{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T00:37:29Z","timestamp":1742949449164,"version":"3.40.3"},"publisher-location":"Cham","reference-count":23,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319470986"},{"type":"electronic","value":"9783319470993"}],"license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016]]},"DOI":"10.1007\/978-3-319-47099-3_2","type":"book-chapter","created":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T11:16:42Z","timestamp":1475147802000},"page":"17-28","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Exploiting Cross-Layer Hotness Identification to Improve Flash Memory System Performance"],"prefix":"10.1007","author":[{"given":"Jinhua","family":"Cui","sequence":"first","affiliation":[]},{"given":"Weiguo","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Shiqiang","family":"Nie","sequence":"additional","affiliation":[]},{"given":"Jianhang","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Zhuang","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Nianjun","family":"Zou","sequence":"additional","affiliation":[]},{"given":"Yinfeng","family":"Wang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,9,30]]},"reference":[{"key":"2_CR1","unstructured":"Margaglia, F., Yadgar, G., Yaakobi, E., Li, Y., Schuster, A., Brinkmann, A.: The devil is in the details: implementing flash page reuse with WOM codes. In: Proceedings of Conference on File and Storage Technologies, February 2016"},{"key":"2_CR2","unstructured":"Zhang, X., Li, J., Wang, H., Zhao, K., Zhang, T.: Reducing solid-state storage device write stress through opportunistic in-place delta compression. In: Proceedings of Conference on File and Storage Technologies, pp. 111\u2013124, February 2016"},{"key":"2_CR3","unstructured":"Cui, J., Wu, W., Zhang, X., Huang, J., Wang, Y.: Exploiting latency variation for access conflict reduction of NAND flash memory. In: 32nd International Conference on Massive Storage Systems and Technology, May 2016"},{"key":"2_CR4","unstructured":"Schroeder, B., Lagisetty, R., Merchant, A.: Flash reliability in production: the expected and the unexpected. In: Proceedings of Conference on File and Storage Technologies, pp. 67\u201380, February 2016"},{"key":"2_CR5","unstructured":"Zhao, K., Zhao, W., Sun, H., Zhang, X., Zheng, N., Zhang, T.: LDPC-in-SSD: making advanced error correction codes work effectively in solid state drives. In: Proceedings of Conference on File and Storage Technologies, pp. 243\u2013256 (2013)"},{"issue":"9","key":"2_CR6","first-page":"2412","volume":"60","author":"G Dong","year":"2013","unstructured":"Dong, G., Xie, N., Zhang, T.: Enabling nand flash memory use soft-decision error correction codes at minimal read latency overhead. IEEE Trans. Circ. Syst. I: Regular Papers 60(9), 2412\u20132421 (2013)","journal-title":"IEEE Trans. Circ. Syst. I: Regular Papers"},{"issue":"4","key":"2_CR7","doi-asserted-by":"publisher","first-page":"55","DOI":"10.1145\/2489792","volume":"18","author":"G Wu","year":"2013","unstructured":"Wu, G., He, X., Xie, N., Zhang, T.: Exploiting workload dynamics to improve SSD read latency via differentiated error correction codes. ACM Trans. Des. Autom. Electron. Syst. 18(4), 55 (2013)","journal-title":"ACM Trans. Des. Autom. Electron. Syst."},{"key":"2_CR8","unstructured":"Jimenez, X., Novo, D., Ienne, P.: Wear unleveling: improving NAND flash lifetime by balancing page endurance. In: Proceedings of Conference on File and Storage Technologies, pp. 47\u201359 (2014)"},{"issue":"7","key":"2_CR9","doi-asserted-by":"publisher","first-page":"1350","DOI":"10.1109\/TVLSI.2012.2210256","volume":"21","author":"Y Pan","year":"2013","unstructured":"Pan, Y., Dong, G., Zhang, T.: Error rate-based wear-leveling for NAND flash memory at highly scaled technology nodes. IEEE Trans. Very Large Scale Integration (VLSI) Syst. 21(7), 1350\u20131354 (2013)","journal-title":"IEEE Trans. Very Large Scale Integration (VLSI) Syst."