{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T10:39:19Z","timestamp":1761129559557,"version":"3.40.3"},"publisher-location":"Cham","reference-count":18,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319957852"},{"type":"electronic","value":"9783319957869"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-319-95786-9_2","type":"book-chapter","created":{"date-parts":[[2018,7,3]],"date-time":"2018-07-03T17:55:52Z","timestamp":1530640552000},"page":"17-28","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["From Measurements to Knowledge - Online Quality Monitoring and Smart Manufacturing"],"prefix":"10.1007","author":[{"given":"Satu","family":"Tamminen","sequence":"first","affiliation":[]},{"given":"Henna","family":"Tiensuu","sequence":"additional","affiliation":[]},{"given":"Eija","family":"Ferreira","sequence":"additional","affiliation":[]},{"given":"Heli","family":"Helaakoski","sequence":"additional","affiliation":[]},{"given":"Vesa","family":"Kyll\u00f6nen","sequence":"additional","affiliation":[]},{"given":"Juha","family":"Jokisaari","sequence":"additional","affiliation":[]},{"given":"Esa","family":"Puukko","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2018,7,4]]},"reference":[{"issue":"4","key":"2_CR1","doi-asserted-by":"publisher","first-page":"969","DOI":"10.1115\/1.2194554","volume":"128","author":"J. A. Harding","year":"2006","unstructured":"Harding, J., Shahbaz, M., Srinivas, Kusiak, A.: Data mining in manufacturing: a review. J. Manuf. Sci. Eng. 128, 969\u2013976 (2006)","journal-title":"Journal of Manufacturing Science and Engineering"},{"key":"2_CR2","unstructured":"Siirtola, P., Tamminen, S., Ferreira, E., Tiensuu, H., Prokkola, E., R\u00f6ning, J.: Automatic recognition of steel plate side edge shape using classification and regression models. In: Proceedings of the 9th Eurosim Congress on Modelling and Simulation (EUROSIM 2016) (2016)"},{"key":"2_CR3","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1002\/9781118522516.ch2","volume-title":"Multicriteria Decision Aid and Artificial Intelligence","author":"Gloria Phillips-Wren","year":"2013","unstructured":"Phillips-Wren, G.: Intelligent decision support systems. In: Multicriteria Decision Aid and Artificial Intelligence. Wiley, Chichester (2013)"},{"key":"2_CR4","doi-asserted-by":"publisher","first-page":"1407","DOI":"10.1007\/s00170-014-6056-4","volume":"74","author":"O Logunova","year":"2014","unstructured":"Logunova, O., Matsko, I., Posohov, I., Luk\u2019ynov, S.: Automatic system for intelligent support of continuous cast billet production control processes. Int. J. Adv. Manuf. Technol. 74, 1407\u20131418 (2014)","journal-title":"Int. J. Adv. Manuf. Technol."},{"key":"2_CR5","volume-title":"Knowledge Management","author":"Ioan Dumitrache","year":"2010","unstructured":"Dumitrache, I., Caramihai, S.: The intelligent manufacturing paradigm in knowledge society. In: Knowledge Management. InTech, pp. 36\u201356 (2010)"},{"issue":"2","key":"2_CR6","doi-asserted-by":"publisher","first-page":"1537","DOI":"10.1109\/TII.2014.2300338","volume":"10","author":"Z Bi","year":"2014","unstructured":"Bi, Z., Xu, L., Wang, C.: Internet of things for enterprise systems of modern manufacturing. IEEE Trans. Ind. Inf. 10(2), 1537\u20131546 (2014)","journal-title":"IEEE Trans. Ind. Inf."},{"issue":"4","key":"2_CR7","doi-asserted-by":"publisher","first-page":"2233","DOI":"10.1109\/TII.2014.2300753","volume":"10","author":"L Xu","year":"2014","unstructured":"Xu, L., He, W., Li, S.: Internet of things in industries: a survey. IEEE Trans. Ind. Inf. 10(4), 2233\u20132243 (2014)","journal-title":"IEEE Trans. Ind. Inf."},{"issue":"4","key":"2_CR8","first-page":"375","volume":"11","author":"M Akram","year":"2012","unstructured":"Akram, M., Saif, A.W., Rahim, M.: Quality monitoring and process adjustment by integrating SPC and APC: a review. Int. J. Ind. Syst. Eng. 11(4), 375\u2013405 (2012)","journal-title":"Int. J. Ind. Syst. Eng."},{"issue":"1\u20132","key":"2_CR9","doi-asserted-by":"publisher","first-page":"12","DOI":"10.1016\/j.compchemeng.2007.07.005","volume":"32","author":"M Kano","year":"2008","unstructured":"Kano, M., Nakagawa, Y.: Data-based process monitoring, process control, and quality improvement: recent developments and applications in steel industry. Comput. Chem. Eng. 32(1\u20132), 12\u201324 (2008)","journal-title":"Comput. Chem. Eng."