{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,2]],"date-time":"2026-02-02T23:58:49Z","timestamp":1770076729637,"version":"3.49.0"},"publisher-location":"Cham","reference-count":40,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783319544069","type":"print"},{"value":"9783319544076","type":"electronic"}],"license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017]]},"DOI":"10.1007\/978-3-319-54407-6_4","type":"book-chapter","created":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:04:07Z","timestamp":1489442647000},"page":"50-61","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":14,"title":["CNN-GRNN for Image Sharpness Assessment"],"prefix":"10.1007","author":[{"given":"Shaode","family":"Yu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fan","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leida","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaoqin","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2017,3,15]]},"reference":[{"issue":"6","key":"4_CR1","doi-asserted-by":"publisher","first-page":"751","DOI":"10.1109\/LSP.2014.2314487","volume":"21","author":"K Bahrami","year":"2014","unstructured":"Bahrami, K., Kot, A.C.: A fast approach for no-reference image sharpness assessment based on maximum local variation. IEEE Sig. Process. Lett. 21(6), 751\u2013755 (2014)","journal-title":"IEEE Sig. Process. Lett."},{"issue":"8","key":"4_CR2","doi-asserted-by":"publisher","first-page":"1798","DOI":"10.1109\/TPAMI.2013.50","volume":"35","author":"Y Bengio","year":"2013","unstructured":"Bengio, Y., Courville, A., Vincent, P.: Representation learning: a review and new perspectives. IEEE Trans. Pattern Anal. Mach. Intell. 35(8), 1798\u20131828 (2013)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"4_CR3","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1155\/2013\/905685","volume":"2013","author":"DM Chandler","year":"2013","unstructured":"Chandler, D.M.: Seven challenges in image quality assessment: past, present, and future research. ISRN Sig. Process. 2013, 1\u201353 (2013)","journal-title":"ISRN Sig. Process."},{"issue":"3","key":"4_CR4","doi-asserted-by":"publisher","first-page":"934","DOI":"10.1109\/TIP.2011.2169974","volume":"21","author":"A Ciancio","year":"2012","unstructured":"Ciancio, A., Costa, A.D., da Silva, E., Said, A., Samadani, R., Obrador, P.: No-reference blur assessment of digital pictures based on multifeature classifiers. IEEE Trans. Image Process. 21(3), 934\u2013945 (2012)","journal-title":"IEEE Trans. Image Process."},{"issue":"4","key":"4_CR5","doi-asserted-by":"publisher","first-page":"717","DOI":"10.1109\/TIP.2008.2011760","volume":"18","author":"R Ferzli","year":"2009","unstructured":"Ferzli, R., Karam, L.J.: A no-reference objective image sharpness metric based on the notion of just noticeable blur (JNB). IEEE Trans. Image Process. 18(4), 717\u2013728 (2009)","journal-title":"IEEE Trans. Image Process."},{"issue":"7","key":"4_CR6","doi-asserted-by":"publisher","first-page":"2798","DOI":"10.1109\/TIP.2013.2251643","volume":"22","author":"R Hassen","year":"2013","unstructured":"Hassen, R., Wang, Z., Salama, M.M.: Image sharpness assessment based on local phase coherence. IEEE Trans. Image Process. 22(7), 2798\u20132810 (2013)","journal-title":"IEEE Trans. Image Process."},{"issue":"2","key":"4_CR7","doi-asserted-by":"publisher","first-page":"46","DOI":"10.1109\/MMUL.2014.55","volume":"22","author":"W Hou","year":"2015","unstructured":"Hou, W., Gao, X.: Saliency-guided deep framework for image quality assessment. IEEE Multimedia 22(2), 46\u201355 (2015)","journal-title":"IEEE Multimedia"},{"issue":"6","key":"4_CR8","first-page":"46","volume":"26","author":"W Hou","year":"2015","unstructured":"Hou, W., Gao, X., Tao, D., Li, X.: Blind image quality assessment via deep learning. IEEE Trans. Neural Netw. Learn. Syst. 26(6), 46\u201355 (2015)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"key":"4_CR9","doi-asserted-by":"crossref","unstructured":"Kang, L., Ye, P., Li, Y., Doermann, D.: Convolutional neural networks for no-reference image quality assessment. IEEE Conference on Computer Vision and Pattern Recognition, pp. 