{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,9]],"date-time":"2026-05-09T11:48:12Z","timestamp":1778327292501,"version":"3.51.4"},"publisher-location":"Cham","reference-count":30,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783319395692","type":"print"},{"value":"9783319395708","type":"electronic"}],"license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016]]},"DOI":"10.1007\/978-3-319-39570-8_15","type":"book-chapter","created":{"date-parts":[[2016,5,24]],"date-time":"2016-05-24T05:04:10Z","timestamp":1464066250000},"page":"222-238","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["Multiple Mutation Testing from FSM"],"prefix":"10.1007","author":[{"given":"Alexandre","family":"Petrenko","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Omer","family":"Nguena Timo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Ramesh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2016,5,24]]},"reference":[{"issue":"7","key":"15_CR1","doi-asserted-by":"publisher","first-page":"783","DOI":"10.1109\/12.599899","volume":"46","author":"I Pomeranz","year":"1997","unstructured":"Pomeranz, I., Sudhakar, M.R.: Test generation for multiple state-table faults in finite-state machines. IEEE Trans. Comput. 46(7), 783\u2013794 (1997)","journal-title":"IEEE Trans. Comput."},{"key":"15_CR2","doi-asserted-by":"crossref","unstructured":"Poage, J.F., McCluskey, Jr., E.J.: Derivation of optimal test sequences for sequential machines. In: Proceedings of the IEEE 5th Symposium on Switching Circuits Theory and Logical Design, pp. 121\u2013132 (1964)","DOI":"10.1109\/SWCT.1964.7"},{"issue":"4","key":"15_CR3","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/C-M.1978.218136","volume":"11","author":"RA DeMillo","year":"1978","unstructured":"DeMillo, R.A., Lipton, R.J., Sayward, F.G.: Hints on test data selection: help for the practicing programmer. IEEE Comput. 11(4), 34\u201341 (1978)","journal-title":"IEEE Comput."},{"issue":"9","key":"15_CR4","doi-asserted-by":"publisher","first-page":"900","DOI":"10.1109\/32.92910","volume":"17","author":"RA DeMilli","year":"1991","unstructured":"DeMilli, R.A., Offutt, J.A.: Constraint-based automatic test data generation. IEEE Trans. Softw. Eng. 17(9), 900\u2013910 (1991)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"15_CR5","unstructured":"Grunsky, I.S., Petrenko, A.: Design of checking experiments with automata describing protocols. Automatic Control and Computer Sciences. Allerton Press Inc. USA. No. 4 (1988)"},{"key":"15_CR6","doi-asserted-by":"crossref","unstructured":"Hennie, F.C.: Fault detecting experiments for sequential circuits. In: Proceedings of the IEEE 5th Annual Symposium on Switching Circuits Theory and Logical Design, pp. 95\u2013110. Princeton (1964)","DOI":"10.1109\/SWCT.1964.8"},{"key":"15_CR7","series-title":"IFIP \u2014 The International Federation for Information Processing","doi-asserted-by":"publisher","first-page":"215","DOI":"10.1007\/978-0-387-35567-2_14","volume-title":"Testing of Communicating Systems","author":"I Koufareva","year":"1999","unstructured":"Koufareva, I., Petrenko, A., Yevtushenko, N.: Test generation driven by user-defined fault models. In: Csopaki, G., Dibuz, S., Tarnay, K. (eds.) Testing of Communicating Systems. IFIP \u2014 The International Federation for Information Processing, vol. 21, pp. 215\u2013233. Springer, New York (1999)"},{"issue":"8","key":"15_CR8","doi-asserted-by":"publisher","first-page":"1090","DOI":"10.1109\/5.533956","volume":"84","author":"D Lee","year":"1996","unstructured":"Lee, D., Yannakakis, M.: Principles and methods of testing finite-state machines - a survey. Proc. IEEE 84(8), 1090\u20131123 (1996)","journal-title":"Proc. IEEE"},{"key":"15_CR9","doi-asserted-by":"crossref","unstructured":"Moore, E.F.: Gedanken - Experiments on sequential machines. In: Automata Studies. Princeton