{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T06:16:04Z","timestamp":1759385764105},"publisher-location":"Berlin, Heidelberg","reference-count":11,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642012150"},{"type":"electronic","value":"9783642012167"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-01216-7_80","type":"book-chapter","created":{"date-parts":[[2009,11,18]],"date-time":"2009-11-18T20:32:19Z","timestamp":1258576339000},"page":"749-757","source":"Crossref","is-referenced-by-count":0,"title":["Neural Network Ensemble Approach in Analog Circuit Fault Diagnosis"],"prefix":"10.1007","author":[{"given":"Hong","family":"Liu","sequence":"first","affiliation":[]},{"given":"Guangju","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Guoming","family":"Song","sequence":"additional","affiliation":[]},{"given":"Tailin","family":"Han","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"80_CR1","unstructured":"Wang, C., Xie, Y.L., Chen, G.J.: Fault Diagnosis Based on Radial Basis Function Neural Network in Analog Circuits. In: International Conference on Communications, Circuits and Systems Proceedings, pp. 1183\u20131185 (2004)"},{"key":"80_CR2","doi-asserted-by":"publisher","first-page":"147","DOI":"10.1016\/S0263-2241(00)00008-7","volume":"28","author":"M. Catelani","year":"2000","unstructured":"Catelani, M., Fort, A.: Fault Diagnosis of Electronic Analog Circuits Using a Radial Basis Function Network Classifier. Measurement\u00a028, 147\u2013158 (2000)","journal-title":"Measurement"},{"key":"80_CR3","doi-asserted-by":"publisher","first-page":"2118","DOI":"10.1109\/TCSI.2005.853266","volume":"52","author":"P. Wang","year":"2005","unstructured":"Wang, P., Yang, S.: A New Diagnosis Approach for Handling Tolerance in Analog and Mixed-signal Circuits by Using Fuzzy Math. IEEE Trans. on Circuits and Sys.ts.I: Fundamental Theory and Applications\u00a052, 2118\u20132127 (2005)","journal-title":"IEEE Trans. on Circuits and Sys.ts.I: Fundamental Theory and Applications"},{"key":"80_CR4","unstructured":"Krogh, A., Vedelsby, J.: Neural Network Ensembles, Cross Validation, and Active Learning. In: Advances in Neural Information Processing Systems, vol.\u00a08, pp. 231\u2013238 (1995)"},{"key":"80_CR5","unstructured":"Zhao, Y., Gao, J., Yang, X.Z.: A Survey of Neural Network Ensembles. In: International Conference on Neural Networks and Brain, pp. 438\u2013442 (2005)"},{"key":"80_CR6","unstructured":"Liu, Y., Wang, Y., Zhang, B.F.: Ensemble Algorithm of Neural Networks and Its Application. In: Proceedings of the Third International Conference on Machine Learning and Cybernetics, pp. 3464\u20133467 (2004)"},{"key":"80_CR7","doi-asserted-by":"crossref","first-page":"169","DOI":"10.1613\/jair.614","volume":"11","author":"D. Opitz","year":"1999","unstructured":"Opitz, D., Maclin, R.: Popular Ensemble Method: An Empirical Study. Journal of Artificial Intelligence Research\u00a011, 169\u2013198 (1999)","journal-title":"Journal of Artificial Intelligence Research"},{"key":"80_CR8","first-page":"197","volume":"5","author":"R. Schapire","year":"1990","unstructured":"Schapire, R.: The Strength of Weak Learnability. Machine Learning\u00a05, 197\u2013227 (1990)","journal-title":"Machine Learning"},{"key":"80_CR9","doi-asserted-by":"publisher","first-page":"932","DOI":"10.1109\/19.799650","volume":"48","author":"Y. Maidon","year":"1999","unstructured":"Maidon, Y., Jervis, B.W.: Using Artificial Neural Networks or Lagrange Interpolation to Characterize the Faults in an Analog Circuit: An Experimental Study. IEEE Trans. on Instrumentation and Measurement\u00a048, 932\u2013938 (1999)","journal-title":"IEEE Trans. on Instrumentation and Measurement"},{"key":"80_CR10","doi-asserted-by":"publisher","first-page":"188","DOI":"10.1109\/82.558453","volume":"44","author":"R. Spina","year":"1997","unstructured":"Spina, R., Upadhyaya, S.: Linear Circuit Fault Diagnosis Using Neuromorphic Analyzers. IEEE Trans. on Circuits and Systems II: Analog and Digital Signal Processing\u00a044, 188\u2013196 (1997)","journal-title":"IEEE Trans. on Circuits and Systems II: Analog and Digital Signal Processing"},{"key":"80_CR11","doi-asserted-by":"crossref","unstructured":"Mahammadi, K., Monfared, A.R.M.: Fault Diagnosis of Analog Circuits with Tolerances By Using RBF and BP Neural Networks. In: IEEE Student Conference on Research and Development Proceedings, vol.\u00a02, pp. 317\u2013321 (2002)","DOI":"10.1109\/SCORED.2002.1033122"}],"container-title":["Advances in Soft Computing","The Sixth International Symposium on Neural Networks (ISNN 2009)"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-01216-7_80.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,30]],"date-time":"2021-04-30T09:59:31Z","timestamp":1619776771000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-01216-7_80"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642012150","9783642012167"],"references-count":11,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-01216-7_80","relation":{},"ISSN":["1867-5662","1867-5670"],"issn-type":[{"type":"print","value":"1867-5662"},{"type":"electronic","value":"1867-5670"}],"subject":[],"published":{"date-parts":[[2009]]}}}