_CR16","doi-asserted-by":"publisher","first-page":"118","DOI":"10.1109\/TPAMI.1986.4767760","volume":"8","author":"M Unser","year":"1986","unstructured":"Unser, M.: Sum and difference histograms for texture classification. IEEE Trans. Pattern Anal. Mach. Intell. 8(1), 118\u2013125 (1986)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"8_CR17","doi-asserted-by":"publisher","first-page":"212","DOI":"10.1177\/004051759006000404","volume":"60","author":"EJ Wood","year":"1990","unstructured":"Wood, E.J.: Applying fourier, associated transforms to pattern characterization in textiles. Text. Res. J. 60, 212\u2013220 (1990)","journal-title":"Text. Res. J."},{"issue":"12","key":"8_CR18","doi-asserted-by":"publisher","first-page":"3116","DOI":"10.1117\/1.1517290","volume":"41","author":"XZ Yang","year":"2002","unstructured":"Yang, X.Z., Pang, G.K.H., Yung, N.H.C.: Discriminative fabric defect detection using adaptive wavelets. Opt. Eng. 41(12), 3116\u20133126 (2002)","journal-title":"Opt. Eng."}],"container-title":["Lecture Notes in Computer Science","Image and Signal Processing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-33618-3_8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,19]],"date-time":"2022-06-19T23:48:55Z","timestamp":1655682535000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-33618-3_8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"ISBN":["9783319336176","9783319336183"],"references-count":18,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-33618-3_8","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2016]]},"assertion":[{"value":"7 May 2016","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}