{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T01:28:53Z","timestamp":1742952533347,"version":"3.40.3"},"publisher-location":"Cham","reference-count":11,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319592251"},{"type":"electronic","value":"9783319592268"}],"license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017]]},"DOI":"10.1007\/978-3-319-59226-8_16","type":"book-chapter","created":{"date-parts":[[2017,5,19]],"date-time":"2017-05-19T14:34:22Z","timestamp":1495204462000},"page":"159-168","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Color-Texture Image Analysis for Automatic Failure Detection in Tiles"],"prefix":"10.1007","author":[{"given":"Miyuki-Teri","family":"Villalon-Hernandez","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dora-Luz","family":"Almanza-Ojeda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mario-Alberto","family":"Ibarra-Manzano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2017,5,20]]},"reference":[{"key":"16_CR1","doi-asserted-by":"publisher","first-page":"118","DOI":"10.1109\/TPAMI.1986.4767760","volume":"8","author":"M Unser","year":"1986","unstructured":"Unser, M.: Sum and difference histograms for texture classification. IEEE Trans. Pattern Anal. Mach. Intell. 8, 118\u2013125 (1986). doi:10.1109\/TPAMI.1986.4767760","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"16_CR2","doi-asserted-by":"publisher","unstructured":"Hocenski, Z., Keser, T.: Failure detection and isolation in ceramic tile edges based on contour descriptor analysis. In: Mediterranean Conference on Control Automation, MED 2007, pp. 1\u20136 (2007). doi:10.1109\/MED.2007.4433713.","DOI":"10.1109\/MED.2007.4433713."},{"key":"16_CR3","doi-asserted-by":"publisher","first-page":"132","DOI":"10.1109\/41.557508","volume":"44","author":"C Boukouvalas","year":"1997","unstructured":"Boukouvalas, C., Kittler, J., Marik, R., Petrou, M.: Automatic color grading of ceramic tiles using machine vision. IEEE Trans. Industr. Electron. 44, 132\u2013135 (1997). doi:10.1109\/41.557508","journal-title":"IEEE Trans. Industr. Electron."},{"key":"16_CR4","doi-asserted-by":"publisher","unstructured":"Boukouvalas, C., Kittler, J., Marik, R., Petrou, M.: Automatic grading of ceramic tiles using machine vision. In: 1994 IEEE International Symposium on Industrial Electronics, Symposium Proceedings, ISIE 1994, pp. 13\u201318 (1994). doi:10.1109\/ISIE.1994.333123.","DOI":"10.1109\/ISIE.1994.333123."},{"key":"16_CR5","unstructured":"Boukouvalas, C., Kittler, J., Marik, R., Mirmehdi, M., Petrou, M.: Ceramic tile inspection for colour and structural defects. In: Proceedings of AMPT95, pp. 390\u2013399 (1995)"},{"key":"16_CR6","doi-asserted-by":"publisher","first-page":"219","DOI":"10.1109\/41.744415","volume":"46","author":"C Boukouvalas","year":"1999","unstructured":"Boukouvalas, C., Kittler, J., Marik, R., Petrou, M.: Color grading of randomly textured ceramic tiles using color histograms. IEEE Transactions on Industrial Electronics 46, 219\u2013226 (1999). doi:10.1109\/41.744415","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"16_CR7","unstructured":"Aborisade, D.O., Ibiyemi, T.S.: Ceramic Wall Tile Quality Classification Training Algorithms Using Statistical Approach. Research Journal of Applied Sciences 2, 1255\u20131260 (2007). http:\/\/medwelljournals.com\/abstract\/?doi=rjasci.2007.1255.1260"},{"key":"16_CR8","doi-asserted-by":"publisher","first-page":"170","DOI":"10.1117\/1.1339877","volume":"40","author":"S Kukkonen","year":"2001","unstructured":"Kukkonen, S., K\u00e4lvi\u00e4inen, H., Parkkinen, J.: Color features for quality control in ceramic tile industry. Opt. Eng. 40, 170\u2013177 (2001). doi:10.1117\/1.1339877","journal-title":"Opt. Eng."},{"key":"16_CR9","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1590\/S1678-58782011000100010","volume":"33","author":"R Andrade","year":"2011","unstructured":"Andrade, R., Eduardo, C.: Methodology for automatic process of the fired ceramic tile\u2019s internal defect using IR images and artificial neural network. J. Braz. Soc. Mech. Sci. Eng. 33, 67\u201373 (2011). doi:10.1590\/S1678-58782011000100010","journal-title":"J. Braz. Soc. Mech. Sci. Eng."},{"key":"16_CR10","doi-asserted-by":"publisher","unstructured":"Smith, M.L., Stamp, R.J.: Automated inspection of textured ceramic tiles. Comput. Ind. 43, 73\u201382 (2000). doi:10.1016\/S0166-3615(00)00052-X, Elsevier","DOI":"10.1016\/S0166-3615(00)00052-X"},{"key":"16_CR11","unstructured":"Rimac-drlje, S., Keller, A., Nyarko, K.E.: Self-learning system for surface failure detection. In: 13th European Signal Processing Conference, pp. 1\u20134 (2005)"}],"container-title":["Lecture Notes in Computer Science","Pattern Recognition"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-59226-8_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T17:59:00Z","timestamp":1710266340000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-59226-8_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"ISBN":["9783319592251","9783319592268"],"references-count":11,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-59226-8_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2017]]},"assertion":[{"value":"20 May 2017","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"MCPR","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Mexican Conference on Pattern Recognition","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Huatulco","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Mexico","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2017","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21 June 2017","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"24 June 2017","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"mcpr22017","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/ccc.inaoep.mx\/~mcpr2017\/index.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}