{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,5]],"date-time":"2025-12-05T14:27:49Z","timestamp":1764944869086},"publisher-location":"Cham","reference-count":17,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319415604"},{"type":"electronic","value":"9783319415611"}],"license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016]]},"DOI":"10.1007\/978-3-319-41561-1_21","type":"book-chapter","created":{"date-parts":[[2016,6,26]],"date-time":"2016-06-26T21:11:44Z","timestamp":1466975504000},"page":"282-296","source":"Crossref","is-referenced-by-count":3,"title":["Multi-exponential Lifetime Extraction in Time-Logarithmic Scale"],"prefix":"10.1007","author":[{"given":"Andrew V.","family":"Knyazev","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qun","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Koon Hoo","family":"Teo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2016,6,28]]},"reference":[{"issue":"6","key":"21_CR1","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/JPROC.2002.1021569","volume":"90","author":"SC Binari","year":"2002","unstructured":"Binari, S.C., Klein, P.B., Kazior, T.E.: Trapping effects in GaN and SiC microwave fets. Proc. IEEE 90(6), 1048\u20131058 (2002)","journal-title":"Proc. IEEE"},{"issue":"90","key":"21_CR2","doi-asserted-by":"crossref","first-page":"297","DOI":"10.1090\/S0025-5718-1965-0178586-1","volume":"19","author":"JW Cooley","year":"1965","unstructured":"Cooley, J.W., Tukey, J.W.: An algorithm for the machine calculation of complex fourier series. Math. Comput. 19(90), 297\u2013301 (1965)","journal-title":"Math. Comput."},{"key":"21_CR3","unstructured":"de Prony, G.C.F.M.R.: Essai exp\u00e9rimental et analytique sur les lois de la Dilatabilit\u00e9 des fluides \u00e9lastiques et sur celles de la Force expansive de la vapeur de l\u2019eau et la vapeur de l\u2019alkool, \u00e0 diff\u00e9rentes temp\u00e9ratures (1795)"},{"issue":"3","key":"21_CR4","doi-asserted-by":"crossref","first-page":"504","DOI":"10.1137\/060657273","volume":"50","author":"CL Epstein","year":"2008","unstructured":"Epstein, C.L., Schotland, J.: The bad truth about Laplace\u2019s transform. SIAM Rev. 50(3), 504\u2013520 (2008)","journal-title":"SIAM Rev."},{"issue":"1\u20133","key":"21_CR5","doi-asserted-by":"crossref","first-page":"170","DOI":"10.1016\/S0925-4005(99)00290-7","volume":"61","author":"R Gutierrez-Osuna","year":"1999","unstructured":"Gutierrez-Osuna, R., Nagle, H.T., Schiffman, S.S.: Transient response analysis of an electronic nose using multi-exponential models. Sens. Actuators B Chem. 61(1\u20133), 170\u2013182 (1999)","journal-title":"Sens. Actuators B Chem."},{"issue":"4","key":"21_CR6","doi-asserted-by":"crossref","first-page":"323","DOI":"10.1023\/A:1015222829062","volume":"29","author":"PC Hansen","year":"2002","unstructured":"Hansen, P.C.: Deconvolution and regularization with Toeplitz matrices. Numer. Algorithms 29(4), 323\u2013378 (2002)","journal-title":"Numer. Algorithms"},{"key":"21_CR7","doi-asserted-by":"crossref","unstructured":"Jin, D., del Alamo, J.A.: Mechanisms responsible for dynamic ON-resistance in GaN high-voltage HEMTs. In: 2012 24th International Symposium on Power Semiconductor Devices and ICs (ISPSD), pp. 333\u2013336 (2012)","DOI":"10.1109\/ISPSD.2012.6229089"},{"issue":"10","key":"21_CR8","doi-asserted-by":"crossref","first-page":"3190","DOI":"10.1109\/TED.2013.2274477","volume":"60","author":"D Jin","year":"2013","unstructured":"Jin, D., del Alamo, J.A.: Methodology for the study of dynamic ON-resistance in high-voltage GaN field-effect transistors. IEEE Trans. Electron Devices 60(10), 3190\u20133196 (2013)","journal-title":"IEEE Trans. Electron Devices"},{"issue":"1","key":"21_CR9","doi-asserted-by":"crossref","first-page":"132","DOI":"10.1109\/TED.2010.2087339","volume":"58","author":"J