{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,7]],"date-time":"2026-02-07T22:01:24Z","timestamp":1770501684667,"version":"3.49.0"},"publisher-location":"Cham","reference-count":38,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783319415604","type":"print"},{"value":"9783319415611","type":"electronic"}],"license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016]]},"DOI":"10.1007\/978-3-319-41561-1_25","type":"book-chapter","created":{"date-parts":[[2016,6,27]],"date-time":"2016-06-27T01:11:44Z","timestamp":1466989904000},"page":"334-348","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Extending Process Monitoring to Simultaneous False Alarm Rejection and Fault Identification (FARFI)"],"prefix":"10.1007","author":[{"given":"Geert","family":"Gins","sequence":"first","affiliation":[]},{"given":"Sam","family":"Wuyts","sequence":"additional","affiliation":[]},{"given":"Sander","family":"Van den Zegel","sequence":"additional","affiliation":[]},{"given":"Jan","family":"Van Impe","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,6,28]]},"reference":[{"key":"25_CR1","doi-asserted-by":"publisher","first-page":"293","DOI":"10.1016\/S0098-1354(02)00160-6","volume":"27","author":"V Venkatasubramanian","year":"2003","unstructured":"Venkatasubramanian, V., Rengaswamy, R., Yin, K., Kavuri, S.: A review of process fault detection and diagnosis\u2013part I: quantitative model-based methods. Comput. Chem. Eng. 27, 293\u2013311 (2003)","journal-title":"Comput. Chem. Eng."},{"key":"25_CR2","doi-asserted-by":"publisher","first-page":"3543","DOI":"10.1021\/ie302069q","volume":"52","author":"Z Ge","year":"2013","unstructured":"Ge, Z., Song, Z., Gao, F.: Review of recent research on data-based process monitoring. Ind. Eng. Chem. Res. 52, 3543\u20133562 (2013)","journal-title":"Ind. Eng. Chem. Res."},{"key":"25_CR3","doi-asserted-by":"publisher","first-page":"220","DOI":"10.1016\/j.arcontrol.2012.09.004","volume":"26","author":"S Qin","year":"2012","unstructured":"Qin, S.: Survey on data-driven industrial process monitoring and diagnosis. Ann. Rev. Control 26, 220\u2013234 (2012)","journal-title":"Ann. Rev. Control"},{"key":"25_CR4","doi-asserted-by":"publisher","first-page":"20","DOI":"10.1016\/j.chemolab.2015.08.019","volume":"148","author":"JFM Impe Van","year":"2015","unstructured":"Van Impe, J.F.M., Gins, G.: An extensive reference dataset for fault detection and identification in batch processes. Chemometr. Intell. Lab. Syst. 148, 20\u201331 (2015)","journal-title":"Chemometr. Intell. Lab. Syst."},{"key":"25_CR5","doi-asserted-by":"publisher","first-page":"431","DOI":"10.1016\/j.jprocont.2013.08.011","volume":"24","author":"S Ding","year":"2014","unstructured":"Ding, S.: Data-driven design of monitoring and diagnosis systems for dynamic processes: a review of subspace technique based schemes and some recent results. J. Process Control 24, 431\u2013449 (2014)","journal-title":"J. Process Control"},{"key":"25_CR6","doi-asserted-by":"publisher","first-page":"1813","DOI":"10.1002\/aic.690460910","volume":"46","author":"S Yoon","year":"2000","unstructured":"Yoon, S., MacGregor, J.: Statistical and causal model-based approaches to fault detection and isolation. AIChE J. 46, 1813\u20131824 (2000)","journal-title":"AIChE J."},{"key":"25_CR7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-5185-2","volume-title":"Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods","author":"C Aldrich","year":"2013","unstructured":"Aldrich, C., Auret, L.: Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods. Springer, London (2013)"},{"key":"25_CR8","doi-asserted-by":"publisher","first-page":"636","DOI":"10.1109\/TCST.2009.2026285","volume":"18","author":"I Hwang","year":"2010","unstructured":"Hwang, I., Kim, S.: A survey of fault detection, isolation, and reconfiguration methods. IEEE Trans. Control Syst. Technol. 