{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:29:26Z","timestamp":1747805366886},"publisher-location":"Cham","reference-count":18,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319648606"},{"type":"electronic","value":"9783319648613"}],"license":[{"start":{"date-parts":[[2017,8,31]],"date-time":"2017-08-31T00:00:00Z","timestamp":1504137600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-319-64861-3_17","type":"book-chapter","created":{"date-parts":[[2017,8,30]],"date-time":"2017-08-30T12:58:04Z","timestamp":1504097884000},"page":"181-191","source":"Crossref","is-referenced-by-count":5,"title":["An Experimental Evaluation of Binary Feature Descriptors"],"prefix":"10.1007","author":[{"given":"Hammam A.","family":"Alshazly","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Hassaballah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abdelmgeid A.","family":"Ali","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2017,8,31]]},"reference":[{"key":"17_CR1","doi-asserted-by":"crossref","unstructured":"Awad, A.I., Hassaballah, M.: Image feature detectors and descriptors: foundations and applications. In: Studies in computational intelligence (ISSN 1860-949X), vol. 630. Springer (2016)","DOI":"10.1007\/978-3-319-28854-3"},{"issue":"3","key":"17_CR2","doi-asserted-by":"crossref","first-page":"177","DOI":"10.1561\/0600000017","volume":"3","author":"T Tuytelaars","year":"2008","unstructured":"Tuytelaars, T., Mikolajczyk, K.: Local invariant feature detectors: a survey. Found. Trends Comput. Graph. Vis. 3(3), 177\u2013280 (2008)","journal-title":"Found. Trends Comput. Graph. Vis."},{"key":"17_CR3","doi-asserted-by":"crossref","unstructured":"Hassaballah, M., Aly, A.A., Alshazly, H.A.: Image features detection, description and matching. In: Image Feature Detectors and Descriptors: Foundations and Applications, vol. 630, pp. 11\u201345. Springer (2016)","DOI":"10.1007\/978-3-319-28854-3_2"},{"issue":"2","key":"17_CR4","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1023\/B:VISI.0000029664.99615.94","volume":"60","author":"D Lowe","year":"2004","unstructured":"Lowe, D.: Distinctive image features from scale-invariant keypoints. Int. J. Comput. Vision 60(2), 91\u2013110 (2004)","journal-title":"Int. J. Comput. Vision"},{"issue":"3","key":"17_CR5","doi-asserted-by":"crossref","first-page":"346","DOI":"10.1016\/j.cviu.2007.09.014","volume":"110","author":"H Bay","year":"2008","unstructured":"Bay, H., Ess, A., Tuytelaars, T., Gool, L.: Speeded-up robust features (SURF). Comput. Vis. Image Underst. 110(3), 346\u2013359 (2008)","journal-title":"Comput. Vis. Image Underst."},{"issue":"10","key":"17_CR6","doi-asserted-by":"crossref","first-page":"1615","DOI":"10.1109\/TPAMI.2005.188","volume":"27","author":"K Mikolajczyk","year":"2005","unstructured":"Mikolajczyk, K., Schmid, C.: A performance evaluation of local descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 27(10), 1615\u20131630 (2005)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"17_CR7","doi-asserted-by":"crossref","unstructured":"Heinly, J., Dunn, E., Frahm, J.M.: Comparative evaluation of binary features. In: European Conference on Computer Vision, pp. 759\u2013773. Florence, Italy (2012)","DOI":"10.1007\/978-3-642-33709-3_54"},{"key":"17_CR8","doi-asserted-by":"crossref","unstructured":"Bekele, D., Teutsch, M., Schuchert, T.: Evaluation of binary keypoint descriptors. In: IEEE International Conference on Image Processing, Melbourne, Australia, pp. 3652\u20133656 (2013)","DOI":"10.1109\/ICIP.2013.6738753"},{"key":"17_CR9","doi-asserted-by":"crossref","unstructured":"Figat, J., Kornuta, T., Kasprzak, W.: Performance evaluation of binary descriptors of local features. In: International Conference on Computer Vision and Graphics, Warsaw, Poland, pp. 187\u2013194 (2014)","DOI":"10.1007\/978-3-319-11331-9_23"},{"issue":"4","key":"17_CR10","doi-asserted-by":"crossref","first-page":"443","DOI":"10.1007\/s00138-015-0679-9","volume":"26","author":"D Mukherjee","year":"2015","unstructured":"Mukherjee, D., Wu, Q.J., Wang, G.: A comparative experimental study of image feature detectors and descriptors. Mach. Vis. Appl. 26(4), 443\u2013466 (2015)","journal-title":"Mach. Vis. Appl."