1733\u20131740 (2014)","DOI":"10.1109\/CVPR.2014.224"},{"key":"4_CR10","unstructured":"Krizhevsky, A., Sutskever, I., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 1097\u20131105 (2012)"},{"issue":"1","key":"4_CR11","doi-asserted-by":"publisher","first-page":"11006","DOI":"10.1117\/1.3267105","volume":"19","author":"EC Larson","year":"2010","unstructured":"Larson, E.C., Chandler, D.M.: Most apparent distortion: full-reference image quality assessment and the role of strategy. J. Electron. Imaging 19(1), 11006 (2010)","journal-title":"J. Electron. Imaging"},{"key":"4_CR12","doi-asserted-by":"publisher","first-page":"436","DOI":"10.1038\/nature14539","volume":"521","author":"Y LeCun","year":"2015","unstructured":"LeCun, Y., Bengio, Y., Hinton, G.: Deep learning. Nature 521, 436\u2013444 (2015)","journal-title":"Nature"},{"issue":"5","key":"4_CR13","doi-asserted-by":"publisher","first-page":"793","DOI":"10.1109\/TNN.2011.2120620","volume":"22","author":"C Li","year":"2011","unstructured":"Li, C., Bovik, A.C., Wu, X.: Blind image quality assessment using a general regression neural network. IEEE Trans. Neural Netw. 22(5), 793\u2013799 (2011)","journal-title":"IEEE Trans. Neural Netw."},{"issue":"1","key":"4_CR14","doi-asserted-by":"publisher","first-page":"39","DOI":"10.1109\/TCYB.2015.2392129","volume":"46","author":"L Li","year":"2016","unstructured":"Li, L., Lin, W., Wang, X., Yang, G., Bahrami, K., Kot, A.C.: No-reference image blur assessment based on discrete orthogonal moments. IEEE Trans. Cybern. 46(1), 39\u201350 (2016)","journal-title":"IEEE Trans. Cybern."},{"key":"4_CR15","doi-asserted-by":"publisher","first-page":"94","DOI":"10.1016\/j.neucom.2014.12.015","volume":"154","author":"Y Li","year":"2015","unstructured":"Li, Y., Po, L., Xu, X., Feng, L., Yuan, F., Cheung, C.H., Cheung, K.W.: No-reference image quality assessment with shearlet transform and deep neural networks. Neurocomputing 154, 94\u2013109 (2015)","journal-title":"Neurocomputing"},{"issue":"6","key":"4_CR16","doi-asserted-by":"publisher","first-page":"1085","DOI":"10.1109\/TMM.2016.2545398","volume":"18","author":"L Li","year":"2016","unstructured":"Li, L., Wu, D., Wu, J., Li, H., Lin, W., Kot, A.C.: Image sharpness assessment by sparse representation. IEEE Trans. Multimedia 18(6), 1085\u20131097 (2016)","journal-title":"IEEE Trans. Multimedia"},{"issue":"4","key":"4_CR17","doi-asserted-by":"publisher","first-page":"297","DOI":"10.1016\/j.jvcir.2011.01.005","volume":"22","author":"W Lin","year":"2011","unstructured":"Lin, W., Kuo, C.: Perceptual visual quality metrics: a survey. J. Vis. Commun. Image Represent. 22(4), 297\u2013312 (2011)","journal-title":"J. Vis. Commun. Image Represent."},{"key":"4_CR18","doi-asserted-by":"crossref","unstructured":"Lv, Q., Jiang, G., Yu, M., Xu, H., Shao, F., Liu, S.: Difference of Gaussian statistical features based blind image quality assessment: a deep learning approach. In: IEEE Conference on Image Processing, pp. 2344\u20132348 (2015)","DOI":"10.1109\/ICIP.2015.7351221"},{"key":"4_CR19","doi-asserted-by":"publisher","first-page":"141","DOI":"10.1016\/j.ins.2014.12.055","volume":"301","author":"RA Manap","year":"2015","unstructured":"Manap, R.A., Shao, L.: Non-distortion-specific no-reference image quality assessment: a survey. Inf. Sci. 301, 141\u2013160 (2015)","journal-title":"Inf. Sci."},{"issue":"12","key":"4_CR20","doi-asserted-by":"publisher","first-page":"4695","DOI":"10.1109\/TIP.2012.2214050","volume":"21","author":"A Mittal","year":"2012","unstructured":"Mittal, A., Moorthy, A.K., Bovik, A.C.: No-reference image quality assessment in the spatial domain. IEEE Trans. Image Process. 21(12), 4695\u20134708 (2012)","journal-title":"IEEE Trans. Image Process."},{"issue":"3","key":"4_CR21","doi-asserted-by":"publisher","first-page":"209","DOI":"10.1109\/LSP.2012.2227726","volume":"20","author":"A Mittal","year":"2013","unstructured":"Mittal, A., Soundararajan, R., Bovik, A.C.: Making a \u201ccompletely\u201d blind image quality analyzer. IEEE Sig. Process. Lett. 20(3), 209\u2013212 (2013)","journal-title":"IEEE Sig. Process. Lett."