{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T22:04:35Z","timestamp":1768514675597,"version":"3.49.0"},"publisher-location":"Cham","reference-count":14,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783319671031","type":"print"},{"value":"9783319671048","type":"electronic"}],"license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017]]},"DOI":"10.1007\/978-3-319-67104-8_7","type":"book-chapter","created":{"date-parts":[[2017,8,31]],"date-time":"2017-08-31T07:14:14Z","timestamp":1504163654000},"page":"130-151","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs"],"prefix":"10.1007","author":[{"given":"Paolo","family":"Bernardi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alberto","family":"Bosio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giorgio","family":"Di Natale","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Guerriero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ernesto","family":"Sanchez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Federico","family":"Venini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2017,9,1]]},"reference":[{"key":"7_CR1","doi-asserted-by":"crossref","unstructured":"Rosinger, S., Metzdorf, M., Helms, D., Nebel, W.: Behavioral-level thermal - and aging-estimation flow. In: 2011 12th Latin American Test Workshop (LATW), Porto de Galinhas, pp. 1\u20136 (2011)","DOI":"10.1109\/LATW.2011.5985908"},{"issue":"11","key":"7_CR2","doi-asserted-by":"publisher","first-page":"1257","DOI":"10.1109\/PROC.1983.12763","volume":"71","author":"W Kuo","year":"1983","unstructured":"Kuo, W., Kuo, Y.: Facing the headaches of early failures: a state-of-the-art review of burn-in decisions. Proc. IEEE 71(11), 1257\u20131266 (1983)","journal-title":"Proc. IEEE"},{"key":"7_CR3","doi-asserted-by":"crossref","unstructured":"Appello, D., Bernardi, P., Cagliesi, R., Giancarlini, M., Grosso, M., Sanchez, E., Sonza Reorda, M.: Automatic functional stress pattern generation for SoC reliability characterization. In: 14th IEEE European Test Symposium (ETS), Sevilla, pp. 93\u201398 (2009)","DOI":"10.1109\/ETS.2009.16"},{"key":"7_CR4","doi-asserted-by":"crossref","unstructured":"Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M.A., Liu, C., Wunderlich, H.J.: FAST-BIST: faster-than-at-Speed BIST targeting hidden delay defects. In: 2014 International Test Conference (ITC), Seattle, WA, pp. 1\u20138 (2014)","DOI":"10.1109\/TEST.2014.7035360"},{"key":"7_CR5","unstructured":"Yan, H., Singh, A.D.: Experiments in detecting delay faults using multiple higher frequency clocks and results from neighboring die. In: 2003 International Test Conference (ITC), pp. 105\u2013111 (2003)"},{"key":"7_CR6","doi-asserted-by":"crossref","unstructured":"Tayade, R., Abraham, J.A.: On-chip programmable capture for accurate path delay test and characterization. In: 2008 IEEE International Test Conference (ITC), Santa Clara, CA, pp. 1\u201310 (2008)","DOI":"10.1109\/TEST.2008.4700564"},{"key":"7_CR7","unstructured":"Pei, S., Li, H., Li, X.: An on-chip clock generation scheme for faster-than-at-speed delay testing. In: 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), Dresden, pp. 1353\u20131356 (2010)"},{"key":"7_CR8","doi-asserted-by":"crossref","unstructured":"Kampmann, M., Kochte, M.A., Schneider, E., Indlekofer, T., Hellebrand, S., Wunderlich, H.J.: Optimized selection of frequencies for faster-than-at-speed test. In: 2015 24th IEEE Asian Test Symposium, pp. 109\u2013114 (2015)","DOI":"10.1109\/ATS.2015.26"},{"key":"7_CR9","doi-asserted-by":"crossref","unstructured":"Ahmed, N., Tehranipoor, M., Jayaram, V.: A novel framework for faster-than-at-speed delay test considering IR-drop effects. In: 2006 IEEE\/ACM International Conference on Computer Aided Design, San Jose, CA, pp. 198\u2013203 (2006)","DOI":"10.1109\/ICCAD.2006.320136"},{"key":"7_CR10","unstructured":"Amodeo, M., Cory, B.: Defining faster-than-at-speed delay tests. Cadence Nanometer Test Q. 2(2), 1\u20133 (2005)"},{"issue":"3","key":"7_CR11","doi-asserted-by":"publisher","first-page":"4","DOI":"10.1109\/MDT.2010.5","volume":"27","author":"M Psarakis","year":"2010","unstructured":"Psarakis, M., Gizopoulos, D., Sanchez, E., Sonza Reorda, M.: Microprocessor software-based self-testing. IEEE Des. Test Comput. 27(3), 4\u201319 (2010)","journal-title":"IEEE Des. Test Comput."},{"key":"7_CR12","doi-asserted-by":"crossref","unstructured":"Bernardi, P., Bosio, A., Di Natale, G., Guerriero, A., Venini, F.: Faster-than-at-speed execution of functional programs: an experimental analysis. In: IFIP\/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Tallinn (2016)","DOI":"10.1109\/VLSI-SoC.2016.7753581"},{"key":"7_CR13","unstructured":"miniMIPS. Opencores.org (2016). http:\/\/opencores.org\/project,minimips"},{"key":"7_CR14","unstructured":"Primetime. synopsys.com (2016). https:\/\/www.synopsys.com\/implementation-and-signoff\/signoff\/primetime.html"}],"container-title":["IFIP Advances in Information and Communication Technology","VLSI-SoC: System-on-Chip in the Nanoscale Era \u2013 Design, Verification and Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-67104-8_7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,8,31]],"date-time":"2021-08-31T00:04:04Z","timestamp":1630368244000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-67104-8_7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"ISBN":["9783319671031","9783319671048"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-67104-8_7","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"value":"1868-4238","type":"print"},{"value":"1868-422X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017]]},"assertion":[{"value":"1 September 2017","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"VLSI-SoC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"IFIP\/IEEE International Conference on Very Large Scale Integration - System on a Chip","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Tallinn","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Estonia","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2016","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 September 2016","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"28 September 2016","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"24","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"vlsi-soc2016","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/ati.ttu.ee\/vlsi-soc2016\/index.php?page=7","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}