{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,22]],"date-time":"2025-01-22T20:14:51Z","timestamp":1737576891952,"version":"3.33.0"},"publisher-location":"Berlin, Heidelberg","reference-count":14,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540768555"},{"type":"electronic","value":"9783540768562"}],"license":[{"start":{"date-parts":[[2007,1,1]],"date-time":"2007-01-01T00:00:00Z","timestamp":1167609600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1007\/978-3-540-76856-2_70","type":"book-chapter","created":{"date-parts":[[2007,11,22]],"date-time":"2007-11-22T00:13:45Z","timestamp":1195690425000},"page":"711-720","source":"Crossref","is-referenced-by-count":3,"title":["ChipViz: Visualizing Memory Chip Test Data"],"prefix":"10.1007","author":[{"given":"Amit P.","family":"Sawant","sequence":"first","affiliation":[]},{"given":"Ravi","family":"Raina","sequence":"additional","affiliation":[]},{"given":"Christopher G.","family":"Healey","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"70_CR1","first-page":"548","volume-title":"Proceedings of the IEEE International Test Conference on Test","author":"H.-D. Oberle","year":"1991","unstructured":"Oberle, H.-D., Muhmenthaler, P.: Test pattern development and evaluation for drams with fault simulator ramsim. In: Proceedings of the IEEE International Test Conference on Test, pp. 548\u2013555. IEEE Computer Society, Washington, DC, USA (1991)"},{"key":"70_CR2","first-page":"526","volume-title":"Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years","author":"S.C. Oh","year":"1994","unstructured":"Oh, S.C., Kim, J.H., Choi, H.J., Choi, S.D., Park, K.T., Park, J.W., Lee, W.J.: Automatic failure-analysis system for high-density dram. In: Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years, pp. 526\u2013530. IEEE Computer Society, Washington, DC, USA (1994)"},{"key":"70_CR3","doi-asserted-by":"publisher","first-page":"18","DOI":"10.1145\/347090.347099","volume-title":"KDD 2000: Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining","author":"T. Fountain","year":"2000","unstructured":"Fountain, T., Dietterich, T., Sudyka, B.: Mining ic test data to optimize vlsi testing. In: KDD 2000: Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining, pp. 18\u201325. ACM Press, New York (2000), doi:10.1145\/347090.347099"},{"key":"70_CR4","doi-asserted-by":"publisher","first-page":"467","DOI":"10.1145\/581396.581397","volume-title":"ICSE 2002: Proceedings of the 24th International Conference on Software Engineering","author":"J.A. Jones","year":"2002","unstructured":"Jones, J.A., Harrold, M.J., Stasko, J.: Visualization of test information to assist fault localization. In: ICSE 2002: Proceedings of the 24th International Conference on Software Engineering, pp. 467\u2013477. ACM Press, New York (2002)"},{"key":"70_CR5","doi-asserted-by":"publisher","first-page":"123","DOI":"10.1145\/307418.307577","volume-title":"DATE 1999: Proceedings of the conference on Design, automation and test in Europe","author":"A.J. Goor van de","year":"1999","unstructured":"van de Goor, A.J., de Neef, J.: Industrial evaluation of dram tests. In: DATE 1999: Proceedings of the conference on Design, automation and test in Europe, p. 123. ACM Press, New York (1999)"},{"key":"70_CR6","first-page":"191","volume-title":"Scientific Visualization, Overviews, Methodologies, and Techniques","author":"S.G. Eick","year":"1997","unstructured":"Eick, S.G.: Engineering perceptually effective visualizations for abstract data. In: Scientific Visualization, Overviews, Methodologies, and Techniques, pp. 191\u2013210. IEEE Computer Society, Washington, DC, USA (1997)"},{"key":"70_CR7","first-page":"35","volume":"25","author":"D.A. Keim","year":"1996","unstructured":"Keim, D.A.: Pixel-oriented database visualizations. SIGMOD Record (ACM Special Interest Group on Management of Data)\u00a025, 35\u201339 (1996)","journal-title":"SIGMOD Record (ACM Special Interest Group on Management of Data)"},{"key":"70_CR8","doi-asserted-by":"crossref","unstructured":"Foltz, M., Davis, R.: Query by attention: Visually searchable information maps. In: Proceedings of Fifth International Conference on Information Visualisation, London, England, pp. 85\u201396 (2001)","DOI":"10.1109\/IV.2001.942043"},{"key":"70_CR9","doi-asserted-by":"crossref","unstructured":"Carlis, J.V., Konstan, J.: Interactive visualization of serial periodic data. In: ACM Symposium on User Interface Software and Technology, pp. 29\u201338 (1998)","DOI":"10.1145\/288392.288399"},{"key":"70_CR10","doi-asserted-by":"crossref","unstructured":"Sawant, A.P., Vanninen, M., Healey, C.G.: PerfViz: A visualization tool for analyzing, exploring, and comparing storage controller performance data. In: Visualization and Data Analysis. vol. 6495, 07. San Jose, CA, pp. 1\u201311 (2007)","DOI":"10.1117\/12.704603"},{"key":"70_CR11","unstructured":"Weigle, C., Emigh, W., Liu, G., Taylor, R., Enns, J.T., Healey, C.G.: Oriented texture slivers: A technique for local value estimation of multiple scalar fields. In: Proceedings Graphics Interface, Montr\u00e9al, Canada (2000) pp. 163\u2013170 (2000)"},{"key":"70_CR12","doi-asserted-by":"publisher","first-page":"145","DOI":"10.1109\/2945.773807","volume":"5","author":"C.G. Healey","year":"1999","unstructured":"Healey, C.G., Enns, J.T.: Large datasets at a glance: Combining textures and colors in scientific visualization. IEEE Transactions on Visualization and Computer Graphics\u00a05, 145\u2013167 (1999)","journal-title":"IEEE Transactions on Visualization and Computer Graphics"},{"key":"70_CR13","unstructured":"Interrante, V.: Harnessing natural textures for multivariate visualization. 20, 6\u201311 (2000)"},{"key":"70_CR14","volume-title":"Information Visualization: Perception for Design","author":"C. Ware","year":"2004","unstructured":"Ware, C.: Information Visualization: Perception for Design, 2nd edn. Morgan Kaufmann Publishers, Inc, San Francisco (2004)","edition":"2"}],"container-title":["Lecture Notes in Computer Science","Advances in Visual Computing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-76856-2_70","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,22]],"date-time":"2025-01-22T19:36:56Z","timestamp":1737574616000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-76856-2_70"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"ISBN":["9783540768555","9783540768562"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-76856-2_70","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2007]]}}}