},{"issue":"5","key":"4_CR22","doi-asserted-by":"publisher","first-page":"513","DOI":"10.1109\/LSP.2010.2043888","volume":"17","author":"AK Moorthy","year":"2010","unstructured":"Moorthy, A.K., Bovik, A.C.: A two-step framework for constructing blind image quality indices. IEEE Sig. Process. Lett. 17(5), 513\u2013516 (2010)","journal-title":"IEEE Sig. Process. Lett."},{"issue":"9","key":"4_CR23","doi-asserted-by":"publisher","first-page":"2678","DOI":"10.1109\/TIP.2011.2131660","volume":"20","author":"ND Narvekar","year":"2009","unstructured":"Narvekar, N.D., Karam, L.J.: A no-reference image blur metric based on the cumulative probability of blur detection (CPBD). IEEE Trans. Image Process. 20(9), 2678\u20132683 (2009)","journal-title":"IEEE Trans. Image Process."},{"issue":"4","key":"4_CR24","doi-asserted-by":"publisher","first-page":"1318","DOI":"10.1016\/j.patcog.2011.09.021","volume":"45","author":"X Niu","year":"2012","unstructured":"Niu, X., Suen, C.: A novel hybrid CNN-SVM classifier for recognizing handwritten digits. Pattern Recogn. 45(4), 1318\u20131325 (2012)","journal-title":"Pattern Recogn."},{"key":"4_CR25","unstructured":"Palm, R.B.: Prediction as a candidate for learning deep hierarchical models of data. Technical University of Denmar (2012)"},{"issue":"4","key":"4_CR26","first-page":"30","volume":"10","author":"N Ponomarenko","year":"2009","unstructured":"Ponomarenko, N., Lukin, V., Zelensky, A., Egiazarian, K., Astola, J., Carli, M., Battisti, F.: TID2008 - a database for evaluation of full-reference visual quality assessment metrics. Adv. Mod. Radioelectron. 10(4), 30\u201345 (2009)","journal-title":"Adv. Mod. Radioelectron."},{"key":"4_CR27","doi-asserted-by":"publisher","first-page":"57","DOI":"10.1016\/j.image.2014.10.009","volume":"20","author":"N Ponomarenko","year":"2015","unstructured":"Ponomarenko, N., Jin, L., Ieremeiev, O., Lukin, V., Egiazarian, K., Astola, J., Vozel, B., Chehdi, K., Carli, M., Battisti, F., Kuo, C.C.J.: Image database TID2013: peculiarities, results and perspectives. Sig. Process. Image Commun. 20, 57\u201377 (2015)","journal-title":"Sig. Process. Image Commun."},{"issue":"3","key":"4_CR28","doi-asserted-by":"publisher","first-page":"211","DOI":"10.1007\/s11263-015-0816-y","volume":"115","author":"O Russakovsky","year":"2015","unstructured":"Russakovsky, O., Deng, J., Su, H., Jonathan, K., Satheesh, S., Ma, S., Huang, Z., Karpathy, A., Khosla, A., Bernstein, M., Berg, A., Li, F.: Imagenet large scale visual recognition challenge. Int. J. Comput. Vis. 115(3), 211\u2013252 (2015)","journal-title":"Int. J. Comput. Vis."},{"issue":"8","key":"4_CR29","doi-asserted-by":"publisher","first-page":"3339","DOI":"10.1109\/TIP.2012.2191563","volume":"21","author":"MA Saad","year":"2012","unstructured":"Saad, M.A., Bovik, A.C., Christophe, C.: Blind image quality assessment: a natural scene statistics approach in the DCT domain. IEEE Trans. Image Process. 21(8), 3339\u20133352 (2012)","journal-title":"IEEE Trans. Image Process."},{"issue":"7","key":"4_CR30","doi-asserted-by":"publisher","first-page":"1625","DOI":"10.1016\/j.jvcir.2014.08.002","volume":"25","author":"Q Sang","year":"2014","unstructured":"Sang, Q., Qi, H., Wu, X., Bovic, A.C.: No-reference image blur index based on singular value curve. J. Vis. Commun. Image Represent. 25(7), 1625\u20131630 (2014)","journal-title":"J. Vis. Commun. Image Represent."},{"issue":"11","key":"4_CR31","doi-asserted-by":"publisher","first-page":"3440","DOI":"10.1109\/TIP.2006.881959","volume":"15","author":"HR Sheikh","year":"2006","unstructured":"Sheikh, H.R., Sabir, M.F., Bovik, A.C.: A statistical evaluation of recent full reference image quality assessment algorithms. IEEE Trans. Image Process. 15(11), 3440\u20133451 (2006)","journal-title":"IEEE Trans. Image Process."},{"issue":"6","key":"4_CR32","doi-asserted-by":"publisher","first-page":"568","DOI":"10.1109\/72.97934","volume":"2","author":"DF Specht","year":"1991","unstructured":"Specht, D.F.: A general regression neural network. IEEE Trans. Neural Netw. 2(6), 568\u2013576 (1991)","journal-title":"IEEE Trans. Neural Netw."