{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T13:58:31Z","timestamp":1756994311847,"version":"3.38.0"},"publisher-location":"Berlin, Heidelberg","reference-count":19,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540228820"},{"type":"electronic","value":"9783540286318"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2004]]},"DOI":"10.1007\/978-3-540-28631-8_54","type":"book-chapter","created":{"date-parts":[[2010,9,20]],"date-time":"2010-09-20T21:44:53Z","timestamp":1285019093000},"page":"748-762","source":"Crossref","is-referenced-by-count":5,"title":["Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis"],"prefix":"10.1007","author":[{"given":"Carles","family":"Pous","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joan","family":"Colomer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joaquim","family":"Melendez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"54_CR1","doi-asserted-by":"crossref","unstructured":"Chandramouli, R., Pateras, S.: Testing system on a chip. IEEE Spectrum, 42\u201347 (1996)","DOI":"10.1109\/6.542274"},{"key":"54_CR2","doi-asserted-by":"publisher","first-page":"796","DOI":"10.1109\/43.285252","volume":"13","author":"L. Milor","year":"1994","unstructured":"Milor, L., Sangiovanni-Vicentelli, A.: Minimizing production test time to detect faults in analog circuits. IEEE Trans. On Computer-Aided Design of IC\u00a013, 796\u2013807 (1994)","journal-title":"IEEE Trans. On Computer-Aided Design of IC"},{"key":"54_CR3","doi-asserted-by":"crossref","unstructured":"Murray, B., Hayes, J.: Testing ICs: Getting to the core of the problem. IEEE Design and Test, 32\u201338 (1996)","DOI":"10.1109\/2.544235"},{"key":"54_CR4","unstructured":"Pang, J., Starzyk, J.: Fault diagnosis in mixed-signal low testability system. International Journal of Circuit Theory and Applications, 487\u2013510 (2002)"},{"key":"54_CR5","doi-asserted-by":"publisher","first-page":"169","DOI":"10.1023\/A:1008376430315","volume":"2","author":"A. Fanni","year":"1999","unstructured":"Fanni, A., Giua, A., Marchesi, M., Montisci, A.: A neural network diagnosis approach for analog circuits. Applied Intelligence\u00a02, 169\u2013186 (1999)","journal-title":"Applied Intelligence"},{"key":"54_CR6","doi-asserted-by":"crossref","unstructured":"Fenton, B., McGinnity, M., Maguire, L.: Fault diagnosis of electronic systems using artificial intelligence. IEEE Instrumentation and Measurement, 16\u201320 (2002)","DOI":"10.1109\/MIM.2002.1028367"},{"key":"54_CR7","unstructured":"Sheppard, J.W., Simpson, W.R.: Research Perspectives and Case Studies in Systems Test and Diagnosis, ch. 5. Frontiers in Electronic Testing, vol.\u00a013. Kluwer, Dordrecht (1998) Inducing Inference Models from Case Data.ISBN 0-7923-8263-3"},{"key":"54_CR8","doi-asserted-by":"publisher","first-page":"941","DOI":"10.1109\/19.39034","volume":"38","author":"G. Stenbakken","year":"1989","unstructured":"Stenbakken, G., Souders, T., Stewart, G.: Ambiguity groups and testability. IEEE Transactions on Instrumentation and Measurement\u00a038, 941\u2013947 (1989)","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"54_CR9","doi-asserted-by":"crossref","unstructured":"Balivada, A., Chen, J., Abraham, J.: Analog testing with time response parameters. IEEE Design and Test of computers, 18\u201325 (1996)","DOI":"10.1109\/54.500197"},{"key":"54_CR10","unstructured":"Lopez de Mantaras, R., Plaza, E.: Case-based reasoning: An overview. AI Communications, 21\u201329 (1997)"},{"key":"54_CR11","unstructured":"Richter, M.: The knowledge contained in similarity measures. remarks on the invited talk given at ICCBR 1995, Sesimbra, Portugal, October 25 (1995), http:\/\/www.cbr-web.org\/documents\/Richtericcbr95remarks.html"},{"key":"54_CR12","doi-asserted-by":"crossref","unstructured":"Voorakaranam, R., Chakrabarti, S., Hou, J., Gomes, A., Cherubal, S., Chatterjee, A.: Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis. In: International Test Conference, pp. 903\u2013912 (1997)","DOI":"10.1109\/TEST.1997.639705"},{"key":"54_CR13","doi-asserted-by":"publisher","first-page":"709","DOI":"10.1109\/TCS.1977.1084298","volume":"cas-24","author":"A. Sangiovanni-Vicentelli","year":"1977","unstructured":"Sangiovanni-Vicentelli, A., Chen, L., Chua, L.: An efficient heuristic cluster algorithm for tearing large-scale networks. IEEE Transactions on Circuits and Systems\u00a0cas-24, 709\u2013717 (1977)","journal-title":"IEEE Transactions on Circuits and Systems"},{"key":"54_CR14","doi-asserted-by":"crossref","unstructured":"Wilson, D.R., Martinez, T.R.: Improved heterogeneous distance functions. Journal of Artificial Intelligence Research, 1\u201334 (1997)","DOI":"10.1613\/jair.346"},{"key":"54_CR15","doi-asserted-by":"crossref","unstructured":"Aamodt, A., Plaza, E.: Case-based reasoning: Foundationalu issues, methodological variations and system approaches. AI Communications, 39\u201359 (1994)","DOI":"10.3233\/AIC-1994-7104"},{"key":"54_CR16","doi-asserted-by":"publisher","first-page":"257","DOI":"10.1023\/A:1007626913721","volume":"38","author":"D. Wilson","year":"2000","unstructured":"Wilson, D., Martinez, T.: Reduction techniques for instance-based learning algorithms. Machine Learning\u00a038, 257\u2013286 (2000)","journal-title":"Machine Learning"},{"key":"54_CR17","first-page":"37","volume":"6","author":"D.W. Aha","year":"1991","unstructured":"Aha, D.W., Kibler, D., Albert, M.: Instance based learning algorithms. Machine Learning\u00a06, 37\u201366 (1991)","journal-title":"Machine Learning"},{"key":"54_CR18","volume-title":"Data Management Systems","author":"I.H. Witten","year":"2000","unstructured":"Witten, I.H., Frank, E.: Data Mining. Practical Machine Learning Tools and Techniques with Java Implementations. In: Data Management Systems, Morgan Kaufmann Publishers, San Francisco (2000) ISBN 1-55860-552-5"},{"key":"54_CR19","doi-asserted-by":"crossref","unstructured":"Kaminska, B., Arabi, K., Goteti, P., Huertas, J., Kim, B., Rueda, A., Soma, M.: Analog and mixed signal benchmark circuits. first release. In: IEEE Mixed Signal Testing Technical Activity Committee ITC 1997, pp. 183\u2013190 (1997)","DOI":"10.1109\/TEST.1997.639612"}],"container-title":["Lecture Notes in Computer Science","Advances in Case-Based Reasoning"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-28631-8_54.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T23:15:24Z","timestamp":1740525324000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-28631-8_54"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004]]},"ISBN":["9783540228820","9783540286318"],"references-count":19,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-28631-8_54","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2004]]}}}