{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T22:28:48Z","timestamp":1725575328522},"publisher-location":"Berlin, Heidelberg","reference-count":6,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540213789"},{"type":"electronic","value":"9783540246534"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2004]]},"DOI":"10.1007\/978-3-540-24653-4_24","type":"book-chapter","created":{"date-parts":[[2011,1,12]],"date-time":"2011-01-12T15:08:30Z","timestamp":1294844910000},"page":"230-239","source":"Crossref","is-referenced-by-count":2,"title":["Exploiting HW Acceleration for Classifying Complex Test Program Generation Problems"],"prefix":"10.1007","author":[{"given":"Ernesto","family":"Sanchez","sequence":"first","affiliation":[]},{"given":"Giovanni","family":"Squillero","sequence":"additional","affiliation":[]},{"given":"Massimo","family":"Violante","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"24_CR1","volume-title":"Digital system testing and testable design","author":"M. Abramovici","year":"1990","unstructured":"Abramovici, M., Breuer, M., Friedman, A.: Digital system testing and testable design. John Wiley & Sons, Inc., Chichester (1990)"},{"key":"24_CR2","doi-asserted-by":"crossref","unstructured":"Papachristou, C.A., Martin, F., Nourani, M.: Microprocessor Based Testing for Core- Based System on Chip. In: ACM\/IEEE Design Automation Conference, pp. 586\u2013591 (1999)","DOI":"10.1145\/309847.310004"},{"key":"24_CR3","unstructured":"Shen, J., Abraham, J.A.: Native Mode Functional Test Generation for Processors with Applications to Self Test and Design Validation. In: International Test Conference, pp. 990\u2013999 (1998)"},{"key":"24_CR4","doi-asserted-by":"crossref","unstructured":"Corno, F., Cumani, G., Sonza Reorda, M., Squillero, G.: Fully Automatic Test-program Generation for Microprocessor Cores. IEEE Design, Automation and Test in Europe, 1006\u20131011 (2003)","DOI":"10.1145\/952532.952676"},{"key":"24_CR5","doi-asserted-by":"crossref","unstructured":"Corno, F., Squillero, G.: An Enhanced Framework for Microprocessor Test-Program Generation. In: EUROGP2003: 6th European Conference on Genetic Programming, Essex (UK), April 14-16, pp. 307\u2013315 (2003)","DOI":"10.1007\/3-540-36599-0_28"},{"key":"24_CR6","unstructured":"SPARC International, The SPARC Architecture Manual"}],"container-title":["Lecture Notes in Computer Science","Applications of Evolutionary Computing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-24653-4_24.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,11,19]],"date-time":"2020-11-19T04:50:17Z","timestamp":1605761417000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-24653-4_24"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004]]},"ISBN":["9783540213789","9783540246534"],"references-count":6,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-24653-4_24","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2004]]}}}