{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:57:41Z","timestamp":1725490661300},"publisher-location":"Berlin, Heidelberg","reference-count":27,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540749837"},{"type":"electronic","value":"9783540749844"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/978-3-540-74984-4_4","type":"book-chapter","created":{"date-parts":[[2007,8,31]],"date-time":"2007-08-31T05:13:08Z","timestamp":1188537188000},"page":"54-68","source":"Crossref","is-referenced-by-count":5,"title":["TTCN-3 Quality Engineering: Using Learning Techniques to Evaluate Metric Sets"],"prefix":"10.1007","author":[{"given":"Edith","family":"Werner","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jens","family":"Grabowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Helmut","family":"Neukirchen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nils","family":"R\u00f6ttger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephan","family":"Waack","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin","family":"Zeiss","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"4_CR1","volume-title":"Software Metrics","author":"N.E. Fenton","year":"1997","unstructured":"Fenton, N.E., Pfleeger, S.L.: Software Metrics. PWS Publishing, Boston (1997)"},{"unstructured":"CMMI Product Team: CMMI for Development, Version 1.2. Technical Report CMU\/SEI-2006-TR-008, Carnegie Mellon University, Software Engineering Institute (2006)","key":"4_CR2"},{"unstructured":"ISO\/IEC: ISO\/IEC Standard No. 15504: Information technology \u2013 Process Assessment; Parts 1\u20135. International Organization for Standardization (ISO) \/ International Electrotechnical Commission (IEC), Geneva, Switzerland (2003-2006)","key":"4_CR3"},{"unstructured":"ETSI: ETSI Standard (ES) 201 873-1 V3.2.1 (2007-02): The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language. European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France, also published as ITU-T Recommendation\u00a0Z.140 (February 2007)","key":"4_CR4"},{"issue":"3","key":"4_CR5","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1016\/S1389-1286(03)00249-4","volume":"42","author":"J. Grabowski","year":"2003","unstructured":"Grabowski, J., Hogrefe, D., R\u00e9thy, G., Schieferdecker, I., Wiles, A., Willcock, C.: An introduction to the testing and test control notation (TTCN-3). Computer Networks\u00a042(3), 375\u2013403 (2003)","journal-title":"Computer Networks"},{"key":"4_CR6","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"148","DOI":"10.1007\/11951148_10","volume-title":"System Analysis and Modeling: Language Profiles","author":"B. Zeiss","year":"2006","unstructured":"Zeiss, B., Neukirchen, H., Grabowski, J., Evans, D., Baker, P.: Refactoring and Metrics for TTCN-3 Test Suites. In: Gotzhein, R., Reed, R. (eds.) SAM 2006. LNCS, vol.\u00a04320, pp. 148\u2013165. Springer, Heidelberg (2006)"},{"unstructured":"Zeiss, B., Vega, D., Schieferdecker, I., Neukirchen, H., Grabowski, J.: Applying the ISO 9126 Quality Model to Test Specifications \u2013 Exemplified for TTCN-3 Test Specifications. In: Bleek, W.G., Raasch, J., Z\u00fcllighoven, H. (eds.) Software Engineering 2007, Bonn, Gesellschaft f\u00fcr Informatik. Lecture Notes in Informatics (LNI), vol.\u00a0105, pp. 231\u2013242. K\u00f6llen Verlag (March 2007)","key":"4_CR7"},{"unstructured":"ISO\/IEC: ISO\/IEC Standard No. 9126: Software engineering \u2013 Product quality; Parts 1\u20134. International Organization for Standardization (ISO) \/ International Electrotechnical Commission (IEC), Geneva, Switzerland (2001-2004)","key":"4_CR8"},{"key":"4_CR9","volume-title":"Elements of Software Science","author":"M. Halstead","year":"1977","unstructured":"Halstead, M.: Elements of Software Science. Elsevier, New York (1977)"},{"issue":"4","key":"4_CR10","doi-asserted-by":"publisher","first-page":"308","DOI":"10.1109\/TSE.1976.233837","volume":"2","author":"T.J. McCabe","year":"1976","unstructured":"McCabe, T.J.: A Complexity Measure. IEEE Transactions on Software Engineering\u00a02(4), 308\u2013320 (1976)","journal-title":"IEEE Transactions on Software Engineering"},{"unstructured":"Watson, A.H., McCabe, T.J.: Structured Testing: A Testing Methodology Using the Cyclomatic Complexity Metricy. NIST Special Publication 500-235, National Institute of Standards and Technology, Computer Systems Laboratory, Gaithersburg, MD, United States of America (1996)","key":"4_CR11"},{"key":"4_CR12","first-page":"430","volume-title":"Proceedings of the First Asia-Pacific Software Engineering Conference","author":"C.F. Fan","year":"1994","unstructured":"Fan, C.F., Yih, S.: Prescriptive metrics for software quality assurance. In: Proceedings of the First Asia-Pacific Software Engineering Conference, Tokyo, Japan, pp. 430\u2013438. IEEE Computer Society Press, Los Alamitos (1994)"},{"issue":"6","key":"4_CR13","doi-asserted-by":"publisher","first-page":"728","DOI":"10.1109\/TSE.1984.5010301","volume":"10","author":"V.R. Basili","year":"1984","unstructured":"Basili, V.R., Weiss, D.M.: A Methodology for Collecting Valid Software Engineering Data. IEEE Transactions on Software Engineering\u00a010(6), 