{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:52:10Z","timestamp":1747806730540},"publisher-location":"Berlin, Heidelberg","reference-count":9,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540743088"},{"type":"electronic","value":"9783540743095"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/978-3-540-74309-5_12","type":"book-chapter","created":{"date-parts":[[2007,8,20]],"date-time":"2007-08-20T10:34:15Z","timestamp":1187606055000},"page":"102-113","source":"Crossref","is-referenced-by-count":4,"title":["An Alternative Organization of Defect Map for Defect-Resilient Embedded On-Chip Memories"],"prefix":"10.1007","author":[{"given":"Kang","family":"Yi","sequence":"first","affiliation":[]},{"given":"Shih-Yang","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Young-Hwan","family":"Park","sequence":"additional","affiliation":[]},{"given":"Fadi","family":"Kurdahi","sequence":"additional","affiliation":[]},{"given":"Ahmed","family":"Eltawil","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"issue":"3","key":"12_CR1","doi-asserted-by":"publisher","first-page":"200","DOI":"10.1109\/MDT.2004.19","volume":"21","author":"S. Shoukourian","year":"2004","unstructured":"Shoukourian, S., Vardanian, V., Zorian, Y.: SoC yield optimization via an embedded-memory test and repair infrastructure. IEEE Design & Test of Computers\u00a021(3), 200\u2013207 (2004)","journal-title":"IEEE Design & Test of Computers"},{"key":"12_CR2","unstructured":"http:\/\/public.itrs.net"},{"key":"12_CR3","doi-asserted-by":"crossref","unstructured":"Gupta, T., Jayatissa, A.H.: Recent advances in nanotechnology: key issues & potential problem areas. In: Proceedings of IEEE Conference on Nanotechnology, vol.\u00a02, pp. 469\u2013472 (2000)","DOI":"10.1109\/NANO.2003.1230947"},{"issue":"1","key":"12_CR4","doi-asserted-by":"publisher","first-page":"27","DOI":"10.1109\/TVLSI.2004.840407","volume":"13","author":"A. Agarwal","year":"2005","unstructured":"Agarwal, A., Paul, B.C., Mahmoodi, H., Datta, A., Roy, K.: A process-tolerant cache architecture for improved yield in nanoscale technologies. IEEE Transactions on Very Large Scale Integration (VLSI) Systems\u00a013(1), 27\u201338 (2005)","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"},{"key":"12_CR5","doi-asserted-by":"crossref","unstructured":"Kurdahi, F.J., Eltawil, A.M., Park, Y.-H., Kanj, R.N., Nassif, S.R.: System-Level SRAM Yield Enhancement. In: ISQED 2006. Proceedings of the 7th International Symposium on Quality Electronic Design, pp. 179\u2013184 (2006)","DOI":"10.1109\/ISQED.2006.130"},{"key":"12_CR6","doi-asserted-by":"crossref","unstructured":"Yi, K., Jung, K.H., Cheng, S.-Y., Park, Y.-H., Kurdahi, F.J., Eltawil, A.: Design and Analysis of Low Power Filter toward Defect-Resilient Embedded Memories for Multimedia SoC. In: Proceedings of Asia-Pacific Computer Systems and Architecture Conference (September 2006), pp. 300\u2013313 (2006)","DOI":"10.1007\/11859802_24"},{"key":"12_CR7","doi-asserted-by":"crossref","unstructured":"Pagiamtzis, K., Sheikholeslami, A.: Contents-Addressable Memory (CAM) Circuits and Architectures: A Tutorial and Survey. IEEE journal of Solid-State Circuits 41(3) (March 2006)","DOI":"10.1109\/JSSC.2005.864128"},{"key":"12_CR8","doi-asserted-by":"crossref","unstructured":"Horowitz, M., et al.: H.264\/AVC Baseline Profile Decoder Complexity Analysis. IEEE Trans. on Circuits and Systems for Video Technology, 13(7) (July 2003)","DOI":"10.1109\/TCSVT.2003.814967"},{"key":"12_CR9","unstructured":"ARC, \n                  \n                    http:\/\/www.arc.com\/subsystems\/video\/ARC_Video_pb.pdf"}],"container-title":["Lecture Notes in Computer Science","Advances in Computer Systems Architecture"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-74309-5_12.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T10:19:39Z","timestamp":1619518779000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-74309-5_12"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["9783540743088","9783540743095"],"references-count":9,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-74309-5_12","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[]}}