{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T21:54:18Z","timestamp":1725486858830},"publisher-location":"Berlin, Heidelberg","reference-count":18,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540715900"},{"type":"electronic","value":"9783540716297"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/978-3-540-71629-7_59","type":"book-chapter","created":{"date-parts":[[2007,7,3]],"date-time":"2007-07-03T02:33:31Z","timestamp":1183430011000},"page":"525-533","source":"Crossref","is-referenced-by-count":2,"title":["Computer-Aided Vision System for Surface Blemish Detection of LED Chips"],"prefix":"10.1007","author":[{"given":"Hong-Dar","family":"Lin","sequence":"first","affiliation":[]},{"given":"Chung-Yu","family":"Chung","sequence":"additional","affiliation":[]},{"given":"Singa Wang","family":"Chiu","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"59_CR1","doi-asserted-by":"publisher","first-page":"92","DOI":"10.1109\/34.3870","volume":"10","author":"L.H. Siew","year":"1988","unstructured":"Siew, L.H., Hodgson, R.M., Wee, L.K.: Texture Measures for Carpet Wear Assessment. IEEE Transactions on Pattern Analysis and Machine Intelligence\u00a010, 92\u2013150 (1988)","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"59_CR2","doi-asserted-by":"publisher","first-page":"543","DOI":"10.1016\/S0262-8856(99)00062-1","volume":"18","author":"A. Latif-Amet","year":"2000","unstructured":"Latif-Amet, A., Ert\u00fcz\u00fcn, A., Ercil, A.: An Efficient Method for Texture Defect Detection: Sub-band Domain Co-occurrence Matrices. Image and Vision Computing\u00a018, 543\u2013553 (2000)","journal-title":"Image and Vision Computing"},{"key":"59_CR3","doi-asserted-by":"publisher","first-page":"1285","DOI":"10.1016\/S0031-3203(00)00071-6","volume":"34","author":"D.M. Tsai","year":"2001","unstructured":"Tsai, D.M., Hsiao, B.: Automatic Surface Inspection Using Wavelet Reconstruction. Pattern Recognition\u00a034, 1285\u20131305 (2001)","journal-title":"Pattern Recognition"},{"key":"59_CR4","doi-asserted-by":"publisher","first-page":"474","DOI":"10.1007\/s001700070055","volume":"16","author":"D.M. Tsai","year":"2000","unstructured":"Tsai, D.M., Wu, S.K.: Automated Surface Inspection Using Gabor Filters. International Journal of Advanced Manufacturing Technology\u00a016, 474\u2013482 (2000)","journal-title":"International Journal of Advanced Manufacturing Technology"},{"key":"59_CR5","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1080\/00207540412331285832","volume":"43","author":"B.C. Jiang","year":"2005","unstructured":"Jiang, B.C., Wang, C.C., Liu, H.C.: Liquid Crystal Display Surface Uniformity Defect Inspection Using Analysis of Variance and Exponentially Weighted Moving Average Techniques. International Journal of Production Research\u00a043, 67\u201380 (2005)","journal-title":"International Journal of Production Research"},{"key":"59_CR6","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"442","DOI":"10.1007\/11949534_44","volume-title":"Advances in Image and Video Technology","author":"H.D. Lin","year":"2006","unstructured":"Lin, H.D., Chiu, S.W.: Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays. In: Chang, L.-W., Lie, W.-N. (eds.) PSIVT 2006. LNCS, vol.\u00a04319, pp. 442\u2013452. Springer, Heidelberg (2006)"},{"key":"59_CR7","doi-asserted-by":"publisher","first-page":"500","DOI":"10.1016\/j.mejo.2005.07.018","volume":"37","author":"N.G. Shankar","year":"2006","unstructured":"Shankar, N.G., Zhong, Z.W.: A Rule-based Computing Approach for the Segmentation of Semiconductor Defects. Microelectronics Journal\u00a037, 500\u2013509 (2006)","journal-title":"Microelectronics Journal"},{"key":"59_CR8","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1016\/j.mee.2004.12.003","volume":"77","author":"N.G. Shankar","year":"2005","unstructured":"Shankar, N.G., Zhong, Z.W.: Defect Detection on Semiconductor Wafer