{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,18]],"date-time":"2025-01-18T05:32:19Z","timestamp":1737178339510,"version":"3.33.0"},"publisher-location":"Berlin, Heidelberg","reference-count":15,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540726845"},{"type":"electronic","value":"9783540726852"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/978-3-540-72685-2_55","type":"book-chapter","created":{"date-parts":[[2007,6,30]],"date-time":"2007-06-30T01:31:29Z","timestamp":1183167089000},"page":"592-603","source":"Crossref","is-referenced-by-count":16,"title":["Cut Sequence Set Generation for Fault Tree Analysis"],"prefix":"10.1007","author":[{"given":"Dong","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weiyan","family":"Xing","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunyuan","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rui","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haiyan","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"55_CR1","doi-asserted-by":"crossref","unstructured":"Coudert, O., Madre, J.C.: Fault tree analysis: 1020 prime implicants and beyond. In: Reliability and Maintainability Symposium, pp. 240\u2013245 (1993)","DOI":"10.1109\/RAMS.1993.296849"},{"key":"55_CR2","doi-asserted-by":"crossref","unstructured":"Amari, S.V., Akers, J.B.: Reliability analysis of large fault trees using the Vesely failure rate. In: RAMS\u201904, pp. 391\u2013396 (2004)","DOI":"10.1109\/RAMS.2004.1285481"},{"key":"55_CR3","doi-asserted-by":"publisher","first-page":"363","DOI":"10.1109\/24.159800","volume":"41","author":"J.B. Dugan","year":"1992","unstructured":"Dugan, J.B., Bavuso, S., Boyd, M.: Dynamic fault tree models for fault tolerant computer systems. IEEE Transactions on Reliability\u00a041, 363\u2013377 (1992)","journal-title":"IEEE Transactions on Reliability"},{"key":"55_CR4","doi-asserted-by":"crossref","unstructured":"Manian, R., Coppit, D.W., Sullivan, K.J., et al.: Bridging the gap between systems and dynamic fault tree models. In: Annual Reliability and Maintainability Symposium 1999 Proceedings, Washington, DC, USA, pp. 105\u2013111 (1999)","DOI":"10.1109\/RAMS.1999.744104"},{"key":"55_CR5","doi-asserted-by":"crossref","unstructured":"Gulati, R., Dugan, J.B.: A Modular Approach for Analyzing Static and Dynamic Fault Trees. In: RAMS\u201997, January 1997, pp. 57\u201363 (1997)","DOI":"10.1109\/RAMS.1997.571665"},{"key":"55_CR6","doi-asserted-by":"publisher","first-page":"499","DOI":"10.1109\/TR.2004.837305","volume":"53","author":"Y. Ou","year":"2004","unstructured":"Ou, Y., Dugan, J.B.: Modular solution of dynamic multi-phase systems. IEEE Transactions on Reliability\u00a053, 499\u2013508 (2004)","journal-title":"IEEE Transactions on Reliability"},{"key":"55_CR7","doi-asserted-by":"crossref","unstructured":"Dugan, J.B., Venkataraman, B., Gulati, R.: DIFTree: A software package for the analysis of dynamic fault tree models. In: RAMS\u201997, Philadelphia, PA, pp. 13\u201316 (1997)","DOI":"10.1109\/RAMS.1997.571666"},{"key":"55_CR8","doi-asserted-by":"crossref","unstructured":"Sullivan, K.J., Dugan, J.B., Coppit, D.: The Galileo fault tree analysis tool. In: Proceedings of the 29th Annual International Symposium on Fault-Tolerant Computing, Madison, Wisconsin, pp. 232\u2013235 (1999)","DOI":"10.1109\/FTCS.1999.781056"},{"key":"55_CR9","doi-asserted-by":"crossref","unstructured":"Fussell, J.B., Aber, E.F., Rahl, R.G.: On the quantitative analysis of priority-AND failure logic. IEEE Transactions on Reliability, 324\u2013326 (1976)","DOI":"10.1109\/TR.1976.5220025"},{"key":"55_CR10","unstructured":"Tang, Z., Dugan, J.B.: Minimal Cut Set\/Sequence Generation for Dynamic Fault Trees. In: Annual Reliability and Maintainability Symposium 2004 Proceedings, LA (2004)"},{"key":"55_CR11","doi-asserted-by":"publisher","first-page":"389","DOI":"10.1109\/24.983400","volume":"50","author":"A. Rauzy","year":"2001","unstructured":"Rauzy, A.: Mathematical foundations of minimal cut sets. IEEE Transactions on Reliability\u00a050, 389\u2013396 (2001)","journal-title":"IEEE Transactions on Reliability"},{"key":"55_CR12","doi-asserted-by":"crossref","unstructured":"Assaf, T., Dugan, J.B.: Diagnostic Expert Systems from Dynamic Fault Trees. In: Proceedings of 2004 Annual Reliability and Maintainability Symposium, LA (2004)","DOI":"10.1109\/RAMS.2004.1285489"},{"key":"55_CR13","doi-asserted-by":"crossref","unstructured":"Assaf, T., Dugan, J.B.: Automatic generation of Diagnostic Expert Systems from Fault Trees. In: RAMS\u201903, Tampa, FL (2003)","DOI":"10.1109\/RAMS.2003.1181916"},{"key":"55_CR14","doi-asserted-by":"crossref","unstructured":"Distefano, S., Xing, L.: A New Approach to Modeling the System Reliability: Dynamic Reliability Block Diagrams. In: RAMS \u201906, pp. 189\u2013195 (2006)","DOI":"10.1109\/RAMS.2006.1677373"},{"key":"55_CR15","doi-asserted-by":"crossref","unstructured":"Boudali, H., Dugan, J.B.: A new bayesian network approach to solve dynamic fault trees. In: RAMS\u201905, pp. 451\u2013456 (2005)","DOI":"10.1109\/RAMS.2005.1408404"}],"container-title":["Lecture Notes in Computer Science","Embedded Software and Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-72685-2_55.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,18]],"date-time":"2025-01-18T00:40:19Z","timestamp":1737160819000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-72685-2_55"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["9783540726845","9783540726852"],"references-count":15,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-72685-2_55","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[]}}