{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T15:40:07Z","timestamp":1751730007969,"version":"3.41.0"},"publisher-location":"Cham","reference-count":43,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319951706"},{"type":"electronic","value":"9783319951713"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-319-95171-3_34","type":"book-chapter","created":{"date-parts":[[2018,7,3]],"date-time":"2018-07-03T19:49:47Z","timestamp":1530647387000},"page":"435-451","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Combining Automatic Variability Analysis Tools: An SPL Approach for\u00a0Building a Framework for\u00a0Composition"],"prefix":"10.1007","author":[{"given":"Agustina","family":"Buccella","sequence":"first","affiliation":[]},{"given":"Matias","family":"Pol\u2019la","sequence":"additional","affiliation":[]},{"given":"Esteban Ruiz","family":"de Galarreta","sequence":"additional","affiliation":[]},{"given":"Alejandra","family":"Cechich","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2018,7,4]]},"reference":[{"issue":"1","key":"34_CR1","doi-asserted-by":"publisher","first-page":"14:1","DOI":"10.1145\/3034827","volume":"50","author":"R Bashroush","year":"2017","unstructured":"Bashroush, R., Garba, M., Rabiser, R., Groher, I., Botterweck, G.: Case tool support for variability management in software product lines. ACM Comput. Surv. 50(1), 14:1\u201314:45 (2017). https:\/\/doi.org\/10.1145\/3034827","journal-title":"ACM Comput. Surv."},{"issue":"6","key":"34_CR2","doi-asserted-by":"publisher","first-page":"615","DOI":"10.1016\/j.is.2010.01.001","volume":"35","author":"D Benavides","year":"2010","unstructured":"Benavides, D., Segura, S., Ruiz-Cort\u00e9s, A.: Automated analysis of feature models 20 years later: a literature review. Inf. Syst. 35(6), 615\u2013636 (2010). https:\/\/doi.org\/10.1016\/j.is.2010.01.001","journal-title":"Inf. Syst."},{"key":"34_CR3","unstructured":"Bessling, S., Huhn, M.: Formal safety analysis and verification in the model driven development of a pacemaker product line. In: MBEES, pp. 133\u2013144 (2012)"},{"key":"34_CR4","unstructured":"Braun, G., Pol\u2019la, M., Buccella, A., Cecchi, L., Fillottrani, P., Cechich, A.: A DL semantics for reasoning over OVM-based variability models. In: Proceedings of the 30th International Workshop on Description Logics, vol. 1879, July 2017"},{"key":"34_CR5","doi-asserted-by":"publisher","first-page":"9","DOI":"10.1016\/j.cageo.2012.11.014","volume":"54","author":"A Buccella","year":"2013","unstructured":"Buccella, A., Cechich, A., Arias, M., Pol\u2019la, M., del Socorro Doldan, M., Morsan, E.: Towards systematic software reuse of GIS: insights from a case study. Comput. Geosci. 54, 9\u201320 (2013). http:\/\/www.sciencedirect.com\/science\/article\/pii\/S0098300412003913","journal-title":"Comput. Geosci."},{"issue":"4","key":"34_CR6","doi-asserted-by":"publisher","first-page":"309","DOI":"10.1016\/j.websem.2008.05.001","volume":"6","author":"GB Cuenca","year":"2008","unstructured":"Cuenca, G.B., Horrocks, I., Motik, B., Bijan, P., Patel-Schneider, P., Sattler, U.: OWL 2: the next step for OWL. Web Semant. 6(4), 309\u2013322 (2008)","journal-title":"Web Semant."