},{"key":"4_CR33","doi-asserted-by":"crossref","unstructured":"Szegedy, C., Liu, W., Jia, Y., Sermanet, P., Reed, S., Anguelov, D., Erhan, D., Vanhoucke, V., Rabinovich, A.: Going deeper with convolutions. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 1\u20139 (2015)","DOI":"10.1109\/CVPR.2015.7298594"},{"issue":"1","key":"4_CR34","doi-asserted-by":"publisher","first-page":"390","DOI":"10.1109\/TIP.2014.2378061","volume":"24","author":"T Virtanen","year":"2015","unstructured":"Virtanen, T., Nuutinen, M., Vaahteranoksa, M., Oittinen, P.: CID2013: a database for evaluating no-reference image quality assessment algorithms. IEEE Trans. Image Process. 24(1), 390\u2013402 (2015)","journal-title":"IEEE Trans. Image Process."},{"issue":"7","key":"4_CR35","doi-asserted-by":"publisher","first-page":"423","DOI":"10.1109\/LSP.2012.2199980","volume":"19","author":"PV Vu","year":"2012","unstructured":"Vu, P.V., Chandler, D.M.: A fast wavelet-based algorithm for global and local image sharpness estimation. IEEE Sig. Process. Lett. 19(7), 423\u2013426 (2012)","journal-title":"IEEE Sig. Process. Lett."},{"issue":"3","key":"4_CR36","doi-asserted-by":"publisher","first-page":"934","DOI":"10.1109\/TIP.2011.2169974","volume":"21","author":"CT Vu","year":"2012","unstructured":"Vu, C.T., Phan, T.D., Chandler, D.M.: S3: a spectral and spatial measure of local perceived sharpness in natural images. IEEE Trans. Image Process. 21(3), 934\u2013945 (2012)","journal-title":"IEEE Trans. Image Process."},{"issue":"6","key":"4_CR37","doi-asserted-by":"publisher","first-page":"29","DOI":"10.1109\/MSP.2011.942471","volume":"28","author":"Z Wang","year":"2011","unstructured":"Wang, Z., Bovik, A.C.: Reduced- and no-reference image quality assessment. IEEE Sig. Process. Mag. 28(6), 29\u201340 (2011)","journal-title":"IEEE Sig. Process. Mag."},{"issue":"4","key":"4_CR38","doi-asserted-by":"publisher","first-page":"600","DOI":"10.1109\/TIP.2003.819861","volume":"13","author":"Z Wang","year":"2004","unstructured":"Wang, Z., Bovik, A.C., Sheikh, H.R., Simoncelli, E.P.: Image quality assessment: from error visibility to structural similarity. IEEE Trans. Image Process. 13(4), 600\u2013612 (2004)","journal-title":"IEEE Trans. Image Process."},{"key":"4_CR39","doi-asserted-by":"crossref","unstructured":"Yu, S., Zhang, W., Wu, S., Li, X., Xie, Y.: Applications of edge preservation ratio in image processing. In: IEEE International Conference on Signal Processing, pp. 698\u2013702 (2014)","DOI":"10.1109\/ICOSP.2014.7015093"},{"issue":"8","key":"4_CR40","doi-asserted-by":"publisher","first-page":"2378","DOI":"10.1109\/TIP.2011.2109730","volume":"20","author":"L Zhang","year":"2011","unstructured":"Zhang, L., Zhang, L., Mou, X., Zhang, D.: FSIM: a feature similarity index for image quality assessment. IEEE Trans. Image Process. 20(8), 2378\u20132386 (2011)","journal-title":"IEEE Trans. Image Process."}],"container-title":["Lecture Notes in Computer Science","Computer Vision \u2013 ACCV 2016 Workshops"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-54407-6_4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T01:47:56Z","timestamp":1558316876000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-54407-6_4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"ISBN":["9783319544069","9783319544076"],"references-count":40,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-54407-6_4","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017]]},"assertion":[{"value":"15 March 2017","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ACCV","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Asian Conference on Computer Vision","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Taipei","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Taiwan","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2016","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 November 2016","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"24 November 2016","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"13","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"accv2016","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.accv2016.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}