{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T15:22:39Z","timestamp":1773760959601,"version":"3.50.1"},"publisher-location":"Cham","reference-count":22,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783319699257","type":"print"},{"value":"9783319699264","type":"electronic"}],"license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017]]},"DOI":"10.1007\/978-3-319-69926-4_13","type":"book-chapter","created":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T06:55:09Z","timestamp":1509087309000},"page":"165-181","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["The Evolution of Design Pattern Grime: An Industrial Case Study"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9371-232X","authenticated-orcid":false,"given":"Daniel","family":"Feitosa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7101-0754","authenticated-orcid":false,"given":"Paris","family":"Avgeriou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5764-7302","authenticated-orcid":false,"given":"Apostolos","family":"Ampatzoglou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Elisa Yumi","family":"Nakagawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2017,10,28]]},"reference":[{"key":"13_CR1","volume-title":"Design Patterns: Elements of Reusable Object-Oriented Software","author":"E Gamma","year":"1995","unstructured":"Gamma, E., Helm, R., Johnson, R.E., Vlissides, J.: Design Patterns: Elements of Reusable Object-Oriented Software. Addison-Wesley Longman Publishing Co., Inc., Boston (1995)"},{"key":"13_CR2","doi-asserted-by":"crossref","unstructured":"Khomh, F., Gueheneuc, Y.-G., Antoniol, G.: Playing roles in design patterns: an empirical descriptive and analytic study. In: 25th IEEE International Conference on Software Maintenance, pp. 83\u201392. IEEE (2009)","DOI":"10.1109\/ICSM.2009.5306327"},{"key":"13_CR3","doi-asserted-by":"crossref","first-page":"781","DOI":"10.1109\/TSE.2015.2414917","volume":"41","author":"A Ampatzoglou","year":"2015","unstructured":"Ampatzoglou, A., Chatzigeorgiou, A., Charalampidou, S., Avgeriou, P.: The effect of GoF design patterns on stability: a case study. IEEE Trans. Softw. Eng. 41, 781\u2013802 (2015)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"13_CR4","doi-asserted-by":"crossref","first-page":"1945","DOI":"10.1016\/j.jss.2013.03.063","volume":"86","author":"A Ampatzoglou","year":"2013","unstructured":"Ampatzoglou, A., Charalampidou, S., Stamelos, I.: Research state of the art on GoF design patterns: a mapping study. J. Syst. Softw. 86, 1945\u20131964 (2013)","journal-title":"J. Syst. Softw."},{"key":"13_CR5","doi-asserted-by":"crossref","first-page":"289","DOI":"10.1007\/s11219-012-9175-x","volume":"21","author":"C Izurieta","year":"2013","unstructured":"Izurieta, C., Bieman, J.M.: A multiple case study of design pattern decay, grime, and rot in evolving software systems. Softw. Qual. J. 21, 289\u2013323 (2013)","journal-title":"Softw. Qual. J."},{"key":"13_CR6","doi-asserted-by":"crossref","unstructured":"Izurieta, C., Bieman, J.M.: Testing consequences of grime buildup in object oriented design patterns. In: First International Conference on Software Testing, Verification, and Validation, pp. 171\u2013179. IEEE (2008)","DOI":"10.1109\/ICST.2008.27"},{"key":"13_CR7","doi-asserted-by":"crossref","unstructured":"Dale, M.R., Izurieta, C.: Impacts of design pattern decay on system quality. In: Eighth ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement, pp. 1\u20134. ACM Press, New York (2014)","DOI":"10.1145\/2652524.2652560"},{"key":"13_CR8","doi-asserted-by":"crossref","DOI":"10.1002\/9781118181034","volume-title":"Case Study Research in Software Engineering: Guidelines and Examples","author":"P Runeson","year":"2012","unstructured":"Runeson, P., Host, M., Rainer, A., Regnell, B.: Case Study Research in Software Engineering: Guidelines and Examples. Wiley Blackwell, Hoboken (2012)"},{"key":"13_CR9","doi-asserted-by":"crossref","unstructured":"Izurieta, C., Bieman, J.M.: How software designs decay: a pilot study of pattern evolution. In: First International Symposium on Empirical Software Engineering and Measurement, pp. 449\u2013451. IEEE (2007)","DOI":"10.1109\/ESEM.2007.55"},{"key":"13_CR10","doi-asserted-by":"crossref","unstructured":"Schanz, T., Izurieta, C.: Object oriented design pattern decay. In: Fourth ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement, pp. 1\u20138. ACM Press, New York (2010)","DOI":"10.1145\/1852786.1852796"},{"key":"13_CR11","doi-asserted-by":"crossref","unstructured":"Griffith, I., Izurieta, C.: Design pattern decay: the case for class grime. In: Eighth ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement, pp. 1\u20134. ACM Press, New York (2014)","DOI":"10.1145\/2652524.2652570"},{"key":"13_CR12","unstructured":"Basili, V.R., Caldiera, G., Rombach, H.D.: Goal question metric paradigm. In: Encyclopedia of Software Engineering, pp. 528\u2013532. Wiley (1994)"},{"key":"13_CR13","doi-asserted-by":"crossref","first-page":"896","DOI":"10.1109\/TSE.2006.112","volume":"32","author":"N Tsantalis","year":"2006","unstructured":"Tsantalis, N., Chatzigeorgiou, A., Stephanides, G., Halkidis, S.T.: Design pattern detection using similarity scoring. Softw. Eng. IEEE Trans. 32, 896\u2013909 (2006)","journal-title":"Softw. Eng. IEEE Trans."},{"key":"13_CR14","doi-asserted-by":"crossref","first-page":"e1851","DOI":"10.1002\/smr.1851","volume":"29","author":"D Feitosa","year":"2017","unstructured":"Feitosa, D., Alders, R., Ampatzoglou, A., Avgeriou, P., Nakagawa, E.Y.: Investigating the effect of design patterns on energy consumption. J. Softw. Evol. Process. 29, e1851 (2017)","journal-title":"J. Softw. Evol. Process."},{"key":"13_CR15","doi-asserted-by":"crossref","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"SR Chidamber","year":"1994","unstructured":"Chidamber, S.R., Kemerer, C.F.: A metrics suite for object oriented design. IEEE Trans. Softw. Eng. 20, 476\u2013493 (1994)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"13_CR16","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1016\/0164-1212(93)90077-B","volume":"23","author":"W Li","year":"1993","unstructured":"Li, W., Henry, S.: Object-oriented metrics that predict maintainability. J. Syst. Softw. 23, 111\u2013122 (1993)","journal-title":"J. Syst. Softw."},{"key":"13_CR17","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/32.979986","volume":"28","author":"J Bansiya","year":"2002","unstructured":"Bansiya, J., Davis, C.G.: A hierarchical model for object-oriented design quality assessment. IEEE Trans. Softw. Eng. 28, 4\u201317 (2002)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"13_CR18","doi-asserted-by":"crossref","first-page":"131","DOI":"10.1016\/j.entcom.2012.10.002","volume":"4","author":"A Ampatzoglou","year":"2013","unstructured":"Ampatzoglou, A., Michou, O., Stamelos, I.: Building and mining a repository of design pattern instances: practical and research benefits. Entertain. Comput. 4, 131\u2013142 (2013)","journal-title":"Entertain. Comput."},{"key":"13_CR19","doi-asserted-by":"crossref","unstructured":"Alhusain, S., Coupland, S., John, R., Kavanagh, M.: Towards machine learning based design pattern recognition. In: 13th UK Workshop on Computational Intelligence, pp. 244\u2013251. IEEE (2013)","DOI":"10.1109\/UKCI.2013.6651312"},{"key":"13_CR20","volume-title":"Discovering Statistics Using SPSS","author":"A Field","year":"2009","unstructured":"Field, A.: Discovering Statistics Using SPSS. SAGE Publications Ltd., Thousand Oaks (2009)"},{"key":"13_CR21","unstructured":"Feitosa, D., Avgeriou, P., Ampatzoglou, A., Nakagawa, E.Y.: Supplementary Material: \u201cThe Evolution of Design Pattern Grime: An Industrial Case Study.\u201d https:\/\/doi.org\/10.5281\/zenodo.806800"},{"key":"13_CR22","doi-asserted-by":"crossref","unstructured":"Amanatidis, T., Chatzigeorgiou, A., Ampatzoglou, A., Stamelos, I.: Who is producing more technical debt? A personalized assessment of TD principal. In: Nineth International Workshop on Managing Technical Debt, pp. 1\u20138. ACM (2017)","DOI":"10.1145\/3120459.3120464"}],"container-title":["Lecture Notes in Computer Science","Product-Focused Software Process Improvement"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-69926-4_13","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,5]],"date-time":"2019-10-05T03:22:40Z","timestamp":1570245760000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-69926-4_13"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"ISBN":["9783319699257","9783319699264"],"references-count":22,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-69926-4_13","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017]]}}}