},{"key":"34_CR7","volume-title":"Generative Programming: Methods, Tools, and Applications","author":"K Czarnecki","year":"2000","unstructured":"Czarnecki, K., Eisenecker, U.W.: Generative Programming: Methods, Tools, and Applications. ACM Press\/Addison-Wesley Publishing Co., New York (2000)"},{"issue":"1","key":"34_CR8","doi-asserted-by":"publisher","first-page":"7","DOI":"10.1002\/spip.213","volume":"10","author":"K Czarnecki","year":"2005","unstructured":"Czarnecki, K., Helsen, S., Eisenecker, U.W.: Formalizing cardinality-based feature models and their specialization. Softw. Process Improv. Pract. 10(1), 7\u201329 (2005)","journal-title":"Softw. Process Improv. Pract."},{"key":"34_CR9","doi-asserted-by":"publisher","unstructured":"Czarnecki, K., Wasowski, A.: Feature diagrams and logics: There and back again. In: Proceedings of the 11th International Software Product Line Conference, SPLC 2007, pp. 23\u201334. IEEE Computer Society, Washington, DC, USA (2007). https:\/\/doi.org\/10.1109\/SPLC.2007.19","DOI":"10.1109\/SPLC.2007.19"},{"issue":"3","key":"34_CR10","doi-asserted-by":"publisher","first-page":"210","DOI":"10.7763\/LNSE.2014.V2.125","volume":"2","author":"N Das","year":"2014","unstructured":"Das, N., Ripon, S., Hossain, O., Uddin, M.S.: Requirement analysis of product line based semantic web services. Lect. Notes Softw. Eng. 2(3), 210 (2014)","journal-title":"Lect. Notes Softw. Eng."},{"key":"34_CR11","doi-asserted-by":"crossref","unstructured":"Dobrica, L., Niemel\u00e4, E.: A UML-based variability specification for product line architecture views. In: Proceedings of the Third International Conference on Software and Data Technologies, ICSOFT, pp. 234\u2013239, Porto, Portugal (2008)","DOI":"10.5220\/0001899202340239"},{"key":"34_CR12","series-title":"Lecture Notes in Computer Science (Lecture Notes in Artificial Intelligence)","doi-asserted-by":"publisher","first-page":"1144","DOI":"10.1007\/11893004_145","volume-title":"Knowledge-Based Intelligent Information and Engineering Systems","author":"S Fan","year":"2006","unstructured":"Fan, S., Zhang, N.: Feature model based on description logics. In: Gabrys, B., Howlett, R.J., Jain, L.C. (eds.) KES 2006. LNCS (LNAI), vol. 4252, pp. 1144\u20131151. Springer, Heidelberg (2006). https:\/\/doi.org\/10.1007\/11893004_145"},{"key":"34_CR13","unstructured":"Frantz, F.R., Benavides Cuevas, D.F., Ruiz Cort\u00e9s, A.: Automated analysis of orthogonal variability models using constraint programming. In: Xv Jornadas De Ingenier\u00eda Del Software Y Bases De Datos, 2010, Valencia, Espa\u00f1a (2010)"},{"key":"34_CR14","doi-asserted-by":"crossref","unstructured":"Haugen, O., Moller-Pedersen, B., Oldevik, J., Olsen, G.K., Svendsen, A.: Adding standardized variability to domain specific languages. In: 2008 12th International Software Product Line Conference, pp. 139\u2013148, September 2008","DOI":"10.1109\/SPLC.2008.25"},{"key":"34_CR15","volume-title":"Software Abstractions: Logic, Language, and Analysis","author":"D Jackson","year":"2016","unstructured":"Jackson, D.: Software Abstractions: Logic, Language, and Analysis. The MIT Press, Cambridge (2016)"},{"key":"34_CR16","doi-asserted-by":"crossref","unstructured":"Kang, K., Cohen, S., Hess, J., Nowak, W., Peterson, S.: Feature-oriented domain analysis (FODA) feasibility study. Technical report CMU\/SEI-90-TR-21, Software Engineering Institute, Carnegie Mellon University Pittsburgh, PA (1990)","DOI":"10.21236\/ADA235785"},{"key":"34_CR17","doi-asserted-by":"publisher","first-page":"143","DOI":"10.1023\/A:1018980625587","volume":"5","author":"K Kang","year":"1998","unstructured":"Kang, K., Kim, S., Lee, J., Kim, K., Kim, G.J., Shin, E.: FORM: a feature-oriented reuse method with domain-specific reference architectures. Ann. Softw. Eng. 5, 143\u2013168 (1998)","journal-title":"Ann. Softw. Eng."