University Press, pp. 129\u2013153 (1956)","DOI":"10.1515\/9781400882618-006"},{"key":"15_CR10","doi-asserted-by":"crossref","first-page":"229","DOI":"10.1016\/B978-0-444-89874-6.50021-0","volume-title":"Protocol Specification, Testing and Verification, XII","author":"Alexandre Petrenko","year":"1992","unstructured":"Petrenko, A., Yevtushenko, N.: Test suite generation for a FSM with a given type of implementation errors. In: Proceedings of IFIP 12th International Symposium on Protocol Specification, Testing, and Verification, pp. 229\u2013243 (1992)"},{"key":"15_CR11","doi-asserted-by":"publisher","first-page":"163","DOI":"10.1007\/978-0-387-35079-0_10","volume-title":"Formal Description Techniques IX","author":"A Petrenko","year":"1996","unstructured":"Petrenko, A., Yevtushenko, N., Bochmann, G.V.: Fault models for testing in context. In: Gotzhein, R., Bredereke, J. (eds.) Formal Description Techniques IX, pp. 163\u2013178. Springer, USA (1996)"},{"key":"15_CR12","first-page":"653","volume":"4","author":"MP Vasilevskii","year":"1973","unstructured":"Vasilevskii, M.P.: Failure diagnosis of automata. Cybernetics 4, 653\u2013665 (1973). Plenum Publishing Corporation. New York","journal-title":"Cybernetics"},{"issue":"3","key":"15_CR13","doi-asserted-by":"publisher","first-page":"178","DOI":"10.1109\/TSE.1978.231496","volume":"4","author":"TS Chow","year":"1978","unstructured":"Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Trans. Softw. Eng. 4(3), 178\u2013187 (1978)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"15_CR14","unstructured":"Vuong, S.T., Ko, K.C.: A novel approach to protocol test sequence generation. In: Global Telecommunications Conference, vol. 3, pp. 2\u20135. IEEE (1990)"},{"key":"15_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"354","DOI":"10.1007\/3-540-48153-2_33","volume-title":"Correct Hardware Design and Verification Methods","author":"JC Godskesen","year":"1999","unstructured":"Godskesen, J.C.: Fault models for embedded systems. In: Pierre, L., Kropf, T. (eds.) CHARME 1999. LNCS, vol. 1703, pp. 354\u2013359. Springer, Heidelberg (1999)"},{"issue":"9","key":"15_CR16","doi-asserted-by":"publisher","first-page":"1065","DOI":"10.1109\/43.159992","volume":"11","author":"KT Cheng","year":"1992","unstructured":"Cheng, K.T., Jou, J.Y.: A functional fault model for sequential machines. IEEE Trans. Comput. Aided Des. Integr. Circ. Syst. 11(9), 1065\u20131073 (1992)","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circ. Syst."},{"issue":"1","key":"15_CR17","doi-asserted-by":"publisher","first-page":"29","DOI":"10.1109\/TSE.2004.1265734","volume":"30","author":"A Petrenko","year":"2004","unstructured":"Petrenko, A., Boroday, S., Groz, R.: Confirming configurations in EFSM testing. IEEE Trans. Softw. Eng. 30(1), 29\u201342 (2004)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"3","key":"15_CR18","doi-asserted-by":"publisher","first-page":"215","DOI":"10.1002\/stvr.402","volume":"19","author":"F Gordon","year":"2009","unstructured":"Gordon, F., Wotawa, F., Ammann, P.: Testing with model checkers: a survey. Softw. Test. Verification Reliab. 19(3), 215\u2013261 (2009)","journal-title":"Softw. Test. Verification Reliab."},{"issue":"8","key":"15_CR19","doi-asserted-by":"publisher","first-page":"1978","DOI":"10.1016\/j.jss.2013.02.061","volume":"86","author":"S Anand","year":"2013","unstructured":"Anand, S., et al.: An orchestrated survey of methodologies for automated software test case generation. J. Syst. Softw. 86(8), 1978\u20132001 (2013)","journal-title":"J. Syst. Softw."