{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T22:29:04Z","timestamp":1748816944380,"version":"3.40.3"},"publisher-location":"Cham","reference-count":19,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319915623"},{"type":"electronic","value":"9783319915630"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-319-91563-0_35","type":"book-chapter","created":{"date-parts":[[2018,5,16]],"date-time":"2018-05-16T05:53:18Z","timestamp":1526449998000},"page":"571-586","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["A Behavior-Based Framework for Assessing Product Line-Ability"],"prefix":"10.1007","author":[{"given":"Iris","family":"Reinhartz-Berger","sequence":"first","affiliation":[]},{"given":"Anna","family":"Zamansky","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2018,5,17]]},"reference":[{"key":"35_CR1","doi-asserted-by":"publisher","first-page":"2972","DOI":"10.1007\/s10664-017-9499-z","volume":"22","author":"WK Assun\u00e7\u00e3o","year":"2017","unstructured":"Assun\u00e7\u00e3o, W.K., Lopez-Herrejon, R.E., Linsbauer, L., Vergilio, S.R., Egyed, A.: Reengineering legacy applications into software product lines: a systematic mapping. Empir. Softw. Eng. 22, 2972\u20133016 (2017)","journal-title":"Empir. Softw. Eng."},{"issue":"9","key":"35_CR2","doi-asserted-by":"publisher","first-page":"608","DOI":"10.1109\/TSE.2007.70720","volume":"33","author":"BS Baker","year":"2007","unstructured":"Baker, B.S.: Finding clones with dup: analysis of an experiment. IEEE Trans. Softw. Eng. 33(9), 608\u2013621 (2007)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"9","key":"35_CR3","doi-asserted-by":"publisher","first-page":"577","DOI":"10.1109\/TSE.2007.70725","volume":"33","author":"S Bellon","year":"2007","unstructured":"Bellon, S., Koschke, R., Antoniol, G., Krinke, J., Merlo, E.: Comparison and evaluation of clone detection tools. IEEE Trans. Softw. Eng. 33(9), 577\u2013591 (2007)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"35_CR4","unstructured":"Berger, C., Rendel, H., Rumpe, B.: Measuring the ability to form a product line from existing products. In: Proceedings of the Fourth International Workshop on Variability Modelling of Software-Intensive Systems (VaMoS) ((2014))"},{"key":"35_CR5","unstructured":"Berger, C., Rendel, H., Rumpe, B., Busse, C., Jablonski, T., Wolf, F.: Product line metrics for legacy software in practice. arXiv preprint arXiv:1409.6581 (2014)"},{"key":"35_CR6","doi-asserted-by":"crossref","unstructured":"Berger, T., Rublack, R., Nair, D., Atlee, J.M., Becker, M., Czarnecki, K., W\u0105sowski, A.: A survey of variability modeling in industrial practice. In: Proceedings of the Seventh International Workshop on Variability Modelling of Software-intensive Systems (VAMOS), p. 7 (2013)","DOI":"10.1145\/2430502.2430513"},{"key":"35_CR7","volume-title":"Software Product Lines","author":"P Clements","year":"2002","unstructured":"Clements, P., Northrop, L.: Software Product Lines. Addison-Wesley, Boston (2002)"},{"key":"35_CR8","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"346","DOI":"10.1007\/3-540-47833-7_31","volume-title":"Software Product-Family Engineering","author":"E Dincel","year":"2002","unstructured":"Dincel, E., Medvidovic, N., van der Hoek, A.: Measuring product line architectures. In: van der Linden, F. (ed.) PFE 2001. LNCS, vol. 2290, pp. 346\u2013352. Springer, Heidelberg (2002). https:\/\/doi.org\/10.1007\/3-540-47833-7_31"},{"key":"35_CR9","doi-asserted-by":"crossref","unstructured":"Gruler, A., Leucker, M., Scheidemann, K.: Calculating and modeling common parts of software product lines. In: Software Product Line Conference (SPLC 2008), pp. 203\u2013212 (2008)","DOI":"10.1109\/SPLC.2008.22"},{"issue":"4","key":"35_CR10","doi-asserted-by":"publisher","first-page":"276","DOI":"10.1007\/s007780050029","volume":"5","author":"V Kashyap","year":"1996","unstructured":"Kashyap, V., Sheth, A.: Semantic and schematic similarities between database objects: a context-based approach. VLDB J. Int. J. Very Large Data Bases 5(4), 276\u2013304 (1996)","journal-title":"VLDB J. Int. J. Very Large Data Bases"},{"key":"35_CR11","unstructured":"Mihalcea, R., Corley, C., Strapparava, C.: Corpus-based and knowledge-based measures of text semantic similarity. In: American Association for Artificial Intelligence (AAAI 2006), pp. 775\u2013780 (2006)"},{"key":"35_CR12","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-28901-1","volume-title":"Software