Surfaces. Microelectronic Engineering\u00a077, 337\u2013346 (2005)","journal-title":"Microelectronic Engineering"},{"issue":"1","key":"59_CR9","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1007\/BF01238027","volume":"1","author":"M.H. Ahmed Fadzil","year":"1998","unstructured":"Ahmed Fadzil, M.H., Weng, C.J.: LED Cosmetic Flaw Vision Inspection System. Pattern Analysis & Application\u00a01(1), 62\u201370 (1998)","journal-title":"Pattern Analysis & Application"},{"key":"59_CR10","doi-asserted-by":"publisher","first-page":"3197","DOI":"10.1016\/j.patrec.2003.08.005","volume":"24","author":"S. Arivazhagan","year":"2003","unstructured":"Arivazhagan, S., Ganesan, L.: Texture Segmentation Using Wavelet Transform. Pattern Recognition Letters\u00a024, 3197\u20133203 (2003)","journal-title":"Pattern Recognition Letters"},{"key":"59_CR11","doi-asserted-by":"publisher","first-page":"2633","DOI":"10.1016\/S0167-8655(03)00107-7","volume":"24","author":"M.K. Bashar","year":"2003","unstructured":"Bashar, M.K., Matsumoto, T., Ohnishi, N.: Wavelet Transform-based Locally Orderless Images for Texture Segmentation. Pattern Recognition Letters\u00a024, 2633\u20132650 (2003)","journal-title":"Pattern Recognition Letters"},{"key":"59_CR12","first-page":"349","volume-title":"Digital Image Processing","author":"R.C. Gonzalez","year":"2002","unstructured":"Gonzalez, R.C., Woods, R.E.: Digital Image Processing, 2nd edn., pp. 349\u2013403. Prentice-Hall, Upper Saddle River (2002)","edition":"2"},{"key":"59_CR13","volume-title":"Techniques of Statistical Analysis","author":"H. Hotelling","year":"1947","unstructured":"Hotelling, H.: Multivariate Quality Control. In: Eisenhart, C., Hastay, M.W., Wallis, W.A. (eds.) Techniques of Statistical Analysis, McGraw-Hill, New York (1947)"},{"key":"59_CR14","doi-asserted-by":"publisher","first-page":"800","DOI":"10.1080\/07408179508936797","volume":"27","author":"C.A. Lowry","year":"1995","unstructured":"Lowry, C.A., Montgomery, D.C.: A Review of Multivariate Control Charts. IIE Transactions\u00a027, 800\u2013810 (1995)","journal-title":"IIE Transactions"},{"key":"59_CR15","first-page":"491","volume-title":"Introduction to Statistical Quality Control","author":"D.C. Montgomery","year":"2005","unstructured":"Montgomery, D.C.: Introduction to Statistical Quality Control, 5th edn., pp. 491\u2013504. John Wiley & Sons, Hoboken (2005)","edition":"5"},{"key":"59_CR16","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1109\/TSMC.1979.4310076","volume":"9","author":"N. Otsu","year":"1979","unstructured":"Otsu, N.: A threshold selection method from gray-level histogram. IEEE Transactions on Systems, Man, Cybernetics\u00a09, 62\u201366 (1979)","journal-title":"IEEE Transactions on Systems, Man, Cybernetics"},{"key":"59_CR17","first-page":"80","volume-title":"Machine Vision","author":"R. Jain","year":"1995","unstructured":"Jain, R., Kasturi, R., Schunck, B.G.: Machine Vision (International edn.), pp. 80\u201383. McGraw-Hill, New York (1995)"},{"key":"59_CR18","first-page":"296","volume-title":"Applied Statistics and Probability for Engineers","author":"D.C. Montgomery","year":"1999","unstructured":"Montgomery, D.C., Runger, G.C.: Applied Statistics and Probability for Engineers, 2nd edn., pp. 296\u2013304. John Wiley & Sons, New York (1999)","edition":"2"}],"container-title":["Lecture Notes in Computer Science","Adaptive and Natural Computing Algorithms"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-71629-7_59.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,11,19]],"date-time":"2020-11-19T05:24:09Z","timestamp":1605763449000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-71629-7_59"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["9783540715900","9783540716297"],"references-count":18,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-71629-7_59","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[]}}