{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T04:01:40Z","timestamp":1751860900377,"version":"3.41.0"},"publisher-location":"Cham","reference-count":23,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319997391"},{"type":"electronic","value":"9783319997407"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-319-99740-7_7","type":"book-chapter","created":{"date-parts":[[2018,8,23]],"date-time":"2018-08-23T09:44:08Z","timestamp":1535017448000},"page":"98-117","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Field-Reliability Predictions Based on Statistical System Lifecycle Models"],"prefix":"10.1007","author":[{"given":"Lukas","family":"Felsberger","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dieter","family":"Kranzlm\u00fcller","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin","family":"Todd","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2018,8,24]]},"reference":[{"key":"7_CR1","doi-asserted-by":"crossref","unstructured":"Barnard, R.: What is wrong with reliability engineering? In: INCOSE International Symposium, vol. 18, pp. 357\u2013365. Wiley Online Library (2008)","DOI":"10.1002\/j.2334-5837.2008.tb00811.x"},{"key":"7_CR2","volume-title":"Pattern recognition and machine learning (Information Science and Statistics)","author":"CM Bishop","year":"2006","unstructured":"Bishop, C.M.: Pattern recognition and machine learning (Information Science and Statistics). Springer, New York (2006)"},{"key":"7_CR3","unstructured":"Blondel, M., et al.: Scikit-learn user guide (2018). http:\/\/scikit-learn.org\/stable\/user_guide.html"},{"key":"7_CR4","first-page":"2079","volume":"11","author":"GC Cawley","year":"2010","unstructured":"Cawley, G.C., Talbot, N.L.: On over-fitting in model selection and subsequent selection bias in performance evaluation. J. Mach. Learn. Res. 11, 2079\u20132107 (2010)","journal-title":"J. Mach. Learn. Res."},{"issue":"3","key":"7_CR5","doi-asserted-by":"publisher","first-page":"321","DOI":"10.1109\/24.740547","volume":"47","author":"W Denson","year":"1998","unstructured":"Denson, W.: The history of reliability prediction. IEEE Trans. Reliab. 47(3), 321\u2013328 (1998)","journal-title":"IEEE Trans. Reliab."},{"issue":"1","key":"7_CR6","doi-asserted-by":"publisher","first-page":"125","DOI":"10.1109\/TR.2011.2172030","volume":"61","author":"JG Elerath","year":"2012","unstructured":"Elerath, J.G., Pecht, M.: IEEE 1413: a standard for reliability predictions. IEEE Trans. Reliab. 61(1), 125\u2013129 (2012)","journal-title":"IEEE Trans. Reliab."},{"issue":"8","key":"7_CR7","doi-asserted-by":"publisher","first-page":"1155","DOI":"10.1016\/S0026-2714(02)00087-2","volume":"42","author":"B Foucher","year":"2002","unstructured":"Foucher, B., Boullie, J., Meslet, B., Das, D.: A review of reliability prediction methods for electronic devices. Microelectron. Reliab. 42(8), 1155\u20131162 (2002)","journal-title":"Microelectron. Reliab."},{"key":"7_CR8","volume-title":"Scientific Method in Practice","author":"HG Gauch","year":"2003","unstructured":"Gauch, H.G.: Scientific Method in Practice. Cambridge University Press, Cambridge (2003)"},{"key":"7_CR9","doi-asserted-by":"crossref","unstructured":"Gullo, L.: In-service reliability assessment and top-down approach provides alternative reliability prediction method. In: Proceedings of Reliability and Maintainability Symposium, Annual, pp. 365\u2013377. IEEE (1999)","DOI":"10.1109\/RAMS.1999.744146"},{"key":"7_CR10","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-21606-5","volume-title":"The Elements of Statistical Learning","author":"T Hastie","year":"2001","unstructured":"Hastie, T., Tibshirani, R., Friedman, J.: The Elements of Statistical Learning. Springer, New York (2001)"},{"key":"7_CR11","doi-asserted-by":"crossref","unstructured":"Johnson, B.G., Gullo, L.: Improvements in reliability assessment and prediction methodology. In: Proceedings of Reliability and Maintainability Symposium, Annual, pp. 181\u2013187. IEEE (2000)","DOI":"10.1109\/RAMS.2000.816304"},{"issue":"2","key":"7_CR12","doi-asserted-by":"publisher","first-page":"127","DOI":"10.1109\/24.784270","volume":"48","author":"J Jones","year":"1999","unstructured":"Jones, J., Hayes, J.: A comparison of electronic-reliability prediction models. IEEE Trans. Reliab. 48(2), 127\u2013134 (1999)","journal-title":"IEEE Trans. Reliab."