Product Line Engineering: Foundations, Principles and Technique","author":"K Pohl","year":"2005","unstructured":"Pohl, K., B\u00f6ckle, G., van Der Linden, F.J.: Software Product Line Engineering: Foundations, Principles and Technique. Springer, Heidelberg (2005). https:\/\/doi.org\/10.1007\/3-540-28901-1"},{"key":"35_CR13","series-title":"Lecture Notes in Business Information Processing","doi-asserted-by":"publisher","first-page":"311","DOI":"10.1007\/978-3-319-19237-6_20","volume-title":"Enterprise, Business-Process and Information Systems Modeling","author":"I Reinhartz-Berger","year":"2015","unstructured":"Reinhartz-Berger, I., Zamansky, A., Kemelman, M.: Analyzing variability of cloned artifacts: formal framework and its application to requirements. In: Gaaloul, K., Schmidt, R., Nurcan, S., Guerreiro, S., Ma, Q. (eds.) CAISE 2015. LNBIP, vol. 214, pp. 311\u2013325. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-19237-6_20"},{"key":"35_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"399","DOI":"10.1007\/978-3-319-25264-3_29","volume-title":"Conceptual Modeling","author":"I Reinhartz-Berger","year":"2015","unstructured":"Reinhartz-Berger, I., Zamansky, A., Wand, Y.: Taming software variability: ontological foundations of variability mechanisms. In: Johannesson, P., Lee, M.L., Liddle, S.W., Opdahl, A.L., L\u00f3pez, \u00d3.P. (eds.) ER 2015. LNCS, vol. 9381, pp. 399\u2013406. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-25264-3_29"},{"key":"35_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"98","DOI":"10.1007\/978-3-319-46397-1_8","volume-title":"Conceptual Modeling","author":"I Reinhartz-Berger","year":"2016","unstructured":"Reinhartz-Berger, I., Zamansky, A., Wand, Y.: An ontological approach for identifying software variants: specialization and template instantiation. In: Comyn-Wattiau, I., Tanaka, K., Song, I.-Y., Yamamoto, S., Saeki, M. (eds.) ER 2016. LNCS, vol. 9974, pp. 98\u2013112. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-46397-1_8"},{"key":"35_CR16","unstructured":"Reinhartz-Berger, I., Zamansky, A.: VarMeR - A Variability Mechanisms Recommender for Software Artifacts. CAiSE-Forum-DC, pp. 57\u201364 (2017)"},{"issue":"7","key":"35_CR17","doi-asserted-by":"publisher","first-page":"470","DOI":"10.1016\/j.scico.2009.02.007","volume":"74","author":"CK Roy","year":"2009","unstructured":"Roy, C.K., Cordy, J.R., Koschke, R.: Comparison and evaluation of code clone detection techniques and tools: a qualitative approach. Sci. Comput. Program. 74(7), 470\u2013495 (2009)","journal-title":"Sci. Comput. Program."},{"issue":"2","key":"35_CR18","first-page":"285","volume":"4","author":"MA Torkamani","year":"2014","unstructured":"Torkamani, M.A.: Metric suite to evaluate reusability of software product line. Int. J. Electr. Comput. Eng. 4(2), 285 (2014)","journal-title":"Int. J. Electr. Comput. Eng."},{"key":"35_CR19","doi-asserted-by":"crossref","unstructured":"Zhang, T., Deng, L., Wu, J., Zhou, Q., Ma, C.: Some metrics for accessing quality of product line architecture. In: IEEE International Conference on Computer Science and Software Engineering, vol. 2, pp. 500\u2013503 (2008)","DOI":"10.1109\/CSSE.2008.500"}],"container-title":["Lecture Notes in Computer Science","Advanced Information Systems Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-91563-0_35","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T18:40:15Z","timestamp":1710268815000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-91563-0_35"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9783319915623","9783319915630"],"references-count":19,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-91563-0_35","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2018]]},"assertion":[{"value":"17 May 2018","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CAiSE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Advanced Information Systems Engineering","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Tallinn","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Estonia","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 June 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"15 June 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"caise2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/caise2018.ut.ee","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}