728\u2013738 (1984)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"4_CR14","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1145\/800003.807911","volume-title":"Proceedings of the 1981 ACM Workshop\/Symposium on Measurement and Evaluation of Software Quality","author":"S. Henry","year":"1981","unstructured":"Henry, S., Kafura, D., Harris, K.: On the Relationships Among Three Software Metrics. In: Proceedings of the 1981 ACM Workshop\/Symposium on Measurement and Evaluation of Software Quality, pp. 81\u201388. ACM Press, New York (1981)"},{"issue":"11","key":"4_CR15","doi-asserted-by":"publisher","first-page":"1134","DOI":"10.1145\/1968.1972","volume":"27","author":"L. Valiant","year":"1984","unstructured":"Valiant, L.: A theory of learnability. Communications of the ACM\u00a027(11), 1134\u20131142 (1984)","journal-title":"Communications of the ACM"},{"key":"4_CR16","doi-asserted-by":"publisher","first-page":"441","DOI":"10.1098\/rsta.1984.0069","volume":"312","author":"L. Valiant","year":"1984","unstructured":"Valiant, L.: Deductive learning. Philosophical Transactions of the Royal Society London A\u00a0312, 441\u2013446 (1984)","journal-title":"Philosophical Transactions of the Royal Society London A"},{"issue":"2","key":"4_CR17","doi-asserted-by":"publisher","first-page":"264","DOI":"10.1137\/1116025","volume":"16","author":"V. Vapnik","year":"1971","unstructured":"Vapnik, V., Chervonenkis, A.Y.: On the uniform convergence of relative frequencies of events and their probabilities. Theory of Probabilty and its Applications\u00a016(2), 264\u2013280 (1971)","journal-title":"Theory of Probabilty and its Applications"},{"issue":"4","key":"4_CR18","doi-asserted-by":"publisher","first-page":"929","DOI":"10.1145\/76359.76371","volume":"36","author":"A. Blumer","year":"1989","unstructured":"Blumer, A., Ehrenfeucht, A., Haussler, D., Warmuth, M.K.: Learnability and the Vapnik-Chervonenkis dimension. Journal of the ACM\u00a036(4), 929\u2013969 (1989)","journal-title":"Journal of the ACM"},{"key":"4_CR19","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-2440-0","volume-title":"The Nature of Statistical Lerning Theory","author":"V. Vapnik","year":"1995","unstructured":"Vapnik, V.: The Nature of Statistical Lerning Theory. Springer, New York (1995)"},{"key":"4_CR20","doi-asserted-by":"crossref","first-page":"443","DOI":"10.1007\/978-1-4612-1358-1_29","volume":"II","author":"V.I. Koltchinskii","year":"2000","unstructured":"Koltchinskii, V.I., Pachenko, D.: Rademacher processes and bounding the risk of learning function. High Dimensional Probability\u00a0II, 443\u2013459 (2000)","journal-title":"High Dimensional Probability"},{"key":"4_CR21","doi-asserted-by":"crossref","DOI":"10.7551\/mitpress\/3897.001.0001","volume-title":"An Introduction to Computational Learning Theory","author":"M.J. Kearns","year":"1994","unstructured":"Kearns, M.J., Vazirani, U.V.: An Introduction to Computational Learning Theory. MIT Press, Cambridge (1994)"},{"key":"4_CR22","doi-asserted-by":"crossref","DOI":"10.1017\/CBO9780511809682","volume-title":"Kernel Methods for Pattern Analysis","author":"J. Shawe-Taylor","year":"2004","unstructured":"Shawe-Taylor, J., Cristianini, N.: Kernel Methods for Pattern Analysis. Cambridge University Press, Cambridge (2004)"},{"doi-asserted-by":"crossref","unstructured":"Massart, P.: Some applications of concentration inequalities to statistics. Annales de la Facult\u00e9 des Sciences de Toulouse, 245\u2013303 vol. sp\u00e9cial d\u00e9di\u00e9 \u00e0 Michel Talagrand (2000)","key":"4_CR23","DOI":"10.5802\/afst.961"},{"unstructured":"ETSI: Technical Specification (TS) 102 027-3 V3.2.1 (2005-07): SIP ATS & PIXIT; Part 3: Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (July 2005)","key":"4_CR24"},{"unstructured":"ETSI: Technical Specification (TS) 102 516 V1.1 (2006-04): IPv6 Core Protocol; Conformance Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (April 2006)","key":"4_CR25"},{"key":"4_CR26","volume-title":"Proceedings of TAIC PART 2006 (Testing: Academic & Industrial Conference \u2013 Practice And Research Techniques)","author":"P. Baker","year":"2006","unstructured":"Baker, P., Evans, D., Grabowski, J., Neukirchen, H., Zeiss, B.: TRex \u2013 The Refactoring and Metrics Tool for TTCN-3 Test Specifications. In: Proceedings of TAIC PART 2006 (Testing: Academic & Industrial Conference \u2013 Practice And Research Techniques), Cumberland Lodge, Windsor Great Park, UK, 29th\u201331st August 2006, IEEE Computer Society Press, Los Alamitos (2006)"},{"unstructured":"TRex Team: TRex Website (2007), http:\/\/www.trex.informatik.uni-goettingen.de","key":"4_CR27"}],"container-title":["Lecture Notes in Computer Science","SDL 2007: Design for Dependable Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-74984-4_4.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T10:50:33Z","timestamp":1619520633000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-74984-4_4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["9783540749837","9783540749844"],"references-count":27,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-74984-4_4","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[]}}