Joh","year":"2011","unstructured":"Joh, J., del Alamo, J.A.: A current-transient methodology for trap analysis for GaN high electron mobility transistors. IEEE Trans. Electron Devices 58(1), 132\u2013140 (2011)","journal-title":"IEEE Trans. Electron Devices"},{"key":"21_CR10","volume-title":"Basic Properties of III-V Devices - Understanding Mysterious Trapping Phenomena","author":"G Kompa","year":"2014","unstructured":"Kompa, G.: Basic Properties of III-V Devices - Understanding Mysterious Trapping Phenomena. Kassel University Press, Kassel (2014)"},{"key":"21_CR11","volume-title":"Applied Analysis","author":"C Lanczos","year":"1988","unstructured":"Lanczos, C.: Applied Analysis. Dover Publications, Mineola (1988)"},{"issue":"2","key":"21_CR12","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1088\/0957-0233\/6\/2\/001","volume":"6","author":"S Marco","year":"1995","unstructured":"Marco, S., Samitier, J., Morante, J.R.: A novel time-domain method to analyze multicomponent exponential transients. Meas. Sci. Technol. 6(2), 135 (1995)","journal-title":"Meas. Sci. Technol."},{"issue":"2","key":"21_CR13","doi-asserted-by":"crossref","first-page":"332","DOI":"10.1109\/TDMR.2008.923743","volume":"8","author":"G Meneghesso","year":"2008","unstructured":"Meneghesso, G., Verzellesi, G., Danesin, F., Rampazzo, F., Zanon, F., Tazzoli, A., Meneghini, M., Zanoni, E.: Reliability of GaN high-electron-mobility transistors: state of the art and perspectives. IEEE Trans. Device Mater. Reliab. 8(2), 332\u2013343 (2008)","journal-title":"IEEE Trans. Device Mater. Reliab."},{"issue":"1","key":"21_CR14","doi-asserted-by":"crossref","first-page":"308","DOI":"10.1016\/0925-4005(94)87099-3","volume":"18","author":"J Samitier","year":"1994","unstructured":"Samitier, J., Lopez-Villegas, J.M., Marco, S., Camara, L., Pardo, A., Ruiz, O., Morante, J.R.: A new method to analyse signal transients in chemical sensors. Sens. Actuators B Chem. 18(1), 308\u2013312 (1994)","journal-title":"Sens. Actuators B Chem."},{"key":"21_CR15","unstructured":"Sozza, A., Dua, C., Morvan, E., diForte Poisson, M.A., Delage, S., Rampazzo, F., Tazzoli, A., Danesin, F., Meneghesso, G., Zanoni, E., Curutchet, A., Malbert, N., Labat, N., Grimbert, B., De Jaeger, J.-C.: Evidence of traps creation in GaN\/AlGaN\/GaN HEMTs after a 3000 hour on-state and off-state hot-electron stress. In: IEEE International Electron Devices Meeting Technical Digest, IEDM 4p., p. 593 (2005)"},{"issue":"12","key":"21_CR16","doi-asserted-by":"crossref","first-page":"124103","DOI":"10.1063\/1.2990627","volume":"93","author":"R Stoklas","year":"2008","unstructured":"Stoklas, R., Gregusova, D., Novak, J., Vescan, A., Kordos, P.: Investigation of trapping effects in AlGaN\/GaN\/Si field-effect transistors by frequency dependent capacitance and conductance analysis. Appl. Phys. Lett. 93(12), 124103 (2008)","journal-title":"Appl. Phys. Lett."},{"issue":"2","key":"21_CR17","doi-asserted-by":"crossref","first-page":"145","DOI":"10.1137\/1005035","volume":"5","author":"L Weiss","year":"1963","unstructured":"Weiss, L., McDonough, R.N.: Prony\u2019s method, Z-transforms, and Pade approximation. SIAM Rev. 5(2), 145\u2013149 (1963)","journal-title":"SIAM Rev."}],"container-title":["Lecture Notes in Computer Science","Advances in Data Mining. Applications and Theoretical Aspects"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-41561-1_21","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T13:13:02Z","timestamp":1498309982000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-41561-1_21"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"ISBN":["9783319415604","9783319415611"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-41561-1_21","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2016]]}}}