{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:07:46Z","timestamp":1725487666150},"publisher-location":"Berlin, Heidelberg","reference-count":18,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540723929"},{"type":"electronic","value":"9783540723936"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/978-3-540-72393-6_94","type":"book-chapter","created":{"date-parts":[[2007,7,16]],"date-time":"2007-07-16T18:44:16Z","timestamp":1184611456000},"page":"785-792","source":"Crossref","is-referenced-by-count":2,"title":["A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips"],"prefix":"10.1007","author":[{"given":"Hong-Dar","family":"Lin","sequence":"first","affiliation":[]},{"given":"Chung-Yu","family":"Chung","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"94_CR1","doi-asserted-by":"publisher","first-page":"92","DOI":"10.1109\/34.3870","volume":"10","author":"L.H. Siew","year":"1988","unstructured":"Siew, L.H., Hodgson, R.M., Wee, L.K.: Texture Measures for Carpet Wear Assessment. IEEE Transactions on Pattern Analysis and Machine Intelligence\u00a010, 92\u2013150 (1988)","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"94_CR2","doi-asserted-by":"publisher","first-page":"543","DOI":"10.1016\/S0262-8856(99)00062-1","volume":"18","author":"A. Latif-Amet","year":"2000","unstructured":"Latif-Amet, A., Ert\u00fcz\u00fcn, A., Ercil, A.: An Efficient Method for Texture Defect Detection: Sub-band Domain Co-occurrence Matrices. Image and Vision Computing\u00a018, 543\u2013553 (2000)","journal-title":"Image and Vision Computing"},{"key":"94_CR3","doi-asserted-by":"publisher","first-page":"1285","DOI":"10.1016\/S0031-3203(00)00071-6","volume":"34","author":"D.M. Tsai","year":"2001","unstructured":"Tsai, D.M., Hsiao, B.: Automatic Surface Inspection Using Wavelet Reconstruction. Pattern Recognition\u00a034, 1285\u20131305 (2001)","journal-title":"Pattern Recognition"},{"key":"94_CR4","doi-asserted-by":"publisher","first-page":"474","DOI":"10.1007\/s001700070055","volume":"16","author":"D.M. Tsai","year":"2000","unstructured":"Tsai, D.M., Wu, S.K.: Automated Surface Inspection Using Gabor Filters. International Journal of Advanced Manufacturing Technology\u00a016, 474\u2013482 (2000)","journal-title":"International Journal of Advanced Manufacturing Technology"},{"key":"94_CR5","unstructured":"Lin, H.D., Ho, D.C.: Detection of Tiny Surface Defects Using DCT Based Enhancement Approach In Computer Vision Systems. In: IEEE\/ASME International Conference on Advanced Intelligent Mechatronics (IEEE\/ASME AIM-2005), pp. 373\u2013378 (2005)"},{"key":"94_CR6","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"442","DOI":"10.1007\/11949534_44","volume-title":"Advances in Image and Video Technology","author":"H.-D. Lin","year":"2006","unstructured":"Lin, H.-D., Chiu, S.W.: Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays. In: Chang, L.-W., Lie, W.-N. (eds.) PSIVT 2006. LNCS, vol.\u00a04319, pp. 442\u2013452. Springer, Heidelberg (2006)"},{"key":"94_CR7","doi-asserted-by":"publisher","first-page":"4331","DOI":"10.1080\/00207540410001716480","volume":"42","author":"C.-J. Lu","year":"2004","unstructured":"Lu, C.-J., Tsai, D.-M.: Defect Inspection of Patterned TFT-LCD Panels Using a Fast Sub-image Based SVD. International Journal of Production Research\u00a042, 4331\u20134351 (2004)","journal-title":"International Journal of Production Research"},{"key":"94_CR8","doi-asserted-by":"publisher","first-page":"500","DOI":"10.1016\/j.mejo.2005.07.018","volume":"37","author":"N.G. Shankar","year":"2006","unstructured":"Shankar, N.G., Zhong, Z.W.: A Rule-based Computing Approach for the Segmentation of Semiconductor Defects. Microelectronics Journal\u00a037, 500\u2013509 (2006)","journal-title":"Microelectronics