},{"key":"34_CR18","doi-asserted-by":"publisher","unstructured":"Kowal, M., Ananieva, S., Th\u00fcm, T.: Explaining anomalies in feature models. In: Proceedings of the 2016 ACM SIGPLAN International Conference on Generative Programming: Concepts and Experiences, GPCE 2016, pp. 132\u2013143. ACM, New York, NY, USA (2016). https:\/\/doi.org\/10.1145\/2993236.2993248","DOI":"10.1145\/2993236.2993248"},{"key":"34_CR19","doi-asserted-by":"crossref","unstructured":"Lauenroth, K., Pohl, K., Toehning, S.: Model checking of domain artifacts in product line engineering. In: 2009 IEEE\/ACM International Conference on Automated Software Engineering, pp. 269\u2013280, November 2009","DOI":"10.1109\/ASE.2009.16"},{"key":"34_CR20","unstructured":"von der Massen, T., H. Lichter, H.: Deficiencies in feature models. In: Mannisto, T., Bosch, J. (eds.) Workshop on Software Variability Management for Product Derivation - Towards Tool Support (2004)"},{"key":"34_CR21","doi-asserted-by":"crossref","unstructured":"Mazo, R., Munoz-Fernandez, J.C., Rincon, L., Salinesi, C., Tamura, G.: VariaMos: an extensible tool for engineering (dynamic) product lines. In: Proceedings of the 19th International Software Product Line Conference, pp. 374\u2013379. ACM (2015)","DOI":"10.1145\/2791060.2791103"},{"key":"34_CR22","doi-asserted-by":"publisher","unstructured":"Mendonca, M., Branco, M., Cowan, D.: S.P.L.O.T.: software product lines online tools. In: Proceedings of the 24th ACM SIGPLAN Conference Companion on Object Oriented Programming Systems Languages and Applications, OOPSLA 2009, pp. 761\u2013762. ACM, New York, NY, USA (2009). https:\/\/doi.org\/10.1145\/1639950.1640002","DOI":"10.1145\/1639950.1640002"},{"key":"34_CR23","doi-asserted-by":"crossref","unstructured":"Metzger, A., Pohl, K., Heymans, P., Schobbens, P.Y., Saval, G.: Disambiguating the documentation of variability in software product lines: a separation of concerns, formalization and automated analysis. In: 15th IEEE International Requirements Engineering Conference (RE 2007), pp. 243\u2013253, October 2007","DOI":"10.1109\/RE.2007.61"},{"key":"34_CR24","doi-asserted-by":"publisher","unstructured":"Nakajima, S.: Semi-automated diagnosis of foda feature diagram. In: Proceedings of the 2010 ACM Symposium on Applied Computing, SAC 2010, pp. 2191\u20132197. ACM, New York, NY, USA (2010). https:\/\/doi.org\/10.1145\/1774088.1774550","DOI":"10.1145\/1774088.1774550"},{"key":"34_CR25","unstructured":"Noorian, M., Ensan, A., Bagheri, E., Boley, H., Biletskiy, Y.: Feature model debugging based on description logic reasoning. In: Proceedings of the 17th International Conference on Distributed Multimedia Systems, DMS 2011, 18\u201320 October 2011, Convitto della Calza, Florence, Italy, pp. 158\u2013164 (2011)"},{"key":"34_CR26","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"73","DOI":"10.1007\/978-3-319-14130-5_6","volume-title":"Software Reuse for Dynamic Systems in the Cloud and Beyond","author":"JA Pereira","year":"2014","unstructured":"Pereira, J.A., Constantino, K., Figueiredo, E.: A systematic literature review of software product line management tools. In: Schaefer, I., Stamelos, I. (eds.) ICSR 2015. LNCS, vol. 8919, pp. 73\u201389. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-14130-5_6"},{"key":"34_CR27","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-28901-1","volume-title":"Software Product Line Engineering: Foundations, Principles and Techniques","author":"K Pohl","year":"2005","unstructured":"Pohl, K., B\u00f6ckle, G., van der Linden, F.J.: Software Product Line Engineering: Foundations, Principles and Techniques. Springer, Secaucus (2005)"},{"key":"34_CR28","doi-asserted-by":"crossref","unstructured":"Pol\u2019la, M., Buccella, A., Arias, M., Cechich, A.: Sevatax: service taxonomy selection validation process for SPL development. In: 2015 34th International Conference of the Chilean Computer Science Society (SCCC), pp. 1\u20136, November 2015","DOI":"10.1109\/SCCC.2015.7416580"},{"key":"34_CR29","doi-asserted-by":"publisher","first-page":"61","DOI":"10.1016\/j.entcs.2015.05.005","volume":"314","author":"L Rincon","year":"2015","unstructured":"Rincon, L., Giraldo, G., Mazo, R., Salinesi, C., Diaz, D.: Method to identify corrections of defects on product line models. Electron. Notes Theor. Comput. Sci. 314, 61\u201381 (2015). http:\/\/www.sciencedirect.com\/science\/article\/pii\/S1571066115000286","journal-title":"Electron. Notes Theor. Comput. Sci."},{"key":"34_CR30","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1016\/j.entcs.2014.01.023","volume":"302","author":"L Rinc\u00f3n","year":"2014","unstructured":"Rinc\u00f3n, L., Giraldo, L., Mazo, R., Salinesi, C.: An ontological rule-based approach for analyzing dead and false optional features in feature models. Electron. Notes Theor. Comput. Sci. 302, 111\u2013132 (2014)","journal-title":"Electron. Notes Theor. Comput. Sci."},{"issue":"1","key":"34_CR31","first-page":"1","volume":"6","author":"S Ripon","year":"2014","unstructured":"Ripon, S., Piash, M.M., Hossain, S.M.A., Uddin, M.S.: Semantic web based analysis of product line variant model. JCEE 6(1), 1\u20136 (2014)","journal-title":"JCEE"},{"key":"34_CR32","unstructured":"Roos-Frantz, F., Galindo, J.A., Benavides, D., Cort\u00e9s, A.R., Garc\u0131a-Gal\u00e1n, J.: Automated analysis of diverse variability models with tool support. In: Jornadas de Ingenier\u0131a del Software y de Bases de Datos (JISBD 2014), C\u00e1diz. Spain, p. 160 (2014)"},{"key":"34_CR33","doi-asserted-by":"crossref","unstructured":"Roos-Frantz, F., Galindo, J.A., Benavides, D., Ruiz-Cort\u00e9s, A.: FaMa-OVM: a tool for the automated analysis of OVMs. In: Proceedings of the 16th International Software Product Line Conference, vol. 2, pp. 250\u2013254. ACM (2012)","DOI":"10.1145\/2364412.2364456"},{"issue":"4","key":"34_CR34","doi-asserted-by":"publisher","first-page":"439","DOI":"10.1007\/s10270-011-0210-3","volume":"10","author":"B Rumpe","year":"2011","unstructured":"Rumpe, B., Robert, F.: Variability in UML language and semantics. Softw. Syst. Model. 10(4), 439\u2013440 (2011)","journal-title":"Softw. Syst. Model."},{"key":"34_CR35","doi-asserted-by":"crossref","unstructured":"Ryssel, U., Ploennigs, J., Kabitzsch, K.: Reasoning of feature models from derived features. In: Proceedings of the 11th International Conference on Generative Programming and Component Engineering, GPCE 2012, ACM, New York, NY, USA (2012)","DOI":"10.1145\/2371401.2371405"},{"key":"34_CR36","unstructured":"Segura, S., Benavides, D., Ruiz-Cort\u00c3$$\\copyright $$s, A.: Fama test suite v1.2. Technical report ISA-10-TR-01, March 2010. http:\/\/www.isa.us.es\/"},{"key":"34_CR37","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"197","DOI":"10.1007\/978-3-540-28630-1_12","volume-title":"Software Product