},{"key":"17_CR11","doi-asserted-by":"crossref","unstructured":"Johansson, J., Solli, M., Maki, A.: An evaluation of local feature detectors and descriptors for infrared images. In: European Conference on Computer Vision Workshops, Amsterdam, The Netherlands, pp. 711\u2013723 (2016)","DOI":"10.1007\/978-3-319-49409-8_59"},{"issue":"7","key":"17_CR12","doi-asserted-by":"crossref","first-page":"1281","DOI":"10.1109\/TPAMI.2011.222","volume":"34","author":"M Calonder","year":"2012","unstructured":"Calonder, M., Lepetit, V., Ozuysal, M., Trzcinski, T., Strecha, C., Fua, P.: Brief: computing a local binary descriptor very fast. IEEE Trans. Pattern Anal. Mach. Intell. 34(7), 1281\u20131298 (2012)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"17_CR13","doi-asserted-by":"crossref","unstructured":"Rublee, E., Rabaud, V., Konolige, K., Bradski, G.: ORB: an efficient alternative to sift or surf. In: ICCV, Barcelona, Spain, pp. 2564\u20132571 (2011)","DOI":"10.1109\/ICCV.2011.6126544"},{"issue":"1","key":"17_CR14","doi-asserted-by":"crossref","first-page":"105","DOI":"10.1109\/TPAMI.2008.275","volume":"32","author":"E Rosten","year":"2010","unstructured":"Rosten, E., Porter, R., Drummond, T.: Faster and better: a machine learning approach to corner detection. IEEE Trans. Pattern Anal. Mach. Intell. 32(1), 105\u2013119 (2010)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"17_CR15","doi-asserted-by":"crossref","unstructured":"Leutenegger, S., Chli, M., Siegwart, R.Y.: BRISK: binary robust invariant scalable keypoints. In: ICCV, Barcelona, Spain, pp. 2548\u20132555 (2011)","DOI":"10.1109\/ICCV.2011.6126542"},{"key":"17_CR16","doi-asserted-by":"crossref","unstructured":"Mair, E., Hager, G.D., Burschka, D., Suppa, M., Hirzinger, G.: Adaptive and generic corner detection based on the accelerated segment test. In: European Conference on Computer Vision, Crete, Greece, pp. 183\u2013196 (2010)","DOI":"10.1007\/978-3-642-15552-9_14"},{"key":"17_CR17","doi-asserted-by":"crossref","unstructured":"Alahi, A., Ortiz, R., Vandergheynst, P.: FREAK: fast retina keypoint. In: IEEE Conference on Computer Vision and Pattern Recognition, Rhode Island, USA, pp. 510\u2013517 (2012)","DOI":"10.1109\/CVPR.2012.6247715"},{"key":"17_CR18","doi-asserted-by":"crossref","unstructured":"Levi, G., Hassner, T.: LATCH: learned arrangements of three patch codes. In: IEEE Winter Conference on Applications of Computer Vision, NY, USA, pp. 1\u20139 (2016)","DOI":"10.1109\/WACV.2016.7477723"}],"container-title":["Advances in Intelligent Systems and Computing","Proceedings of the International Conference on Advanced Intelligent Systems and Informatics 2017"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-64861-3_17","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,16]],"date-time":"2020-10-16T17:35:40Z","timestamp":1602869740000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-64861-3_17"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8,31]]},"ISBN":["9783319648606","9783319648613"],"references-count":18,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-64861-3_17","relation":{},"ISSN":["2194-5357","2194-5365"],"issn-type":[{"type":"print","value":"2194-5357"},{"type":"electronic","value":"2194-5365"}],"subject":[],"published":{"date-parts":[[2017,8,31]]}}}