},{"key":"2_CR10","unstructured":"Agrawal, N., Prabhakaran, V., Wobber, T., Davis, J.D., Manasse, M.S., Panigrahy, R.: Design tradeoffs for SSD performance. In: USENIX Annual Technical Conference, pp. 57\u201370 (2008)"},{"key":"2_CR11","unstructured":"Jeong, J., Hahn, S.S., Lee, S., Kim, J.: Lifetime improvement of NAND flash-based storage systems using dynamic program and erase scaling. In: Proceedings of Conference on File and Storage Technologies, pp. 61\u201374 (2014)"},{"key":"2_CR12","doi-asserted-by":"crossref","unstructured":"Peleato, B., Agarwal, R.: Maximizing MLC NAND lifetime and reliability in the presence of write noise. In: Proceedings of IEEE International Conference on Communications, pp. 3752\u20133756, June 2012","DOI":"10.1109\/ICC.2012.6363639"},{"key":"2_CR13","unstructured":"Jeong, J., Hahn, S.S., Lee, S., Kim, J.: Improving NAND endurance by dynamic program and erase scaling. In: USENIX Workshop on Hot Topics in Storage and File Systems, June 2013"},{"key":"2_CR14","unstructured":"Pan, Y., Dong, G., Zhang, T.: Exploiting memory device wear-out dynamics to improve NAND flash memory system performance. In: Proceedings of Conference on File and Storage Technologies, p. 18 (2011)"},{"issue":"4","key":"2_CR15","doi-asserted-by":"publisher","first-page":"614","DOI":"10.1109\/TCE.2014.7027334","volume":"60","author":"J Cui","year":"2014","unstructured":"Cui, J., Wu, W., Wang, Y., Duan, Z.: PT-LRU: a probabilistic page replacement algorithm for NAND flash-based consumer electronics. IEEE Trans. Consum. Electron. 60(4), 614\u2013622 (2014)","journal-title":"IEEE Trans. Consum. Electron."},{"issue":"1","key":"2_CR16","doi-asserted-by":"publisher","first-page":"23","DOI":"10.1109\/TCE.2016.7448559","volume":"62","author":"M Lin","year":"2016","unstructured":"Lin, M., Yao, Z., Xiong, J.: History-aware page replacement algorithm for NAND flash-based consumer electronics. IEEE Trans. Consum. Electron. 62(1), 23\u201329 (2016)","journal-title":"IEEE Trans. Consum. Electron."},{"key":"2_CR17","unstructured":"Storage Performance Council traces. \n                      http:\/\/traces.cs.umass.edu\/storage\/"},{"key":"2_CR18","doi-asserted-by":"crossref","unstructured":"Narayanan, D., Thereska, E., Donnelly, A., Elnikety, S., Rowstron, A.: Migrating server storage to SSDs: analysis of tradeoffs. In: Proceedings of the 4th ACM European Conference on Computer Systems, Nuremberg, Germany, pp. 145\u2013158 (2009)","DOI":"10.1145\/1519065.1519081"},{"key":"2_CR19","doi-asserted-by":"crossref","unstructured":"Hu, Y., Jiang, H., Feng, D., Tian, L., Luo, H., Zhang, S.: Performance impact and interplay of SSD parallelism through advanced commands, allocation strategy and data granularity. In: Proceedings of the International Conference on Supercomputing, pp. 96\u2013107, May 2011","DOI":"10.1145\/1995896.1995912"},{"issue":"6","key":"2_CR20","doi-asserted-by":"publisher","first-page":"1141","DOI":"10.1109\/TC.2012.60","volume":"62","author":"Y Hu","year":"2013","unstructured":"Hu, Y., Jiang, H., Feng, D., Tian, L., Luo, H., Ren, C.: Exploring and exploiting the multilevel parallelism inside SSDS for improved performance and endurance. IEEE Trans. Comput. 62(6), 1141\u20131155 (2013)","journal-title":"IEEE Trans. Comput."},{"key":"2_CR21","unstructured":"Jung, M., Kandemir, M.: An evaluation of different page allocation strategies on high-speed SSDS. In: Proceedings of USENIX Conference on File and Storage Technologies, p. 9 (2012)"},{"issue":"2","key":"2_CR22","doi-asserted-by":"publisher","first-page":"339","DOI":"10.1109\/TCE.2010.5505937","volume":"56","author":"S Jung","year":"2010","unstructured":"Jung, S., Lee, Y., Song, Y.: A process-aware hot\/cold identification scheme for flash memory storage systems. IEEE Trans. Consum. Electron. 56(2), 339\u2013347 (2010)","journal-title":"IEEE Trans. Consum. Electron."},{"key":"2_CR23","doi-asserted-by":"crossref","unstructured":"Park, D., Du, D.: Hot data identification for flash memory using multiple bloom filters. In: Proceedings of USENIX Conference on File and Storage Technologies, October 2011","DOI":"10.1109\/MSST.2011.5937216"}],"container-title":["Lecture Notes in Computer Science","Network and Parallel Computing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-47099-3_2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:07:00Z","timestamp":1603066020000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-47099-3_2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"ISBN":["9783319470986","9783319470993"],"references-count":23,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-47099-3_2","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2016]]},"assertion":[{"value":"30 September 2016","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"NPC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"IFIP International Conference on Network and Parallel Computing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Xi'an","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2016","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"28 October 2016","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"29 October 2016","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"13","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"npc2016","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}