},{"issue":"10","key":"2_CR10","doi-asserted-by":"publisher","first-page":"966","DOI":"10.2355\/isijinternational.39.966","volume":"39","author":"H Bhadesia","year":"1999","unstructured":"Bhadesia, H.: Neural networks in materials science. ISIJ Int. 39(10), 966\u2013979 (1999)","journal-title":"ISIJ Int."},{"key":"2_CR11","series-title":"Lecture Notes in Computer Science (Lecture Notes in Artificial Intelligence)","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1007\/978-3-642-14400-4_21","volume-title":"Advances in Data Mining. Applications and Theoretical Aspects","author":"S Tamminen","year":"2010","unstructured":"Tamminen, S., Juutilainen, I., R\u00f6ning, J.: Quantile regression model for impact toughness estimation. In: Perner, P. (ed.) ICDM 2010. LNCS (LNAI), vol. 6171, pp. 263\u2013276. Springer, Heidelberg (2010). https:\/\/doi.org\/10.1007\/978-3-642-14400-4_21"},{"key":"2_CR12","doi-asserted-by":"publisher","first-page":"4577","DOI":"10.1016\/j.eswa.2013.01.056","volume":"40","author":"S Tamminen","year":"2013","unstructured":"Tamminen, S., Juutilainen, I., R\u00f6ning, J.: Exceedance probability estimation for quality test consisting of multiple measurements. Expert Syst. Appl. 40, 4577\u20134584 (2013)","journal-title":"Expert Syst. Appl."},{"issue":"1","key":"2_CR13","doi-asserted-by":"publisher","first-page":"1","DOI":"10.2200\/S00240ED1V01Y200912DMK002","volume":"2","author":"Giovanni Seni","year":"2010","unstructured":"Seni, G., Elder, J.: Ensemble methods in data mining: improving accuracy through combining predictions. In: Synthesis Lectures on Data Mining and Knowledge Discovery. Morgan & Claypool, USA (2010)","journal-title":"Synthesis Lectures on Data Mining and Knowledge Discovery"},{"key":"2_CR14","doi-asserted-by":"crossref","unstructured":"Natekin, A., Knoll, A.: Gradient boosting machines, a tutorial. Front. Neurorobot. 7 (2013)","DOI":"10.3389\/fnbot.2013.00021"},{"key":"2_CR15","doi-asserted-by":"publisher","first-page":"802","DOI":"10.1111\/j.1365-2656.2008.01390.x","volume":"77","author":"J Elith","year":"2008","unstructured":"Elith, J., Leathwick, J., Hastie, T.: A working guide to boosted regression trees. J. Anim. Ecol. 77, 802\u2013813 (2008)","journal-title":"J. Anim. Ecol."},{"key":"2_CR16","doi-asserted-by":"publisher","first-page":"367","DOI":"10.1016\/S0167-9473(01)00065-2","volume":"19","author":"J Friedman","year":"2002","unstructured":"Friedman, J.: Stochastic gradient boosting. Comput. Stat. Data Anal. 19, 367\u2013378 (2002)","journal-title":"Comput. Stat. Data Anal."},{"key":"2_CR17","doi-asserted-by":"crossref","unstructured":"Juutilainen, I., Tamminen, S., R\u00f6ning, J.: A tutorial to developing statistical models for predictiong disqualification probability. In: Computational Methods for Optimizing Manufacturing Technology, Models and Techniques, pp. 368\u2013399. IGI Global, USA (2012)","DOI":"10.4018\/978-1-4666-0128-4.ch015"},{"issue":"1","key":"2_CR18","first-page":"47","volume":"13","author":"A Inselberg","year":"1998","unstructured":"Inselberg, A.: Visual data mining with parallel coordinates. Comput. Stat. 13(1), 47\u201363 (1998)","journal-title":"Comput. Stat."}],"container-title":["Lecture Notes in Computer Science","Advances in Data Mining. Applications and Theoretical Aspects"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-95786-9_2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T16:22:55Z","timestamp":1710260575000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-95786-9_2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9783319957852","9783319957869"],"references-count":18,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-95786-9_2","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2018]]},"assertion":[{"value":"4 July 2018","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICDM","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Industrial Conference on Data Mining","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"New York, NY","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"USA","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 July 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"12 July 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"incdm2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.data-mining-forum.de\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"146","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"24","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"15","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"16% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}