18, 636\u2013653 (2010)","journal-title":"IEEE Trans. Control Syst. Technol."},{"key":"25_CR9","doi-asserted-by":"publisher","first-page":"213","DOI":"10.1002\/acs.859","volume":"19","author":"T Kourti","year":"2005","unstructured":"Kourti, T.: Application of latent variable methods to process control and multivariate statistical process control in industry. Int. J. Adapt. Control Signal Process. 19, 213\u2013246 (2005)","journal-title":"Int. J. Adapt. Control Signal Process."},{"key":"25_CR10","doi-asserted-by":"publisher","first-page":"1043","DOI":"10.1007\/s00216-006-0303-y","volume":"384","author":"T Kourti","year":"2006","unstructured":"Kourti, T.: The process analytical technology initiative and multivariate process analysis, monitoring and control. Anal. Bioanal. Chem. 384, 1043\u20131048 (2006)","journal-title":"Anal. Bioanal. Chem."},{"key":"25_CR11","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1016\/j.compchemeng.2012.06.017","volume":"47","author":"J MacGregor","year":"2012","unstructured":"MacGregor, J., Cinar, A.: Monitoring, fault diagnosis, fault-tolerant control and optimization: data driven methods. Comput. Chem. Eng. 47, 111\u2013120 (2012)","journal-title":"Comput. Chem. Eng."},{"issue":"3","key":"25_CR12","doi-asserted-by":"publisher","first-page":"403","DOI":"10.1016\/0967-0661(95)00014-L","volume":"3","author":"J MacGregor","year":"1995","unstructured":"MacGregor, J., Kourti, T.: Statistical process control of multivariate processes. Control Eng. Pract. 3(3), 403\u2013414 (1995)","journal-title":"Control Eng. Pract."},{"key":"25_CR13","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780198538493.001.0001","volume-title":"Neural Networks Pattern Recogn.","author":"C Bishop","year":"1995","unstructured":"Bishop, C.: Neural Networks Pattern Recogn. Clarendon Press, Oxford (1995)"},{"key":"25_CR14","series-title":"Lecture Notes in Earth Sciences","doi-asserted-by":"publisher","first-page":"97","DOI":"10.1007\/978-3-540-78938-3_6","volume-title":"Nonlinear Time Series Analysis in the Geosciences","author":"WW Hsieh","year":"2008","unstructured":"Hsieh, W.W., Cannon, A.J.: Towards robust nonlinear multivariate analysis by neural network methods. In: Donner, R.V., Barbosa, S.M. (eds.) Nonlinear Time Series Analysis in the Geosciences. Lecture Notes in Earth Sciences, pp. 97\u2013124. Springer, Heidelberg (2008)"},{"key":"25_CR15","doi-asserted-by":"crossref","unstructured":"Van Impe, J.F.M., Augustinus, K., De Prins, M., Gins, G.: Advance warning for loss of separation in an industrial distillation column (2016). Submitted","DOI":"10.1002\/qre.2222"},{"key":"25_CR16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-1904-8","volume-title":"Principal Component Analysis","author":"I Jolliffe","year":"1986","unstructured":"Jolliffe, I.: Principal Component Analysis. Springer, New York (1986)"},{"key":"25_CR17","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1016\/S0009-2509(01)00366-9","volume":"57","author":"J Chen","year":"2002","unstructured":"Chen, J., Liu, K.: On-line batch process monitoring using dynamic PCA and dynamic PLS models. Chem. Eng. Sci. 57, 63\u201375 (2002)","journal-title":"Chem. Eng. Sci."},{"key":"25_CR18","doi-asserted-by":"publisher","first-page":"622","DOI":"10.1016\/j.ces.2007.09.046","volume":"63","author":"S Choi","year":"2008","unstructured":"Choi, S., Morris, J., Lee, I.B.: Dynamic model-based batch process monitoring. Chem. Eng. Sci. 63, 622\u2013636 (2008)","journal-title":"Chem. Eng. Sci."},{"key":"25_CR19","doi-asserted-by":"publisher","first-page":"223","DOI":"10.1016\/j.ces.2003.09.012","volume":"59","author":"J Lee","year":"2004","unstructured":"Lee, J., Yoo, C., Choi, S., Vanrolleghem, P., Lee, I.B.: Nonlinear process monitoring using kernel principal component analysis. Chem. Eng. Sci. 59, 223\u2013234 (2004)","journal-title":"Chem. Eng. Sci."