Journal"},{"key":"94_CR9","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1016\/j.mee.2004.12.003","volume":"77","author":"N.G. Shankar","year":"2005","unstructured":"Shankar, N.G., Zhong, Z.W.: Defect Detection on Semiconductor Wafer Surfaces. Microelectronic Engineering\u00a077, 337\u2013346 (2005)","journal-title":"Microelectronic Engineering"},{"key":"94_CR10","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1007\/BF01238027","volume":"1","author":"M.A. Fadzil","year":"1998","unstructured":"Fadzil, M.A., Weng, C.J.: LED Cosmetic Flaw Vision Inspection System. Pattern Analysis & Application\u00a01, 62\u201370 (1998)","journal-title":"Pattern Analysis & Application"},{"key":"94_CR11","doi-asserted-by":"publisher","first-page":"3197","DOI":"10.1016\/j.patrec.2003.08.005","volume":"24","author":"S. Arivazhagan","year":"2003","unstructured":"Arivazhagan, S., Ganesan, L.: Texture Segmentation Using Wavelet Transform. Pattern Recognition Letters\u00a024, 3197\u20133203 (2003)","journal-title":"Pattern Recognition Letters"},{"key":"94_CR12","doi-asserted-by":"publisher","first-page":"2633","DOI":"10.1016\/S0167-8655(03)00107-7","volume":"24","author":"M.K. Bashar","year":"2003","unstructured":"Bashar, M.K., Matsumoto, T., Ohnishi, N.: Wavelet Transform-based Locally Orderless Images for Texture Segmentation. Pattern Recognition Letters\u00a024, 2633\u20132650 (2003)","journal-title":"Pattern Recognition Letters"},{"key":"94_CR13","first-page":"349","volume-title":"Digital Image Processing","author":"R.C. Gonzalez","year":"2002","unstructured":"Gonzalez, R.C., Woods, R.E.: Digital Image Processing, 2nd edn., pp. 349\u2013403. Prentice-Hall, Upper Saddle River (2002)","edition":"2"},{"key":"94_CR14","doi-asserted-by":"publisher","first-page":"59","DOI":"10.1016\/S0167-9236(00)00063-4","volume":"29","author":"B.S. Kang","year":"2000","unstructured":"Kang, B.S., Park, S.C.: Integrated Machine Learning Approaches for Complementing Statistical Process Control Procedures. Decision Support Systems\u00a029, 59\u201372 (2000)","journal-title":"Decision Support Systems"},{"key":"94_CR15","doi-asserted-by":"publisher","first-page":"309","DOI":"10.1080\/00207549408956935","volume":"32","author":"A.E. Smith","year":"1994","unstructured":"Smith, A.E.: X-bar and R Control Chart Interpretation Using Neural Computing. International Journal of Production Research\u00a032, 309\u2013320 (1994)","journal-title":"International Journal of Production Research"},{"key":"94_CR16","doi-asserted-by":"crossref","unstructured":"Hush, D.R., Horne, B.G.: Progress in Supervised Neural Networks. IEEE Signal Processing Magazine, 8\u201339 (January 1993)","DOI":"10.1109\/79.180705"},{"key":"94_CR17","first-page":"80","volume-title":"Machine Vision","author":"R. Jain","year":"1995","unstructured":"Jain, R., Kasturi, R., Schunck, B.G.: Machine Vision, pp. 80\u201383. McGraw-Hill, New York (1995)"},{"key":"94_CR18","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1109\/TSMC.1979.4310076","volume":"9","author":"N. Otsu","year":"1979","unstructured":"Otsu, N.: A threshold selection method from gray-level histogram. IEEE Transactions on Systems, Man, Cybernetics\u00a09, 62\u201366 (1979)","journal-title":"IEEE Transactions on Systems, Man, Cybernetics"}],"container-title":["Lecture Notes in Computer Science","Advances in Neural Networks \u2013 ISNN 2007"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-72393-6_94.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,11,19]],"date-time":"2020-11-19T05:32:11Z","timestamp":1605763931000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-72393-6_94"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["9783540723929","9783540723936"],"references-count":18,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-72393-6_94","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[]}}