},{"key":"7_CR13","doi-asserted-by":"publisher","DOI":"10.1002\/9781118841716","volume-title":"Reliability Engineering","author":"KC Kapur","year":"2014","unstructured":"Kapur, K.C., Pecht, M.: Reliability Engineering. Wiley, Hoboken (2014)"},{"issue":"4","key":"7_CR14","doi-asserted-by":"publisher","first-page":"243","DOI":"10.1002\/qre.4680060406","volume":"6","author":"CT Leonard","year":"1990","unstructured":"Leonard, C.T., Pecht, M.: How failure prediction methodology affects electronic equipment design. Qual. Reliab. Eng. Int. 6(4), 243\u2013249 (1990)","journal-title":"Qual. Reliab. Eng. Int."},{"issue":"3","key":"7_CR15","doi-asserted-by":"publisher","first-page":"415","DOI":"10.1162\/neco.1992.4.3.415","volume":"4","author":"DJ MacKay","year":"1992","unstructured":"MacKay, D.J.: Bayesian interpolation. Neural Comput. 4(3), 415\u2013447 (1992)","journal-title":"Neural Comput."},{"key":"7_CR16","doi-asserted-by":"crossref","unstructured":"Miller, R., Green, J., Herrmann, D., Heer, D.: Assess your program for probability of success using the reliability scorecard tool. In: Annual Symposium-RAMS on Reliability and Maintainability, pp. 641\u2013646. IEEE (2004)","DOI":"10.1109\/RAMS.2004.1285519"},{"key":"7_CR17","volume-title":"Practical Reliability Engineering","author":"P O\u2019Connor","year":"2012","unstructured":"O\u2019Connor, P., Kleyner, A.: Practical Reliability Engineering. Wiley, Chichester (2012)"},{"key":"7_CR18","unstructured":"Pandian, G.P., Diganta, D., Chuan, L., Enrico, Z., Pecht, M.: A critique of reliability prediction techniques for avionics applications. Chin. J. Aeronaut. (2017)"},{"issue":"9\u201311","key":"7_CR19","doi-asserted-by":"publisher","first-page":"1259","DOI":"10.1016\/S0026-2714(02)00132-4","volume":"42","author":"MG Pecht","year":"2002","unstructured":"Pecht, M.G., Das, D., Ramakrishnan, A.: The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectron. Reliab. 42(9\u201311), 1259\u20131266 (2002)","journal-title":"Microelectron. Reliab."},{"key":"7_CR20","first-page":"2825","volume":"12","author":"F Pedregosa","year":"2011","unstructured":"Pedregosa, F., et al.: Scikit-learn: machine learning in Python. J. Mach. Learn. Res. 12, 2825\u20132830 (2011)","journal-title":"J. Mach. Learn. Res."},{"key":"7_CR21","volume-title":"Gaussian processes for machine learning","author":"CK Williams","year":"2006","unstructured":"Williams, C.K., Rasmussen, C.E.: Gaussian processes for machine learning. The MIT Press, Massachusetts (2006)"},{"key":"7_CR22","volume-title":"Machine that Changed the World","author":"JP Womack","year":"1990","unstructured":"Womack, J.P., Womack, J.P., Jones, D.T., Roos, D.: Machine that Changed the World. Simon and Schuster, New York (1990)"},{"issue":"2","key":"7_CR23","doi-asserted-by":"publisher","first-page":"125","DOI":"10.1016\/j.ress.2008.06.002","volume":"94","author":"E Zio","year":"2009","unstructured":"Zio, E.: Reliability engineering: old problems and new challenges. Reliab. Eng. Syst. Saf. 94(2), 125\u2013141 (2009)","journal-title":"Reliab. Eng. Syst. Saf."}],"container-title":["Lecture Notes in Computer Science","Machine Learning and Knowledge Extraction"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-99740-7_7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,6]],"date-time":"2025-07-06T13:58:34Z","timestamp":1751810314000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-99740-7_7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9783319997391","9783319997407"],"references-count":23,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-99740-7_7","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2018]]},"assertion":[{"value":"24 August 2018","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CD-MAKE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Cross-Domain Conference for Machine Learning and Knowledge Extraction","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Hamburg","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Germany","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27 August 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30 August 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cd-make2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/cd-make.net\/about\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"45","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"25","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"56% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}