{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T00:52:39Z","timestamp":1740099159214,"version":"3.37.3"},"publisher-location":"Cham","reference-count":6,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319929996"},{"type":"electronic","value":"9783319930008"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-319-93000-8_55","type":"book-chapter","created":{"date-parts":[[2018,6,5]],"date-time":"2018-06-05T01:50:47Z","timestamp":1528163447000},"page":"490-496","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Quantification and Prediction of Damage in SAM Images of Semiconductor Devices"],"prefix":"10.1007","author":[{"given":"D\u017eenana","family":"Alagi\u0107","sequence":"first","affiliation":[]},{"given":"Olivia","family":"Bluder","sequence":"additional","affiliation":[]},{"given":"J\u00fcrgen","family":"Pilz","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2018,6,6]]},"reference":[{"unstructured":"Rasband, W.S.: ImageJ. U.S. National Institutes of Health, Bethesda, Maryland, USA (1997\u20132016). http:\/\/imagej.nih.gov\/ij\/","key":"55_CR1"},{"unstructured":"Alagi\u0107, D.: A statistical measure for fatigue induced degradation in metal layers. Master thesis, Alpen-Adria University of Klagenfurt (2017)","key":"55_CR2"},{"issue":"1","key":"55_CR3","doi-asserted-by":"publisher","first-page":"27","DOI":"10.1109\/83.650848","volume":"7","author":"P Th\u00e9venaz","year":"1998","unstructured":"Th\u00e9venaz, P., Ruttimann, U.E., Unser, M.: A pyramid approach to subpixel registration based on intensity. IEEE Trans. Image Process. 7(1), 27\u201341 (1998). http:\/\/bigwww.epfl.ch\/publications\/thevenaz9801.html","journal-title":"IEEE Trans. Image Process."},{"doi-asserted-by":"crossref","unstructured":"Glavanovics, M., K\u00f6ck, H., Kosel, V., Smorodin, T.: A new cycle test system emulating inductive switching waveforms. In: Proceedings of the 12th European Conference on Power Electronics and Applications, pp. 1\u20139 (2007)","key":"55_CR4","DOI":"10.1109\/EPE.2007.4417742"},{"doi-asserted-by":"crossref","unstructured":"Agresti, A.: An Introduction to Categorical Data Analysis. Wiley, Hoboken (2007)","key":"55_CR5","DOI":"10.1002\/0470114754"},{"unstructured":"Christensen, R.H.B.: Analysis of ordinal data with cumulative link models estimation with the R-package ordinal (2015). https:\/\/cran.r-project.org\/web\/packages\/ordinal\/vignettes\/clm_intro.pdf","key":"55_CR6"}],"container-title":["Lecture Notes in Computer Science","Image Analysis and Recognition"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-93000-8_55","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,18]],"date-time":"2019-10-18T22:31:00Z","timestamp":1571437860000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-93000-8_55"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9783319929996","9783319930008"],"references-count":6,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-93000-8_55","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2018]]}}}