},{"key":"25_CR20","doi-asserted-by":"publisher","first-page":"2995","DOI":"10.1016\/j.ces.2004.04.031","volume":"59","author":"J Lee","year":"2004","unstructured":"Lee, J., Yoo, C., Lee, I.B.: Statistical monitoring of dynamic processes based on dynamic independent component analysis. Chem. Eng. Sci. 59, 2995\u20133006 (2004)","journal-title":"Chem. Eng. Sci."},{"key":"25_CR21","doi-asserted-by":"publisher","first-page":"403","DOI":"10.1016\/j.cherd.2009.09.002","volume":"88","author":"L Wang","year":"2010","unstructured":"Wang, L., Shi, H.: Multivariate statistical process monitoring using an improved independent component analysis. Chem. Eng. Res. Des. 88, 403\u2013414 (2010)","journal-title":"Chem. Eng. Res. Des."},{"key":"25_CR22","doi-asserted-by":"publisher","first-page":"90","DOI":"10.1016\/j.jprocont.2015.01.006","volume":"26","author":"G Gins","year":"2015","unstructured":"Gins, G., Van den Kerkhof, P., Vanlaer, J., Van Impe, J.F.M.: Improving classification-based iagnosis of batch processes through data selection and appropriate pretreatment. J. Process Control 26, 90\u2013101 (2015)","journal-title":"J. Process Control"},{"key":"25_CR23","doi-asserted-by":"publisher","first-page":"1361","DOI":"10.1002\/aic.690400809","volume":"40","author":"P Nomikos","year":"1994","unstructured":"Nomikos, P., MacGregor, J.F.: Monitoring batch processes using multiway principal component analysis. AIChE J. 40, 1361\u20131375 (1994)","journal-title":"AIChE J."},{"key":"25_CR24","doi-asserted-by":"publisher","first-page":"331","DOI":"10.1016\/S0169-7439(98)00162-2","volume":"44","author":"S Wold","year":"1998","unstructured":"Wold, S., Kettaneh, N., Friden, H., Holmberg, A.: Modelling and diagnosis of batch processes and analogous kinetic experiments. Chemometr. Intell. Lab. Syst. 44, 331\u2013340 (1998)","journal-title":"Chemometr. Intell. Lab. Syst."},{"key":"25_CR25","doi-asserted-by":"publisher","first-page":"79","DOI":"10.1016\/S0169-7439(02)00051-5","volume":"64","author":"B Li","year":"2002","unstructured":"Li, B., Morris, J., Martin, E.: Model selection for partial least squares regression. Chemometr. Intell. Lab. Syst. 64, 79\u201389 (2002)","journal-title":"Chemometr. Intell. Lab. Syst."},{"key":"25_CR26","doi-asserted-by":"publisher","first-page":"322","DOI":"10.1016\/j.jprocont.2010.10.005","volume":"21","author":"C Alcala","year":"2011","unstructured":"Alcala, C., Qin, S.J.: Analysis and generalization of fault diagnosis methods for process monitoring. J. Process Control 21, 322\u2013330 (2011)","journal-title":"J. Process Control"},{"key":"25_CR27","doi-asserted-by":"crossref","unstructured":"Bodesheim, P., Freytag, A., Rodner, E., Denzler, J.: Local novelty detection in multi-class recognition problems. In: Proceedings of the 2015 WACV Conference, pp. 813\u2013820 (2015)","DOI":"10.1109\/WACV.2015.113"},{"issue":"3","key":"25_CR28","doi-asserted-by":"publisher","first-page":"289","DOI":"10.1080\/08839519508945477","volume":"9","author":"R King","year":"1995","unstructured":"King, R., Feng, C., Sutherland, A.: StatLog: a comparison of classification algorithms on large real-world problems. Appl. Artif. Intell. 9(3), 289\u2013333 (1995)","journal-title":"Appl. Artif. Intell."},{"issue":"1","key":"25_CR29","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s10115-007-0114-2","volume":"14","author":"X Wu","year":"2008","unstructured":"Wu, X., Kumar, V., Quinlan, J., Ghosh, J., Yang, Q., Motoda, H., McLachlan, G., Ng, A., Liu, B., Yu, P., Zhou, Z., Steinbach, M., Hand, D., Steinberg, D.: Top 10 algorithms in data mining. Knowl. Inf. Syst. 14(1), 1\u201337 (2008)","journal-title":"Knowl. Inf. Syst."