},{"key":"15_CR20","series-title":"Modeling and verification of parallel processes","first-page":"196","volume-title":"Fault model-driven test derivation from finite state models: Annotated bibliography","author":"A Petrenko","year":"2001","unstructured":"Petrenko, A.: Fault model-driven test derivation from finite state models: Annotated bibliography. Modeling and verification of parallel processes, pp. 196\u2013205. Springer, Heidelberg (2001)"},{"issue":"1","key":"15_CR21","doi-asserted-by":"publisher","first-page":"81","DOI":"10.1016\/S0169-7552(96)00019-0","volume":"29","author":"A Petrenko","year":"1996","unstructured":"Petrenko, A., Bochmann, G.V., Yao, M.: On fault coverage of tests for finite state specifications. Comput. Netw. ISDN Syst. 29(1), 81\u2013106 (1996)","journal-title":"Comput. Netw. ISDN Syst."},{"issue":"2","key":"15_CR22","doi-asserted-by":"publisher","first-page":"91","DOI":"10.1049\/iet-sen.2008.0018","volume":"3","author":"A Simao","year":"2009","unstructured":"Simao, A., Petrenko, A., Maldonado, J.C.: Comparing finite state machine test coverage criteria. IET Softw. 3(2), 91\u2013105 (2009)","journal-title":"IET Softw."},{"key":"15_CR23","unstructured":"De Moura, L., Dutertre B.: Yices 1.0: An efficient SMT solver. In: The Satisfiability Modulo Theories Competition (SMT-COMP) (2006)"},{"key":"15_CR24","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1007\/978-3-540-78800-3_24","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"L de Moura","year":"2008","unstructured":"de Moura, L., Bj\u00f8rner, N.S.: Z3: an efficient SMT solver. In: Ramakrishnan, C.R., Rehof, J. (eds.) TACAS 2008. LNCS, vol. 4963, pp. 337\u2013340. Springer, Heidelberg (2008)"},{"key":"15_CR25","doi-asserted-by":"publisher","first-page":"499","DOI":"10.4236\/jsea.2015.89048","volume":"8","author":"S R\u04e7sch","year":"2015","unstructured":"R\u04e7sch, S., Ulewicz, S., Provost, J., Vogel-Heuser, B.: Review of model-based testing approaches in production automation and adjacent domains - current challenges and research gaps. J. Softw. Eng. Appl. 8, 499\u2013519 (2015)","journal-title":"J. Softw. Eng. Appl."},{"key":"15_CR26","unstructured":"Bochmann, G.V., et al.: Fault models in testing. In: Proceedings of the IFIP TC6\/WG6. 1 Fourth International Workshop on Protocol Test Systems, pp. 17\u201330. North-Holland Publishing Co. (1991)"},{"issue":"9","key":"15_CR27","doi-asserted-by":"publisher","first-page":"1154","DOI":"10.1109\/TC.2005.152","volume":"54","author":"A Petrenko","year":"2005","unstructured":"Petrenko, A., Yevtushenko, N.: Testing from partial deterministic FSM specifications. IEEE Trans. Comput. 54(9), 1154\u20131165 (2005)","journal-title":"IEEE Trans. Comput."},{"key":"15_CR28","doi-asserted-by":"crossref","unstructured":"Korel, B., Tahat, L.H., Harman M.: Test prioritization using system models. In: Proceedings of the 21st IEEE International Conference on Software Maintenance, pp. 559\u2013568 (2005)","DOI":"10.1109\/ICSM.2005.87"},{"key":"15_CR29","doi-asserted-by":"crossref","unstructured":"Petrenko, A., Dury, A., Ramesh, S., Mohalik, S.: A method and tool for test optimization for automotive controllers. In: ICST Workshops, pp. 198\u2013207 (2013)","DOI":"10.1109\/ICSTW.2013.31"},{"key":"15_CR30","volume-title":"The Definitive ANTLR 4 Reference","author":"T Parr","year":"2013","unstructured":"Parr, T.: The Definitive ANTLR 4 Reference, vol. 2. Pragmatic Bookshelf, Raleigh (2013)"}],"container-title":["Lecture Notes in Computer Science","Formal Techniques for Distributed Objects, Components, and Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-39570-8_15","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,5,23]],"date-time":"2020-05-23T00:10:12Z","timestamp":1590192612000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-39570-8_15"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"ISBN":["9783319395692","9783319395708"],"references-count":30,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-39570-8_15","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]},"assertion":[{"value":"24 May 2016","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}