Lines","author":"M Sinnema","year":"2004","unstructured":"Sinnema, M., Deelstra, S., Nijhuis, J., Bosch, J.: COVAMOF: a framework for modeling variability in software product families. In: Nord, R.L. (ed.) SPLC 2004. LNCS, vol. 3154, pp. 197\u2013213. Springer, Heidelberg (2004). https:\/\/doi.org\/10.1007\/978-3-540-28630-1_12"},{"issue":"2","key":"34_CR38","doi-asserted-by":"publisher","first-page":"51","DOI":"10.1016\/j.websem.2007.03.004","volume":"5","author":"E Sirin","year":"2007","unstructured":"Sirin, E., Parsia, B., Grau, B.C., Kalyanpur, A., Katz, Y.: Pellet: a practical OWL-DL reasoner. Web Semant. 5(2), 51\u201353 (2007)","journal-title":"Web Semant."},{"key":"34_CR39","doi-asserted-by":"publisher","first-page":"46","DOI":"10.4204\/EPTCS.206.5","volume":"206","author":"Anjali Sree-Kumar","year":"2016","unstructured":"Sree-Kumar, A., Planas, E., Clariso, R.: Analysis of feature models using alloy: a survey. In: Proceedings 7th International Workshop on Formal Methods and Analysis in Software Product Line Engineering, FMSPLE@ETAPS 2016, Eindhoven, The Netherlands, 3 April 2016, pp. 46\u201360 (2016). https:\/\/doi.org\/10.4204\/EPTCS.206.5","journal-title":"Electronic Proceedings in Theoretical Computer Science"},{"key":"34_CR40","series-title":"Lecture Notes in Computer Science (Lecture Notes in Artificial Intelligence)","doi-asserted-by":"publisher","first-page":"292","DOI":"10.1007\/11814771_26","volume-title":"Automated Reasoning","author":"D Tsarkov","year":"2006","unstructured":"Tsarkov, D., Horrocks, I.: FaCT++ description logic reasoner: system description. In: Furbach, U., Shankar, N. (eds.) IJCAR 2006. LNCS (LNAI), vol. 4130, pp. 292\u2013297. Springer, Heidelberg (2006). https:\/\/doi.org\/10.1007\/11814771_26"},{"issue":"2","key":"34_CR41","doi-asserted-by":"publisher","first-page":"117","DOI":"10.1016\/j.websem.2006.11.006","volume":"5","author":"HH Wang","year":"2007","unstructured":"Wang, H.H., Li, Y.F., Sun, J., Zhang, H., Pan, J.: Verifying feature models using OWL. Web Semant. 5(2), 117\u2013129 (2007)","journal-title":"Web Semant."},{"key":"34_CR42","doi-asserted-by":"crossref","unstructured":"Zaid, L., Kleinermann, F., Troyer, O.D.: Applying semantic web technology to feature modeling. In: Proceedings of the 2009 ACM Symposium on Applied Computing, SAC 2009. ACM, New York, NY, USA (2009)","DOI":"10.1145\/1529282.1529563"},{"key":"34_CR43","doi-asserted-by":"publisher","first-page":"557","DOI":"10.1007\/978-3-540-33253-4_15","volume-title":"Software Product Lines: Research Issues in Engineering and Management","author":"T Ziadi","year":"2006","unstructured":"Ziadi, T., J\u00e9z\u00e9quel, J.: Software product line engineering with the UML: deriving products. In: K\u00e4k\u00f6la, T., Due\u00f1as, J.C. (eds.) Software Product Lines: Research Issues in Engineering and Management, pp. 557\u2013588. Springer, Heidelberg (2006)"}],"container-title":["Lecture Notes in Computer Science","Computational Science and Its Applications \u2013 ICCSA 2018"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-95171-3_34","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T15:00:38Z","timestamp":1751727638000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-319-95171-3_34"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9783319951706","9783319951713"],"references-count":43,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-95171-3_34","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2018]]}}}