},{"key":"25_CR30","volume-title":"Support Vector Machines for Pattern Classification","author":"S Abe","year":"2005","unstructured":"Abe, S.: Support Vector Machines for Pattern Classification. Springer, Heidelberg (2005)"},{"key":"25_CR31","doi-asserted-by":"crossref","unstructured":"Fix, E., Hodges, J.: Discriminatory analysis, nonparametric discrimination: consistency properties USAF school of aviation medicine, Randolph Field (TX, USA), Technical Report 4 (1951)","DOI":"10.1037\/e471672008-001"},{"key":"25_CR32","doi-asserted-by":"publisher","DOI":"10.1142\/9789812776655","volume-title":"Least Squares Support Vector Machines","author":"J Suykens","year":"2002","unstructured":"Suykens, J., Van Gestel, T., De Brabanter, J.: Least Squares Support Vector Machines. World Scientific, Singapore (2002)"},{"key":"25_CR33","first-page":"821","volume":"25","author":"MA Aizerman","year":"1964","unstructured":"Aizerman, M.A., Braverman, E.A., Rozonoer, L.: Theoretical foundations of the potential function method in pattern recognition learning. Autom. Remote Control 25, 821\u2013837 (1964)","journal-title":"Autom. Remote Control"},{"key":"25_CR34","doi-asserted-by":"publisher","first-page":"1553","DOI":"10.1016\/S0098-1354(02)00127-8","volume":"26","author":"G Birol","year":"2002","unstructured":"Birol, G., Undey, C., Cinar, A.: A modular simulation package for fed-batch fermentation: penicillin production. Comput. Chem. Eng. 26, 1553\u20131565 (2002)","journal-title":"Comput. Chem. Eng."},{"key":"25_CR35","doi-asserted-by":"publisher","first-page":"108","DOI":"10.1016\/j.compchemeng.2014.07.010","volume":"69","author":"G Gins","year":"2014","unstructured":"Gins, G., Vanlaer, J., Van den Kerkhof, P., Van Impe, J.F.M.: The RAYMOND simulation package - generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms. Comput. Chem. Eng. 69, 108\u2013118 (2014)","journal-title":"Comput. Chem. Eng."},{"key":"25_CR36","doi-asserted-by":"publisher","first-page":"285","DOI":"10.1016\/j.ces.2013.08.007","volume":"104","author":"P Kerkhof Van den","year":"2013","unstructured":"Van den Kerkhof, P., Vanlaer, J., Gins, G., Van Impe, J.F.M.: Analysis of smearing-out in contribution plot based fault isolation for statistical process control. Chem. Eng. Sci. 104, 285\u2013293 (2013)","journal-title":"Chem. Eng. Sci."},{"key":"25_CR37","doi-asserted-by":"publisher","first-page":"95","DOI":"10.1016\/S0169-7439(00)00062-9","volume":"51","author":"JA Westerhuis","year":"2000","unstructured":"Westerhuis, J.A., Gurden, S.P., Smilde, A.K.: Generalized contribution plots in multivariate statistical process monitoring. Chemometr. Intell. Lab. Syst. 51, 95\u2013114 (2000)","journal-title":"Chemometr. Intell. Lab. Syst."},{"key":"25_CR38","first-page":"1283","volume":"8","author":"S Wuyts","year":"2015","unstructured":"Wuyts, S., Gins, G., Van den Kerkhof, P., Van Impe, J.M.F.: Fault identification in batch processes using process data or contribution plots: a comparative study. Adv. Control Chem. Process. 8, 1283\u20131288 (2015)","journal-title":"Adv. Control Chem. Process."}],"container-title":["Lecture Notes in Computer Science","Advances in Data Mining. Applications and Theoretical Aspects"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-41561-1_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,17]],"date-time":"2024-06-17T22:38:55Z","timestamp":1718663935000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-41561-1_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"ISBN":["9783319415604","9783319415611"],"references-count":38,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-41561-1_25","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]},"assertion":[{"value":"28 June 2016","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}}]}}