{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:33:21Z","timestamp":1725536001763},"publisher-location":"Berlin, Heidelberg","reference-count":6,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642030949"},{"type":"electronic","value":"9783642030956"}],"license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-03095-6_35","type":"book-chapter","created":{"date-parts":[[2009,7,30]],"date-time":"2009-07-30T13:40:55Z","timestamp":1248961255000},"page":"362-371","source":"Crossref","is-referenced-by-count":10,"title":["A Low Communication Overhead and Load Balanced Parallel ATPG with Improved Static Fault Partition Method"],"prefix":"10.1007","author":[{"given":"K. -W.","family":"Yeh","sequence":"first","affiliation":[]},{"given":"M. -F.","family":"Wu","sequence":"additional","affiliation":[]},{"given":"J. -L.","family":"Huang","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"35_CR1","doi-asserted-by":"crossref","unstructured":"Butler, R., Keller, B., Paliwal, S., Schoonover, R., Swenton, J.: Design and Implementation of a Parallel Automatic Test Pattern Generation Algorithm with Low Test Vector Count. In: Proc. International Test Conference (2000)","DOI":"10.1109\/TEST.2000.894246"},{"key":"35_CR2","doi-asserted-by":"crossref","unstructured":"Klenke, R.H., Kaufman, L., Aylor, J.H., Waxman, R., Narayan, P.: Workstation Based Parallel Test Generation. In: Proc. International Test Conference (1993)","DOI":"10.1109\/TEST.1993.470670"},{"key":"35_CR3","doi-asserted-by":"crossref","unstructured":"Patil, S., Banerjee, P.: Fault Partitioning Issues in an Integrated Parallel Test generation\/Fault Simulation Environment. In: Proc. International Test Conference (1989)","DOI":"10.1109\/TEST.1989.82360"},{"issue":"12","key":"35_CR4","doi-asserted-by":"publisher","first-page":"1542","DOI":"10.1109\/43.103504","volume":"10","author":"S. Patil","year":"1991","unstructured":"Patil, S., Banerjee, P.: Performance Trade-Offs in a Parallel Test Generation\/Fault Simulation Environment. IEEE Transactions on Computer-Aided Design\u00a010(12), 1542\u20131558 (1991)","journal-title":"IEEE Transactions on Computer-Aided Design"},{"issue":"5","key":"35_CR5","doi-asserted-by":"publisher","first-page":"517","DOI":"10.1109\/43.506139","volume":"15","author":"J.M. Wolf","year":"1996","unstructured":"Wolf, J.M., Kaufman, L.M., Klenke, R.H., Aylor, J.H., Waxman, R.: An Analysis of Fault Partitioned Parallel Test Generation. IEEE Transactions on Computer-Aided Design\u00a015(5), 517\u2013534 (1996)","journal-title":"IEEE Transactions on Computer-Aided Design"},{"issue":"3\/4","key":"35_CR6","first-page":"165","volume":"8","author":"M. Forum","year":"1994","unstructured":"Forum, M.: MPI: A message-passing interface standard. International Journal of Supercom-puter Application\u00a08(3\/4), 165\u2013416 (1994)","journal-title":"International Journal of Supercom-puter Application"}],"container-title":["Lecture Notes in Computer Science","Algorithms and Architectures for Parallel Processing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-03095-6_35","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,3,9]],"date-time":"2019-03-09T02:43:52Z","timestamp":1552099432000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-03095-6_35"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642030949","9783642030956"],"references-count":6,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-03095-6_35","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2009]]}}}