{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T09:55:01Z","timestamp":1742982901069,"version":"3.40.3"},"publisher-location":"Berlin, Heidelberg","reference-count":8,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540748267"},{"type":"electronic","value":"9783540748274"}],"license":[{"start":{"date-parts":[[2007,1,1]],"date-time":"2007-01-01T00:00:00Z","timestamp":1167609600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1007\/978-3-540-74827-4_110","type":"book-chapter","created":{"date-parts":[[2007,9,11]],"date-time":"2007-09-11T19:35:16Z","timestamp":1189539316000},"page":"877-884","source":"Crossref","is-referenced-by-count":1,"title":["Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines"],"prefix":"10.1007","author":[{"given":"YuanLin","family":"Wen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sheng-Luen","family":"Chung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"LiDer","family":"Jeng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"MuDer","family":"Jeng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"8","key":"110_CR1","doi-asserted-by":"publisher","first-page":"1318","DOI":"10.1109\/9.940942","volume":"46","author":"S. Jiang","year":"2001","unstructured":"Jiang, S., Huang, Z., Chandra, V., Kumar, R.: A Polynomial Algorithm for Testing Diagnosability of Discrete-Event Systems. IEEE Trans. on Automatic Control\u00a046(8), 1318\u20131321 (2001)","journal-title":"IEEE Trans. on Automatic Control"},{"issue":"2","key":"110_CR2","first-page":"13","volume":"24","author":"W. Lin","year":"2002","unstructured":"Lin, W.: Introduction to Metal-Organic Vapor Phase Epitaxy System and Technology. Instruments Today\u00a024(2), 13\u201324 (2002)","journal-title":"Instruments Today"},{"issue":"9","key":"110_CR3","doi-asserted-by":"publisher","first-page":"1555","DOI":"10.1109\/9.412626","volume":"40","author":"M. Sampath","year":"1995","unstructured":"Sampath, M., Lafortune, S., Sinnamohideen, K., Teneketzis, D.: Diagnosability of Discrete Event Systems. IEEE Trans. on Automatic Control\u00a040(9), 1555\u20131557 (1995)","journal-title":"IEEE Trans. on Automatic Control"},{"key":"110_CR4","doi-asserted-by":"publisher","first-page":"1135","DOI":"10.4028\/www.scientific.net\/MSF.505-507.1135","volume":"505","author":"Y.L. Wen","year":"2006","unstructured":"Wen, Y.L., Jeng, M.D., Huang, Y.S.: Diagnosability of Semiconductor Manufacturing Equipment. Material Science Forum\u00a0505, 1135\u20131140 (2006)","journal-title":"Material Science Forum"},{"key":"110_CR5","series-title":"Lecture Notes in Artificial Intelligence","doi-asserted-by":"publisher","first-page":"879","DOI":"10.1007\/11893004_112","volume-title":"Knowledge-Based Intelligent Information and Engineering Systems","author":"Y.L. Wen","year":"2006","unstructured":"Wen, Y.L., Jeng, M.D., Jeng, L.D., Fan, P.S.: An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems. In: Gabrys, B., Howlett, R.J., Jain, L.C. (eds.) KES 2006. LNCS (LNAI), vol.\u00a04252, pp. 879\u2013887. Springer, Heidelberg (2006)"},{"key":"110_CR6","first-page":"113","volume-title":"Proc. of the 1998 IEEE Int. Con. on Systems, Man, and Cybernetics","author":"T. Ushio","year":"1998","unstructured":"Ushio, T., Onishi, I., Okuda, K.: Fault Detection Based on Petri Net Models with Faulty Behaviors. In: Proc. of the 1998 IEEE Int. Con. on Systems, Man, and Cybernetics, pp. 113\u2013118. IEEE Computer Society Press, Los Alamitos (1998)"},{"key":"110_CR7","doi-asserted-by":"crossref","unstructured":"Martinez, J., Silva, M.: A simple and fast algorithm to obtain all invariants of a generalized Petri nets. In: Proc. of Second European Workshop on Application and Theory of Petri Nets. Informatik-Fachberichte, vol.\u00a052, pp. 301\u2013310 (1982)","DOI":"10.1007\/978-3-642-68353-4_47"},{"issue":"2\u20133","key":"110_CR8","doi-asserted-by":"publisher","first-page":"158","DOI":"10.1080\/0951192052000288206","volume":"18","author":"S.-L. Chung","year":"2005","unstructured":"Chung, S.-L.: Diagnosing PN-based models with partial observable transitions. Int. J. Computer Integrated Manufacturing\u00a018(2\u20133), 158\u2013169 (2005)","journal-title":"Int. J. Computer Integrated Manufacturing"}],"container-title":["Lecture Notes in Computer Science","Knowledge-Based Intelligent Information and Engineering Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-74827-4_110","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,21]],"date-time":"2019-05-21T21:48:34Z","timestamp":1558475314000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-74827-4_110"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"ISBN":["9783540748267","9783540748274"],"references-count":8,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-74827-4_110","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2007]]}}}