{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:55:30Z","timestamp":1747810530001,"version":"3.40.3"},"publisher-location":"Berlin, Heidelberg","reference-count":19,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540877844"},{"type":"electronic","value":"9783540877851"}],"license":[{"start":{"date-parts":[[2008,1,1]],"date-time":"2008-01-01T00:00:00Z","timestamp":1199145600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008]]},"DOI":"10.1007\/978-3-540-87785-1_37","type":"book-chapter","created":{"date-parts":[[2008,9,24]],"date-time":"2008-09-24T01:22:11Z","timestamp":1222219331000},"page":"417-430","source":"Crossref","is-referenced-by-count":6,"title":["Automated Maintainability of TTCN-3 Test Suites Based on Guideline Checking"],"prefix":"10.1007","author":[{"given":"George","family":"Din","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Diana","family":"Vega","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ina","family":"Schieferdecker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"37_CR1","unstructured":"ETSI: Etsi standard es 201 873-1 v3.1.1 (2005-06): The testing and test control notation version 3; part 1: Ttcn-3 core language. European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (2005)"},{"key":"37_CR2","doi-asserted-by":"publisher","DOI":"10.1002\/0470017317","volume-title":"An Introduction to TTCN-3","author":"C. Willcock","year":"2005","unstructured":"Willcock, C., Dei, T., Tobies, S., Keil, S., Engler, F., Schulz, S.: An Introduction to TTCN-3. John Wiley & Sons, Ltd, Nokia Research Center, Nokia, Germany, Nokia, Finland (April 2005)"},{"key":"37_CR3","unstructured":"ETSI: European Telecommunication Standards Institute - ETSI"},{"key":"37_CR4","series-title":"Lecture Notes in Informatics (LNI)","volume-title":"Software Engineering 2007 (SE 2007)","author":"B. Zei\u00df","year":"2007","unstructured":"Zei\u00df, B., Vega, D., Schieferdecker, I., Neukirchen, H., Grabowski, J.: Applying the ISO 9126 Quality Model to Test Specifications Exemplified for TTCN-3 Test Specifications. In: Software Engineering 2007 (SE 2007), March 2007. Lecture Notes in Informatics (LNI), Copyright Gesellschaft f\u00fcr Informatik, K\u00f6llen Verlag, Bonn (2007)"},{"key":"37_CR5","unstructured":"European Telecommunication Institute - ETSI: Internet Protocol version 6 (IPv6) Conformance Test Specification (2006)"},{"key":"37_CR6","doi-asserted-by":"crossref","unstructured":"Wiles, A.: ETSI testing activities and the use of TTCN-3 (2001)","DOI":"10.1007\/3-540-48213-X_8"},{"key":"37_CR7","unstructured":"European Telecommunication Institute - ETSI: Session Initiation Protocol (SIP) Conformance Test Specification (2006)"},{"key":"37_CR8","unstructured":"European Telecommunication Institute - ETSI: MTP Level 3 User Adaptation Layer (2002)"},{"key":"37_CR9","volume-title":"Refactoring: Improving the Design of Existing Code","author":"M. Fowler","year":"1999","unstructured":"Fowler, M.: Refactoring: Improving the Design of Existing Code. Addison-Wesley, Boston (1999)"},{"key":"37_CR10","unstructured":"Zei\u00df, B.: A Refactoring Tool for TTCN-3. Master\u2019s thesis, Masterarbeit im Studiengang Angewandte Informatik am Institut f\u00fcr Informatik, ZFI-BM-2006-05, ISSN 1612-6793 (Tippfehlerbereinigte Version), Zentrum f\u00fcr Informatik, Georg-August-Universit\u00e4t G\u00f6ttingen (March 2006)"},{"key":"37_CR11","unstructured":"TestingTechnologies: TTworkbench: an Eclipse based TTCN-3 IDE, \n                    \n                      http:\/\/www.testingtech.de\/products\/ttwb_intro.php"},{"key":"37_CR12","unstructured":"Eclipse: Eclipse Modeling Framework (EMF) (2008)"},{"key":"37_CR13","series-title":"Lecture Notes in Computer Science","volume-title":"Proceedings of SAM 2006 \u2013 Fifth Workshop on System Analysis and Modelling (formerly SDL and MSC Workshop)","author":"D.E. Vega","year":"2006","unstructured":"Vega, D.E., Schieferdecker, I.: Towards quality of TTCN-3 tests. In: Gotzhein, R., Reed, R. (eds.) SAM 2006. LNCS, vol.\u00a04320. Springer, Heidelberg (2006)"},{"key":"37_CR14","unstructured":"ETSI: ETSI Naming Conventions (2007)"},{"key":"37_CR15","volume-title":"The C++ Programming Language","author":"B. Stroustrup","year":"1986","unstructured":"Stroustrup, B.: The C++ Programming Language. Addison-Wesley, Reading (1986)"},{"key":"37_CR16","volume-title":"Javasoft: Java Look & Feel Design Guidelines","author":"I. Sun Microsystems","year":"1999","unstructured":"Sun Microsystems, I., Javasoft: Java Look & Feel Design Guidelines. Addison-Wesley Longman Publishing Co., Inc., Boston (1999)"},{"key":"37_CR17","unstructured":"Services, G.S.: Unit testing guidelines (2007)"},{"key":"37_CR18","unstructured":"M\u00e4ki-Asiala, P.: Reuse of ttcn-3 code. Master\u2019s thesis, VTT Electronics Helsinki (2005)"},{"key":"37_CR19","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"148","DOI":"10.1007\/11951148_10","volume-title":"System Analysis and Modeling: Language Profiles","author":"B. Zei\u00df","year":"2006","unstructured":"Zei\u00df, B., Neukirchen, H., Grabowski, J., Evans, D., Baker, P.: Refactoring and Metrics for TTCN-3 Test Suites. In: Gotzhein, R., Reed, R. (eds.) SAM 2006. LNCS, vol.\u00a04320, pp. 148\u2013165. Springer, Heidelberg (2006)"}],"container-title":["Lecture Notes in Computer Science","Software Technologies for Embedded and Ubiquitous Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-540-87785-1_37","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,19]],"date-time":"2019-05-19T11:52:05Z","timestamp":1558266725000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-540-87785-1_37"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008]]},"ISBN":["9783540877844","9783540877851"],"references-count":19,"URL":"https:\/\/doi.org\/10.1007\/978-3-540-87785-1_37","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2008]]}}}